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The <strong>Journal</strong> <strong>of</strong><br />

JULY/AUGUST 1999<br />

<strong>Vol</strong>ume 43 • Number 4<br />

IMAGING SCIENCE<br />

<strong>and</strong><br />

TECHNOLOGY<br />

IS&T<br />

The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>


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1. H. P. Le, Progress <strong>and</strong> trends in ink-jet printing technology, J. <strong>Imaging</strong> Sci. Technol. 42, 46 (1998).<br />

2. E. M. Williams, The Physics <strong>and</strong> <strong>Technology</strong> <strong>of</strong> Xerographic Processes, John Wiley <strong>and</strong> Sons, New York,<br />

1984, p. 30.<br />

3. G. K. Starkweather, Printing technologies for images, gray scale, <strong>and</strong> color, Proc. SPIE 1458, 120 (1991).<br />

4. L. T. Creagh-Dexter, Applications in commercial printing for hot melt ink-jets, in Proc. IS&T’s 10th Int’l.<br />

Congress on Adv. in Non-Impact Printing Technologies, IS&T, Springfield, VA 1994, pp. 446–448.<br />

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<strong>Vol</strong>. 43, No. 4, July/Aug. 1999 i


July/August 1999<br />

CODEN: JIMTEG 43(4) 309–404 (1999)<br />

ISSN: 1062-3701<br />

<strong>Vol</strong>ume 43, Number 4<br />

<strong>Journal</strong> <strong>of</strong><br />

IMAGING SCIENCE<br />

<strong>and</strong><br />

TECHNOLOGY<br />

Official publication <strong>of</strong> IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

CONTENTS<br />

Feature Article<br />

309 Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD (Digital Micromirror Device) <strong>and</strong> Laser Exposure Modules in<br />

Electrophotographic Printing<br />

John B. Allen <strong>and</strong> Albert B. S. Coit<br />

320 Particle Size Effects in Pigmented Inkjet Inks<br />

Alex<strong>and</strong>ra D. Bermel <strong>and</strong> D. E. Bugner<br />

325 Investigations <strong>of</strong> Nonreproducible Phenomena in Thermal Ink Jets with Real High-Speed Cine Photomicrography<br />

Christian Rembe, Stefan aus der Wiesche, Michael Beuten, <strong>and</strong> Eberhard P. H<strong>of</strong>er<br />

332 New Thermal Ink Jet Printhead with Improved Energy Efficiency Using Silicon Reactive Ion Etching<br />

Masahiko Fujii, Toshinobu Hamazaki <strong>and</strong> Kenji Ikeda<br />

339 Thermal Dye Transfer Printing with Chelate Compounds<br />

Takao Abe, Shigeru Mano, Yorihiro Yamaya, <strong>and</strong> Atsushi Tomotake<br />

345 Dot Allocations in Dither Matrix with Wide Color Gamut<br />

Ryoichi Saito <strong>and</strong> Hiroaki Kotera<br />

Supplemental materials—Figure 4 (in color) <strong>and</strong> Table III can be found on the IS&T website (www.imaging.org) <strong>and</strong> on the CD-ROM<br />

353 Symmetry Properties <strong>of</strong> Halftone Images I: Scattering Symmetry <strong>and</strong> Pattern Symmetry<br />

Jonathan S. Arney <strong>and</strong> Shinya Yamaguchi<br />

359 Symmetry Properties <strong>of</strong> Halftone Images II: Accounting for Ink Opacity <strong>and</strong> Dot Sharpness<br />

Jonathan S. Arney <strong>and</strong> Akio Tsujita<br />

365 Kubelka–Munk Theory <strong>and</strong> the Yule–Nielsen Effect on Halftones<br />

Jonathan S. Arney, Eric Pray <strong>and</strong> Katsuya Ito<br />

Contents continued<br />

ii<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>


Contents continued<br />

371 The Free Radicals <strong>and</strong> Iron <strong>of</strong> Photographic Gelatin Doped with Na 2<br />

S 2<br />

O 3<br />

Yi-heng Zhang, Ji Tan, Jie Li, Tian-tang Yan, Shu-qin Yu, Si-yong Zhuang <strong>and</strong> Bi-xian Peng<br />

375 Calculated Properties <strong>of</strong> Sulfur Centers on AgCl Cubic Surfaces<br />

Roger C. Baetzold<br />

382 The Measurement <strong>of</strong> Diffuse Optical Densities. Part II: The German St<strong>and</strong>ard Reference Densitometers<br />

Egbert Buhr, D. Hoeschen <strong>and</strong> D. Bergmann<br />

388 NIST Reference Densitometer for Visual Diffuse Transmission Density<br />

Edward A. Early, Christopher L. Cromer, Xiaoxiong Xiong, Daniel J. Dummer, Thomas R. O’Brian <strong>and</strong> Albert C. Parr<br />

398 Self-Excited Vibration Induced in Paper-Feed-Roller in Electrophotography Copy Machine<br />

Hiroyuki Kawamoto<br />

DEPARTMENTS<br />

iii<br />

Calendar<br />

403 Business Directory<br />

Calendar<br />

IS&T Meetings<br />

October 17–22, 1999—NIP15: The l5th International<br />

Congress on Digital Printing T echnologies, General<br />

Chair: Michael Lee, The Caribe Royal Resort Suites,<br />

Lake Buena Vista, Florida<br />

November 16–19, 1999—7th Color <strong>Imaging</strong> Conference—<br />

Color <strong>Science</strong>, Systems & Applications, cosponsored<br />

by the Society for Information Display;<br />

General Co-chairs: Jack Holm (IS&T) <strong>and</strong> Todd Newman<br />

(SID), The SunBurst Resort Hotel, Scottsdale, Arizona<br />

January 22–28, 2000—IS&T/SPIE Electronic <strong>Imaging</strong>:<br />

<strong>Science</strong> <strong>and</strong> <strong>Technology</strong>, General Co-chairs: John<br />

