Multicarrier conduction in semiconductors

Multicarrier conduction in semiconductors Multicarrier conduction in semiconductors

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Multicarrier conduction in semiconductors Murthy O.V.S.N. June 5, 2003 1 Introduction Take a semiconductor piece, an n-type Silicon for instance, and put it in a conventional Hall effect measurement setup. What you observe is as follows. The Hall voltage would appear to be increasing linearly with magnetic field and the change in resistivity of the sample with magnetic field, magnetoresistance, negligible. The carrier parameters like number density of carriers and the mobility are obtained from the following relations n = 1 R H e (1a) µ = 1 R S ne (1b) where R H = V H IB = V (B) − V (0) IB = ∆R MO,P N B (2a) R S = π R MN,OP + R NO,P M f( R MN,OP ) ln2 2 R NO,P M if you are performing a van der Pauw measurement [3] on a square sample with corners marked M,N,O and P. Both the quantities n, R S are usually expressed as 2D values (in units of cm −2 and Ω resp.). 1 (2b)

<strong>Multicarrier</strong> <strong>conduction</strong> <strong>in</strong> <strong>semiconductors</strong><br />

Murthy O.V.S.N.<br />

June 5, 2003<br />

1 Introduction<br />

Take a semiconductor piece, an n-type Silicon for <strong>in</strong>stance, and put it <strong>in</strong> a conventional Hall effect<br />

measurement setup. What you observe is as follows. The Hall voltage would appear to be<br />

<strong>in</strong>creas<strong>in</strong>g l<strong>in</strong>early with magnetic field and the change <strong>in</strong> resistivity of the sample with magnetic<br />

field, magnetoresistance, negligible. The carrier parameters like number density of carriers and the<br />

mobility are obta<strong>in</strong>ed from the follow<strong>in</strong>g relations<br />

n = 1<br />

R H e<br />

(1a)<br />

µ = 1<br />

R S ne<br />

(1b)<br />

where<br />

R H = V H<br />

IB<br />

=<br />

V (B) − V (0)<br />

IB<br />

= ∆R MO,P N<br />

B<br />

(2a)<br />

R S =<br />

π R MN,OP + R NO,P M<br />

f( R MN,OP<br />

)<br />

ln2 2 R NO,P M<br />

if you are perform<strong>in</strong>g a van der Pauw measurement [3] on a square sample with corners marked<br />

M,N,O and P. Both the quantities n, R S are usually expressed as 2D values (<strong>in</strong> units of cm −2 and<br />

Ω resp.).<br />

1<br />

(2b)


2 S<strong>in</strong>gle carrier case<br />

1 In order to see the <strong>conduction</strong> process microscopically, we can write out the equations of motion<br />

for the electron<br />

m e ˙v xe = −eE x − ev y B z<br />

(3a)<br />

m e ˙v ye = −eE y + ev x B z<br />

(3b)<br />

and cancel the second term of eqn. 3a s<strong>in</strong>ce the current is zero <strong>in</strong> the y-direction. Physically<br />

what happens is that the carriers (electrons) keep gett<strong>in</strong>g deflected until steady state is reached<br />

where there is a transverse voltage developed which balances the Lorentz force on the carriers. The<br />

second equation eqn. 3b then gives us (with ˙v ye = 0) the ratio E y /E x . In the time averaged sense,<br />

the carriers undergo collisions with an average relaxation time (τ) and are left with a mean ‘drift<br />

velocity’ v xe given as follows:<br />

v x = v x0 − eE ∫ ∞<br />

tP (t) = v x0 − eE ∫ ∞<br />

tex[−t/τ]dt = v x0 − eEτ/m e (4)<br />

τm e τm e<br />

0<br />

and s<strong>in</strong>ce collision processes have no memory, the first term drops out. Armed with an expression<br />

for averaged velocity <strong>in</strong> the direction of applied field, we can now calculate the ‘Hall angle’ (θ)<br />

between the current and the resultant electric field.<br />

tanθ = E y /E x = −Bµ e (5)<br />

0<br />

with the current J x = neµ e E x . Still, a bit further from experimentally observed quantities, we<br />

calculate the ‘Hall constant’ or ‘Hall coefficient’ by R H = E y /J x B and as can be seen, this gives<br />

along with our previous result eqn. 5, the carrier concentration from eqn. 1a.<br />

