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exotic nuclei structure and reaction noyaux exotiques ... - IPN - IN2P3

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But at 80 keV total energy ( 200 eV/atom) we observed<br />

a full coherent effect [9] with a projected<br />

range increased by a factor of almost 6 to 8 because<br />

of the clearing the way effect (the first cluster<br />

atoms entering in the solids push away the target<br />

atoms <strong>and</strong> so open an easy path for their followers).<br />

It is thus important to control in the range<br />

from 40 keV to 400 keV of total energy what is the<br />

contribution of the coherent motion on the energy<br />

loss, the part of the clearing the way effect versus<br />

the friction processes (effect of the charge at the<br />

surface Coulomb explosion etc) observed between<br />

200 keV per charge <strong>and</strong> 4 MeV per charge [2].<br />

The targets are carbon foils of 5, 10, 15 nm. The<br />

reference of these measurements are the 20-100<br />

keV beams of Au 1-5 [10]. The secondary ion <strong>and</strong><br />

electron emission are measured from the backside<br />

of the target <strong>and</strong> simultaneously we measure<br />

the velocity of the projectiles or fragments by time<br />

of flight. The first results show that the massive<br />

cluster passes through 15 nm of carbon at 80 keV<br />

per charge <strong>and</strong> produces an ion emission of carbon<br />

clusters; It is important to notice that an atomic<br />

ion with the same velocity is stopped by 3 nm of<br />

carbon <strong>and</strong> that 15 nm is the range of atomic gold<br />

at 27 keV or Au 3 at 80 keV; this has been controlled<br />

experimentally. These measurements will<br />

allow to establish the transition between coherent<br />

effect <strong>and</strong> independent atomic interaction <strong>and</strong> also<br />

to know the energy deposited in the first 10 nm of<br />

matter which contributes to the secondary emission<br />

from the solid.<br />

References<br />

[1] S. Bouneau, et al , Nucl. Instr. And Meth. B225, 579-589,<br />

2004.<br />

[2] A.Tempez, et al, Rapid Comm; in Mass Spectrom. 18 371-<br />

376, 2004.<br />

[3] C. Guillermier, et al, Applied Surface Science 252, 6529-<br />

6532, 2006.<br />

[4] C. Guillermier, et al, Int. Journal of Mass Spect., Volume<br />

263, Issues 2-3, 5, 298-303, 2007.<br />

[5]C.Guillermier, et al, Int. Journal of Mass Spect., 275, 86-90,<br />

2008.<br />

[6]S. Della-Negra, et al, Surface <strong>and</strong> Interface Analysis, accepted,<br />

2010.<br />

[7]A.D.Dymnikov <strong>and</strong> S.Y. Yavor.,Sov. Phys. Techn. Phys., 8-<br />

7, 639, 1964.<br />

[8]S. Bouneau, et al,. Nucl. Instr. And Meth. B 251, 383-389,<br />

2006.<br />

[9] S. Della-Negra, M. Pautrat, G. Rizza, In preparation<br />

[10]H.H. Andersen, et al, Nucl. Instr. <strong>and</strong> Meth. B212, 56, 2003.<br />

102

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