奈米科學介紹 - 中研院物理研究所
奈米科學介紹 - 中研院物理研究所
奈米科學介紹 - 中研院物理研究所
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Nano Sci<br />
Lab<br />
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http://www.phys.sinica.edu.tw/~nano/
Nano Sci<br />
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http://www.phys.sinica.edu.tw/~nano/
Nano Sci<br />
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Nano Sci<br />
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Nano Sci<br />
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Nano Sci<br />
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√ √ √<br />
√ √ √<br />
√ √<br />
√ √<br />
√ √<br />
<br />
√<br />
√ √<br />
<br />
√<br />
√ √<br />
() √ √<br />
1
Nano Sci<br />
Lab<br />
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1
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
Liangti Qu et al.<br />
Science 322 (2008)<br />
238.
Nano Sci<br />
Lab<br />
<br />
Liangti Qu et al.<br />
Science 322 (2008)<br />
238.
Nano Sci<br />
Lab<br />
<br />
1 (nanometer) = 1 ( 10 -9 m)<br />
DNA
Nano Sci<br />
Lab<br />
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1 (nanometer) = 1 ( 10 -9 m)<br />
DNA
Nano Sci<br />
Lab<br />
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1 (nanometer) = 1 ( 10 -9 m)<br />
<br />
DNA
Nano Sci<br />
Lab<br />
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1 (nanometer) = 1 ( 10 -9 m)<br />
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<br />
DNA
Nano Sci<br />
Lab<br />
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1 (nanometer) = 1 ( 10 -9 m)<br />
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DNA
Nano Sci<br />
Lab<br />
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1<br />
1<br />
1
Nano Sci<br />
Lab<br />
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<br />
The convergence of top-down and bottom-up<br />
production techniques (Whatmore 2001)
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
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,<br />
,
Nano Sci<br />
Lab<br />
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STM <br />
: Eigler et al. ’90<br />
: Hosoki et al. ‘91<br />
5 nm<br />
D.M. Eigler, IBM, Amaden
Nano Sci<br />
Lab<br />
<br />
STM <br />
: Eigler et al. ’90<br />
: Hosoki et al. ‘91<br />
5 nm<br />
D.M. Eigler, IBM, Amaden
Nano Sci<br />
Lab<br />
<br />
Size
Nano Sci<br />
Lab<br />
<br />
Size
Nano Sci<br />
Lab<br />
<br />
100<br />
<br />
75<br />
50<br />
25<br />
0<br />
0 13 25 38 50<br />
(nm)
Nano Sci<br />
Lab<br />
<br />
(Reproduced from Quantum Dot Co.)
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
1931 Ernst Ruska <br />
1959 Feynman “There is plenty of room at the bottom”<br />
<br />
1962 Kubo <br />
1980 Drexler
Nano Sci<br />
Lab<br />
<br />
1931 Ernst Ruska <br />
1959 Feynman “There is plenty of room at the bottom”<br />
<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985 Binnig and Quate (AFM)<br />
1990 Eigler STM
History of Electron Microscopy<br />
!! 1931- Ernst Ruska co-invents the electron microscope.<br />
•! 1938- 10nm resolution reached.<br />
•! 1940- 2.4 nm resolution.<br />
•! 1945- 1.0nm resolution achieved.<br />
!! 1981- Gerd Binning and Heinrich Rohrer invent the scanning<br />
tunneling electron microscope (STM).<br />
!! 1986- The Atomic Force Microscope was developed in collaboration<br />
between IBM and Stanford University.<br />
Nano Sci<br />
Lab
History of Electron Microscopy<br />
Ernst Ruska<br />
!! 1931- Ernst Ruska co-invents the electron microscope.<br />
•! 1938- 10nm resolution reached.<br />
•! 1940- 2.4 nm resolution.<br />
•! 1945- 1.0nm resolution achieved.<br />
