CURRICULUM VITAE FOR Mark E. Orazem - Chemical Engineering ...

Curriculum Vitae for Mark E. Orazem
University of Florida
page 13
12. M. E. Orazem and M. G. Miller, “Current Distribution and Formation of a Salt Film on an Iron Disk
below the Passivation Potential,” presented at the 169th Meeting of the Electrochemical Society,
Boston, Massachusetts, May 7, 1986.
13. E. C. Gan and M. E. Orazem, “A Mathematical Model for the Corrosion of Iron in Sulfuric Acid,”
presented at the 169th Meeting of the Electrochemical Society, Boston, Massachusetts, May 7, 1986.
14. M. E. Orazem, “A Mathematical Model for the Photoelectrochemical Etching of Semiconductors,”
presented at the 79th Annual Meeting of the American Institute of Chemical Engineers, Miami Beach,
Florida, November 5, 1986.
15. G. Hickey and M. E. Orazem, “An Experimental Technique for Evaluating Film Persistency,”
presented at Corrosion/87, Annual Conference of the National Association of Corrosion Engineers,
San Francisco, California, March 13, 1987.
16. D. B. Bonham and M. E. Orazem, “In-Situ Characterization of Surface States with Application to
Photoelectrochemical Semiconductor Processing,” presented at the Spring Meeting of the AIChE,
Houston, Texas, March 30, 1987.
17. C. B. Diem and M. E. Orazem, “A Scanning Ellipsometer to Evaluate the Influence of Fluid Velocity
on Corrosion,” presented at the T-5A Workshop on Fluid Flow Enhanced Corrosion, Corrosion/88,
Saint Louis, Missouri, March 23, 1988.
18. J. M. Esteban, M. Lowry, and M. E. Orazem, “Correction of Experimental Data for the Ohmic
Potential Drop Corresponding to a Secondary Current Distribution on a Disk Electrode,” (invited
paper) presented at the ASTM Symposium on Ohmic Electrolyte Resistance Measurement and
Compensation, Baltimore, Maryland, May 19, 1988.
19. D. B. Bonham and M. E. Orazem, “Identification of Deep-Level Electronic Defects by
Photoelectrochemical A. C. Impedance Spectroscopy,” (invited paper) presented at the 174th Meeting
of the Electrochemical Society, Chicago, Illinois, October 11, 1988.
20. D. B. Bonham and M. E. Orazem, “The Influence of Deep-Level Electronic Defects on
Characterization Methods involving Mott-Schottky Theory,” presented at the 174th Meeting of the
Electrochemical Society, Chicago, Illinois, October 12, 1988.
21. D. B. Bonham and M. E. Orazem, “The Influence of Deep-Level Electronic Defects on
Photoelectrochemical A. C. Impedance Spectroscopy of Semiconductors,” presented at the Annual
Meeting of the American Institute of Chemical Engineers, Washington, D.C., December 1, 1988.
22. M. E. Orazem, “Identification of Deep-Level Electronic Defects in III-V Semiconductors by
Photoelectrochemical A. C. Impedance Spectroscopy of Semiconductors,” (invited paper) presented
at the 18th Annual Symposium of the American Vacuum Society, Clearwater Beach, Florida,
February 8, 1989.
23. D. B. Bonham and M. E. Orazem, “Applications of Mathematical Models of Photoelectrochemical A.
C. Impedance Spectroscopy for Identification of Deep-Level Electronic Defects in Semiconductors,”
presented at the First International Symposium on Electrochemical Impedance Spectroscopy,
Bombannes, France, May 26, 1989.