1 The present analysis closely follows Smith [2].<br />

2


3 Two-carrier case<br />

What changes when we have two carriers <strong>in</strong>stead, can be found out from the equations of motion<br />

eqns 1a and 1b of the carriers written for both carriers. Here, we cannot assume that J y = 0<br />

implies that both electron and hole currents are zero. In fact, both are non-zero <strong>in</strong> the presence<br />

of a magnetic field, but due to their opposite signs, cancel each other aga<strong>in</strong> giv<strong>in</strong>g J y = 0. Go<strong>in</strong>g<br />

back to eqn. 3a, we aga<strong>in</strong> neglect the second term assum<strong>in</strong>g the Hall angle is small (e.g. <strong>in</strong> case<br />

of a long Hall bar) and get a mean drift velocity v xe = −µ e E x . We use this <strong>in</strong> eqn. 3b and s<strong>in</strong>ce<br />

the right hand side of the equation is constant, we can apply the same analysis as above to get a<br />

time-averaged velocity<br />

v y e = −µ e E y − µ 2 eBE x<br />

(6a)<br />

and similarly for holes<br />

v y h = µ h E y − µ 2 hBE x<br />

(6b)<br />

The total current, however, rema<strong>in</strong>s zero. Thus,<br />

do<strong>in</strong>g so, we obta<strong>in</strong> a Hall angle and a Hall coefficient<br />

J y = −nev ye + pev yh = 0 (7)<br />

tanθ = E y /E x = pµ2 h − nµ2 e<br />

nµ e + pµ h<br />

(8)<br />

R H = E y /J x B =<br />

pµ2 h − nµ2 e<br />

e(nµ e + pµ h ) 2 (9)<br />

3.1 Magnetic field dependence<br />

All along we have been neglect<strong>in</strong>g the magnetic force compared to the force due to the electric field,<br />

but this assumption breaks down when the Hall angle is large. This happens when the dimensionless<br />

number represented by µB >> 1 for any of the carriers. To see what happens <strong>in</strong> this scenario, let<br />

us keep the term and <strong>in</strong>troduce the angular ‘cyclotron frequency’ (ω = eB/m e )<br />

˙v xe = −(e/m e )E x − ωv y<br />

(10a)<br />

3


˙v ye = −(e/m e )E y + ωv x<br />

(10b)<br />

To solve this, we can <strong>in</strong>troduce complex variables z = x + iy and Z = v x + iv y , the differential<br />

equations become decoupled and merge to form<br />

Z − iωZ = −(e/m e )(E x + iE y ) (11)<br />

The solution is as follows<br />

Z = Z 0 e iωt + (e/m e )(E x + iE y ) 1 − eiωt<br />

iω<br />

Aga<strong>in</strong> carry<strong>in</strong>g out the time <strong>in</strong>tegration, we obta<strong>in</strong> the mean velocities as<br />

(12)<br />

v x + iv y = −(e/m e )(E x + iE y )τ/(1 − iωt) (13)<br />

The current densities can be obta<strong>in</strong>ed by tak<strong>in</strong>g real and imag<strong>in</strong>ary parts of the above equation<br />

and writ<strong>in</strong>g J = −nev as follows<br />

J x = ne2 τE x<br />

{<br />

m e 1 + ω 2 τ − ωτ 2 E y<br />

2 1 + ω 2 τ } (14a)<br />

2<br />

J y = ne2 τE y<br />

{<br />

m e 1 + ω 2 τ + ωτ 2 E x<br />

2 1 + ω 2 τ } (14b)<br />

2<br />

To put the equations <strong>in</strong> a closer to experimental form, we note that µ = eτ/m e , and also ωτ = µB<br />

J x = σ xx E x + σ xy E y = neµ e E x − neµ 2 eBE y<br />

(15a)<br />

J y = σ yx E x + σ yy E y = neµ 2 eBE x + neµ e E y<br />

(15b)<br />

One th<strong>in</strong>g particularly notable and which is not clearly expressed by above equations is that similar<br />

expressions for the holes also exist and that the conductivities of both carrier species are additive.<br />

In fact the above equations hold true for any number of carrier species and the conductivities add<br />

up provided the basic assumptions like s<strong>in</strong>gle parabolic band for <strong>conduction</strong> for each carrier species<br />

(m e constant) and energy <strong>in</strong>dependent relaxation time (τconstant). The reader must be warned<br />

that these assumptions are far from reality <strong>in</strong> many cases. These expressions will be our start<strong>in</strong>g<br />

po<strong>in</strong>t for further analysis of multicarrier <strong>conduction</strong> [1].<br />

4


References<br />

[1] W.A. Beck and J.R. Anderson. Determ<strong>in</strong>ation of electrical transport properties us<strong>in</strong>g a novel<br />

magnetic field-dependent hall technique. J. Appl. Phys., 62(2):541, 1987.<br />

[2] R. A. Smith. Semiconductors. Cambridge University Press, 1978.<br />

[3] L.J. van der Pauw. A method of measur<strong>in</strong>g the resistivity and hall coefficient on lamellae of<br />

arbitrary shape. Philips Res. Repts., 13:1–9, 1958.<br />

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