!! 1981- Gerd Binning and Heinrich Rohrer invent the scanning<br />
tunneling electron microscope (STM).<br />
!! 1986- The Atomic Force Microscope was developed in collaboration<br />
between IBM and Stanford University.<br />
Nano Sci<br />
Lab
History of Electron Microscopy<br />
Ernst Ruska<br />
!! 1931- Ernst Ruska co-invents the electron microscope.<br />
•! 1938- 10nm resolution reached.<br />
•! 1940- 2.4 nm resolution.<br />
•! 1945- 1.0nm resolution achieved.<br />
!! 1981- Gerd Binning and Heinrich Rohrer invent the scanning<br />
tunneling electron microscope (STM).<br />
!! 1986- The Atomic Force Microscope was developed in collaboration<br />
between IBM and Stanford University.<br />
Nano Sci<br />
Lab
• Å <br />
<br />
δ:Rayleigh <br />
λ:<br />
µ:(refractive index)<br />
β:<br />
µSinβ:Numerical Aperature~1<br />
• 0.1~0.2mm ()<br />
• ~3000Å (1000)
“”(?)<br />
<br />
• Å <br />
<br />
δ:Rayleigh <br />
λ:<br />
µ:(refractive index)<br />
β:<br />
µSinβ:Numerical Aperature~1<br />
• 0.1~0.2mm ()<br />
• ~3000Å (1000)
“”(?)<br />
<br />
• Å <br />
<br />
E (kev)<br />
λ(Å)<br />
δ:Rayleigh <br />
λ:<br />
100 0.037<br />
200 0.025<br />
300 0.0196<br />
400 0.0169<br />
µ:(refractive index)<br />
β:<br />
µSinβ:Numerical Aperature~1<br />
• 0.1~0.2mm ()<br />
• ~3000Å (1000)
TEM
TEM
TEM
Nano Sci<br />
Lab<br />
<br />
(Scanning Tunneling Microscopy)
Nano Sci<br />
Lab<br />
<br />
(Scanning Tunneling Microscopy)
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
D.M. Eigler<br />
IBM, Amaden
Nano Sci<br />
Lab<br />
<br />
100 nm<br />
10 nm
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
Scanning Thermal
Nano Sci<br />
Lab<br />
<br />
Scanning Thermal<br />
Scanning Hall Probe
Nano Sci<br />
Lab<br />
<br />
Scanning Thermal<br />
Scanning Hall Probe<br />
Scanning Optical
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
AFM
Nano Sci<br />
Lab<br />
AFM
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM<br />
1985 Curl, Kroto and Smalley (C 60 )<br />
1988 Fe/Cr (GMR)<br />
1991 Iijima (Carbon Nano Tubes)
Nano Sci<br />
Lab<br />
Fullerenes<br />
C 60 C 70 RbC 60
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Steel: 100-200 GPa<br />
Carbon nanotube: 1–4 TPa
Nano Sci<br />
Lab<br />
<br />
SiC/SiO2 Nanocable<br />
ZnO Nanobelts<br />
Science 281, 973 (1998)<br />
ZnO Nanowires<br />
Science 291, 1947 (2001)<br />
GaN Nanowire<br />
FET<br />
Science 292, 1897 (2001)<br />
Nano Lett. 2, 101 (2002)
Nano Sci<br />
Lab<br />
<br />
S. Fan et al., Science 283, 512 (1999).
Nano Sci<br />
Lab<br />
<br />
~30 kV<br />
~30 kV
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM<br />
1985 Curl, Kroto and Smalley (C 60 )<br />
1988Fe/Cr (GMR)<br />
1991 Iijima (Carbon Nano Tubes)
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM<br />
1985 Curl, Kroto and Smalley (C 60 )<br />
1988Fe/Cr (GMR)<br />
1991 Iijima (Carbon Nano Tubes)<br />
1998 Dekker <br />
1999 Lieber
Three-dimensional microelectromechanical devices<br />
Nano Sci<br />
Lab
Three-dimensional microelectromechanical devices<br />
Super growth<br />
Alligned SWNT films<br />
Bottom up<br />
Liquid induced<br />
densification<br />
Top down<br />
CNT wafer<br />
Processing by lithography<br />
Integrated planar and 3D devices<br />
Nano Sci<br />
Lab
Three-dimensional microelectromechanical devices<br />
10 –5<br />
Current (A)<br />
10 –7<br />
10 –9<br />
10 –11<br />
OFF<br />
ON<br />
10 –13<br />
0<br />
20<br />
40<br />
60<br />
Gate bias (V)<br />
OFF<br />
S<br />
ON<br />
y<br />
G<br />
C<br />
3.6 µm<br />
L<br />
x<br />
D<br />
170 nm<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
S.J. Tans et al.,<br />
Nature 393, 49 (1998).
