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incorporate a monochromator to allow full spectral<br />

measurements of multi-angle regular reflectance.<br />

Measurements have shown good agreement with existing<br />

near and mid infrared reflectance scales. This<br />

complements the existing V-W measurements at 7° in the<br />

200 nm to 2500 nm region, and V-only and multiangle<br />

reflectance capabilities in the mid infrared [6]<br />

Uncertainties<br />

The uncertainty budget covering diffuse reflectance<br />

measurements in the ultra violet to visible [2] has been<br />

refined and extended to cover diffuse and regular<br />

reflectance measurements up to 2.5 µm. The total<br />

combined uncertainty varies depending upon the scattering<br />

properties of the sample and the spectral region of interest.<br />

In the UV signal to noise and reproducibility are dominant,<br />

whilst in the visible these are less significant and geometry<br />

becomes important. The non-uniformity of the detector<br />

becomes a considerable source of uncertainty in the near<br />

infrared. For 0°/45° radiance factor and total<br />

hemispherical reflectance of a white Spectralon target, the<br />

total combined uncertainty is better than ± 0.25% (k = 2) in<br />

the visible.<br />

Acknowledgments<br />

This work was funded by the UK DTI National Measurement<br />

Systems Directorate ’ s Programme on Optical Radiation<br />

Metrology.<br />

References<br />

[1] Williams, D. C., Establishment of absolute diffuse reflectance<br />

scales using the NPL Reference Reflecteometer, Analytica<br />

Chimica Acta, 380, 165-172, Elsevier 1999<br />

[2] Chunnilall, C. J., NPL Scales for Radiance Factor and Total<br />

Diffuse Reflectance, Metrologia, 40, no. 1, S192 – S195, 2003<br />

[3] Clarke, F. J. J. & Larkin, J. A. Measurement of total<br />

reflectance, transmittance and emissivity over the thermal IR<br />

spectrum. Infrared Physics 25, 359-367 (1985).<br />

[4] Chunnilall C. J., Clarke F. J. J. & Shaw M. J., Diffuse<br />

reflectance scales at NPL, Proc. SPIE 4826, 12-20, (2003).<br />

[5] Morren, L., A study of the reflection factor of usual<br />

photometric standards in the near infra-red, Lighting Research<br />

and Technology 4, pp. 243-249, 1972.<br />

[6] Clarke, F. J. J., Birch, J. R., Chunnilall, C. J. & Smart, M. P.<br />

FTIR measurements, standards and accuracy. Vibrational<br />

Spectroscopy 30, 25-29 (2002).<br />

© Crown Copyright 2005. Reproduced by permission of the<br />

Controller of HMSO and Queen’s Printer for Scotland.<br />

340

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