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Download Abstracts Book - DF-UFPE Pessoal

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Application of a phenomenological model for the surface impedance in<br />

high temperature superconducting films<br />

A.S. Mosquera Polo 1,3 , D. A. Landínez Téllez 2 , L.T. Corredor 1 , J. Albino Aguiar 1<br />

1 . Departamento de Física, Universidade Federal de Pernambuco, Av. Prof. Luis Freire s/n,<br />

50670-901, Cidade Universitária, Recife-PE, Brazil<br />

2 . Grupo de Física de Nuevos Materiales, Departamento de Física, Universidad Nacional de<br />

Colombia, Bogotá DC<br />

3 . Grupo de Nuevos Materiales, Departamento de Física, Universidad del Magdalena, AA<br />

10004, Santa Marta, Colombia<br />

We report the application of a phenomenological model for the microwave surface<br />

impedance in high temperature superconducting films. This model is based on the<br />

modified two-fluid model, in which the real and imaginary parts of the surface<br />

impedance use the modelling parameter γ. This is responsible for the superconducting<br />

and normal charge carrier density and is used for the description of the temperature<br />

dependence of the London penetration depth λL(T) including λL(0). The relaxation time<br />

model also uses the γ parameter in combination with the residual resistance parameter α.<br />

The parameter δ 1

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