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Films minces à base de Si nanostructuré pour des cellules ...

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to equation 2.4, when X-ray beam strikes on a crystal at an angle θ, constructive<br />

interference occurs only when the distance travelled by the X-rays scattered from<br />

successive planes diers by an integer n of the wavelength and results in the diraction<br />

pattern. In our case, the thin lms are usually composed of randomly oriented<br />

nanocrystals and gure 2.6 shows a pictorial representation of Bragg's diraction<br />

from one of the diracting nanocrystal. Each orientation of the crystal results in a<br />

diraction peak at dierent angles (which is usually measured as 2θ in the experiments<br />

for practical purposes), characteristic to the crystallographic structures of the<br />

material.<br />

tel-00916300, version 1 - 10 Dec 2013<br />

Figure 2.6: Pictorial representation of Bragg's law.<br />

Experimental set-up and working<br />

The experiments were performed in grazing inci<strong>de</strong>nce using a Philips XPERT instrument<br />

equipped with a copper ano<strong>de</strong> to generate X-rays with λ = 1.5406 and<br />

1.5444 angströms corresponding to the Cu-K α1 and K α2 lines respectively. Figure<br />

2.7 shows a schematic representation of the experimental set-up in grazing geometry.<br />

Figure 2.7: XRD- Illustration of working principle and experimental set-up.<br />

Grazing inci<strong>de</strong>nce XRD is a technique suitable for the analysis of thin lms since<br />

39

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