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Surface and bulk passivation of multicrystalline silicon solar cells by ...

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80<br />

Figure 5.3 An XTEM image <strong>of</strong> a defect cluster showing metallic precipitation [112].<br />

Defect clustering occurs during crystal growth when local thermal stress exceeds<br />

yield stress <strong>of</strong> some preferred grain orientations causing the stress relief through local<br />

generation <strong>of</strong> defect networks. Defect clusters also serve as internal gettering sites for<br />

metallic impurities, <strong>and</strong> <strong>of</strong>ten result in impurity precipitation at these sites. Figure 5.3 is a<br />

cross-sectional TEM image <strong>of</strong> such precipitates in a defect cluster region; other<br />

researchers have also observed similar precipitates [113].<br />

Precipitation <strong>of</strong> impurities at defect clusters is <strong>of</strong> particular concern, because it is<br />

now known that precipitated impurities are difficult to getter <strong>by</strong> the techniques used in<br />

the PV industry (viz, P diffusion for junction formation <strong>and</strong> Al alloying for back-contact<br />

formation). Hence, defect clusters have an important bearing on the development <strong>of</strong> new

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