ANALYSETTE 22 NanoTec

0.01 – 2000 µm
ANALYSETTE 22 NanoTec plus – Practical modular system: measuring unit with separate wet dispersion unit
FRITSCH-IDEA: A THIRD LASER FOR MEASURING
THE BACKWARD SCATTERING
To extend the particle size determination down to the nano
range, it is necessary to detect the light that scatters backward.
And the FRITSCH solution for this is simply brilliant: a
third laser beam utilises backward scattering for the measurement.
This beam irradiates the sample positioned directly in
front of the detector through a micro-hole in the centre of the
detector. Your advantage: the uniquely large measuring range
of the ANALYSETTE 22 NanoTec plus with a lower measuring
limit of approximately 0.01 µm. And instead of a weak diode
a real intensive laser for backward scattering.
IR laser
Detector
Green laser
Measuring cell
Zeichnung noch inhaltlich abzustimmen
Green backward laser
Measurement design for the nano particle size range
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