EI0312 VLSI - SRM University

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Assessment details: Cycle test-I 10 points Cycle test-II 10 points Model exam 10 points Surprise test 5 points Attendance 5 points Total 50 Outcomes: Students who have successfully completed this course Study of MOS technology and circuits. Gain knowledge of Layout and digital Circuits. Understanding of ASIC Purpose FPGA Knowledge of Faults The students will be able to understand the types of MOS, their properties and their design with stick diagrams The Students will be able to analyze scaling in MOS, pass transistor, Supper Buffer, Clocking Strategies, PLA and PAL design. The students will have a broad knowledge in Floor planning, Placement and routing. The Students will be able to acquire knowledge about FPGA The students can acquire a clear knowledge of testability, controllability and observability of the model, Detailed Session Plan: DAY NAME OF THE TOPICS REFERENCE UNIT-I 1 Digital systems and VLSI 2 CMOS Technology 3 Bipolar technologies MOS circuits electrical properties 4 Integrated Circuit Design Techniques 5 Transistors and Layout 6 Fabrication Process of nMOS 7 Fabrication process of CMOS 8 Stick diagram and Layout 9 Design Rules UNIT-II 10 Introduction to Logic Gates 11 Combinational Logic Functions and Static Complementary Gates 12 Wires and Delays, Switch Logic 1. Douglas A. Pucknell, Basic VLSI Design Systems and Circuits, Prentice Hall of India, 1993 2. Wayne Wolf, Modern VLSI Design (System on Silicon), Prentice Hall PTR 2000 1. Douglas A. Pucknell, Basic VLSI Design Systems and Circuits, Prentice Hall of India, 1993
13 Alternative Gate Circuits 2. Wayne Wolf, Modern 14 Combinational Logic Networks VLSI Design (System on Silicon), Prentice Hall PTR 2000 15 Layout Design Methods 16 Combinational Network Delay 17 Cross Talk - Power Optimization 18 Switch Logic Networks - Combinational Logic Testing. UNIT-III 19 Sequential Machines 20 Latches and Flipflops 21 Sequential system and Clocking discipline 22 Sequential System Design - Power Optimization 23 Design Validation - Sequential Testing 24 Subsystem design - Combinational Shifters 25 Adders- ALU - Multipliers 26 High Density Memory UNIT-IV 27 Application Specific Integrated Circuits 28 Types of ASIC 29 Design Flow of VLSI 30 Types of Simulation 31 Programmable ASIC 32 Floor planning - Placement 33 Partitioning - Routing UNIT-V 34 Types of PLD, FPLA 35 FPGA Architecture 36 Fault Models - Stuck-at-Faults 37 Design for testability 38 Design for controllability 39 Design for absorvability 40 LFSR - Boundary Scan Techniques. 1. Douglas A. Pucknell, Basic VLSI Design Systems and Circuits, Prentice Hall of India, 1993 2. Wayne Wolf, Modern VLSI Design (System on Silicon), Prentice Hall PTR 2000 1. Wayne Wolf, Modern VLSI Design (System on Silicon), Prentice Hall PTR 2000 2. Michael John Sabestian Smith, Application Specific Integrated circuits, 2002 1. Michael John Sabestian Smith, Application Specific Integrated circuits, 2002
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EI0312 VLSI - SRM University

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