Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Applications<br />
• Hybrid Cantilever<br />
Logic Chip Sets<br />
Products<br />
ASICs, µcontrollers<br />
Metallurgy<br />
Pitch (µm)<br />
PbSn Bump<br />
200 - 250<br />
Al Pad<br />
35/50<br />
I/O’s<br />
Config.<br />
#<br />
Area Array<br />
400 - 800<br />
Staggered<br />
100 - 300<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 14
Change language