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A Practical Guide to SPM

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A <strong>Practical</strong> <strong>Guide</strong> <strong>to</strong> <strong>SPM</strong><br />

TABLE OF CONTENTS (continued)<br />

17 VI. NON-IMAGING MODES<br />

17 Spectroscopy<br />

17 Scanning Tunneling Spectroscopy (STS)<br />

17 Force Spectroscopy<br />

19 Force Volume<br />

19 Advanced Force Spectroscopy<br />

20 Surface Modification Techniques<br />

20 Nanolithography<br />

20 Nanoindentation, Nanoscratching, Wear Testing<br />

20 Nanomanipulation<br />

21 VII. THE SCANNER<br />

21 How Scanners Work<br />

22 Hysteresis<br />

23 Aging<br />

23 Creep<br />

23 Bow<br />

24 VIII. PROBES<br />

24 AFM Probes<br />

24 Silicon Nitride<br />

24 Silicon<br />

25 Types of <strong>SPM</strong> Probes<br />

26 IX. TIP SHAPE ISSUES<br />

27 Resolution Issues<br />

28 X. TYPICAL IMAGE ARTIFACTS

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