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SELF-ASSEMBLY OF BLOCK COPOLYMERS ON LITHOGRAPHICALLY DEFINED NANOPATTERNED SUBSTRATES Paul Nealey Center for NanoTechnology (CNTech), 3731 Schneider Drive, Stoughton, WI 53589-3097 and Dept. of Chemical Engineering, University of Wisconsin-Madison, Madison, WI 53706 Top-down approaches to fabrication such as advanced lithographic techniques are designed to meet severe processing constraints, but may be prohibitively capital intensive or may not offer sufficient control at the nanoscale. Inexpensive bottom-up approaches based on selfassembling materials such as colloidal particles and block copolymers often possess the required nanometer resolution, but the dimensions over which the self-assembled structures are defectfree limits potential applications. Tremendous promise exists for the development of hybrid technologies in which self-assembling materials are integrated into existing manufacturing processes to deliver molecular level control in parallel processes to meet exacting tolerances and margins, and placement of the structures, including registration and overlay, with nanometer precision. Here we demonstrate the integration of advanced lithography with the self-assembly of thin films of block copolymer to induce the epitaxial assembly of densely packed nanoscopic domains. The areas over which the patterns are defect free, oriented and registered with the underlying substrate are arbitrarily large, determined by the size and quality of the lithographically defined surface pattern rather than the inherent limitations of the self-assembly process.
IDENTIFICATION OF SUB-MICROMETER SILICATE INCLUSIONS IN ARCHEAN ZIRCONS WITH A X-RAY PHOTOELECTRON EMISSION SPECTROMICROSCOPY (X-PEEM) B. H. Frazer (1,2), G. De Stasio (1), B. Gilbert (3), A. Cavosie (4) and J. W. Valley (4) (1) University of Wisconsin-Madison, Dept. of Physics and Synchrotron Radiation Center (2) Institute de Physique Appliquée, Ecole Polytechnique Fédérale de Lausanne (3) University of California-Berkeley, Earth and Planetary Science (4) University of Wisconsin, Department of Geology and Geophysics We recently optimized a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals and can spatially resolve chemical species with a resolution presently reaching 35 nm. We tested the differential coating by analyzing a 4.4 billion-year-old zircon containing silicate inclusions. We observed quartz inclusions smaller than 1 µm in size, that could not be analyzed with any other non-destructive technique. We also present X-ray absorption near-edge structure (XANES) spectroscopy of 20 silicate, alumosilicate and aluminum oxide minerals and two glasses at the SiK and SiL 2,3 , and OK edges. The similar nearest-neighbor environments lead to similar spectral lineshapes at each edge, but the fine-structure differences allow individual and groups of structurally similar minerals to be distinguished. By combining spectra and their first energy derivative from three absorption edges, we show that every mineral studied is distinguishable with XANES. These reference spectra, assist in the interpretation of sub-micrometer inclusions in archean zircons, studied with X-PEEM.
Page 2 and 3: Welcome to the 36 th SRC Users’ M
Page 4 and 5: 12:20 - 1:10 Lunch 1:10 -1:45 Poste
Page 6 and 7: Administration Executive Director D
Page 8 and 9: STATUS OF THE SRC BEAMLINES AND INS
Page 10 and 11: ACCELERATOR DEVELOPMENTS Ken Jacobs
Page 12 and 13: HIGH ENERGY RESEARCH POSSIBILITIES
Page 14 and 15: ATOMICALLY UNIFORM THIN FILMS ON SI
Page 16 and 17: calculated binding energies of the
Page 18 and 19: MANY-ELECTRON EFFECTS ON THE XE 5S
Page 20 and 21: PHOTOELECTRON SPECTROMETRY OF ATOMI
Page 22 and 23: PHOTOEMISSION STUDY OF USb AND UTe
Page 24 and 25: CANADIAN SYNCHROTRON RADIATION FACI
Page 28 and 29: A B S T R A C T S
Page 30 and 31: Photoemission spectra, a.u. -0.3 -0
Page 32 and 33: THE INITIAL AND FINAL STATE BANDS I
Page 34 and 35: TRANSITION LAYERS AT BURIED FERROMA
Page 36 and 37: LOW-DIMENSIONAL ELECTRONS AT SILICO
Page 38 and 39: SUBCELLULAR DISTRIBUTION OF MOTEXAF
Page 40 and 41: LINEAR POLARIZATION MEASUREMENTS OF
Page 42 and 43: Fig.1: Photoemission spectra of opt
Page 44 and 45: The sample manipulator has a cool d
Page 46 and 47: Cr and Fe but for these U systems t
Page 48 and 49: [4] G. -H. Gweon, J. W. Allen, and
Page 50 and 51: References [1] S. Cho, Y. Kim, A. D
Page 52 and 53: [3] D. L. Mills, Physical Review B
Page 54 and 55: CHARACTERIZATION OF SULPHATE INTERA
Page 56 and 57: in the data acquisition chamber. Th
Page 58 and 59: spatially resolved chemistry of the
Page 60 and 61: THE RELATIONSHIP BETWEEN PHOSPHATE
Page 62 and 63: PHOTOEMISSION STUDIES OF QUANTUM WE
Page 64 and 65: Ag surface state such that it moves
Page 66 and 67: HIGH-RESOLUTION STUDY OF THE LITHIU
Page 68 and 69: RELATIVE PARTIAL CROSS SECTIONS AND
Page 70 and 71: Christian Ast Max-Planck Institute
Page 72 and 73: David L. Huber Physical Sciences La
Page 74 and 75: Tom Miller University of Illinois a
Page 76 and 77:
Eric Wiedemann University of Wiscon
Page 78 and 79:
Pete Hagen Phone: (608) 877-2154 Em
Page 80:
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