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Surface and bulk passivation of multicrystalline silicon solar cells by ...

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69<br />

work. The most convenient is 1 mil polyethylene bag. A well cleaned sample is placed in<br />

a polyethylene bag <strong>and</strong> covered on both sides with I-Ε solution (typically the molarity <strong>of</strong><br />

0.1). Excess solution from each surface is squeezed out to leave a thin uniform layer <strong>of</strong><br />

the solution on the surface. In the measurements performed in this study, the molarity <strong>of</strong><br />

the solution (within a range <strong>of</strong> 0.01 <strong>and</strong> 0.1) did not influence the measurements. Figure<br />

4.2 shows a typical measured lifetime using QSSPCD technique with Sinton apparatus, as<br />

a function <strong>of</strong> time (curve A). The wafer was a semiconductor grade, p-type Si, with a<br />

resistivity <strong>of</strong> 12.8 Ω-cm.<br />

Figure 4.2 τb <strong>of</strong> a p-type Si wafer measured <strong>by</strong> QSSPCD as a function <strong>of</strong> time. The<br />

sample was cleaned <strong>by</strong> "ICP" <strong>and</strong> passivated in IE solution. (A) after ICP; (B)<br />

dilute HF dip after (A); (C) dilute HF dip after (B); (D) after oxide removal<br />

[108].

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