Films minces à base de Si nanostructuré pour des cellules ...
Films minces à base de Si nanostructuré pour des cellules ... Films minces à base de Si nanostructuré pour des cellules ...
tel-00916300, version 1 - 10 Dec 2013 Figure 2.21: PL spectra before and after correcting to spectral response.λ excitation = 488 nm. 58
Chapter 3 A study on RF sputtered SRSO monolayers and SRSO/SiO 2 multilayers tel-00916300, version 1 - 10 Dec 2013 3.1 Introduction One of the major aims of this thesis, as mentioned in chapter 1, is to increase the density of Si-nanoparticles (Si-np) with regard to the team's earlier obtained value of 9 x10 18 np/cm 3 [Maestre 10]. Optimizing the growth parameters of SRSO 1 is an important step towards accomplishing this increase of density. Prior works on SRSO grown either by co-sputtering of SiO 2 target topped with Si chips placed at the target surface [Charvet 99] or by reactive sputtering [Ternon 02] have been done in our laboratory, using another RF magnetron sputtering unit 'MECA 2000'. With the sputtering unit AJA International used in this thesis, initial studies were performed with the values of plasma pressure controlled with buttery valve, substrate-target distance and the substrate rotation speed of 3 mTorr, 38 cm and 20 rpm respectively. These values were conrmed by [Hijazi 09b] while studying SRSO: Er materials in which SRSO was grown by the co-sputtering of SiO 2 and Si. Hence these values have been adopted for all our depositions. Three methods using confocal sputtering technique are developed in our team to introduce excess Si to form SRSO. The rst two methods are the same as those used by Ternon, (Reactive sputtering which will be investigated in AJA now) and Hijazi (co-sputtering) for their thesis in the references cited above. The third method, 'Reactive co-sputtering' is a newly introduced concept in this thesis, combining the advantages of the two other aforesaid methods. The SRSO monolayers grown using these three methods are studied with respect to deposition rate r d , refractive index n and structural composition. Optimized 1 SRSO will be occasionally denoted as SiO x in the text 59
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Chapter 3<br />
A study on RF sputtered SRSO monolayers and<br />
SRSO/<strong>Si</strong>O 2 multilayers<br />
tel-00916300, version 1 - 10 Dec 2013<br />
3.1 Introduction<br />
One of the major aims of this thesis, as mentioned in chapter 1, is to increase the<br />
<strong>de</strong>nsity of <strong>Si</strong>-nanoparticles (<strong>Si</strong>-np) with regard to the team's earlier obtained value<br />
of 9 x10 18 np/cm 3 [Maestre 10]. Optimizing the growth parameters of SRSO 1 is an<br />
important step towards accomplishing this increase of <strong>de</strong>nsity. Prior works on SRSO<br />
grown either by co-sputtering of <strong>Si</strong>O 2 target topped with <strong>Si</strong> chips placed at the target<br />
surface [Charvet 99] or by reactive sputtering [Ternon 02] have been done in our<br />
laboratory, using another RF magnetron sputtering unit 'MECA 2000'. With the<br />
sputtering unit AJA International used in this thesis, initial studies were performed<br />
with the values of plasma pressure controlled with buttery valve, substrate-target<br />
distance and the substrate rotation speed of 3 mTorr, 38 cm and 20 rpm respectively.<br />
These values were conrmed by [Hijazi 09b] while studying SRSO: Er materials in<br />
which SRSO was grown by the co-sputtering of <strong>Si</strong>O 2 and <strong>Si</strong>. Hence these values<br />
have been adopted for all our <strong>de</strong>positions. Three methods using confocal sputtering<br />
technique are <strong>de</strong>veloped in our team to introduce excess <strong>Si</strong> to form SRSO. The rst<br />
two methods are the same as those used by Ternon, (Reactive sputtering which will<br />
be investigated in AJA now) and Hijazi (co-sputtering) for their thesis in the references<br />
cited above. The third method, 'Reactive co-sputtering' is a newly introduced<br />
concept in this thesis, combining the advantages of the two other aforesaid methods.<br />
The SRSO monolayers grown using these three methods are studied with respect<br />
to <strong>de</strong>position rate r d , refractive in<strong>de</strong>x n and structural composition. Optimized<br />
1 SRSO will be occasionally <strong>de</strong>noted as <strong>Si</strong>O x in the text<br />
59