ANALYSETTE 22 NanoTec - Fritsch - Malen en Zeven

FRITSCH · LASER PARTICLE SIZER 

IDEAL FOR 

- MEASURING THE PARTICLE SIZE DISTRIBUTION 

OF SOLIDS AND SUSPENSIONS 

- MEASURING RANGE 0.01 – 2000 µm 

- PRODUCTION AND QUALITY CONTROL 

- RESEARCH AND DEVELOPMENT 

STATIC LASER SCATTERING

FRITSCH ANALYSETTE 22 

For over 25 years, FRITSCH has remained one step ahead in the area of laser 

particle sizing. In 1985, we revolutionised measurement precision by introducing the 

concept of laser diffraction in a convergent laser beam with the patented FRITSCH 

FRITSCH. ONE STEP AHEAD. 

measurement process. This process has now become the international standard for 

easy, fast and reliable particle size analysis. Benefi t from the practical experience 

and technical superiority achieved in a quarter-century of work in laser particle sizing. 

2

ANALYSETTE 22 

SIMPLE. 

FLEXIBLE. 

RELIABLE. 

The FRITSCH ANALYSETTE 22 ensures precise determination of particle sizes worldwide – 

in production and quality control as well as in research and development. Benefit from its decisive 

advantages: extremely simple operation, short analysis times and consistently reproducible and 

reliable results. And of course getting the best value for your money. 

QUALITY AND TECHNOLOGY FROM GERMANY 

All key components of all FRITSCH Laser Particle Sizers are manufactured entirely in Germany. The fi nal 

production takes place exclusively at our own plant at our headquarters in Idar-Oberstein. With strict 

quality controls and the special attention to detail of a traditional family-owned company. This you can 

really depend on. 

3



COMPACT SIZE – 

COMPACT PRICE 

YOUR ADVANTAGES 

Measuring range 0.01 – 2000 µm 

Short measuring time 

High measurement precision 

Consistent reproducibility 

Reliable comparability 

User-friendly operation 

TWO MODELS FOR ALL APPLICATIONS 

MicroTec plus (0.08 – 2000 µm) 

NanoTec plus (0.01 – 2000 µm) 

0.08 2000 

Dry dispersion unit 

0.01 0.10 1 10 100 1000 

10000 (µm) 

Choose according to your needs: either the ANALYSETTE 22 MicroTec plus – 

the perfect all-round-laser with a measuring range of 0.08 – 2000 µm for all 

typical measurement tasks; or the ANALYSETTE 22 NanoTec plus, the highend 

instrument for measurements down to the nano range – for maximum 

precision and sensitivity for the smallest particles through the measurement 

of the backward scattering in a third laser beam. 

Measuring unit 

4

FRITSCH-PLUS 

• Intelligent modular design Each ANALYSETTE 22 consists of a compact measuring unit that 

can be quickly and easily combined with various dispersion units for dry respectively wet 

measurements. This allows you to buy only what you need for your applications. 

• Practical fast-switch-system Quickly switch between dispersion units by simply changing 

the cartridge containing the measuring cell. 

• Short measuring time The ANALYSETTE 22 completes most measurements in less than 

a minute. The instrument is then immediately ready to be used again. 

• Fully automatic analysis with clearly organised results visible directly on the screen. 

Of course, you can also print out or save a report customised to your needs. 

Wet dispersion unit 

5

FRITSCH Particle Sizing 

SIMPLE 

Laser particle sizing at the push of a button 

With the ANALYSETTE 22, particle measurement becomes a simple matter, for 

professionals as well as for any employee, with only brief instructions, e.g. in 

merchandise receipt or shipping departments. No prior knowledge is required. Just 

start the programme, select a SOP and add the sample – the rest takes place 

completely automatic. Fast. Reliable. Efficient. 

1. START PROGRAMME 

To start a measurement with the ANALYSETTE 22, simply select one of the predefined 

Standard Operating Procedures (SOPs, see pages 7 and 18). 

2. ADD SAMPLE 

The programme will prompt you to add the sample material. As soon as the quantity 

is sufficient, the measurement starts automatically. 

3. THE REST IS AUTOMATIC 

• Automatic dispersion 

• Automatic measurement 

• Automatic analysis 

• Automatic report generation 

DONE! 

6

ADAPTABLE 

FRITSCH-Plus Open configuration of the measuring processes – SOPs 

The software of the ANALYSETTE 22 contains completely predefined Standard Operating Procedures - SOPs for 

short - for nearly all typical measurement tasks. Via a well-arranged input mask, you are completely free and 

fl exible to modify these SOPs to perfectly suit your measurement requirements: The dispersion process and 

duration, measuring frequency, time intervals and many other parameters can be easily selected and saved 

as separate SOPs. Your advantage: a completely new level of freedom in structuring the entire dispersion and 

measurement process. 

Especially safe: You can assign individual usage permissions for each SOP to ensure that no unauthorised 

changes can be made by the operator while performing the measurement. 

WE ASSIST YOU! 