Nano Sci<br />
Lab<br />
RAM<br />
T. Rueckes et al.,<br />
Science 289, 94 (2000).
Nano Sci<br />
Lab<br />
<br />
P. Kim and C.M. Lieber,<br />
Science 286, 2148 (1999).
Prof. Zettl<br />
<br />
A.M. Fennimore et al. Nature 424, 408 (2003).<br />
<br />
Nano Sci<br />
Lab
Prof. Zettl<br />
<br />
A.M. Fennimore et al. Nature 424, 408 (2003).<br />
<br />
Nano Sci<br />
Lab
Prof. Zettl<br />
<br />
A.M. Fennimore et al. Nature 424, 408 (2003).<br />
<br />
Nano Sci<br />
Lab
Prof. Zettl<br />
<br />
A.M. Fennimore et al. Nature 424, 408 (2003).<br />
<br />
Nano Sci<br />
Lab
Prof. Zettl<br />
<br />
A.M. Fennimore et al. Nature 424, 408 (2003).<br />
<br />
Nano Sci<br />
Lab
Nano letters<br />
Nano Sci<br />
Lab
Nanotube radio<br />
Nano letters<br />
Nano Sci<br />
Lab
Nanotube radio<br />
Nano letters<br />
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
DNA
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM<br />
1985 Curl, Kroto and Smalley (C 60 )<br />
1988Fe/Cr (GMR)<br />
1991 Iijima (Carbon Nano Tubes)<br />
1998Dekker <br />
1999 Lieber
Nano Sci<br />
Lab<br />
<br />
1959 Feynman “There is plenty of room at the<br />
bottom”<br />
1962 Kubo <br />
1980 Drexler <br />
1981 Binnig and Rohrer (STM)<br />
1985Binnig and Quate (AFM)<br />
1990 Eigler STM<br />
1985 Curl, Kroto and Smalley (C 60 )<br />
1988Fe/Cr (GMR)<br />
1991 Iijima (Carbon Nano Tubes)<br />
1998Dekker <br />
1999 Lieber <br />
2000 <br />
2002 <br />
2003 – 2009
Nano Sci<br />
Lab<br />
<br />
http://nano-taiwan.sinica.edu.tw/<br />
http://www.nano.edu.tw/main.aspx<br />
2003 - 2009 2009 - 2015
Nano Sci<br />
Lab<br />
<br />
∞<br />
8<br />
<br />
nano<br />
http://proj3.moeaidb.gov.tw/nanomark/
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
59
(www.phys.sinica.edu.tw/~nano/)<br />
HRTEM x1 UHV-TEM x1 VT UHV-STM x7(∞ )RT UHV-STM x2<br />
(∞ ) AFM x∞SEM UHV-FIM x1 UHV-FEM x1<br />
UHV-<br />
59
Single-Atom Tip
Single-Atom Tip
Single-Atom Tip
Single-Atom Tip<br />
T.Y. Fu et al.<br />
PRB64, 113401 (2001).<br />
H.S. Kuo et al.<br />
Nano Letters (2004)<br />
Atom perfect & chemically inert Pd-covered W(111)-base<br />
pyramid. Thermally stable up to ~1000 K
Single-Atom Tip<br />
Traditional<br />
T.Y. Fu et al.<br />
PRB64, 113401 (2001).<br />
H.S. Kuo et al.<br />
Nano Letters (2004)<br />
Ideal charged<br />
particle point source<br />
Atom perfect & chemically inert Pd-covered W(111)-base<br />
pyramid. Thermally stable up to ~1000 K
Nano Sci<br />
Lab<br />
<br />
12<br />
29 37<br />
127<br />
Y.P. Chiu et al., Phys. Rev. Lett. 97, 165504 (2006)
Nano Sci<br />
Lab<br />
<br />
35<br />
30<br />
Counting rate (%)<br />
10 nm<br />
25<br />
20<br />
15<br />
10<br />
5<br />
8<br />
6<br />
7<br />
10<br />
12<br />
19<br />
22<br />
24<br />
29<br />
34<br />
37<br />
40<br />
58<br />
0 20 40 60 80 100 120<br />
61<br />
91<br />
Ratio (%)<br />
60<br />
40<br />
20<br />
0<br />
127<br />
24 28 32 36 40<br />
Ag atom number N
Nano Sci<br />
Lab<br />
<br />
Counting rate (%)<br />
10 nm<br />
35<br />
30<br />