McCann (IS&T) <strong>and</strong> Giordano Beretta (SPIE), San Jose<br />

Convention Center, San Jose, California<br />

January 31–February 2, 2000— 11th International<br />

Symposium on Phot<strong>of</strong>inishing <strong>Technology</strong>, General<br />

Co-chairs: Steven Howe <strong>and</strong> Daniel English, co-located<br />

with the PMA Exhibition, Las Vegas, Nevada<br />

March 26–29, 2000—The PICS Conference, (IS&T’s<br />

53rd Annual Spring Conference), General chair: Jim<br />

Milch, The Portl<strong>and</strong> Marriott Hotel, Portl<strong>and</strong>, Oregon<br />

September 10–14, 2000—International Symposium<br />

on Silver Halide T echnologies, co-sponsored by<br />

SPSTJ, General Co-chairs: Rene DeKeyzer, Gary House,<br />

Melville Sahyun, <strong>and</strong> Tadaaki Tani, Resort Hotel Mont-<br />

Gabriel, Montreal (St. Adele), Quebec, Canada<br />

October 15–20, 2000—NIP16: The l6th International<br />

Congress on Digital Printing T echnologies, The<br />

Westin Bayshore, Vancouver, B.C., Canada<br />

November 6–10, 2000— 8th Color <strong>Imaging</strong> Confer -<br />

ence—Color <strong>Science</strong>, Systems, <strong>and</strong> Applications,<br />

co-sponsored by the Society for Information Display, The<br />

SunBurst Resort Hotel, Scotsdale, Arizona<br />

For more details, contact IS&T at<br />

703-642-9090; FAX: 703-642-9094;<br />

E-mail: info@imaging.org;<br />

or visit us at www.imaging.org<br />

For a more complete listing <strong>of</strong> other imaging conferences<br />

• Visit IS&T’s website: www.imaging.org<br />

• See the Other Meetings column in the member<br />

newsletter, IS&T Reporter<br />

• Request a printout via e-mail: info@imaging.org or<br />

fax: (703) 642-9094<br />

<strong>Vol</strong>. 43, No. 4, July/Aug. 1999 iii


The <strong>Journal</strong> <strong>of</strong><br />

<strong>Imaging</strong> <strong>Science</strong> <strong>and</strong><br />

<strong>Technology</strong> CD<br />

Editor: <strong>Vol</strong>ume 40, 1996—Vivian Walworth<br />

Editor: <strong>Vol</strong>ume 41, 1997—Melville R. V. Sahyun<br />

The <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong><br />

<strong>Technology</strong> is dedicated to the advancement<br />

<strong>of</strong> knowledge in the imaging<br />

sciences, in practical applications<br />

<strong>of</strong> such knowledge, <strong>and</strong> in related fields<br />

<strong>of</strong> study. The pages <strong>of</strong> this journal are<br />

open to reports <strong>of</strong> new theoretical or<br />

experimental results <strong>and</strong> to comprehensive<br />

reviews.<br />

<strong>Vol</strong>. 40, 1996 <strong>and</strong> <strong>Vol</strong>. 41, 1997<br />

now available on CD<br />

Cost is as follows: CD-ROM<br />

IS&T Member $45.00<br />

Non-member $55.00<br />

Institution $100.00<br />

<strong>Vol</strong>. 42, 1998 <strong>and</strong> <strong>Vol</strong>. 43, 1999<br />

available Spring, 2000<br />

1999 Honors <strong>and</strong> Awards Recipients<br />

More information regarding IS&T awards <strong>and</strong> the nomination form Honors <strong>and</strong> Awards for 2000<br />

can be found on the IS&T website, http://www.imaging.org. Click on Membership, then click on Honors <strong>and</strong> Awards.<br />

Honorary Member<br />

Robert Gundlach<br />

Edwin H. L<strong>and</strong> Award<br />

Robert W. Webb<br />

Chester F. Carlson Award<br />

David S. Weiss<br />

Leiven Gevaert Medal<br />

Vitaly Belous<br />

Kosar Memorial Award<br />

Jean Fréchet<br />

C. Grant Willson<br />

Hiroshi Ito<br />

Bowman Award<br />

Jeff B. Pelz<br />

Fellowship<br />

Gary L. House<br />

Hiroyuki Kawamoto<br />

Mitsuo Kawasaki<br />

Robert J. Nash<br />

John Texter<br />

<strong>Journal</strong> Award (<strong>Science</strong>)<br />

Koichi Iino<br />

Roy S. Berns<br />

Charles E. Ives Award<br />

Juha Katajamäki<br />

Hannu J. Saarelma<br />

Itek Award<br />

Angela F. Marks<br />

Senior Member<br />

David Q. McDowell<br />

Service Awards<br />

James C. King<br />

Jeffrey Seideman<br />

Raymond Davis Scholarship<br />

Kishwar Ahsan<br />

Benjamin Spead<br />

iv<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Feature Article<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD<br />

(Digital Micromirror Device) <strong>and</strong> Laser Exposure Modules in<br />

Electrophotographic Printing<br />

John B. Allen <strong>and</strong> Albert B. S. Coit<br />

Raytheon TI Systems, Plano, Texas*<br />

DMD <strong>and</strong> laser exposure modules are compared with respect to the formation <strong>of</strong> a single pixel on the photoconductor . Toner<br />

development is assumed to neutralize the normal component <strong>of</strong> the electric field above the photoconductor at the location <strong>of</strong> the<br />

toner about to be developed. This field is produced by bias voltages, the single pixel latent image, <strong>and</strong> toner already developed.<br />

Care is taken in predicting development <strong>of</strong> the second layer <strong>of</strong> toner to assume that the latent image is on the surface <strong>of</strong> the<br />

photoconductor <strong>and</strong> the first layer <strong>of</strong> toner is above the surface <strong>of</strong> the photoconductor . The predicted toner development is in<br />

accord with the experimental data. The analysis shows that the normal component <strong>of</strong> the electric field for single pixel development<br />

produced by a 600 dpi DMD exposure module is stronger than the corresponding field <strong>of</strong> an 85 µm wide Gaussian pixel<br />

produced by a laser exposure module. Therefore, toner development resulting from the DMD exposure module is more stable,<br />

smaller, <strong>and</strong> more compact on the photoconductor than the toner developed image produced by the corresponding laser exposure<br />

module. Comparing theory with experimental data where the exposure <strong>of</strong> the photoconductor by the DMD exposure module is<br />

varied, suggests that toner development only begins after a threshold electric field is reached. Justification for a threshold<br />

behavior is given.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 309–319 (1999)<br />

