MonteCarlo simulations with GEANT4 for the XENON100 Detector
MonteCarlo simulations with GEANT4 for the XENON100 Detector MonteCarlo simulations with GEANT4 for the XENON100 Detector
Background from Radioactive Contamination in LXe 8946':$46(9%$4()4;4#$3?•6%7•34544, . !. ./ !2 ./ !1 ./ !0 ./ !- ./ !A ./ 21B C DE F9 212 Scaled to 2.90ppt of 238 U 1.95ppt of 232 Th 238 U 232 Th !@ ./ ./ !- !0 ./ ./ !1 ./ !2 !"#$%&'#%$'"#()**+, !. ./ . Kr contamination of Xe is measured with the delayed coincidence analysis as 0.7 ppb (before processing with distillation column) Collecting statistics for delayed coincidence analysis after Kr purification Scaled to 0.7ppb of Kr 85 Kr Alexander Kish | XENON100 | 14th Geant4 Users Workshop | Catania, Sicily | October 15, 2009 | p.18
Gamma Background from 222 Rn in the Shield Cavity Scaled to 1Bq/m 3 of 222 Rn The measured activity of radon in the tunnel is > 100 Bq/m 3 With the closed shield door and constant flushing with nitrogen (6 SLPM) the concentration of Rn in the shield cavity is 1-2 Bq/m 3 , which is predicted to contribute a few mDRU in the low energy part of the spectra (1-60 keVee) Alexander Kish | XENON100 | 14th Geant4 Users Workshop | Catania, Sicily | October 15, 2009 | p.19
- Page 1 and 2: MonteCarlo simulations with GEANT4
- Page 3 and 4: XENON-100 collaboration 45 research
- Page 5 and 6: Target Volume ~100 kg Muon Veto QUP
- Page 7 and 8: The Principle of the XENON experime
- Page 9 and 10: Simulation of the Optical Response
- Page 11 and 12: Prediction of the Detected Light Yi
- Page 13 and 14: Backgrounds Prediction SOURCES OF E
- Page 15 and 16: Predicted Electron Recoil Backgroun
- Page 17: Intrinsic Contamination: Delayed Co
- Page 21 and 22: Neutrons from (α,n) reactions and
- Page 23 and 24: Muon-Induced Neutron Background Con
- Page 25: Thank you. Special thanks to: Dr. E
Background from Radioactive Contamination in LXe<br />
8946':$46(9%$4()4;4#$3?•6%7•34544,<br />
.<br />
!.<br />
./<br />
!2<br />
./<br />
!1<br />
./<br />
!0<br />
./<br />
!-<br />
./<br />
!A<br />
./<br />
21B<br />
C<br />
DE<br />
F9<br />
212<br />
Scaled to 2.90ppt of 238 U<br />
1.95ppt of 232 Th<br />
238<br />
U<br />
232<br />
Th<br />
!@<br />
./<br />
./<br />
!-<br />
!0<br />
./<br />
./<br />
!1<br />
./<br />
!2<br />
!"#$%&'#%$'"#()**+,<br />
!.<br />
./ .<br />
Kr contamination of Xe is measured <strong>with</strong> <strong>the</strong><br />
delayed coincidence analysis as 0.7 ppb<br />
(be<strong>for</strong>e processing <strong>with</strong> distillation column)<br />
Collecting statistics <strong>for</strong> delayed coincidence<br />
analysis after Kr purification<br />
Scaled to 0.7ppb of Kr<br />
85<br />
Kr<br />
Alexander Kish | <strong>XENON100</strong> | 14th Geant4 Users Workshop | Catania, Sicily | October 15, 2009 | p.18
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