25<br />
20<br />
15<br />
10<br />
5<br />
8<br />
6<br />
7<br />
10<br />
12<br />
19<br />
22<br />
24<br />
29<br />
34<br />
37<br />
40<br />
Δ E = (E n+1<br />
+ E n-1<br />
) -2E n<br />
0.35<br />
0.30<br />
0.25<br />
0.20<br />
0.15<br />
0.10<br />
0.05<br />
0.00<br />
58<br />
-0.05<br />
-0.10<br />
-0.15<br />
Ratio (%)<br />
60<br />
40 127<br />
Ag atom number<br />
20<br />
0 20 40 60 80 100 120<br />
61<br />
6<br />
8<br />
10<br />
91<br />
12<br />
0<br />
22 24<br />
5 10 15 20 25 30<br />
24 28 32 36 40<br />
29<br />
Ag atom number N
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
‧
Nano Sci<br />
Lab<br />
‧
Nano Sci<br />
Lab<br />
‧
• Nano-positioning
• Nano-positioning
• Nano-positioning
• Nano-positioning
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
Gold knife<br />
AFM tip<br />
Base pressure 2 x 10 -10 torr
Nano Sci<br />
Lab<br />
<br />
ChangYC<br />
Base pressure 2 x 10 -10 torr
Kondo Y.
Kondo Y.
Kondo Y.
Kondo Y.
SEM contamination<br />
CNT<br />
NanoSci<br />
Lab
SEM contamination<br />
CNT<br />
NanoSci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
8 nm
Nano Sci<br />
Lab<br />
8 nm
Nano Sci<br />
Lab<br />
NanoSci<br />
Lab
Nano Sci<br />
Lab<br />
first peeling<br />
NanoSci<br />
Lab
Nano Sci<br />
Lab<br />
second peeling<br />
first peeling<br />
NanoSci<br />
Lab
Nano Sci<br />
Lab<br />
ChangYC<br />
NanoSci<br />
Lab
The Mechanical Properties of MWNT
The Mechanical Properties of MWNT<br />
" = # 2<br />
i<br />
i<br />
8$<br />
( 1 D 2 2<br />
+ D )E 1 #<br />
L 2 %<br />
Science 283 (1999) 1513
Development of cantilever-based mass sensor
Development of cantilever-based mass sensor<br />
Year Authors Contribution Sensitivity<br />
1995 G. Y. Chen et al. propose the method of mass sensing ~0.6 pg<br />
1999 P. Poncharal et al. the first CNT-based mass sensor ~22 fg<br />
2003 X. D. Bai et al. dual-mode of ZnO resonance X<br />
2004 B. Ilic et al. derive the expression of a concentrated<br />
mass<br />
~6 ag<br />
2005 M. Nishio et al. the first zeptogram detection ~100 zg<br />
2005 S. Dohn et al. move the position of adsorbed particle ~60 pg<br />
2007 S. Dohn et al. Derive the expression of adsorbed<br />
mass position<br />
~60 pg<br />
★ fg(10 -15 ), ag(10 -18 ), zg(10 -21 )
Development of cantilever-based mass sensor<br />
Year Authors Contribution Sensitivity<br />
1995 G. Y. Chen et al. propose the method of mass sensing ~0.6 pg<br />
1999 P. Poncharal et al. the first CNT-based mass sensor ~22 fg<br />
2003 X. D. Bai et al. dual-mode of ZnO resonance X<br />
2004 B. Ilic et al. derive the expression of a concentrated<br />
mass<br />
~6 ag<br />
2005 M. Nishio et al. the first zeptogram detection ~100 zg<br />
2005 S. Dohn et al. move the position of adsorbed particle ~60 pg<br />
2007 S. Dohn et al. Derive the expression of adsorbed<br />
mass position<br />
~60 pg<br />
2008 Y. C. Chang et al. Atomic-resolution mass sensor<br />
★ fg(10 -15 ), ag(10 -18 ), zg(10 -21 )
Nano Sci<br />
Lab<br />
<br />
Y.-C. Chang et al., Small 4,2195 (2008).