Introduction<br />

The DMD (digital micromirror device) is a digitally controlled<br />

two dimensional spatial light modulator invented<br />

at Texas Instruments. 1,2 The idea <strong>of</strong> using a DMD in an<br />

exposure module <strong>of</strong> an electrophotographic printer has<br />

been suggested. 3–6 The DMD spatially modulates a beam<br />

<strong>of</strong> light with the information needed to form a desired<br />

print. The modulated light exposes the photoconductor<br />

<strong>of</strong> the electrophotographic printer. It is an optical system<br />

with no macroscopic moving parts such as a rotating<br />

polygon scanner required by a conventional laser<br />

exposure module. We predict the light intensity distribution<br />

<strong>of</strong> a single pixel on the photoconductor produced<br />

by a DMD exposure module <strong>and</strong> an 85 µm wide (measured<br />

at the 1/e 2 points) Gaussian pixel, typical <strong>of</strong> today’s<br />

600 dpi laser exposure module. The toner distributions<br />

on the photoconductor produced by the DMD exposure<br />

module have been experimentally measured. The exposures<br />

range from low to fully saturated. In order to predict<br />

the development <strong>of</strong> single pixels on the<br />

photoconductor, we extend Schein’s equilibrium theory<br />

<strong>of</strong> development <strong>of</strong> solid areas. 7,8 The extension accounts<br />

for the weakening <strong>of</strong> the field <strong>of</strong> the latent image as the<br />

location where the toner develops further away from the<br />

photoconductor surface due to the growth in height <strong>of</strong><br />

Original manuscript received January 12, 1998<br />

* The work presented in this paper was done by the authors<br />

while employed at Texas Instruments, Inc., Dallas, Texas.<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

the pile <strong>of</strong> toner comprising the pixel. The single pixel<br />

latent image fields weaken above the photoconductor<br />

due to their high spatial frequency content. Because we<br />

are dealing with single pixels rather than solid areas,<br />

the build up <strong>of</strong> charge on the carrier is not significant<br />

because a single pixel latent image removes much less<br />

toner from the carrier than a solid area latent image.<br />

The extended equilibrium theory closely matches the<br />

experiment at higher exposures. The theory predicts<br />

more toner to be developed than is actually observed at<br />

low exposures. We suggest that the deviation is due to<br />

the transient effect <strong>of</strong> toner being driven up into the<br />

magnetic bush prior to development, thus reducing the<br />

amount <strong>of</strong> toner available for development in the single<br />

pixel. This is the first time, to our knowledge, that a<br />

theory <strong>of</strong> electrophotographic development is able to<br />

semiquantitatively account for single pixel development.<br />

We apply the theory to compare development <strong>of</strong> a single<br />

pixel by a DMD <strong>and</strong> laser exposure module.<br />

DMD <strong>and</strong> Laser Exposure Modules . A DMD exposure<br />

module, depicted in Fig. 1, consists <strong>of</strong> a source <strong>of</strong><br />

illumination or an illuminator, the DMD <strong>and</strong> a projection<br />

lens. The light from the illuminator falls on the<br />

DMD. The illuminator produces sufficiently uniform illumination<br />

to ensure that there are no artifacts in the<br />

final print to nonuniform illumination. The DMD consists<br />

<strong>of</strong> a matrix <strong>of</strong> individually addressable miniature<br />

mirrors called “micromirrors” as shown in Fig. 2. A<br />

micromirror is a square mirror that is 16 µm on the side.<br />

The center-to-center spacing <strong>of</strong> the micromirrors is 17<br />

µm. The micromirrors rotate about the diagonal shown<br />

309


1<br />

Figure 1. Schematic <strong>of</strong> the DMD exposure module.<br />

64<br />

in Fig. 3 to two discrete <strong>and</strong> stabile angular displacements<br />

which are +10 <strong>and</strong> –10° with respect to the plane<br />

<strong>of</strong> the DMD. The angular displacement <strong>of</strong> +10 ° is referred<br />

to as the “on” position <strong>and</strong> the angular displacement<br />

<strong>of</strong> –10 ° is referred to as the “<strong>of</strong>f” position. The<br />

direction <strong>of</strong> the incident illumination upon the DMD,<br />

namely 20°, is chosen so that when a micromirror in<br />

the “on” position is illuminated, the axis <strong>of</strong> the cone <strong>of</strong><br />

light reflected from the micromirror is parallel to the<br />

optical axis <strong>of</strong> the projection lens as shown in Fig. 3.<br />

When a micromirror in the “<strong>of</strong>f” position is illuminated,<br />

the axis <strong>of</strong> the cone <strong>of</strong> reflected light from the<br />

micromirror makes an angle <strong>of</strong> 40° with respect the optical<br />

axis <strong>of</strong> the projection lens <strong>and</strong> thus is reflected<br />

around the lens. The projection lens images a<br />

micromirror in the “on” position onto the photoconductor<br />

forming a pixel on the photoconductor. The light from a<br />

micromirror in the “<strong>of</strong>f” position is reflected through a<br />

large angle <strong>and</strong> out <strong>of</strong> the optical system <strong>and</strong>, therefore,<br />

no micromirror image is formed. Hence, the DMD<br />

is a two dimensional light switch that can selectively<br />

illuminate pixels on the photoconductor. The number <strong>of</strong><br />

columns <strong>of</strong> micromirrors on the DMD is equal to the<br />

number pixels across the print, namely 7056, which for<br />

600 dpi, equates to 11.76 in. wide. The number <strong>of</strong> rows,<br />

in this case 64, is equal to the number <strong>of</strong> possible sequential<br />

