Films minces à base de Si nanostructuré pour des cellules ...
Films minces à base de Si nanostructuré pour des cellules ... Films minces à base de Si nanostructuré pour des cellules ...
tel-00916300, version 1 - 10 Dec 2013 4.40 Comparing the PL spectra obtained after STA and 4.75h-FG annealing processes in 50 and 100 patterned SRSO/SRSN MLs. . . . . . . . 126 4.41 PL spectra obtained from 50(3.5/5) ML after STA + FG annealing. 127 4.42 Investigating the PL spectra obtained from 50(3.5/5) SRSO/SRSN ML after FG+STA. (The PL spectra obtained after STA (1min-1000°C N 2 ) from 50 and 100 patterned MLs are also given in dotted lines for comparison). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 4.43 PL spectra from 50(3.5/3.5) SRSO/SRSN, SRSO/SiO 2 and SRSN/SiO 2 MLs after STA and CA treatments. . . . . . . . . . . . . . . . . . . 129 4.44 PL spectra obtained from FG annealed 50(3.5/5) SRSN/SiO 2 . . . . . 130 4.45 Surface microstructure of 50(3.5/5) ML after N 2 , FG and N 2 +FG annealing as observed by optical microscope. . . . . . . . . . . . . . 132 4.46 I-V curve of STA SRSO/SRSN versus CA SRSO/SiO 2 . . . . . . . . . 135 5.1 Schematic representation of external and internal components of our thin lm samples under investigation. in TE mode. θ inc = 45 o and θ collect = ±23 o . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 138 5.2 The variation of complex refractive index (ñ = n(λ)−ik(λ)) of a thin lm, as a function of wavelength. . . . . . . . . . . . . . . . . . . . . 141 5.3 Pump intensity prole with regard to its angle of incidence on the thin lm. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 141 5.4 Inuence of total lm thickness on the pump prole. . . . . . . . . . 142 5.5 Pump prole versus real part of thin lm refractive index (n 2 ). . . . 143 5.6 Pump prole versus imaginary part of thin lm refractive index (k 2 ). 144 5.7 An illustration of the pump prole variation in a thin lm of thickness d(nm) with distribution of emitters in monolayer conguration. . . . 144 5.8 An illustration of the pump prole variation in a thin lm of thickness d(nm) with distribution of emitters in multilayer congurations. . . . 145 5.9 Schematic representation of the various components of the incident wave and the wave from a single emitter placed at a distance x e in the thin lm. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 146 5.10 Four level system for modeling absorption and emission. . . . . . . . 148 5.11 Distribution of emitters with depth in a lm of 1000 nm thickness. Left axis: Number of emitters in a small thickness dx and Right axis: volumic concentration per m 3 . (Simulated with Incident pump intensity: 10 5 W/m 2 ). . . . . . . . . . . . . . . . . . . . . . . . . . . 149 5.12 The shapes of k(λ) and k (λ, x). Lorentzian t of the k(λ) obtained through experiments, gives the shape of k(λ, x). . . . . . . . . . . . . 151 xi
tel-00916300, version 1 - 10 Dec 2013 5.13 Illustration of emission and absorption cross-sections for arbitrary inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151 5.14 Dependence of emission intensity with dynamic gain and maximum emission cross-section obtained by simulations. . . . . . . . . . . . . 152 5.15 Extinction coecient curves as a function of wavelength obtained from ellipsometry and UV-Visible spectrophotometry. . . . . . . . . . 154 5.16 Experimentally obtained PL spectra of 50(3/3) SRSO/SiO 2 ML. . . . 155 5.17 Inuence of slight variations in refractive index, ∆n on emission. ∆n varies between ±0.05 in steps of 0.01. [∆n = 0 corresponds to n 1.95eV obtained by ellipsometry (here, n 1.95ev = 1.8)]. . . . . . . . . . . . . . . . . 156 5.18 Eect of total thickness, and refractive index on the emission spectra. 157 5.19 Inuence of total thickness on the emission spectra, for a xed refractive index. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158 5.20 Simulating the width and intensity of PL spectra similar to experimental curve using single emitter. σ emis.max = 8.78 x 10 −19 m 2 . . . . . 158 5.21 Simulating the width and intensity of PL spectra similar to experimental curve using single emitter and higher emission cross-sections. . 159 5.22 Theoretically modeled spectra considering double kind of emitters. The inset of sub-gure (b) shows the lorentzian t performed on the PL spectra from trial 3. The details of all the trials are given in Appendix II. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 160 5.23 (a)-(e) Simulated pump prole and excited state distribution of 50(3/t SiO2 ) where t SiO2 varies between 1.5 nm to 10 nm. . . . . . . . . . . . . . . 161 5.24 Variation of excited emitter population and maximum PL intensity with t SiO2 in MLs with dierent total thicknesses. . . . . . . . . . . . 162 5.25 Variation of excited emitter population and maximum PL intensity with t SiO2 in MLs with similar total thicknesses. . . . . . . . . . . . . 163 5.26 Experimental and simulated PL spectra of 100(3.5/5) SRSO/SRSN ML. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164 xii
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tel-00916300, version 1 - 10 Dec 2013<br />
5.13 Illustration of emission and absorption cross-sections for arbitrary<br />
inputs. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 151<br />
5.14 Depen<strong>de</strong>nce of emission intensity with dynamic gain and maximum<br />
emission cross-section obtained by simulations. . . . . . . . . . . . . 152<br />
5.15 Extinction coecient curves as a function of wavelength obtained<br />
from ellipsometry and UV-Visible spectrophotometry. . . . . . . . . . 154<br />
5.16 Experimentally obtained PL spectra of 50(3/3) SRSO/<strong>Si</strong>O 2 ML. . . . 155<br />
5.17 Inuence of slight variations in refractive in<strong>de</strong>x, ∆n on emission. ∆n<br />
varies between ±0.05 in steps of 0.01. [∆n = 0 corresponds to n 1.95eV<br />
obtained by ellipsometry (here, n 1.95ev = 1.8)]. . . . . . . . . . . . . . . . . 156<br />
5.18 Eect of total thickness, and refractive in<strong>de</strong>x on the emission spectra. 157<br />
5.19 Inuence of total thickness on the emission spectra, for a xed refractive<br />
in<strong>de</strong>x. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 158<br />
5.20 <strong>Si</strong>mulating the width and intensity of PL spectra similar to experimental<br />
curve using single emitter. σ emis.max = 8.78 x 10 −19 m 2 . . . . . 158<br />
5.21 <strong>Si</strong>mulating the width and intensity of PL spectra similar to experimental<br />
curve using single emitter and higher emission cross-sections. . 159<br />
5.22 Theoretically mo<strong>de</strong>led spectra consi<strong>de</strong>ring double kind of emitters.<br />
The inset of sub-gure (b) shows the lorentzian t performed on the<br />
PL spectra from trial 3. The <strong>de</strong>tails of all the trials are given in<br />
Appendix II. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 160<br />
5.23 (a)-(e) <strong>Si</strong>mulated pump prole and excited state distribution of 50(3/t <strong>Si</strong>O2 )<br />
where t <strong>Si</strong>O2 varies between 1.5 nm to 10 nm. . . . . . . . . . . . . . . 161<br />
5.24 Variation of excited emitter population and maximum PL intensity<br />
with t <strong>Si</strong>O2 in MLs with dierent total thicknesses. . . . . . . . . . . . 162<br />
5.25 Variation of excited emitter population and maximum PL intensity<br />
with t <strong>Si</strong>O2 in MLs with similar total thicknesses. . . . . . . . . . . . . 163<br />
5.26 Experimental and simulated PL spectra of 100(3.5/5) SRSO/SRSN<br />
ML. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 164<br />
xii
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