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Standards Kick-off Meeting Presentation - PVMC

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Initial c-Si U.S. <strong>PVMC</strong> Program Areas<br />

In-line/Off-line c-Si Metrology<br />

– Identify and rank critical industry needs in c-Si metrology<br />

– Create national roadmap for metrology and participate in standards development efforts<br />

– Develop projects to demonstrate new c-Si metrology technologies<br />

– Build infrastructure to support metrology programs<br />

– Transition new metrology technologies into pilot and manufacturing lines<br />

– Provide member companies access to high-impact metrology tools and services<br />

New Feedstock/Wafering Methodologies<br />

– Identify and rank critical industry needs in feedstock and wafering<br />

– Establish c-Si feedstock/wafering programs to accelerate transition of new technologies into<br />

mainstream manufacturing<br />

– Provide/foster process, test, and demonstration activities to validate new technologies and identify<br />

barriers<br />

– Create national roadmap and participate in standards development efforts<br />

We expect to expand Program Areas going forward<br />

Dr. Winston V. Schoenfeld<br />

Dr. Hubert Seigneur<br />

Mr. Kris Davis<br />

Mr. Andy Rudack<br />

Director, c-Si U.S. <strong>PVMC</strong><br />

Program Manager, Feedstock/Wafering<br />

Program Manager, c-Si Metrology<br />

Operations Manager<br />

<strong>PVMC</strong> Confidential – Not for reproduction/distribution without written permission from <strong>PVMC</strong>-FL

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