Upon installation of your ANALYSETTE 22, we show you how easy it is to create your own SOPs. You can 

also send us your sample for a free-of-charge sample measurement, and along with the result, receive the 

parameters for a corresponding SOP. Or simply give us a call – we would be happy to advise you and help you 

with the determination of the optimal dispersion process for your particular measurement tasks, which you 

can then save as an SOP. 

+49 67 84 70 138 

7

FRITSCH Service ANALYSETTE und Beratung 22 MicroTec plus 

ANALYSETTE 22 MicroTec plus 


• Measuring range 0.08 – 2000 μm 

• Especially high measurement precision 

• Revolutionary dual-laser technology 

• Practical modular system 

• Quick change between wet and dry measurement 

• Simple cleaning 

• Small footprint 

FLEXIBLE ALL-ROUNDER FOR ALL TASKS 

The ANALYSETTE 22 MicroTec plus is the ideal, compact, 

all-round Laser Particle Sizer attractively priced for all typical 

applications. For example for handling your own quality 

and production control. An interesting alternative even for 

small and medium-sized companies. And it‘s worth making 

a comparison! 

Variable measuring range 

With the ANALYSETTE 22 MicroTec plus, you can easily and 

fully automatically choose between two individual measuring 

ranges or combine the two into a third option. 

Your advantage: maximum fl exibility and a total measuring 

range of 0.08 – 2000 µm in a single instrument. 

Maximum resolution within a compact unit 

The ANALYSETTE 22 MicroTec plus measures with two 

lasers. The detector captures 108 measuring channels. Your 

advantage: maximum measurement precision and outstanding 

resolution within a compact unit. 

8

0.08 – 2000 µm 

ANALYSETTE 22 MicroTec plus – Practical modular system: measuring unit with separate dry dispersion unit 

FRITSCH-IDEA: TWO LASERS IN ONE INSTRUMENT 

In the FRITSCH ANALYSETTE 22 MicroTec plus, a semi conductor 

laser with green light carries out the measurement of 

small particles, while an infrared-semiconductor laser handles 

large particle size ranges. Both lasers can be optimally 

aligned extremely quickly, automatically and independently of 

each other through lateral motion. Your advantage: the ideal 

wavelength for every particle size and an ideal combination 

of large measuring range, outstanding resolution and small 

footprint. 

IR laser 

Green laser 

Detector 

Measuring cell 

Measurement design for the lower particle size range 

Brilliant FRITSCH-idea: With redirection of the long wavelength 

red laser beam, the ANALYSETTE 22 MicroTec plus allows for 

maximum measurement precision even for large particles 

within a compact unit. To switch to the measurement of small 

particles in the short wavelength green laser, the detector and 

the laser source are simply moved as a unit – the measuring 

cell remains fixed in place. 

IR laser 



Detector 

Measurement design for the upper particle size range 

9

FRITSCH ANALYSETTE 22 NanoTec plus 

ANALYSETTE 22 NanoTec plus 


• Measurement of even nano-particles in an extremely wide measuring 

range of 0.01 – 2000 μm 

• Triple-laser technology for forward and backward scattering 

• Especially high measurement precision through the analysis of 165 channels 

• Fast, automatic particle size analysis 

• Practical modular system 

• Quick change between wet and dry measurement 

• Fast and simple cleaning 

HIGH-END DOWN TO THE NANO RANGE 

With a total measuring range of 0.01 – 2000 µm in a 

single instrument, the ANALYSETTE 22 NanoTec plus 

is the ideal, universally applicable Laser Particle Sizer 

for the effective and reliable determination of particle 

size distributions. Innovative FRITSCH laser technology 

makes it possible to separately select 5 different 

measuring ranges. For elegant measurements with 

maximum flexibility, highest resolution, outstanding 

sensitivity - and perfect results down to the nano range. 

5 measuring ranges without optical conversion 

With your ANALYSETTE 22 NanoTec plus, you can choose 

between three measurement positions of the measuring 

cell, allowing measurements in 5 different measuring ranges 

without modifi cation. Your advantage: optimal adaptation of 

the particle size measurement to your sample. 

Highest measurement precision with all detectors 

The elegant FRITSCH measuring solution: Regardless of 

the measurement position you select, the ANALYSETTE 22 

NanoTec plus always uses all 57 measuring channels of the 

detector. By combining the various measurement positions, it 

is possible to perform measurements with up to 165 effective 

channels. Your advantage: a particularly high resolution and 

sensitivity. 

10

0.01 – 2000 µm 

ANALYSETTE 22 NanoTec plus – Practical modular system: measuring unit with separate wet dispersion unit 

FRITSCH-IDEA: A THIRD LASER FOR MEASURING 

THE BACKWARD SCATTERING 

To extend the particle size determination down to the nano 

range, it is necessary to detect the light that scatters backward. 

And the FRITSCH solution for this is simply brilliant: a 

third laser beam utilises backward scattering for the measurement. 

