Films minces à base de Si nanostructuré pour des cellules ...

Films minces à base de Si nanostructuré pour des cellules ... Films minces à base de Si nanostructuré pour des cellules ...

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etween 2.5-25 µm. The former is used for alignment and the latter interacts with the sample. In the FTIR set-up, the IR radiation is guided through a Michelson's interferometer (Fig. 2.4a) with a moving mirror. An interferogram consisting of light intensity versus optical path is recorded by the detector with each movement of the mirror. This data from the interferogram is converted into the spatial domain using fourier transformation (Fig. 2.4b). The contributions from the reference substrate and other atmospheric components such as CO 2 and water were subtracted from the spectrum to analyse the structural composition of the deposited material. tel-00916300, version 1 - 10 Dec 2013 Figure 2.4: (a) Schematic representation of FTIR set-up and (b) Interferogram to Fourier transformed spectra. Typical spectra of SiO 2 obtained in two dierent angles of incidence are presented in gure 2.5 as a representative of the main absorption features analysing methodology which will be followed for all the other samples in this thesis. The spectrum recorded in normal incidence enables to visualise the transverse optical modes as shown in gure 2.5a. The spectra of SiO 2 is characterized by three major absorption bands TO 2 , TO 3 and TO 4 corresponding to Si-O-Si rocking, symmetric stretching and asymmetric stretching modes respectively. Each transverse optical mode (TO) has an associated longitudinal optical mode (LO), and this is called as the LO-TO splitting. LO modes cannot be seen through FTIR in normal incidence but can be detected if measured in oblique incidence (Fig. 2.5b) [Berremann 63]. In this thesis, Brewster incidence of 65° is chosen for viewing the LO modes. Besides these vibrations, there is a fourth vibrational splitting known as 36

(a) Normal Incidence. (b) Oblique (Brewster) Incidence. tel-00916300, version 1 - 10 Dec 2013 Figure 2.5: Typical FTIR spectra of SiO 2 which is decomposed into three and ve gaussians in the normal incidence and Brewster incidence spectra respectively. LO 4 -TO 4 , which is assigned to disorder-induced mode in the SiO 2 matrix [Kirk 88]. The presence of these vibrational modes are sometimes overlapping and hence a curve tting within the range of interest was perfomed using gaussian functions to resolve the peaks and estimate their positions. Table 2.1 summarizes the characteristic vibrational frequencies of SiO 2 as compiled from [Lehmann 83, Pai 86, Innocenzi 03]. Peak position (cm −1 ) Vibrational Modes 460 TO 1 Si-O rocking 507 LO 1 Si-O rocking 810 TO 2 Si-O symmetric stretch 820 LO 2 Si-O symmetric stretch 1080 TO 3 Si-O antisymmetric stretch (adjacent O atoms in phase) 1256 LO 3 Si-O antisymmetric stretch 1150-1200 LO 4 -TO 4 Si-O antisymmetric stretch (adjacent O atoms out of phase - disorder induced mode). Table 2.1: Characteristic FTIR vibrational frequencies of SiO 2 . Informations extracted in this thesis ˆ The dierent types of bonds such as Si-O, Si-H, Si-N, Si-ON, N-H etc., are detected from the position of the longitudinal and transverse optic modes. 37

etween 2.5-25 µm. The former is used for alignment and the latter interacts with<br />

the sample. In the FTIR set-up, the IR radiation is gui<strong>de</strong>d through a Michelson's<br />

interferometer (Fig. 2.4a) with a moving mirror. An interferogram consisting of<br />

light intensity versus optical path is recor<strong>de</strong>d by the <strong>de</strong>tector with each movement<br />

of the mirror. This data from the interferogram is converted into the spatial domain<br />

using fourier transformation (Fig. 2.4b). The contributions from the reference substrate<br />

and other atmospheric components such as CO 2 and water were subtracted<br />

from the spectrum to analyse the structural composition of the <strong>de</strong>posited material.<br />

tel-00916300, version 1 - 10 Dec 2013<br />

Figure 2.4: (a) Schematic representation of FTIR set-up and (b) Interferogram to Fourier<br />

transformed spectra.<br />

Typical spectra of <strong>Si</strong>O 2 obtained in two dierent angles of inci<strong>de</strong>nce are presented<br />

in gure 2.5 as a representative of the main absorption features analysing<br />

methodology which will be followed for all the other samples in this thesis.<br />

The spectrum recor<strong>de</strong>d in normal inci<strong>de</strong>nce enables to visualise the transverse<br />

optical mo<strong>de</strong>s as shown in gure 2.5a. The spectra of <strong>Si</strong>O 2 is characterized by<br />

three major absorption bands TO 2 , TO 3 and TO 4 corresponding to <strong>Si</strong>-O-<strong>Si</strong> rocking,<br />

symmetric stretching and asymmetric stretching mo<strong>de</strong>s respectively. Each transverse<br />

optical mo<strong>de</strong> (TO) has an associated longitudinal optical mo<strong>de</strong> (LO), and<br />

this is called as the LO-TO splitting. LO mo<strong>de</strong>s cannot be seen through FTIR in<br />

normal inci<strong>de</strong>nce but can be <strong>de</strong>tected if measured in oblique inci<strong>de</strong>nce (Fig. 2.5b)<br />

[Berremann 63]. In this thesis, Brewster inci<strong>de</strong>nce of 65° is chosen for viewing the<br />

LO mo<strong>de</strong>s. Besi<strong>de</strong>s these vibrations, there is a fourth vibrational splitting known as<br />

36

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