Films minces à base de Si nanostructuré pour des cellules ...
Films minces à base de Si nanostructuré pour des cellules ...
Films minces à base de Si nanostructuré pour des cellules ...
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(a) Absorption coecient curves.<br />
(b) PL spectra.<br />
Figure 4.7: The absorption coecient and photoluminescence spectra obtained from<br />
SRSN samples, with regard to refractive in<strong>de</strong>x and annealing.<br />
tel-00916300, version 1 - 10 Dec 2013<br />
grown samples (80-100 nm thick) with three dierent compositions (refractive indices<br />
2.012, 2.44 and 3.3 that are close to <strong>Si</strong> 3 N 4 , SRSN and <strong>Si</strong> respectively). The left part<br />
of gure 4.7a shows that the absorption increases with increasing <strong>Si</strong> excess, which<br />
can be attributed to the higher <strong>de</strong>nsity of <strong>Si</strong>-np formed in the material.<br />
Figure 4.8: Optical investigations on <strong>Si</strong>N x<br />
monolayers with n 1.95eV between 2.01 and 2.13.<br />
seen from gure 4.7b.<br />
Comparing the SRSN samples<br />
with same refractive in<strong>de</strong>x in the<br />
left and right part of this graph,<br />
it is interesting to note that with<br />
increasing thickness the absorption<br />
coecient of the material is lower,<br />
whatever be the annealing treatment.<br />
This dierence cannot be explained<br />
at the moment. However<br />
the absorption does not vary with<br />
annealing for energies higher than 3<br />
eV.<br />
In the case of PL properties,<br />
both the thin and thick SRSN samples<br />
(n 1.95eV =2.44) do not exhibit<br />
any emission in their as grown or annealed<br />
state whatever the temperature<br />
or time of annealing as can be<br />
98