This beam irradiates the sample positioned directly in 

front of the detector through a micro-hole in the centre of the 

detector. Your advantage: the uniquely large measuring range 

of the ANALYSETTE 22 NanoTec plus with a lower measuring 

limit of approximately 0.01 µm. And instead of a weak diode 

a real intensive laser for backward scattering. 

IR laser 

Detector 



Zeichnung noch inhaltlich abzustimmen 

Green backward laser 

Measurement design for the nano particle size range 

11

FRITSCH ANALYSETTE 22 Dispersion 

DISPERSION 

Modular design – maximum flexibility 

Basically, any particle size measurement is only as good as its dispersion. For this reason, we place great 

importance on this aspect and bring all our experience to bear. The result: an especially practical modular 

system for a fast, perfect dry and wet dispersion in both ANALYSETTE 22 models. 

FRITSCH-Plus 

Modular concept 

All dispersion modules of the ANALYSETTE 22 can be 

connected to the measuring unit individually or in combination. 

Depending on the measurement task, choose between a wet 

or dry dispersion unit. The small volume wet dispersion unit 

is available for the wet dispersion of very small quantities, 

and the falling chute can be used for dry measurements of 

agglomerates or free-fl owing materials. It is therefore easy 

to quickly modify your ANALYSETTE 22 at any time for new 

measurement tasks. 

FRITSCH-Plus 

Time-saving fast-switch-system 

The measuring cells of the ANALYSETTE 22 are located 

in practical cartridges that can be easily exchanged when 

switching between wet and dry measurements – without 

changing any hoses or modifying the instrument! With this 

system even the cleaning of the measuring cell is like child‘s 

play. Plus, whenever you are not using the cartridge, it can be 

easily stored within the respective dispersion unit. Perfectly 

neat and tidy. 

Wet 

dispersion 

unit 

Small volume 

wet dispersion 

unit 

Dry 

dispersion 

unit 

Falling chute 

THE MODULES 

12

Well-conceived: practical fast-switchsystem 

for changing between the different 

dispersion units 

FRITSCH-Plus 

Full flexibility and fast work 

Standard programmes for simple operation, freely programmable 

dispersion and measurement processes, 

especially fast and effi cient automatic cleaning and many 

other advantages simplify your work and ensure high-quality 

measuring results. 

FRITSCH-Tip: The matching dispersion 

Wet dispersion is the ideal method for about 80% of all 

samples. For easily soluble samples or samples that 

swell signifi cantly, dry dispersion or the FRITSCH falling 

chute is the right solution. Just ask us – we are happy 

to advise you! 

Practical cartridges with measuring cells for switching between the individual dispersion units. 

13


WET DISPERSION UNIT 


• Freely adjustable ultrasonic-intensity for optimal dispersion 

• Automatic rinsing cycle adaptable to each sample material 

• Free programmability for maximum flexibility 

• Variable suspension volume with a total volume between 300 and 500 ml 

• Benzene, alcohol and many organic solvents can also be used as suspension 

liquids as a standard feature 

• Simple and fast cleaning of the measuring cell 

WET DISPERSION: 

THE IDEAL STANDARD SOLUTION 

For about 80% of all samples, wet dispersion represents 

the ideal method for perfect dispersion. Therefore the 

samples are feed into a closed liquid circulation system. 

An integrated and freely programmable ultrasonic emitter 

ensures fast and extremely efficient degradation of the 

agglomerates – precisely adapted to each sample. Due 

to the integrated water connection, the unit can be 

automatically cleaned and refilled with new, clean liquid 

after each measurement. And is quickly ready again for 

the next measurement. 

Powerful pump 

A powerful centrifugal pump with individually variable speed 

ensures optimal transport of even dense, heavy particles 

within the wet dispersion unit of the ANALYSETTE 22. 

Illuminated ultrasonic bath 

Due to illumination of the ergonomically positioned and 

easily accessible ultrasonic bath offers an outstanding 

observance of the dispersion process. This makes it 

incredibly easy to feed the sample into the measurement 

circuit. 

Parameter: Water quality 

Generally, normal tap water is entirely suffi cient for wet 

dispersion. In rare cases, it may be necessary to use distilled 

water. Just ask us – we are happy to advise you! 

14

Small volume wet dispersion unit 

and wet dispersion unit in the front 

SMALL VOLUME WET DISPERSION UNIT 


• Especially practical transparent glass container for checking the sample 

• Manually controlled centrifugal pump for gentle transport of the sample 

• The measurement circuit is without dead space and can be easily rinsed with a single-lever valve (4/2-way ball valve) 

• All parts coming into contact with the liquid are made of steel, PTFE, glass, FFPM (Kalrez ® ) or Norprene ® 

If an organic solvent must be used for a specifi c sample material or if only minimal sample quantities are available, the use 

of a solvent-compatible dispersion unit with low volume can be advantageous. For this purpose, FRITSCH offers the small 

volume wet dispersion unit with roughly 100 ml total volume as the ideal supplement for measurements in solvents up to 

a particle size of about 600 µm. With intuitive manual operation guided by the software of the ANALYSETTE 22 – for fast, 

easy operation. 

