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Films minces à base de Si nanostructuré pour des cellules ...

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the values from literatures for band to band recombinations in <strong>Si</strong>-np. Therefore,<br />

the carrier lifetime (τ 34 ) is xed as 50 µs in all the simulations. The time taken for<br />

fast radiative transitions to reach a maximum <strong>de</strong>nsity of excited carriers (τ 23 ) and<br />

the time to <strong>de</strong>excite to ground state (τ 41 ) are xed arbitrarily as 100 and 500 ps<br />

respectively.<br />

5.4.3 Absorption and emission wavelengths<br />

tel-00916300, version 1 - 10 Dec 2013<br />

Figure 5.15: Extinction coecient curves as<br />

a function of wavelength obtained from ellipsometry<br />

and UV-Visible spectrophotometry.<br />

The absorption wavelength of <strong>Si</strong>-np<br />

was estimated by tting the absorption<br />

k (λ) curves (obtained from ellipsometry<br />

and UV-Vis spectrophotometry<br />

3 ) using Forouhi-Bloomer mo<strong>de</strong>l<br />

[Forouhi 86]. Figure 5.15 shows the typical<br />

example of k (λ) curves, obtained<br />

with SRSO/SRSN ML.<br />

The maximum absorption of the material<br />

is centered around 260 nm (4.76<br />

eV). <strong>Si</strong>milar curves were obtained also<br />

with SRSO/<strong>Si</strong>O 2 MLs. Hence, it is valid<br />

to link this absorption wavelength at<br />

260 nm to <strong>Si</strong>-np absorption as the SRSO<br />

sublayer containing <strong>Si</strong>-np is the common<br />

sublayer in both MLs.<br />

The emission of <strong>Si</strong>-np mostly ranges between 720-830 nm (1.5 eV-1.7 eV) as<br />

<strong>de</strong>monstrated experimentally in our layers in the previous chapters. Hence in the<br />

mo<strong>de</strong>ling, the emission wavelength is xed in this range when assuming the existence<br />

of a single peak in the PL spectra.<br />

As mentioned in the previous sections, the other parameters such as the electric<br />

eld amplitu<strong>de</strong> of the pump (Ar laser) and the initial population of emitters are<br />

xed at 8x10 3 V/m and 10 26 <strong>Si</strong>-np/m 3 respectively.<br />

5.5 Mo<strong>de</strong>ling SRSO/<strong>Si</strong>O 2 MLs<br />

Figure 5.16 is shown to remind the PL spectra obtained experimentally from 50(3/3)<br />

SRSO/<strong>Si</strong>O 2 1h-1100°C annealed (CA) ML in chapter 3. As mentioned earlier, curve<br />

3 UV-Visible measurements were performed at Matériaux et Instrumentation Laser team of<br />

the CIMAP laboratory<br />

154

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