3 - Calibration standards and specimens - Agar Scientific
3 - Calibration standards and specimens - Agar Scientific
3 - Calibration standards and specimens - Agar Scientific
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<strong>Calibration</strong> <strong>st<strong>and</strong>ards</strong> <strong>and</strong> <strong>specimens</strong><br />
SEM 144 nm reference st<strong>and</strong>ard<br />
S1861<br />
S1861A<br />
S1861B<br />
S1861C<br />
S1861D<br />
S1861E<br />
S1861T<br />
S1861U<br />
144 nm calibration st<strong>and</strong>ard on 12.5 mm pin stub<br />
144 nm calibration st<strong>and</strong>ard on 10 mm JEOL stub<br />
144 nm calibration st<strong>and</strong>ard on 15 mm Topcon/ISI/ABT stub<br />
144 nm calibration st<strong>and</strong>ard on 15 mm Hitachi stub<br />
144 nm calibration st<strong>and</strong>ard on customer’s stub<br />
144 nm calibration st<strong>and</strong>ard on 12.5 mm JEOL stub<br />
144 nm calibration st<strong>and</strong>ard on thin carbon disc (0.5 mm)<br />
144 nm calibration st<strong>and</strong>ard, unmounted<br />
SEM 144 nm reference st<strong>and</strong>ard, certified<br />
S1862<br />
S1862A<br />
S1862B<br />
S1862C<br />
S1862D<br />
S1862E<br />
S1862T<br />
S1862U<br />
144 nm certified calibration st<strong>and</strong>ard on 12.5 mm pin stub<br />
144 nm certified calibration st<strong>and</strong>ard on 10 mm JEOL stub<br />
144 nm certified calibration st<strong>and</strong>ard on 15 mm Topcon/ISI/ABT stub<br />
144 nm certified calibration st<strong>and</strong>ard on 15 mm Hitachi stub<br />
144 nm certified calibration st<strong>and</strong>ard on customer’s stub<br />
144 nm certified calibration st<strong>and</strong>ard on 12.5 mm JEOL stub<br />
144 nm certified calibration st<strong>and</strong>ard on thin carbon disc (0.5 mm)<br />
144 nm certified calibration st<strong>and</strong>ard, unmounted<br />
SEM 300 nm reference st<strong>and</strong>ard<br />
S1863<br />
S1863A<br />
S1863B<br />
S1863C<br />
S1863D<br />
S1863E<br />
S1863T<br />
S1863U<br />
300 nm calibration st<strong>and</strong>ard on 12.5 mm pin stub<br />
300 nm calibration st<strong>and</strong>ard on 10 mm JEOL stub<br />
300 nm calibration st<strong>and</strong>ard on 15 mm Topcon/ISI/ABT stub<br />
300 nm calibration st<strong>and</strong>ard on 15 mm Hitachi stub<br />
300 nm calibration st<strong>and</strong>ard on customer’s stub<br />
300 nm calibration st<strong>and</strong>ard on 12.5 mm JEOL stub<br />
300 nm calibration st<strong>and</strong>ard on thin carbon disc (0.5 mm)<br />
300 nm calibration st<strong>and</strong>ard, unmounted<br />
AFM 144 nm reference st<strong>and</strong>ard<br />
F7050<br />
144 nm AFM calibration st<strong>and</strong>ard on 12 mm steel disc<br />
AFM 144 nm reference st<strong>and</strong>ard, certified<br />
F7051<br />
144 nm AFM certified calibration st<strong>and</strong>ard on 12 mm steel disc<br />
AFM 300 nm reference st<strong>and</strong>ard<br />
F7052<br />
300 nm AFM calibration st<strong>and</strong>ard on 12 mm steel disc<br />
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