15


DRY DISPERSION UNIT 


• Fast measurement of powdery samples in an accelerated air flow 

• For sample volumes from less than 1 cm 3 to approx. 100 cm 3 

• Efficient degradation of agglomerates with a special annular gap Venturi nozzle 

• No impact areas – protection against comminution of the particles 

• Perfect sample feeding with high-frequency feeder 

• Automatic computer-controlled adjustment of the dispersion pressure 

• Fully automatic measurement processes freely programmable 

• Especially fast and easy to clean 

DRY DISPERSION: 

FAST AND EASY 

Dry dispersion is especially suited for not too fine, freeflowing 

materials, which react in water or other liquids. 

The sample material is transported with a vibratory 

feeder through the intake funnel into the dry measuring 

cell, where it falls directly into a Venturi nozzle operating 

with an adjustable flow of compressed air. Upon passing 

through the nozzle, agglomerates are broken up and the 

measurement of the particle size distribution in the laser 

beam takes place directly behind it. Generally, larger 

sample volumes are required for dry dispersion; however, 

it is also easier to obtain a representative analysis. 

Multifunctional exhaust system 

The integrated exhaust system of the dry dispersion unit 

ensures automatic sample exhaust during the measurement. 

After completion of the measurement, it can also be 

easily used for manual cleaning of the feeder. 

Integrated feeding 

An electronically controlled high-frequency feeder ensures 

automatic continuous feeding of powdery samples without 

residues when using the dry dispersion unit or the FRITSCH 

falling chute. 

Note: For the operation of the dry dispersion unit, an oil-, 

water- and particle-free supply of compressed air with a 

pressure of at least 5 bar and a flow rate of at least 125 l/min 

is required. An external exhaust system is necessary to 

vacuum the sample material, which can be ordered as a 

FRITSCH accessory together with the instrument. 

High-frequency feeder 

for automatic sample 

feeding for the dry 

dispersion unit and 

falling chute 

16

Digital display for 

precise adjustment 

of the spacing 

ANALYSETTE 22 MicroTec plus measuring unit with dry dispersion unit 

WORKING WITHOUT COMPRESSED AIR – 

THE FRITSCH FALLING CHUTE 

For the measurement of agglomerates of dry powder or for determining particle 

size distributions of free-fl owing, coarse-grained materials which you would like 

to measure without dispersion, we have developed the FRITSCH falling chute. 

In this case, the sample is transported with an electronically controlled 

feeder directly above the intake funnel of the falling chute, from where it falls 

directly into the measuring cell and is measured by the laser beam without any 

dispersion at all. Afterward, the integrated exhaust system ensures automatic 

exhausting of the sample. 

Our tip: Depending on the sample material, where compressed air connection 

is unavailable, the FRITSCH falling chute is an option. 

FRITSCH falling chute 

for dry measurement 

without dispersion or 

compressed air 

17

FRITSCH Software ANALYSETTE 22 

Software 

ANALYSETTE 22 is delivered automatically with the matching software, 

which guides you through the entire measurement process in an easyto-learn 

and largely self-explanatory manner. Simple, flexible, reliable. 

PERFECT ANALYSIS 

THE FACTS 

The special FRITSCH MaS control software is based 

on a relational database in which all user entries, 

parameters and results are securely stored and safe 

from manipulation. Predefined Standard Operating 

Procedures (SOPs) regulate many typical measurement 

processes. Own SOPs can be completely freely defined. 

The report generator allows your measurement reports 

to be organised exactly according to your needs. The 

integration into a local computer network is also a 

simple matter. Your advantage: all measuring data can 

be conveniently analysed on different computers. 

• Simple, clear organisation of the measuring data 

• Fast, clear comparison of different measurements 

• All relevant information available at a glance 

• Analysis according to Fraunhofer or Mie theory 

• Control of the measurement process via SOPs 

• Individual reports and layouts 

• Freely selectable user values issued in a table format 

• Manual entry of comparison data is possible 

• Consideration of sieving results 

• Data export to Excel TM and in XML format 

• SQL database 

• CFR 21 part 11 included as a standard feature 

• Intuitive operation via central navigation area 

• Easy-to-learn thanks to use of the Microsoft Office 

standard 

• User interface multi-lingual 

18

DATA MANAGEMENT 

AND USER RIGHTS 

FLEXIBLE 

REPORT RT GENERATOR 

R 

All results and templates are stored in a SQL database that 

is tamper-proof. By individually assigning user permissions, 

you can separately defi ne access to data or the ability to 

alter measurement processes for each individual user. 

If the computer connected to the ANALYSETTE 22 has network 

access, the measuring results can also be viewed at any time 

from other network computers. Simple, secure, reliable. e. 

In addition to integrated t standard d reports, the freely editable 

report generator offers fl exible options for displaying the 

measuring results according to your individual needs. The 

reports can integrate graphs as well as all measurement 

parameters, statistical values or selected measured values. 

