Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
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<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Maintenance<br />
• Buckling Beam<br />
Metallurgy<br />
Frequency<br />
Cleaning<br />
Method<br />
Repair<br />
Lifetime<br />
PbSn<br />
50 - 2000<br />
Brush,<br />
Abrasive Pad,<br />
Gel Pad<br />
Some<br />
Inhouse<br />
100K –<br />
1M<br />
Al Pad<br />
200 - 1000<br />
Brush,<br />
Abrasive Pad,<br />
Gel Pad<br />
Some<br />
Inhouse<br />
---<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 17