ANALYSETTE 22 NanoTec
ANALYSETTE 22 NanoTec
ANALYSETTE 22 NanoTec
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0.01 – 2000 µm<br />
<strong>ANALYSETTE</strong> <strong>22</strong> <strong>NanoTec</strong> plus – Practical modular system: measuring unit with separate wet dispersion unit<br />
FRITSCH-IDEA: A THIRD LASER FOR MEASURING<br />
THE BACKWARD SCATTERING<br />
To extend the particle size determination down to the nano<br />
range, it is necessary to detect the light that scatters backward.<br />
And the FRITSCH solution for this is simply brilliant: a<br />
third laser beam utilises backward scattering for the measurement.<br />
This beam irradiates the sample positioned directly in<br />
front of the detector through a micro-hole in the centre of the<br />
detector. Your advantage: the uniquely large measuring range<br />
of the <strong>ANALYSETTE</strong> <strong>22</strong> <strong>NanoTec</strong> plus with a lower measuring<br />
limit of approximately 0.01 µm. And instead of a weak diode<br />
a real intensive laser for backward scattering.<br />
IR laser<br />
Detector<br />
Green laser<br />
Measuring cell<br />
Zeichnung noch inhaltlich abzustimmen<br />
Green backward laser<br />
Measurement design for the nano particle size range<br />
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