exposures per pixel as the photoconductor drum<br />

turns.<br />

Let us compare the laser exposure module shown schematically<br />

in Fig. 4 with the DMD exposure module<br />

shown in Fig. 1. The DMD exposure module images the<br />

micromirrors onto the photoconductor as shown. The<br />

projection lens can be thought <strong>of</strong> as a pair <strong>of</strong> collimating<br />

lenses. The first collimating lens collimates a point<br />

source in the micromirror plane. The second lens focuses<br />

the collimated beam onto the photoconductor. The separation<br />

between the two lenses is not critical so long as<br />

the rays entering the first lens all pass through the second<br />

lens. The two lenses are generally placed as close<br />

together as possible in a single unit to form the projection<br />

lens. To have a high resolution imaging system, the<br />

diameter <strong>of</strong> the lens is made large enough to increase<br />

resolution due to the diffraction limit. The maximum<br />

diameter <strong>of</strong> the lens is limited by the geometric aberrations<br />

that increase as the diameter increases <strong>and</strong> the<br />

depth <strong>of</strong> field which decreases as the diameter increases.<br />

The depth <strong>of</strong> field requirements are set by the maximum<br />

runout <strong>of</strong> the drum. W e found the best compromise<br />

<strong>of</strong> these parameters to be a 1 in. diam. f/5.6<br />

Figure 2. Schematic <strong>of</strong> the DMD showing 7056 columns <strong>and</strong><br />

64 rows <strong>of</strong> micromirrors.<br />

Figure 3. Sketch showing the direction <strong>of</strong> reflection <strong>of</strong> the illumination<br />

from a micromirror in the on <strong>and</strong> <strong>of</strong>f positions.<br />

projection lens for a 600 dpi DMD printer . The projection<br />

lens magnified each micromirror so that the center<br />

to center spacing <strong>of</strong> the micromirror images on the<br />

photoconductor was 1/600 in.<br />

Unlike the DMD exposure module, the laser exposure<br />

module requires a scanner to move the focussed laser<br />

beam across the photoconductor. The rotating polygon<br />

scanner is an economically feasible <strong>and</strong> currently available<br />

scanner that can scan the beam fast enough for<br />

use in a printer. In order for the writing beam to be on a<br />

planar rather than a spherical surface at the photoconductor,<br />

it is necessary that the beam be collimated in<br />

the direction <strong>of</strong> scan when it falls on the rotating poly-<br />

310 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Allen <strong>and</strong> Coit


Figure 4. Schematic <strong>of</strong> a laser exposure module.<br />

gon scanner. To attain collimation, the laser beam is<br />

focussed in the focal plane <strong>of</strong> collimating lens 1 as shown<br />

in Fig. 4. The beam is reflected by the scanner <strong>and</strong> is<br />

focussed by collimating lens 2 onto the photoconductor.<br />

Like the DMD exposure module, the laser exposure<br />

module has a projection lens that can be thought <strong>of</strong> as a<br />

pair <strong>of</strong> collimating lenses. Unlike the DMD exposure<br />

module, a rotating polygon scanner must be inserted<br />

between the two components <strong>of</strong> the projection lens in<br />

order to scan the laser beam across the photoconductor.<br />

In the scanning system configured as shown in Fig. 4,<br />

the height <strong>of</strong> the rotating polygon scanner must at least<br />

equal the diameter <strong>of</strong> the projection lens so that all <strong>of</strong><br />

the light entering the lens is scanned. If a 1 in. diam.<br />

f/5.6 lens analogous to the imaging lens in the DMD exposure<br />

module were used, the height <strong>of</strong> the rotating<br />

polygon scanner would have to be at least 1 in. This<br />

would result in a large <strong>and</strong> expensive polygon scanner.<br />

The height restriction <strong>of</strong> the polygon scanner can be<br />

overcome 13 by placing a cylindrical lens after collimating<br />

lens 1 in Fig. 4 to focus the laser beam in the cross<br />

scan direction onto the face <strong>of</strong> the scanner. A second cylindrical<br />

lens is placed before collimating lens 2 to image<br />

the scanner face in the cross scan direction onto the<br />

photoconductor. As pointed out by Holl<strong>and</strong>, 13 this arrangement<br />

also reduces distortion due to scanner<br />

wobble. Apertures or masks can be placed in the focal<br />

plane <strong>of</strong> the focussing lens to alter the Gaussian distribution<br />

<strong>of</strong> the laser beam <strong>and</strong> increase its spatial frequency<br />

content. However the scanner <strong>and</strong> optics must<br />

be designed to pass the increased spatial frequency content<br />

onto the photoconductor. It is clear that multiple<br />

addressing or the exposure <strong>of</strong> an adjacent pixel affect<br />

the final toner distribution <strong>of</strong> a given pixel for either a<br />

laser or DMD exposure module. However , only single<br />

isolated pixels are treated here <strong>and</strong> adjacent pixel effects<br />

<strong>and</strong> the formulation <strong>of</strong> screens are beyond the scope<br />

<strong>of</strong> this particular study.<br />

The salient difference between the DMD <strong>and</strong> the laser<br />

exposure module is that the DMD exposure module<br />

requires no scanner <strong>and</strong> therefore the diameter <strong>and</strong><br />

hence the resolution <strong>of</strong> the projection lens is not limited<br />

by the scanner aperture. The problems <strong>of</strong> preserving<br />

single pixel spatial frequency content in the presence <strong>of</strong><br />

an aperture restricting rotating polygon scanner <strong>and</strong> the<br />

jitter <strong>and</strong> wobble included with that scanner are nonexistent<br />

in DMD exposure module.<br />

Comparison <strong>of</strong> the Resolution <strong>of</strong> the Single Pixel<br />

