Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
You also want an ePaper? Increase the reach of your titles
YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.
<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
Leadtimes = Cantilever<br />
Key Challenges<br />
Current per pin<br />
mA x 100‘s<br />
+ +<br />
Pitch (µm)<br />
Peripheral:80,60,50..<br />
Cost effective Array:150,130,100...<br />
solutions required<br />
+ NOW +<br />
Pincount x 10k<br />
Multi DUT x 10‘s<br />
Please !<br />
+ +<br />
Al,Au,Cu,PbSn,SnAg<br />
Temperature ( o C)<br />
-40 +150.....<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 26