19

FRITSCH Certified Reproducibility and Measurement Accuracy 

ISO 13320 

All FRITSCH Laser Particle Sizers meet the strict requirements of ISO 13320 

in regard to repeatability, reproducibility and measurement precision. And 

in fact, they exceed these requirements. Typically FRITSCH. 

SURPASSING THE STANDARD 

THE ISO 13320 DEFINES 

Repeatability, reproducibility and accuracy of measuring 

results are of central importance in practical applications. 

In this regard, you can rely on the inspection of all FRITSCH 

Laser Particle Sizers according to ISO 13320 Particle Size 

Analysis – Laser Diffraction Methods. As a guideline for the 

measurement of particle size distribution with Laser Particle 

Sizers, this norm specifies the minimum standards, which 

are significantly exceeded by all FRITSCH instruments, and 

regulates their easy verification. 

• The fundamental measuring principle 

• The optical arrangement of Laser Diffraction Instruments 

• The key instrument parameters for users to ensure quick 

comparison of different instruments 

• Important details on use of the physical theories of light 

scattering, in particular Mie theory or Fraunhofer theory 

• Inspection of the minimum requirements for repeatability 

and accuracy with suitable standard materials 

20

100 

80 

60 

40 

% Undersize 

X - Electroformed Sieve Analysis 

L - Electroformed Sieve Analysi 

s 

X - Electroformed Sieve Analysis 

C - Coulter Counte 

r 

M - 

Coul ter Co 

ounte 

r 

J - Coulter Counte 

r 

D - Coulter Counte 

r 

X - Coulter Counte 

r 

U - Coulter Counte 

r 

W - Coulter Counte 

r 

F - Microscopy 

Q - Micr 

oscop 

py 

X1- Microscopy 

X1 - Microscopy 

20 

0 

20 25 30 35 40 45 

50 

55 

5 60 65 70 

Size (μm) 

REFERENCE MATERIALS 

The particle size measurement using laser diffraction is based 

on fundamental physical relationships, meaning that calibration 

of the instrument is not necessary, strictly speaking. 

Nevertheless, the measuring instrument should be inspected 

regularly to ensure proper function. This is done with reference 

materials with a spherical shape that permit precise determination 

of the particle size with the help of laser diffraction. 

Reference materials for inspecting 

the measuring system 

The reference materials offered by FRITSCH are delivered 

along with precise dispersion and measurement instructions 

and are accompanied by a certifi cate that states the upper 

and lower limits of the expected particle sizes. These limit 

values were determined using an internationally recognised 

process (NIST-traceable). 

Measured cumulative distribution curve for a certifi ed reference material 

21

FRITSCH ANALYSETTE 22 MicroTec plus/ANALYSETTE 22 NanoTec plus 

TECHNICAL DATA 

ANALYSETTE 22 MicroTec plus/ANALYSETTE 22 NanoTec plus 

Measuring range 

Laser 

ANALYSETTE 22 MicroTec plus 

0.08 – 2000 µm 

Selectable measuring ranges: 

0.08 – 45 µm / 15 – 2000 µm / 

0.08 – 2000 µm 

Two semiconductor lasers 

Green (λ = 532 nm, 7 mW), 

IR (λ = 940 nm, 9 mW) 

Linear polarisation 

10000 hours average lifetime 

ANALYSETTE 22 NanoTec plus 

Wet dispersion: 0.01 – 2000 µm 

Dry dispersion: 0.1 – 2000 µm 

Selectable measuring ranges: 

0.01 – 45 µm / 0.08 – 45 µm / 15 – 2000 µm / 

0.01 – 2000 µm / 0.08 – 2000 µm 

Three semiconductor lasers 

2 x green (λ = 532 nm, 7 mW), 

1 x IR (λ = 940 nm, 9 mW) 

Linear polarisation 

10000 hours average lifetime 

Number of particle size classes Max. 108 Max. 165 

Optical arrangement 

Fourier lenses 

Laser beam alignment 

Inverse Fourier design 

Movable measuring cell (FRITSCH patent) 

260 mm and 560 mm focal length (green or infrared) 

10 mm diameter of the laser beam in the Fourier lens 

Automatic 

Laser protection class 1 (according to EN 60825) 

Sensor 

Typical measuring time 

2 segments 

1 x for vertical and 1 x for horizontal direction of the laser light polarisation 

57 elements 

5 – 10 s (measurement value recording of a single measurement) 

2 min (entire measuring cycle) 

Wet dispersion unit 

Suspension volume 300 – 500 cm 3 

Radial pump with adjustable speed 

Ultrasonic with adjustable output (max. 60 W) 

Materials used in the sample circuit: stainless steel, PTFE, BK7 glass, Norprene ® -hoses 

Small volume wet dispersion unit 

Dry dispersion unit 

Falling chute 

Required computer 

Dimensions (w x d x h) 

Weight 

Suspension volume approx. 100 ml 

Radial pump with adjustable speed 

Max. particle size approx. 600 µm (depending on the material) 

Materials used in the sample circuit: steel, PTFE, glass, FFPM (Kalrez ® ), Norprene ® 

