On the Analysis of Optical Mapping Data - University of Wisconsin ...
On the Analysis of Optical Mapping Data - University of Wisconsin ...
On the Analysis of Optical Mapping Data - University of Wisconsin ...
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89<br />
which can be shown to have higher likelihood than θ t .<br />
The details <strong>of</strong> <strong>the</strong>se calculations depend on <strong>the</strong> emission model. We consider two specific<br />
models for <strong>the</strong> emission distribution (B.1). In <strong>the</strong> first model, η = (λ 1 , . . .,λ K , σ), which<br />
defines <strong>the</strong> emission distributions<br />
X i |Π i = k ∼ N B (λ k , σ) (B.5)<br />
In words, <strong>the</strong> emission distribution in each state is negative binomial with a different mean<br />
and a common size parameter. The second model attempts to ensure that copy number<br />
changes are limited to simple fractions (e.g. 2:3, 1:2, 1:1, 2:1, 3:2) by fixing <strong>the</strong>m relative to<br />
each o<strong>the</strong>r. Specifically, η = (λ, σ) and<br />
X i |Π i = k ∼ N B (λα k , σ) (B.6)<br />
where α 1 , . . .,α K are fixed known constants. Theorem 1 gives <strong>the</strong> Baum-Welch updates for<br />
<strong>the</strong>se two models in terms <strong>of</strong> <strong>the</strong> quantities<br />
A k,l =<br />
B k =<br />
N k,b =<br />
∑L−1<br />
i=1<br />
∑L−1<br />
i=1<br />
∑L−1<br />
i=1<br />
I {Πi =k,Π i+1 =l}<br />
I {Πi =k}<br />
I {Πi =k,x i =b}<br />
and<br />
Ā k,l (θ) = E (A k,l |x, θ)<br />
¯B k (θ) = E (B k |x, θ)<br />
¯N k,b (θ) = E (N k,b |x, θ)<br />
The pro<strong>of</strong> <strong>of</strong> <strong>the</strong> <strong>the</strong>orem is long but straightforward, and will not be given here.