DMD <strong>and</strong> Laser Exposure Module Images. Figure 5<br />

compares the single pixel image (predicted 9 <strong>and</strong> experimentally<br />

measured) produced by a 600 dpi DMD exposure<br />

module to that produced by a laser exposure module.<br />

The spatial intensity distribution <strong>of</strong> the laser exposure<br />

module image is taken to be a Gaussian function whose<br />

width is 85 µm (full width at 1/e 2 points). The dip in the<br />

center <strong>of</strong> the micromirror image results from a 3 µm hole<br />

in the center <strong>of</strong> the micromirror placed there for manufacturing<br />

reasons. The images are normalized to the same<br />

spatially integrated intensity, i.e., the same power in both<br />

beams. Note that the DMD exposure module produces a<br />

tighter <strong>and</strong> more intense single pixel image than does<br />

the laser exposure module.<br />

To illustrate the difference between the DMD exposure<br />

module <strong>and</strong> the above laser exposure module in<br />

terms <strong>of</strong> resolution, we reduce the aperture <strong>of</strong> the DMD<br />

projection lens from 1 to 0.3 in. Reduction <strong>of</strong> the aper -<br />

ture <strong>of</strong> the DMD projection lens from 1 to 0.3 in. results<br />

in a reduction <strong>of</strong> the resolving power <strong>of</strong> the lens. An 85<br />

µm wide laser exposure module image is shown in Fig.<br />

6 along with the image produced by the reduced aper -<br />

ture DMD exposure module. Note that the single pixel<br />

DMD exposure is not as compact as it is in Fig. 5. The<br />

single pixel image produced by the reduced aperture<br />

DMD exposure module is virtually identical to the single<br />

pixel image produced by this laser exposure module. The<br />

essential difference in the image produced by DMD <strong>and</strong><br />

this laser exposure module is that the DMD exposure<br />

module is capable <strong>of</strong> producing a higher resolution single<br />

pixel image.<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD ...Electrophotographic Printing <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 311


Figure 5. Comparison <strong>of</strong> a single pixel image made by a 600 dpi DMD <strong>and</strong> a laser exposure module with an 85<br />

Gaussian beam.<br />

µm wide<br />

Figure 6. Comparison <strong>of</strong> a single pixel image made by a DMD exposure module with a reduced aperture <strong>and</strong> a laser exposure<br />

module with an 85 µm wide Gaussian beam.<br />

Computation <strong>of</strong> the Normal Component <strong>of</strong> the Electric<br />

Field due to the Latent Image at a Given Height<br />

Above the Photoconductor. We shall now compute the<br />

normal component <strong>of</strong> the electric field at a height h above<br />

the photoconductor produced by a single pixel latent image<br />

created by both a DMD exposure module <strong>and</strong> laser<br />

exposure module. We extend the air gap model shown in<br />

Fig. 7 <strong>and</strong> described by Schein 10 for solid area development<br />

to the problem <strong>of</strong> single pixel development. The<br />

ground plane is located at z = 0 <strong>and</strong> has a voltage equal<br />

to 0. The photoconductor has a thickness L <strong>and</strong> a dielectric<br />

K a as shown. There is a small air gap <strong>of</strong> height δ a<br />

with dielectric constant K b equal to unity between the<br />

photoconductor <strong>and</strong> the toner–carrier mix <strong>of</strong> dielectric<br />

constant K c . The developmental electrode resides at a distance<br />

M from the conductor. Schaffert 11 states the equations<br />

to find the electric field in the center layer <strong>of</strong> a three<br />

layer dielectric shown in Fig. 7 due to a one dimensional<br />

cosinusoidal charge distribution on the photoconductor.<br />

The relationship between the electric field <strong>and</strong> the charge<br />

distribution is linear implying that the relationship between<br />

an arbitrary charge distribution <strong>and</strong> the corresponding<br />

electric field can be calculated by convolving<br />

the charge distribution with an appropriate two dimensional<br />

spatial impulse response. W e shall now find the<br />

transfer function corresponding to this impulse response<br />

by applying Schaffert’s equations.<br />

First, we calculate the normal component <strong>of</strong> the electric<br />

field in the air gap due to a cosinusoidal charge density<br />

in the x 0 direction as shown in Fig. 8. The x 0 direction<br />

makes an angle θ with the x-axis. The x-axis is in the<br />

cross-process dimension <strong>and</strong> the y-axis is in the process<br />

dimension. We express the cosinusoidal charge density<br />

in the (x, y) coordinate system. Let the charge distribution<br />

σ(x 0 , y 0 ) (coulombs/m 2 ) on the photoconductor be<br />

given by:<br />

σ( x , y ) = cos( 2πfx<br />

)<br />

(1)<br />

0 0 0<br />

312 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Allen <strong>and</strong> Coit


Figure 7. Schematic <strong>of</strong> air gap model used in the analysis.<br />

Figure 8. Spatial coordinates on the photoconductor used in<br />

the analysis.<br />

The factor f (cycles per meter) is the spatial frequency <strong>of</strong><br />

the cosine wave. We find the potentials ( V a , V b , V c ) in the<br />

three regions (a, b, c) <strong>of</strong> Fig. 7 with the solution <strong>of</strong> Laplace’ s<br />