Sample volume < 1 – 100 cm 3 


Annular gap Venturi nozzle 

Required compressed air supply: Min. 5 bar, 125 l/min, oil-free, water-free, particle-free 

External exhaust system required 

Sample volume 1 – 100 cm 3 


External exhaust system required 

Standard Windows-PC, at least 500 MB free hard drive space, 1 GB RAM, 

Windows XP (current service pack), Windows 7, USB-interface, at least 19“ monitor 

53 x 62 x 35 – 55 cm (MicroTec plus measuring unit, depending on confi guration) 

68 x 62 x 35 – 55 cm (NanoTec plus measuring unit, depending on confi guration) 

32 x 62 x 44 cm (wet dispersion unit) 

Ø 14 x 33 cm (small volume wet dispersion unit) 

36 x 65 x 37 cm (dry dispersion unit) 

36 x 65 x 37 cm (falling chute) 

38.4 – 43 kg (MicroTec plus measuring unit, depending on confi guration) 

48 – 52.6 kg (NanoTec plus measuring unit, depending on confi guration) 

30.8 kg (wet dispersion unit) 

8 kg (small volume wet dispersion unit) 

25 kg (dry dispersion unit) 

24.6 kg (falling chute) 

22


ORDERING DATA 

Order No. Article 

LASER PARTICLE SIZERS 

ANALYSETTE 22 MicroTec plus / ANALYSETTE 22 NanoTec plus 


EXHAUST SYSTEMS FOR MEASUREMENTS WITH THE DRY 

DISPERSION UNIT AND THE FALLING CHUTE 


MEASURING UNITS 


22.8400.00 Measuring unit ANALYSETTE 22 MicroTec plus 

With USB-interface 

For 100-120/200-240 V/1~, 50-60 Hz, 50 Watt 

22.2400.00 Measuring unit ANALYSETTE 22 NanoTec plus 

With USB-interface 

For 100-120/200-240 V/1~, 50-60 Hz, 50 Watt 

DISPERSION UNITS 


22.8500.00 Wet dispersion unit 

300-500 ml ultrasonic bath, feed pump and fl ow measuring cell 

For 100-120/200-240 V/1~, 50-60 Hz, 100 Watt 

22.8600.00 Dry dispersion unit 

For dispersion in a free jet with pre-dispersion 

For 100-120/200-240 V/1~, 50-60 Hz, 50 Watt 

22.8900.00 Falling chute 

For feeding of free-fl owing samples 

For 100-120/200-240 V/1~, 50-60 Hz, 50 Watt 

43.9050.00 Dust category ”M” according to DIN EN 60335-2-69 

For 230 V/1~, 50-60 Hz, 1000 Watt 

43.9010.00 With hose and ultra-fi ne fi lter, dust category ”H” 

according to DIN EN 60335-2-69 

For 230 V/1~, 50-60 Hz 

Spare parts for exhaust systems for measurements 

with the dry dispersion unit and the falling chute 

43.9055.00 Paper fi lter bag (pack = 5 pieces) for exhaust system 43.9050.00 

43.9052.00 Plastic bag (pack = 5 pieces) for exhaust system 43.9050.00 

43.9051.00 Filter set polyester for exhaust system 43.9050.00 

43.9011.00 Disposal bag (pack = 10 pieces) for exhaust system 43.9010.00 

43.9012.00 Safety bag (pack = 5 pieces) for exhaust system 43.9010.00 

43.9013.00 Ultra-fi ne fi lter for exhaust system 43.9010.00 


CERTIFIED REFERENCE MATERIALS AND CERTIFICATES 


22.8670.00 Conversion kit to use the dry dispersion unit as a falling chute 

For feeding of free-fl owing samples 

For 100-120/200-240 V/1~, 50-60 Hz 

22.8599.00 Small volume wet dispersion unit 

Incl. cartridge with cpl. fl ow measuring cell 

For 230 V/1~, 50-60 Hz, 35 Watt 

(Transformer to adapt line voltage on request!) 

SPARE PARTS 


22.8570.00 Cartridge 

With cpl. fl ow measuring cell for wet dispersion unit 


With cpl. fl ow measuring cell for small volume wet dispersion unit 

22.8560.00 Flow measuring cell 

Cpl. for wet dispersion units 

22.8566.26 Measuring cell glass 

4 mm for 22.8560.00 


Cpl. 12 mm for 22.8560.00 

84.0095.15 O-ring 

64 mm x 1.5 mm for fl ow measuring cell 

84.0315.15 O-ring 

25 mm x 2.5 mm for fl ow measuring cell 


With cpl. dry measuring cell for dry dispersion unit 


With cpl. dry measuring cell for falling chute 

22.8650.00 Dry measuring cell 

Cpl. for dry dispersion unit and falling chute 


For 22.8650.00 

Certified reference materials for performance verification according to 

ISO 13320 

85.2220.00 Test powder for wet dispersion (Box with 10 single-shots 0.5 g) 

85.2230.00 Test powder for dry dispersion (Box with 10 single-shots 5 g) 

85.2240.00 Test suspension nano for system check (Box with 10 single-shots 5 ml) 

85.2250.00 Test suspension 1 µm for system check (Box with 10 single-shots 5 ml) 

85.2260.00 Test suspension 10 µm for system check (Box with 10 single-shots 5 ml) 

Certificates for tests according to ISO 13320 

96.0080.00 Performance verifi cation for wet dispersion 

96.0081.00 Performance verifi cation for dry dispersion 

96.1000.00 Set of IQ/OQ blank forms (standards not included) 

Sample division 

For representative sample division, we recommend the Rotary Cone Sample Divider 

LABORETTE 27 – the foundation of any precise analysis. 

