MMC2107 - Freescale Semiconductor

Signal Description
Freescale Semiconductor, Inc.
4.5.10 Test Signal (TEST)
This input signal (TEST) is reserved for factory testing only and should
be connected to V SS to prevent unintentional activation of test functions.
4.5.11 Power and Ground Signals
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Freescale Semiconductor, I
These signals provide system power and ground to the chip. Multiple
signals are provided for adequate current capability. All power supply
signals must have adequate bypass capacitance for high-frequency
noise suppression.
4.5.11.1 Power for FLASH Erase/Program (V PP )
This signal supplies an isolated power for FLASH program and erase
operations.
4.5.11.2 Power and Ground for FLASH Array (V DDF and V SSF )
4.5.11.3 Standby Power (V STBY )
4.5.11.4 Positive Supply (V DD )
These signals supply an isolated power and ground to the FLASH array.
This signal is used to provide standby voltage to the RAM array if V DD is
lost.
This signal supplies positive power to the core logic and I/O pads.
4.5.11.5 Ground (V SS )
This signal is the negative supply (ground) to the chip.
Technical Data MMC2107 – Rev. 2.0
128 Signal Description MOTOROLA
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