2.1 Ultrafast solid-state lasers - ETH - the Keller Group
2.1 Ultrafast solid-state lasers - ETH - the Keller Group
2.1 Ultrafast solid-state lasers - ETH - the Keller Group
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Ref. p. 134] <strong>2.1</strong> <strong>Ultrafast</strong> <strong>solid</strong>-<strong>state</strong> <strong>lasers</strong> 89<br />
a<br />
b<br />
c<br />
d<br />
e<br />
Output<br />
coupler Laser gain Mirror<br />
R<br />
top<br />
R<br />
R top 0<br />
cw laser<br />
Coupled cavity<br />
bottom<br />
Saturable<br />
absorber<br />
RPM − Dec 1,1990<br />
Mirror<br />
R bottom<br />
A−FPSA−<br />
April 1,1992<br />
Scaling A −FPSA−Feb.15,1995<br />
Single quantum well absorber<br />
(SBR June 15,1995)<br />
SESAM−<br />
May 19,1995<br />
Absorber embedded inside an arbitrary mirror<br />
Fig. <strong>2.1</strong>.12. Historical evolution of different SESAM designs: (a) Ordinary cw laser. (b) Initially <strong>the</strong><br />
semiconductor saturable absorber was used inside a nonlinear coupled cavity, termed Resonant Passive<br />
Mode-locking (RPM) [90Kel2]. (c) First intracavity saturable absorber to passively mode-lock diodepumped<br />
<strong>solid</strong>-<strong>state</strong> <strong>lasers</strong> without Q-switching instabilities: Antiresonant Fabry–Perot Saturable Absorber<br />
(A-FPSA) [92Kel2]. (d) Scaling of <strong>the</strong> A-FPSA resulted in a single quantum well saturable absorber integrated<br />
into a Bragg mirror [95Bro2] – later also referred to as Saturable Bragg Reflector (SBR) [95Tsu].<br />
(e) General concept of SEmiconductor Saturable Absorber Mirror (SESAM) without any restrictions on<br />
<strong>the</strong> mirror design [95Kel, 96Kel].<br />
of an AlGaAs/AlAs or InGaAlP/AlAs Bragg mirror using wet oxidation of AlAs which creates<br />
low-index Al x O y layers [04Tan].<br />
In 1995 [95Kel] it was fur<strong>the</strong>r realized that <strong>the</strong> intracavity saturable absorber can be integrated<br />
in a more general mirror structure that allows for both saturable absorption and negative dispersion<br />
control, which is now generally referred to as a SEmiconductor Saturable Absorber Mirror<br />
(SESAM) (Fig. <strong>2.1</strong>.12e). In a general sense we <strong>the</strong>n can reduce <strong>the</strong> design problem of a SESAM to<br />
<strong>the</strong> analysis of multilayered interference filters for a given desired nonlinear reflectivity response<br />
for both <strong>the</strong> amplitude and phase. The A-FPSA [92Kel2], <strong>the</strong> Saturable Bragg Reflector (SBR)<br />
[95Bro2, 95Tsu, 95Kno] and <strong>the</strong> Dispersive Saturable Absorber Mirror (D-SAM) [96Kop2] are<br />
<strong>the</strong>n special examples of SESAM designs. In this more general class of design we do not restrict<br />
ourselves to Bragg mirror structures, which are defined by a stack of quarter-wave layers with<br />
alternating high and low refractive indices (e.g. [95Kno]). For example, we have demonstrated with<br />
many examples that non-quarter-wave layers in mirrors give more design freedom for integrating<br />
<strong>the</strong> absorber layers into <strong>the</strong> mirror structure. Fur<strong>the</strong>rmore, double-chirped semiconductor mirror<br />
structures can provide very broadband negative dispersion [99Pas1].<br />
One important parameter of a SESAM device is its saturation fluence, which has typical values<br />
in <strong>the</strong> range of 10–100 μJ/cm 2 . Lower saturation fluence is particularly relevant for fundamentally<br />
mode-locked <strong>solid</strong>-<strong>state</strong> <strong>lasers</strong> with GHz pulse repetition rates and high average power [05Spu3].<br />
Novel design structures allowed to substantially lower <strong>the</strong> saturation fluence of SESAMs into <strong>the</strong><br />
1 μJ/cm 2 regime [05Spu3]. New terms “LOw-Field-Enhancement Resonant-like SESAM device”<br />
(LOFERS) [03Wei1] and “Enhanced SESAM device” (E-SESAM) [03Wei2] were introduced. A<br />
LOFERS can be used to fur<strong>the</strong>r reduce saturation fluence without <strong>the</strong> detrimental effects of strongly<br />
resonant structures such as bistability and narrow bandwidth. Such a design has a low-finesse<br />
resonant structure such that <strong>the</strong> field strength is substantially higher in <strong>the</strong> spacer layer containing<br />
<strong>the</strong> absorber and <strong>the</strong>refore reducing <strong>the</strong> saturation fluence fur<strong>the</strong>r.<br />
So far <strong>the</strong> SESAM is mostly used as an end mirror of a standing-wave cavity. Very compact<br />
cavity designs have been achieved for example in passively Q-switched microchip <strong>lasers</strong> (Fig. <strong>2.1</strong>.6)<br />
Landolt-Börnstein<br />
New Series VIII/1B1