Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
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<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Selection<br />
• Membrane…..MEMS<br />
Sourcing<br />
Decision<br />
2nd<br />
Strengths<br />
Weaknesses<br />
Performance<br />
None<br />
High Frequency,<br />
Planarity,<br />
Alignment, Fine<br />
Pitch<br />
Cost, Leadtime,<br />
Single-Sourcing<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 23
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