3 nm<br />
Ag cluster<br />
6 nm<br />
Nano Sci<br />
Lab<br />
80 nm<br />
m ~ m 0 (Δf/2f 0 ) ~ 1.8x10 -19 g<br />
(mass of 1000 Ag atoms)<br />
Y.-C. Chang et al., Small 4,2195 (2008).
3 nm<br />
Ag cluster<br />
6 nm<br />
Nano Sci<br />
Lab<br />
80 nm<br />
m ~ m 0 (Δf/2f 0 ) ~ 1.8x10 -19 g<br />
(mass of 1000 Ag atoms)<br />
Q~1000<br />
~10 -22 g<br />
Y.-C. Chang et al., Small 4,2195 (2008).
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
CNT probe for SPM<br />
by OM 2003 by SEM 2004<br />
by TEM 2007<br />
by TEM 2008<br />
<br />
Y.-C. Chang et al., APL 82, 3541 (2003).
1. Nanoscale tip radii<br />
2. High aspect ratio<br />
3. Low tip-sample adhesion<br />
4. Highly robust<br />
...<br />
Carbon nanotube tip F EULER<br />
~ 6.38nN<br />
L~ 500nm, D~ 30nm<br />
Thermo-vibration of CNT probe<br />
X tip<br />
< 0.5nm, SWNT (L) < 100nm<br />
MWNT (L) < 1µm
Optimized CNT probe<br />
<br />
Y.-C. Chang et al., Nanotechnology 20,285307 (2009).
Optimized CNT probe<br />
<br />
Y.-C. Chang et al., Nanotechnology 20,285307 (2009).
Resolution & High aspect ratio<br />
Y. C. Chang et al., JJAP 43 7B, 4517 (2004).<br />
Y.-K. Chen, C.-H. Leng, H. Olivares, M.-H. Lee, Y.-C. Chang, PNAS 101, 10572 (2004).<br />
L.-H. Lee, C.-H. Leng, Y.-C. Chang et al., BBRC 323, 845 (2004).<br />
Y.-C. Chang et al., Biochemsitry 44, 6052 (2005).<br />
M.-H. Lee, Y.-C. Chang, JBC 280, 40980 (2005).<br />
L.-T. Chen, T.-P. Ko, Y.-C. Chang et al., Nucleic Acids Research 35,1787-1801(2007).<br />
PRL 103, 264301 (2009).
Resolution & High aspect ratio<br />
Y. C. Chang et al., JJAP 43 7B, 4517 (2004).<br />
Y.-K. Chen, C.-H. Leng, H. Olivares, M.-H. Lee, Y.-C. Chang, PNAS 101, 10572 (2004).<br />
L.-H. Lee, C.-H. Leng, Y.-C. Chang et al., BBRC 323, 845 (2004).<br />
Y.-C. Chang et al., Biochemsitry 44, 6052 (2005).<br />
M.-H. Lee, Y.-C. Chang, JBC 280, 40980 (2005).<br />
L.-T. Chen, T.-P. Ko, Y.-C. Chang et al., Nucleic Acids Research 35,1787-1801(2007).<br />
PRL 103, 264301 (2009).