More information is available at www.fritsch.de. 

The FRITSCH Laser Particle Sizers include the software for the control, recording of 

data and evaluation. 

Maintenance and recalibration of your Laser Particle Sizers on request. 

Computers, colour ink jet printer and laser printer on request. 

Technical specifications are subject to change without notice. 

23

FRITSCH Brief Introduction to Laser Particle Size Measurement 

BRIEF INTRODUCTION TO LASER PARTICLE SIZE MEASUREMENT 

P RINCIPLE OF LASER DIFFRACTION 

Particle measurement with laser diffraction is actually very simple: to measure 

the size of a particle, a laser beam is directed at it. The partial deflection of the 

laser light results in a characteristic, ring-shaped intensity distribution behind 

the sample which is measured by a specially shaped detector. The particle 

size is calculated based on the spacing of these rings: large particles produce 

closely situated rings; small particles produce more widely spaced rings. That 

is the principle. 

Laser Measuring cell Detector 

BAS I C CON C EPTS 

The illumination of a particle with light results in various effects that collectively 

lead to a weakening of the light beam. This extinction is essentially the sum of 

absorption and deflection of the light from the original direction. 

In the absorption, the particle takes up a portion of the electromagnetic energy from 

the light and converts it primarily into heat. This phenomenon plays a large role in 

Mie theory. 

Laser beam 

Particle 

Three different effects fundamentally contribute to the deflection of the 

incoming light: diffraction, reflection and refraction. 

• To understand the diffraction it is necessary to imagine the light beam as a broad 

wave front. When this wave front encounters a particle, new waves are produced 

at its edges which run in different directions. The overlapping (interference) of the 

many new waves results in a characteristic diffraction pattern behind the particle 

which is uniquely determined by the diameter of the particle. Its exact progression 

is described by Fraunhofer theory. 

• The reflection occurs mostly on the surface of a particle – according to the law 

which states: angle of incidence is equal to angle of refl ection. This portion of the 

scattered light cannot be used for particle size determination. 

• Refraction involves the changing of the light beam direction at a transition 

between two materials with different indexes of refraction. A light beam that hits 

a rain drop, for example, is fi rst refracted toward the middle of the drop and then 

repeatedly reflected into the drop again upon encountering the drop‘s outer edge. 

A portion of the light also escapes the drop during each refl ection. 

Incoming light beam 

Refl ected 

beam 

Refracted 

beam 

Partial 

refl ection 

to the 

inside 

24

DES I G N O F A LAS ER PARTIC LE S IZER 

A significant component of every Laser Particle Sizer is the Fourier lens that 

focuses the scattered light of the laser within the beam path onto the detector. 

Its position defines the key difference between a conventional design and the 

Inverse Fourier design. 

• Conventional Design 

In the conventional arrangement, the Fourier lens is situated between the detector 

and the measuring cell, through which a wide, parallel laser beam passes. The 

disadvantage: only a limited particle size range can be detected, and in order to 

change the measurement, it is necessary to change the lens and adjust it very 

precisely. Also, the ability to measure large scattering angles for particularly small 

particles is severely limited. 

Laser 

Fourier 

lens Detector 


Parallel laser beam 

f 

f 

• FRITSCH Technology: Inverse Fourier Design 

25 years ago, FRITSCH was the fi rst company in the industry to bring a 

revolutionary alternative to the conventional design onto the market in the form of 

a convergent laser beam: by positioning the Fourier lens in front of the measuring 

cell, a convergent laser beam passes through the measuring cell. The scattered 

light is focused directly onto the detector without additional optical elements. This 

design is now in widespread use, and most manufacturers use a main detector 

for capturing the small scattering angles for measuring of large particles. For the 

large scattering angles of small particles, a side detector system must then be 

integrated, generally consisting of only a few detector elements. FRITSCH has 

progressed another step further. 

Fourier 

lens 


Convergent 

laser beam 

Main 

detector 

DIS PERS I O N 

An optimally dispersed sample is a basic prerequisite for reliable determination of 

the particle size distribution. In most cases, agglomerates must be broken up and 

the correct particle concentration of the sample material must be established. In 

principle, the dispersion process can take place within an air fl ow (dry dispersion) 

or in a liquid (wet dispersion). Dry dispersion is especially suited for not too fi ne, 

free-fl owing materials, which react in water or other liquids. The required sample 

quantity for dry dispersion is normally signifi cantly larger than for wet dispersion; 

however, this does make it easy to obtain a representative sample. Wet dispersion 

must be used for many materials. These include sticky materials such as clay 

or materials that tend to agglomerate when dry. Even for very fi ne powders with 

particle sizes below about 10 µm, it is often not possible to completely break up the 

agglomerates using dry dispersion. In this case, wet dispersion also represents the 

considerably more effective and fl exible alternative. Thanks to the modular design 

of the ANALYSETTE 22 and due to the design of the measuring cell cartridge, it is 

possible to switch very quickly between wet and dry measurements. 

