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STM32W108C8

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<strong>STM32W108C8</strong><br />

Electrical characteristics<br />

Table 150.<br />

Digital I/O characteristics (continued)<br />

Parameter Conditions Min. Typ. Max. Unit<br />

Output voltage for logic 0<br />

V OL<br />

(I OL = 4 mA for standard<br />

pads, 8 mA for high<br />

current pads)<br />

0 –<br />

0.18 x<br />

VDD_PAD<br />

S<br />

V<br />

Output voltage for logic 1<br />

V OH<br />

(I OH = 4 mA for standard<br />

pads, 8 mA for high<br />

current pads)<br />

0.82 x<br />

VDD_PAD<br />

S<br />

–<br />

VDD_PAD<br />

S<br />

V<br />

Output source current (standard<br />

current pad)<br />

Output sink current (standard<br />

current pad)<br />

Output source current<br />

high current pad: PA6, PA7,<br />

PB6, PB7, PC0<br />

Output sink current<br />

high current pad: PA6, PA7,<br />

PB6, PB7, PC0<br />

Total output current (for I/O<br />

Pads)<br />

I OHS – – 4 mA<br />

I OLS – – 4 mA<br />

I OHH – – 8 mA<br />

I OLH – – 8 mA<br />

I OH + I OL – – 40 mA<br />

Input voltage threshold for<br />

OSC32A<br />

0.2 x<br />

VDD_PAD<br />

S<br />

–<br />

0.8 x<br />

VDD_PAD<br />

S<br />

V<br />

Input voltage threshold for<br />

OSCA<br />

0.2 x<br />

VDD_PAD<br />

SA<br />

–<br />

0.8 x<br />

VDD_PAD<br />

SA<br />

V<br />

14.8 Non-RF system electrical characteristics<br />

Table 151 lists the non-RF system level characteristics for the STM32W.<br />

Table 151. Non-RF system electrical characteristics<br />

Parameter Conditions Min. Typ. Max. Unit<br />

System wakeup time from deep<br />

sleep<br />

Shutdown time going into deep<br />

sleep<br />

From wakeup event to first<br />

ARM ® Cortex-M3 instruction<br />

running from 6MHz internal RC<br />

clock<br />

Includes supply ramp time and<br />

oscillator startup time<br />

From last ARM ® Cortex-M3<br />

instruction to deep sleep mode<br />

– 110 – µs<br />

– 5 – µs<br />

Doc ID 018587 Rev 2 206/215

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