Resolution & High aspect ratio<br />
Y. C. Chang et al., JJAP 43 7B, 4517 (2004).<br />
Y.-K. Chen, C.-H. Leng, H. Olivares, M.-H. Lee, Y.-C. Chang, PNAS 101, 10572 (2004).<br />
L.-H. Lee, C.-H. Leng, Y.-C. Chang et al., BBRC 323, 845 (2004).<br />
Y.-C. Chang et al., Biochemsitry 44, 6052 (2005).<br />
M.-H. Lee, Y.-C. Chang, JBC 280, 40980 (2005).<br />
L.-T. Chen, T.-P. Ko, Y.-C. Chang et al., Nucleic Acids Research 35,1787-1801(2007).<br />
PRL 103, 264301 (2009).<br />
<br />
DNA<br />
Dmc1
Highlighted in Nanotechweb:<br />
http://nanotechweb.org/cws/article/lab/39807
Highlighted in Nanotechweb:<br />
http://nanotechweb.org/cws/article/lab/39807
Electron Tomography
Escherichia coli RecA-dsDNA<br />
Y.-W. Chang, T.-P. Ko, C.-D. Lee, Y.-C. Chang et al., PLoS ONE 4, e4890 (2009)
Escherichia coli RecA-dsDNA<br />
left(or right)-handed helical filament?<br />
Y.-W. Chang, T.-P. Ko, C.-D. Lee, Y.-C. Chang et al., PLoS ONE 4, e4890 (2009)
Concept of tomography :<br />
Artifact due to projection<br />
?<br />
Drawing by John O’Brien, The New Yorker Magazine (1991)<br />
“Transmission Electron Microscopy”, David B. Willams
Concept of tomography :<br />
Artifact due to projection<br />
Drawing by John O’Brien, The New Yorker Magazine (1991)<br />
“Transmission Electron Microscopy”, David B. Willams
Concept of tomography :<br />
Artifact due to projection<br />
Drawing by John O’Brien, The New Yorker Magazine (1991)<br />
“Transmission Electron Microscopy”, David B. Willams
Electron Tomography-1<br />
Tilt series<br />
Electron source<br />
Condenser lens<br />
Electron beam<br />
specimen<br />
Objective lens<br />
Intermediate &<br />
Projector lens<br />
CCD Camera
Electron Tomography-1<br />
Tilt series<br />
Electron source<br />
Condenser lens<br />
optical axis<br />
Electron beam<br />
specimen<br />
Objective lens<br />
Intermediate &<br />
Projector lens<br />
Tilt axis<br />
CCD Camera<br />
Eu-centric height calibration is needed
Electron Tomography-1<br />
Tilt series<br />
Electron source<br />
Condenser lens<br />
optical axis<br />
Electron beam<br />
specimen<br />
Objective lens<br />
Intermediate &<br />
Projector lens<br />
Tilt axis<br />
CCD Camera<br />
Eu-centric height calibration is needed
Electron Tomography-1<br />
Tilt series<br />
Tilt specimen<br />
Focus correction<br />
Electron source<br />
Shift correction<br />
By Stage<br />
By Deflector<br />
optical axis<br />
Condenser lens<br />
Electron beam<br />
specimen<br />
Objective lens<br />
Acquire image<br />
Commercial software : Recorder ® (JEOL)<br />
XPlore3D ® (FEI)<br />
Tilt axis<br />
Intermediate &<br />
Projector lens<br />
CCD Camera<br />
<br />
Eu-centric height calibration is needed
Electron Tomography-1 Tilt series
Electron Tomography-1 Tilt series
10 nm
10 nm
Resolution of electron tomography
Resolution of electron tomography
Resolution of electron tomography
Resolution of electron tomography
Resolution of electron tomography
There is plenty of room for improvement<br />
1. More versatile reconstruction algorithms(incorporation of boundary conditions)<br />
2. Electron optics (aberration correction)<br />
3. Dual axis tilting (reduction of missing data)<br />
4. Better detectors (“single” electron detection for intermediate voltage microscopes)<br />
5. Contrast enhancement (Zernike-type phase plates)
There is plenty of room for improvement<br />
1. More versatile reconstruction algorithms(incorporation of boundary conditions)<br />
2. Electron optics (aberration correction)<br />
3. Dual axis tilting (reduction of missing data)<br />
4. Better detectors (“single” electron detection for intermediate voltage microscopes)<br />
5. Contrast enhancement (Zernike-type phase plates)
Electron Tomography-2<br />
Single particle
Electron Tomography-2<br />
Single particle
Electron Tomography-2<br />
Single particle
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
Pick Window Cull<br />
Align<br />
Projection<br />
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
Pick Window Cull<br />
Align<br />
Projection<br />
SPIDER:<br />
(System for Processing Image Data from<br />
Electron microscopy and Related fields)
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
<br />
1.<br />
2.<br />
3.<br />
4.<br />
5.