25

FRITSCH Brief Introduction to Laser Particle Size Measurement 

• FRITSCH Technology: Simple Measurement of the Backward Scattering 

Another advantage of the FRITSCH patent: the measuring cell can be positioned 

directly in front of the detector to measure the very small particles below 100 

nanometres (nm) of particle diameter. Through a small opening at the centre of 

the detector, the sample is irradiated by a second laser beam from behind and the 

backward scattered light can be captured with the full resolution of the detector 

under very favourable geometric conditions. The result: a very efficient and precise 

measurement of the backward scattering without complicated coordination of 

various detector systems. 

Measuring 

cell 

Detector 

Fourier 

lens 

Laser for 

backward scattering 

THEO RIES FO R ANALYS I S 

The actual result of a particle size measurement is only created through analysis 

with the supplied FRITSCH software. Depending on the particle properties and 

requirements, two common analysis theories are used for this: Fraunhofer 

theory for larger particles when their exact optical parameters are unknown 

and Mie theory for the smallest particles with known optical parameters. It is 

very easy to select both theories in the FRITSCH MaS control software. 

The Fraunhofer Theory 

Fraunhofer theory describes the portion of light defl ection that occurs exclusively 

as a result of diffraction. If light encounters an obstacle or an opening, this results 

in diffraction and interference effects. If the incoming light is parallel (even wave 

fronts), this is referred to as Fraunhofer diffraction. This is always the case if the 

light source is located at infinity or is ”shifted“ there by a lens. Since for suffi ciently 

large particles the light defl ection is dominated by diffraction, Fraunhofer theory can 

be used for particle size distribution down to the lower micrometre range. One major 

advantage of Fraunhofer theory lies in the fact that no knowledge of the optical 

properties of the examined material is required. 

The Mie Theory 

For particles with diameters that are not signifi cantly larger than the wavelength 

of the light used, the Mie theory is applied for the analysis of the measurements. 

This theory was developed at the start of the 20 th century by Gustav Mie and is the 

complete solution of the Maxwell equations for the scattering of electromagnetic 

waves by spherical particles. It can be used to analyse the characteristic intensity 

distributions for even very small particles, which, in contrast to Fraunhofer theory, 

are not restricted to scattering angles of less than 90° (forward scattering). In fact, 

scattering angles of greater than 90° also occur (backward scattering). In order 

to be able to use the intensity distribution for the calculation of the particle size, 

determined in this manner, the refraction index and absorption index of the sample 

must be known with the Mie theory in contrast to the Fraunhofer theory. The FRITSCH 

software includes a comprehensive database containing the refraction indexes of 

numerous different materials. 

26

Benefit from our experience 

Choose FRITSCH Laser Particle Sizers to take advantage of the technical 

superiority of over 25 years of practical experience in determining particle 

size distributions. 

Today, the laser diffraction technology in a convergent laser beam introduced 

by FRITSCH is an international standard, and the models of the ANALYSETTE 22 

series are used as perfect assistants worldwide in research and development 

as well as in production and quality control. 

With the ANALYSETTE 12, FRITSCH also offers dynamic light scattering for use 

in the lower nanometre range. Easy to operate, fast and reliable. Request the 

separate leafl et for the Nano Particle Sizer ANALYSETTE 12 with dynamic light 

scattering. 

ANALYSETTE 12 

DynaSizer 

Dynamic light scattering 


MicroTec plus and NanoTec plus 

Static light scattering 

DynaSizer (0.001 – 6 µm) 

MicroTec plus (0.08 – 2000 µm) 

NanoTec plus (0.01 – 2000 µm) 

0.08 6 

2000 

0.001 0.01 0.10 1 10 100 1000 

10000 (µm) 

We are happy to advise you 

For all questions regarding FRITSCH laser particle sizing and its possible application, 

please feel free to contact our expert Dr. Günther Crolly. 

Just call! 

+49 67 84 70 138 

crolly@fritsch-laser.com 

www.fritsch-laser.com 

27

Fritsch GmbH 

Milling and Sizing 

Industriestrasse 8 

55743 Idar-Oberstein 

Germany 

Phone +49 67 84 70 0 

Fax +49 67 84 70 11 

info@fritsch.de 

www.fritsch.de 

www.fritsch-laser.com 

Concept and design: Zink & Kraemer AG, Trier · Cologne, www.zuk.de 

Produktlasere-11-04-5/P

ANALYSETTE 22 NanoTec - Fritsch - Malen en Zeven

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