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<strong>STM32W108C8</strong><br />
Electrical characteristics<br />
Table 150.<br />
Digital I/O characteristics (continued)<br />
Parameter Conditions Min. Typ. Max. Unit<br />
Output voltage for logic 0<br />
V OL<br />
(I OL = 4 mA for standard<br />
pads, 8 mA for high<br />
current pads)<br />
0 –<br />
0.18 x<br />
VDD_PAD<br />
S<br />
V<br />
Output voltage for logic 1<br />
V OH<br />
(I OH = 4 mA for standard<br />
pads, 8 mA for high<br />
current pads)<br />
0.82 x<br />
VDD_PAD<br />
S<br />
–<br />
VDD_PAD<br />
S<br />
V<br />
Output source current (standard<br />
current pad)<br />
Output sink current (standard<br />
current pad)<br />
Output source current<br />
high current pad: PA6, PA7,<br />
PB6, PB7, PC0<br />
Output sink current<br />
high current pad: PA6, PA7,<br />
PB6, PB7, PC0<br />
Total output current (for I/O<br />
Pads)<br />
I OHS – – 4 mA<br />
I OLS – – 4 mA<br />
I OHH – – 8 mA<br />
I OLH – – 8 mA<br />
I OH + I OL – – 40 mA<br />
Input voltage threshold for<br />
OSC32A<br />
0.2 x<br />
VDD_PAD<br />
S<br />
–<br />
0.8 x<br />
VDD_PAD<br />
S<br />
V<br />
Input voltage threshold for<br />
OSCA<br />
0.2 x<br />
VDD_PAD<br />
SA<br />
–<br />
0.8 x<br />
VDD_PAD<br />
SA<br />
V<br />
14.8 Non-RF system electrical characteristics<br />
Table 151 lists the non-RF system level characteristics for the STM32W.<br />
Table 151. Non-RF system electrical characteristics<br />
Parameter Conditions Min. Typ. Max. Unit<br />
System wakeup time from deep<br />
sleep<br />
Shutdown time going into deep<br />
sleep<br />
From wakeup event to first<br />
ARM ® Cortex-M3 instruction<br />
running from 6MHz internal RC<br />
clock<br />
Includes supply ramp time and<br />
oscillator startup time<br />
From last ARM ® Cortex-M3<br />
instruction to deep sleep mode<br />
– 110 – µs<br />
– 5 – µs<br />
Doc ID 018587 Rev 2 206/215