exotic nuclei structure and reaction noyaux exotiques ... - IPN - IN2P3
exotic nuclei structure and reaction noyaux exotiques ... - IPN - IN2P3
exotic nuclei structure and reaction noyaux exotiques ... - IPN - IN2P3
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But at 80 keV total energy ( 200 eV/atom) we observed<br />
a full coherent effect [9] with a projected<br />
range increased by a factor of almost 6 to 8 because<br />
of the clearing the way effect (the first cluster<br />
atoms entering in the solids push away the target<br />
atoms <strong>and</strong> so open an easy path for their followers).<br />
It is thus important to control in the range<br />
from 40 keV to 400 keV of total energy what is the<br />
contribution of the coherent motion on the energy<br />
loss, the part of the clearing the way effect versus<br />
the friction processes (effect of the charge at the<br />
surface Coulomb explosion etc) observed between<br />
200 keV per charge <strong>and</strong> 4 MeV per charge [2].<br />
The targets are carbon foils of 5, 10, 15 nm. The<br />
reference of these measurements are the 20-100<br />
keV beams of Au 1-5 [10]. The secondary ion <strong>and</strong><br />
electron emission are measured from the backside<br />
of the target <strong>and</strong> simultaneously we measure<br />
the velocity of the projectiles or fragments by time<br />
of flight. The first results show that the massive<br />
cluster passes through 15 nm of carbon at 80 keV<br />
per charge <strong>and</strong> produces an ion emission of carbon<br />
clusters; It is important to notice that an atomic<br />
ion with the same velocity is stopped by 3 nm of<br />
carbon <strong>and</strong> that 15 nm is the range of atomic gold<br />
at 27 keV or Au 3 at 80 keV; this has been controlled<br />
experimentally. These measurements will<br />
allow to establish the transition between coherent<br />
effect <strong>and</strong> independent atomic interaction <strong>and</strong> also<br />
to know the energy deposited in the first 10 nm of<br />
matter which contributes to the secondary emission<br />
from the solid.<br />
References<br />
[1] S. Bouneau, et al , Nucl. Instr. And Meth. B225, 579-589,<br />
2004.<br />
[2] A.Tempez, et al, Rapid Comm; in Mass Spectrom. 18 371-<br />
376, 2004.<br />
[3] C. Guillermier, et al, Applied Surface Science 252, 6529-<br />
6532, 2006.<br />
[4] C. Guillermier, et al, Int. Journal of Mass Spect., Volume<br />
263, Issues 2-3, 5, 298-303, 2007.<br />
[5]C.Guillermier, et al, Int. Journal of Mass Spect., 275, 86-90,<br />
2008.<br />
[6]S. Della-Negra, et al, Surface <strong>and</strong> Interface Analysis, accepted,<br />
2010.<br />
[7]A.D.Dymnikov <strong>and</strong> S.Y. Yavor.,Sov. Phys. Techn. Phys., 8-<br />
7, 639, 1964.<br />
[8]S. Bouneau, et al,. Nucl. Instr. And Meth. B 251, 383-389,<br />
2006.<br />
[9] S. Della-Negra, M. Pautrat, G. Rizza, In preparation<br />
[10]H.H. Andersen, et al, Nucl. Instr. <strong>and</strong> Meth. B212, 56, 2003.<br />
102