Certificate - Apacer

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EN61000-3-2: 2000 AS/NZS 61000.3.2: 2003 EN61000-3-3: 1995/A1: 2001 AS/NZS 61000.3.3: 1998 Page 2 of 2 Report No. ISL-06HE096C, 06HE096E Standard Description Results Limits for harmonics current emissions Pass Limits for voltage fluctuations and flicker in low-voltage supply systems . We, Apacer Technology Inc., hereby declare that the equipment bearing the trade name and model number specified above was tested conforming to the applicable Rules under the most accurate measurement standards possible, and that all the necessary steps have been taken and are in force to assure that production units of the same equipment will continue to comply with the requirements. --------------------------- Michael Yang / Engineer Apacer Technology Inc. Date: 2006/05/22 Pass
EN55024 / AS/NZS CISPR 24 / IMMUNITY EN61000-3-2 / HARMONICS EN61000-3-3 / VOLTAGE FLUCTUATIONS TEST REPORT of Product Name USB Disk Module Model UDM Applied by: Apacer Technology Inc. 9F, 100, Sec. 1, Hsin Tai Wu Rd., Hsichih, Taipei Hsien 221, Taiwan, R.O.C. Test Performed by: (NVLAP Lab. Code: 200234-0) International Standards Laboratory (V) Hsichih LAB Lung-Tan LAB NEMKO:ELA 113A NEMKO:ELA 113B NVLAP Lab. Code: 200234-0 NVLAP Lab. Code: 200234-0 No. 65, Ku Dai Keng St. No. 120, Lane 180, San Ho Tsuen, Hsin Ho Rd. Hsichih, Taipei Hsien 22117 Lung-Tan Hsiang, Tao Yuan County 325 Taiwan, R.O.C. Taiwan, R.O.C Tel:(02)2646-2550 Tel:(03)407-1718 Fax:(02)2646-4641 Fax:(03)407-1738 Report Number: ISL-06HE096E Issue Date: 2006/05/22 HC LAB:NVLAP:200234-0;VCCI: R-341,C-354; NEMKO:ELA 113A;BSMI:SL2-IN-E-0037;SL2-R1-E-0037;CNLA:1178; IC:IC4067 LT LAB: NVLAP:200234-0;VCCI: R-1435,C-1440;NEMKO:ELA 113B;CNLA:0997; IC:IC4164-1 T10-R1-20
Page 1 and 2: No. 65, Ku Dai Keng St., Hsichih, T
Page 3 and 4: Declaration of Conformity Name of R
Page 5: Declaration of Conformity Name of R
Page 9 and 10: 1. General 1.1 Certification of Acc
Page 13 and 14: 2.3.1 Software for Controlling Supp
Page 15 and 16: 2.4 Description of Equipment Under
Page 17 and 18: 4. Radio-Frequency, Electromagnetic
Page 19 and 20: Test Setup -11- EUT is at least 50c
Page 21 and 22: -13- 7. Immunity to Conductive Dist
Page 23 and 24: 9. Voltage Dips, Short Interruption
Page 25 and 26: 11. Voltage Fluctuations 11.1 Volta
Page 27 and 28: 12. Test Equipment List -19- Locati
Page 29 and 30: 13. Photographs 13.1 Photo of ESD m
Page 31 and 32: -23- 13.5 Photo of Conductive Measu
Page 33: 13.9 Appendix: Photographs of EUT P

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