Films minces à base de Si nanostructuré pour des cellules ...
Films minces à base de Si nanostructuré pour des cellules ... Films minces à base de Si nanostructuré pour des cellules ...
(a) PL spectra vs. FG annealing. (b) PL peak maximum vs. t A . tel-00916300, version 1 - 10 Dec 2013 Figure 4.39: (a) Eect of annealing time under forming gas on the PL spectra of 50(3.5/5) SRSO/SRSN ML and, (b) PL peak maximum with regard to time of annealing in SRSO/SRSN MLs with dierent t SRSN . (Inset) Recalling the inuence of t SRSN on PL from STA (1min-1000°C/N 2 ) samples. the control over emission peak position. Figure 4.39b shows the PL peak maximum of FG annealed 50(3.5/t SRSN ) MLs where t SRSN varies between 1.5-10 nm. The samples were annealed sequentially between 0.5-5h. It can be observed that the time of annealing shows minimal in- uence on the PL intensity. Thus, 0.5h is a sucient annealing time for achieving considerable emission. Since T A =500°C favours exodiusion of hydrogen, further investigations under forming gas annealing were performed by reducing T A , to understand the role of hydrogen in passivation of dangling bonds. Similar intensities were obtained even by reducing the T A further down to 380°C (not shown here). It was observed in both the cases, that the intensities for a given time increase with t SRSN till 8 nm and decreases with further increase in t SRSN as observed in STA (Inset of Fig. 4.39b). Figure 4.40 shows a comparison of PL spectra between 50 and 100 patterned MLs after STA and 4.75h-FG. The emission intensity Figure 4.40: Comparing the PL spectra obtained after STA and 4.75h-FG annealing processes in 50 and 100 patterned SRSO/SRSN MLs. 126
increases for the 50 patterned sample after 4.75h-FG, whereas for the 100 patterned sample STA leads to the highest intensity. Moreover, one can notice a blueshift of the spectra between 4.75h-FG and STA 4.9.2 Short time annealing (STA) + Forming gas annealing tel-00916300, version 1 - 10 Dec 2013 Since FG annealing results in emission equivalent to STA (1min1000°C- N 2 ) in 50 patterned ML, the next set of investigations focussed on enhancing the emission from STA sample by succeeding STA with a low temperature FG process. Figure 4.41 compares the PL spectra obtained from 50(3.5/5) ML after STA+FG annealing with PL spectra obtained from STA sample. It can be seen from the gure that if STA treatment is done preceding FG annealing, it results in a detrimental Figure 4.41: PL spectra obtained from 50(3.5/5) ML after STA + FG annealing. eect on the emission intensity as compared to that obtained by FG annealing or STA alone. It is interesting to note that the PL peak position remains the same, and is not blushifted as observed in the previous case with FG annealing. This can be attributed to the initial STA that almost completes the reorganization of the matrix with the formation of a high density of Si-np that would crystallize upon subsequent annealing treatments. 4.9.3 Forming gas annealing + Short time annealing (STA) Figure 4.42 shows the PL spectra obtained from 50(3.5/5) SRSO/SRSN ML which was subjected to an initial annealing in FG and then succeeded by STA. The gure also presents the spectra obtained after annealing only by STA (1min-1000 °C/N 2 ). Since it was seen that 0.5h in FG is sucient to obtain considerable emission, such a treatment was rst employed on SRSO/SRSN ML prior to STA treatment. The emission intensity of 50 patterned ML annealed with 0.5h FG +STA treatment and only 0.5h in FG are similar (ref. Fig. 4.39a). Investigations were carried out, with varying t A under FG ow followed by STA (not shown here) and it was 127
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increases for the 50 patterned sample after 4.75h-FG, whereas for the 100 patterned<br />
sample STA leads to the highest intensity. Moreover, one can notice a blueshift of<br />
the spectra between 4.75h-FG and STA<br />
4.9.2 Short time annealing (STA) + Forming gas annealing<br />
tel-00916300, version 1 - 10 Dec 2013<br />
<strong>Si</strong>nce FG annealing results in emission<br />
equivalent to STA (1min1000°C-<br />
N 2 ) in 50 patterned ML, the next set<br />
of investigations focussed on enhancing<br />
the emission from STA sample by<br />
succeeding STA with a low temperature<br />
FG process.<br />
Figure 4.41 compares the PL<br />
spectra obtained from 50(3.5/5) ML<br />
after STA+FG annealing with PL<br />
spectra obtained from STA sample.<br />
It can be seen from the gure that if<br />
STA treatment is done preceding FG<br />
annealing, it results in a <strong>de</strong>trimental<br />
Figure 4.41: PL spectra obtained from<br />
50(3.5/5) ML after STA + FG annealing.<br />
eect on the emission intensity as compared to that obtained by FG annealing or<br />
STA alone.<br />
It is interesting to note that the PL peak position remains the same, and is<br />
not blushifted as observed in the previous case with FG annealing. This can be<br />
attributed to the initial STA that almost completes the reorganization of the matrix<br />
with the formation of a high <strong>de</strong>nsity of <strong>Si</strong>-np that would crystallize upon subsequent<br />
annealing treatments.<br />
4.9.3 Forming gas annealing + Short time annealing (STA)<br />
Figure 4.42 shows the PL spectra obtained from 50(3.5/5) SRSO/SRSN ML which<br />
was subjected to an initial annealing in FG and then succee<strong>de</strong>d by STA. The gure<br />
also presents the spectra obtained after annealing only by STA (1min-1000 °C/N 2 ).<br />
<strong>Si</strong>nce it was seen that 0.5h in FG is sucient to obtain consi<strong>de</strong>rable emission, such<br />
a treatment was rst employed on SRSO/SRSN ML prior to STA treatment.<br />
The emission intensity of 50 patterned ML annealed with 0.5h FG +STA treatment<br />
and only 0.5h in FG are similar (ref. Fig. 4.39a). Investigations were carried<br />
out, with varying t A un<strong>de</strong>r FG ow followed by STA (not shown here) and it was<br />
127