Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
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<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Data Sources<br />
• Member Company Topic Presentations<br />
• Special <strong>Vertical</strong> Probe Survey for SWTW<br />
Probe Card<br />
Application<br />
Leadtime<br />
I/O Count<br />
I/O Layout<br />
Typ. Lifetime<br />
Cleaning<br />
Repair<br />
Selection<br />
Spacetransformer<br />
Other<br />
Type/Technology<br />
Manufacturer<br />
Product Name<br />
Product Type<br />
I/O Type<br />
1st<br />
Subsequent<br />
Minimum<br />
Maximum<br />
Pitch<br />
Type<br />
# Touchdowns<br />
Frequency<br />
Technique<br />
In-house<br />
Supplier<br />
Why?<br />
2nd Sourcing<br />
Required (Y/|N) / If Yes<br />
name Supplier<br />
Type<br />
Sourcing<br />
Strengths<br />
Weaknesses<br />
1 2 3<br />
Enter Data<br />
Enter Data<br />
Enter Data<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 7
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