equation for the charge density σ(x 0 , y 0 ) as follows 11 :<br />

2πfz<br />

−2πfz<br />

Va<br />

= [ A1<br />

( f) e + A2<br />

( f) e ]cos( 2πfx0<br />

)<br />

2πfz<br />

−2πfz<br />

V = [ B ( f) e + B ( f) e ]cos( 2π fx ) (2)<br />

b<br />

1<br />

2<br />

0<br />

2πfz<br />

2<br />

−2πfz<br />

2π<br />

0<br />

V = [ C ( f) e + C ( f) e ]cos( fx )<br />

c<br />

1<br />

The normal component <strong>of</strong> the electric field E bn0 in the<br />

air gap (region b) is obtained by differentiating V b with<br />

respect to z:<br />

2πfz<br />

−2πfz<br />

E =−2πf[ B ( f) e −B ( f) e ]cos( 2πfx<br />

) (3)<br />

bn0 1<br />

We now rotate the coordinate system (x 0 , y 0 ) through<br />

an angle θ into the (x, y) coordinate system. We obtain<br />

the field E bn as follows:<br />

2πfz<br />

Ebn<br />

= 2πf[ B1<br />

( f) e − B2<br />

( f) e ]cos[ 2πfxcos( θ)<br />

+<br />

(4)<br />

2πfysin( θ)]<br />

2<br />

−2πfz<br />

Now make the following definitions:<br />

so that E bn becomes:<br />

fx<br />

= f cos( θ) fy<br />

= f sin( θ)<br />

2 2 (5)<br />

ρ = f + f<br />

x<br />

y<br />

2πρz<br />

−2πρz<br />

Ebn<br />

= 2πρ[ B1<br />

( ρ) e − B2<br />

( ρ) e ]cos( 2πfxx+<br />

2πfyy) (6)<br />

By definition from Eq. 6, the transfer function H na (f x ,<br />

f y ) relating the normal component <strong>of</strong> the electric field to<br />

the two dimensional charge density on the<br />

photoconductor is:<br />

2πρz<br />

−2πρz<br />

Hna( fx , fy<br />

) = 2πρ[ B1<br />

( f) e −B2<br />

( f) e ]<br />

With respect to Fig. 7, we can apply the following<br />

boundary conditions to obtain B 1 (ρ) <strong>and</strong> B 2 (ρ):<br />

0<br />

(7)<br />

1. The voltage at z = 0 is zero <strong>and</strong> the voltage at z = M<br />

is V 0<br />

.<br />

2. The potential is continuous across the dielectric<br />

boundary.<br />

3. The change in the normal component <strong>of</strong> electric<br />

displacement at a dielectric boundary is equal to the<br />

charge density at the boundary.<br />

Theory <strong>of</strong> Toner Distribution <strong>of</strong> Single Pixels on<br />

the Photoconductor. We extend Schein’s theory <strong>of</strong><br />

solid area development to predict the development <strong>of</strong><br />

single pixels. In that theory, Schein 10 compares the forces<br />

attracting the toner to the photoconductor <strong>and</strong> the forces<br />

attracting the toner to the carrier. Schein assumes that<br />

development occurs if the forces attracting the toner to<br />

the photoconductor exceed the forces attracting the toner<br />

to the carrier taking into account the build up <strong>of</strong> charge<br />

on the carrier bead. The build up <strong>of</strong> charge on the car -<br />

rier does not significantly restrict development <strong>of</strong> single<br />

pixels because the amount <strong>of</strong> toner removed from a carrier<br />

by a single pixel is much less than the toner removed<br />

by a solid area. We extend Schein’s approach to<br />

include the degradation <strong>of</strong> the electric field produced<br />

by a single pixel latent image as development occurs<br />

further from the photoconductor. The first layer <strong>of</strong> toner<br />

senses the electric field at a height above the photoconductor<br />

approximately equal to the radius <strong>of</strong> the toner<br />

which is four µm for eight µm diameter toner. The second<br />

layer <strong>of</strong> toner senses the field at a height above the<br />

photoconductor that is approximately the toner radius<br />

above the first layer, or 12 µm above the photoconductor.<br />

The single pixel latent image field has high spatial frequency<br />

content <strong>and</strong> therefore weakens as the height<br />

above the photoconductor increases. As the pile <strong>of</strong> toner<br />

becomes higher, the latent image field weakens <strong>and</strong> the<br />

force <strong>of</strong> the already developed toner strengthens thus<br />

terminating further development.<br />

Calculations <strong>of</strong> Single Pixel T oner Distributions<br />

for DMD <strong>and</strong> Laser Exposure Modules. We predict<br />

<strong>and</strong> compare the toner distributions for single pixel development<br />

produced by both DMD <strong>and</strong> laser exposure<br />

modules at an exposure <strong>of</strong> 0.0021 J/m 2 . We assume that<br />

the DMD exposure module images 16 µm micromirrors<br />

on 17 µm centers imaged to 1/600 in. at the photoconductor<br />

surface. We assume that the laser exposure module<br />

creates an 85 µm wide Gaussian beam at the 1/e 2<br />

points at the photoconductor surface. We also assume 8<br />

µm toner particles <strong>and</strong> a high sensitivity photoconductor.<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD ...Electrophotographic Printing <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 313


Figure 9. Comparison <strong>of</strong> the normal components <strong>of</strong> the E-fields for a DMD <strong>and</strong> the assumed laser exposer module at height <strong>of</strong> 4<br />

microns above the PC.<br />

Figure 10. Comparison <strong>of</strong> the normal components <strong>of</strong> the E-fields for a DMD <strong>and</strong> the assumed laser exposer module at height <strong>of</strong><br />

12 microns above the PC.<br />

Figure 9 compares the normal component <strong>of</strong> the latent<br />

image electric field at a height <strong>of</strong> 4 µm above the<br />

photoconductor where development <strong>of</strong> the first layer <strong>of</strong><br />

toner occurs for both the DMD <strong>and</strong> laser exposure modules.<br />

Similarly, Fig. 10 compares the normal component<br />

<strong>of</strong> the latent image electric field at a height <strong>of</strong> 12 µm<br />

above the photoconductor where development <strong>of</strong> the second<br />

layer <strong>of</strong> toner occurs for both exposure modules. Note<br />

that fields produced by the DMD exposure module are<br />

stronger <strong>and</strong> more concentrated than the fields produced<br />

by the laser exposure module. In addition, the top <strong>of</strong><br />

the electric field produced by the DMD exposure module<br />

is flat as shown in Fig. 9. The flat top is a result <strong>of</strong><br />

the hole in the micromirror as described earlier <strong>and</strong><br />

<strong>and</strong> will promote uniform toner development. Figure 11<br />

compares the image on the photoconductor <strong>of</strong> a micromirror<br />

with <strong>and</strong> without a hole present. The image <strong>of</strong><br />

