Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
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<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Applications<br />
• Spring<br />
Products<br />
Metallurgy<br />
Pitch (µm)<br />
I/O’s<br />
Config.<br />
#<br />
ASICs, µprocessors, Chip Sets<br />
Flash<br />
PbSn Bump<br />
180 - 225<br />
Al Pad<br />
100<br />
Area Array<br />
800 - 3100<br />
Inline<br />
20x – 100x<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 15
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