Surface and bulk passivation of multicrystalline silicon solar cells by ...
Surface and bulk passivation of multicrystalline silicon solar cells by ...
Surface and bulk passivation of multicrystalline silicon solar cells by ...
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Figure 5.5 A comparison <strong>of</strong> (a) defect-cluster distribution in a wafer <strong>and</strong> (b) longwavelength<br />
LBIC image <strong>of</strong> the <strong>solar</strong> cell on a sister wafer.<br />
5.4.3 Results<br />
The typical experimental results <strong>of</strong> material <strong>and</strong> cell parameters are summarized in Table<br />
5.1 for six <strong>cells</strong> <strong>and</strong> their corresponding sister wafers. Column 4 in Table 5.1 shows cell<br />
parameters, open-circuit voltage (ν 0 ), short-circuit current (J sc) <strong>and</strong> external fill factor<br />
(FF) <strong>of</strong> <strong>solar</strong> <strong>cells</strong> fabricated using commercial processing. The calculated cell parameters<br />
<strong>of</strong> these <strong>cells</strong> are shown in column 5. These calculations were performed using actual<br />
defect distributions <strong>and</strong> the following values <strong>of</strong> the network parameters:<br />
Jph(undefected) = 34.00 mA cm-2, Jph(defected) = 23.8 mA cm-2<br />
J0 (undefected) = 3.6x 10 -9 A cm 2, J01 (defected) = 3.6x 10 -8 A cm-2<br />
J02(undefected) = 4.5x10 13 A cm -2, J01 (defected) = 4.5x10 11 A cm2