the hole is apparent. Figure 12 compares the normal<br />

component <strong>of</strong> the electric field at 4 µm above the<br />

photoconductor resulting from the im ages shown in<br />

Fig. 11. Note that flat top is present in the electric<br />

field created by micromirror with the hole present.<br />

The hole in the micromirror creates an object for<br />

the projection lens that has higher spatial frequency<br />

content than the object created by the micromirror with<br />

no hole. Hence image <strong>of</strong> the micromirror with the hole<br />

has higher spatial frequencies than the micromirror<br />

without the hole as is apparent from Fig. 1 1. Because<br />

the transfer function relating the micromirror image to<br />

the normal component <strong>of</strong> the electric field is lowpass,<br />

the field produced by the micromirror with the hole also<br />

has higher spatial frequencies i.e., a flat rather than a<br />

rounded top.<br />

Figures 13 <strong>and</strong> 14 show the predicted toner distribution<br />

in the first two layers <strong>of</strong> toner for the DMD <strong>and</strong><br />

laser exposure module pixels, respectively. Each square<br />

corresponds to the space taken by an 8 µm toner particle.<br />

The development <strong>of</strong> the first layer is predicted by<br />

computing the net electric field sensed by the toner particle<br />

at its center, namely, 4 µm above the photoconductor<br />

for an 8 µm toner diameter. The net electric field consists<br />

<strong>of</strong> the bias field <strong>and</strong> the latent image field. The<br />

314 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Allen <strong>and</strong> Coit


Figure 11. Comparison <strong>of</strong> the single pixel intensity distribution on the PC produced by a micromirror with <strong>and</strong> without a hole.<br />

Figure 12. Comparision <strong>of</strong> the normal component <strong>of</strong> the electic field <strong>of</strong> a single pixel produced by a micromirror with <strong>and</strong> without<br />

a hole.<br />

Figure 13. Location <strong>of</strong> toner particles on the photoconductor<br />

in the first <strong>and</strong> second layers <strong>of</strong> the DMD pixel. Each square<br />

corresponds to one toner particle. The solid squares represent<br />

the x <strong>and</strong> y location <strong>of</strong> the toner particles in both the first <strong>and</strong><br />

second layers. The crosses represent the location <strong>of</strong> toner particles<br />

in the first layer only.<br />

Figure 14. Location <strong>of</strong> toner particles on the photoconductor<br />

in the first <strong>and</strong> second layers <strong>of</strong> the laser pixel. Each square<br />

corresponds to one toner particle. The solid squares represent<br />

the x <strong>and</strong> y location <strong>of</strong> the toner particles in both the first <strong>and</strong><br />

second layers. The crosses represent the location <strong>of</strong> toner particles<br />

in the first layer only.<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD ...Electrophotographic Printing <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 315


Figure 15. Normal component <strong>of</strong> the electric field due to the latent image at heights above the photoconductor where development<br />

takes place for a single pixel 0.3 mm in diameter.<br />

Figure 16. Normal component <strong>of</strong> the electric field acting on the toner particles in the second <strong>and</strong> third layers <strong>of</strong> toner along a<br />

diameter <strong>of</strong> the 0.3 mm pixel.<br />

predicted development <strong>of</strong> the second layer is achieved<br />

in a similar manner except that the fields are computed<br />

at a height <strong>of</strong> 12 µm above the photoconductor <strong>and</strong> the<br />

repelling field <strong>of</strong> the first layer <strong>of</strong> toner is included. No<br />

third layer is predicted for either exposure module because<br />

the force repelling toner attempting to develop in<br />

the third layer due to the electric field <strong>of</strong> the toner in<br />

the first two layers exceeded the force attracting the<br />

toner to the photoconductor . The predicted developed<br />

area <strong>of</strong> the first layer <strong>of</strong> the DMD pixel is 50% <strong>of</strong> the<br />

predicted area <strong>of</strong> the laser pixel. The second layers are<br />

comparable in size. The DMD developed pixel is smaller<br />

with steeper sides than the laser produced pixel. This<br />

is in accord with our observations.<br />

Predictions Using Extended Equilibrium Theory<br />

<strong>of</strong> Toner Distributions in Solid Areas. We applied<br />

the extended equilibrium theory <strong>of</strong> development to solid<br />

areas <strong>of</strong> diameter 0.3 mm <strong>and</strong> 2.0 mm. Figure 15 depicts<br />

the latent image field as a function <strong>of</strong> displacement<br />

across the 0.3 mm pixel at the heights above the<br />

photoconductor where toner development takes place.<br />

Note that the reduction in field strength as height above<br />

the photoconductor increases <strong>and</strong> is less severe for the<br />

0.3 mm area than the single pixel case depicted in Figs.<br />

9 <strong>and</strong> 10. The field created by the large area has a lower<br />

spatial frequency content than the field created by the<br />

single pixel <strong>and</strong> hence degrades less as the height <strong>of</strong><br />

the photoconductor increases. Figure 16 shows the total<br />

field acting on the toner at locations where the second<br />

<strong>and</strong> third layers are formed. The field acting on the<br />

toner is the sum <strong>of</strong> the attracting latent image field <strong>and</strong><br />

the repelling field <strong>of</strong> previously developed toner. Because<br />

the field is positive for the second <strong>and</strong> third layers, toner<br />

development will take place in the first three layers.<br />

The field acting on the fourth layer was entirely negative<br />

<strong>and</strong> hence no fourth layer is developed. Figure 17<br />

describes the latent image field as function <strong>of</strong> displacement<br />

across the 2.0 mm solid at the heights above the<br />

photoconductor where toner development takes place.<br />

The drop <strong>of</strong>f <strong>of</strong> the field strength as the height above<br />

the photoconductor is increased, is even less than that<br />

incurred by the 0.3 mm solid area. Figure 18 shows the<br />

net field acting at the locations above the photoconductor<br />

316 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Allen <strong>and</strong> Coit