Nano Sci<br />
Lab<br />
<br />
<br />
1.<br />
2.<br />
3.<br />
4.<br />
5.
•
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
1st transistor<br />
Quantum-dot<br />
turnstile<br />
Quantum corral<br />
Nanotube transistor<br />
One-atom contact<br />
1960<br />
1980 1990<br />
2000<br />
Century of<br />
Nanotechnology
Nano Sci<br />
Lab<br />
<br />
1st transistor<br />
Quantum-dot<br />
turnstile<br />
Quantum corral<br />
Nanotube transistor<br />
One-atom contact<br />
1960<br />
1980 1990<br />
2000<br />
Century of<br />
Nanotechnology
Nano Sci<br />
Lab<br />
<br />
Y. Huang et al. Science 294, 1313 (2001)<br />
A. Bachtold et al. Science 294, 1317 (2001)<br />
V c (5V)<br />
N-GaN<br />
Au<br />
R<br />
V 1 V 2<br />
V o<br />
“AND”<br />
V o<br />
V 2<br />
P-Si<br />
V c<br />
V 1<br />
Al<br />
J.H. Schon et al. Nature 413, 713 (2001) K.M. Roth et al. JVST B18, 2359 (2000)
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
Y. Cui et al. Science 293, 1289 (2001)
Nano Sci<br />
Lab<br />
<br />
<br />
<br />
1
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
<br />
<br />
<br />
1950<br />
<br />
50003000<br />
1010<br />
<br />
110
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
<br />
<br />
<br />
(Adapted from National Institute for Resources and Environment, Japan http://www.nire.go.jp/<br />
eco_tec_e/hyouka_e.htm).
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab
Nano Sci<br />
Lab<br />
<br />
“Imagine a technology so powerful that it will allow such feats as<br />
desktop manufacturing, cellular repair, artificial intelligence,<br />
inexpensive space travel, clean and abundant energy, and<br />
environmental restoration; a technology so portable that<br />
everyone can reap its benefits; a technology so fundamental that<br />
it will radically change our economic and political systems; a<br />
technology so imminent that most of us will see its impact within<br />
our lifetimes. Such is the promise of Nanotechnology”. Kai Wu
Nano Sci<br />
Lab<br />
<br />
<br />
<br />
<br />
<br />
<br />
<br />
“Imagine a technology so powerful that it will allow such feats as<br />
desktop manufacturing, cellular repair, artificial intelligence,<br />
inexpensive space travel, clean and abundant energy, and<br />
environmental restoration; a technology so portable that<br />
everyone can reap its benefits; a technology so fundamental that<br />
it will radically change our economic and political systems; a<br />
technology so imminent that most of us will see its impact within<br />
our lifetimes. Such is the promise of Nanotechnology”. Kai Wu
Nano Sci<br />
Lab<br />
<br />
1. Scientific American.<br />
2. Nanotechnology: Big Things from a Tiny World, A Publication of the<br />
National Nanotechnology Initiative.<br />
3. US National Report. (1999) WTEC Panel Report on Nanostructure<br />
Science and Technology RD Status and Trends in Nanoparticles,<br />
Nanostructured Materials, and Nanodevices.<br />
4. UK The Royal Society & The Royal Academy of Engineering<br />
Report. (2004) Nanoscience and nanotechnologies: opportunities and<br />
uncertainties.<br />
5. Report by National Institute for Occupational Safety and Health Report,<br />
(2009) Approaches to Safe Nanotechnology.<br />
http://diamond.iams.sinica.edu.tw/tamol/<br />
http://itri.loyola.edu/nano/final/<br />
http://www.nsf.gov/
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