Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
Vertical Probing Experiences - Semiconductor Wafer Test Workshop
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<strong>Vertical</strong> <strong>Probing</strong> <strong>Experiences</strong><br />
<strong>Experiences</strong>: Probe Technologies<br />
• Hybrid Cantilever<br />
– Cantilever w. Wire<br />
Through Guide Plates<br />
– Sourced From<br />
• K&S (VertaProbe)<br />
Illustration Courtesy of Motorola<br />
June 3, 2003 2003 Southwest <strong>Test</strong> <strong>Workshop</strong> 10
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