Figure 17. Normal component <strong>of</strong> the electric field acting on the toner particles in the second to the third layers <strong>of</strong> toner along a<br />

diameter <strong>of</strong> the 2 mm pixel.<br />

Figure 18. Normal component <strong>of</strong> the electric field acting on the toner particles in the second to the third layers <strong>of</strong> toner along a<br />

diameter <strong>of</strong> the 2 mm pixel.<br />

where the second <strong>and</strong> third layers will develop. Two complete<br />

layers <strong>and</strong> a portion <strong>of</strong> a third layer around the<br />

edges <strong>of</strong> the area develop. The field acting on the fourth<br />

layer was negative across the pixel so that no fourth<br />

layer was formed. The development <strong>of</strong> toner in the large<br />

pixels representing solid areas in the limit, shown in<br />

Figs. 16 <strong>and</strong> 18, is consistent with the experiment.<br />

Measurements <strong>of</strong> Single Pixels. We carried out<br />

halftoning experiments to investigate the properties <strong>of</strong><br />

single pixels formed by DMD exposure modules. The<br />

measurements were made on the image evaluation<br />

breadboard (IEB), which is a custom designed testbed.<br />

The IEB is an optical bench that holds all <strong>of</strong> the electrophotographic<br />

subsystems, including the DMD exposure<br />

module. All subsystems are cantilevered for easy access,<br />

<strong>and</strong> can be mounted at various locations around the<br />

photoconductor. A CCD camera acquires the developed<br />

image on the photoconductor. The image is digitized <strong>and</strong><br />

stored for evaluation.<br />

We used a two component developer <strong>and</strong> a high sensitivity<br />

OPC for the tests. The toner diameter was 8 µm.<br />

We charged the OPC to –800V <strong>and</strong> set the bias set to<br />

–650V. We adjusted the optics for a 600 dpi resolution<br />

<strong>and</strong> best focus. We measured toner concentration (TC)<br />

<strong>and</strong> Q/M <strong>of</strong> the developer with a blow<strong>of</strong>f device. It was<br />

verified that the values <strong>of</strong> TC <strong>and</strong> Q/M remained constant<br />

throughout the experiment.<br />

The test pattern used to create the single pixels consisted<br />

<strong>of</strong> every fourth pixel being turned on. Pixels were<br />

built up by gradually increasing the light intensity until<br />

the OPC was well into saturation. Discharge area<br />

development was used to develop the single pixel test<br />

pattern on the OPC. Images <strong>of</strong> pixels created at the various<br />

intensity levels were captured <strong>and</strong> stored.<br />

Figures 19 to 21 are sample photographs <strong>of</strong> pixels<br />

toned on the OPC. An example <strong>of</strong> pixels created with a<br />

small amount <strong>of</strong> light is shown in Fig. 19. The exposure<br />

was 1.1 mJ/m 2 , this corresponded to the midpoint <strong>of</strong> the<br />

linear region <strong>of</strong> the photoinduced discharge curve. An<br />

example <strong>of</strong> pixels created with an intermediate amount<br />

<strong>of</strong> light is shown in Fig. 20. In this case exposure was<br />

2.2 mJ/m 2 . The pixel diameter is on the order <strong>of</strong> 60 µm.<br />

This corresponds to the optimum 600 dpi dot size. An<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD ...Electrophotographic Printing <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 317


Figure 19. Single pixels created with small amount <strong>of</strong> light.<br />

Mean diam. = 40 µm.<br />

Figure 21. Single pixels created with large amount <strong>of</strong> light.<br />

Mean diam. = 73 µm.<br />

Figure 20. Single pixels created with intermediate amount <strong>of</strong><br />

light. Mean diam. = 60 µm.<br />

example <strong>of</strong> pixels created with a large amount <strong>of</strong> light<br />

is shown in Fig. 21, where exposure was 4.5 mJ/m 2 ,<br />

which is well into the saturation region <strong>of</strong> the OPC. The<br />

pixel diameter is on the order <strong>of</strong> 73 µm.<br />

Figure 22 compares the experimentally measured<br />

pixel diameter with the predicted diameter . The predicted<br />

diameter is taken to be the diameter <strong>of</strong> the first<br />

layer <strong>of</strong> toner. The distribution <strong>of</strong> the first layer <strong>of</strong> toner<br />

was predicted in the same manner as in Figs. 13 <strong>and</strong><br />

14. A toner particle is developed if the net electric field<br />

sensed by the toner at its center i.e., at a height <strong>of</strong> 4<br />

µm above the photoconductor for the first layer , attracts<br />

the toner to the photoconductor . Note that the<br />

predicted diameter is greater than the experimentally<br />

measured diameter at the low exposures. At higher<br />

exposures, the curves are somewhat closer together .<br />

We suggest that this deviation from theory at lower<br />

exposure pixels may be explained by the following reasoning.<br />

Prior to the development <strong>of</strong> a single pixel, the<br />

magnetic brush passes over areas <strong>of</strong> the photoconductor<br />

with no exposure. The bias electric field in these<br />

areas prevents development <strong>and</strong> drives the toner up<br />

into the brush. When the brush passes over the por -<br />

tion <strong>of</strong> the photoconductor exposed as a single pixel,<br />

the lack <strong>of</strong> toner at the interface <strong>of</strong> the brush <strong>and</strong> the<br />

exposed photoconductor reduces the amount <strong>of</strong> toner<br />

developed. At high exposures, the field <strong>of</strong> the latent<br />

image is strong enough to pull more toner down the<br />

brush to be developed. No attempt is made in this study<br />

to model this effect. Jen <strong>and</strong> Lubinsky 12 discuss the<br />

transient effects in development <strong>of</strong> a line. This effect<br />

is the source <strong>of</strong> the well known trailing edge <strong>and</strong> leading<br />

edge deletion <strong>of</strong> magnetic brush development.<br />

The experimentally observed pixels can be interpreted<br />

in terms <strong>of</strong> a threshold on the electric field computed at<br />

the center <strong>of</strong> the toner in the first layer which is 4 µm<br />

above the photoconductor for our experimental data. If<br />

at a given location on the photoconductor the field is<br />

greater than the threshold, we declare toner development<br />

at that location. If the field is less than the threshold,<br />

no toner is developed. Figure 23 depicts the<br />

prediction <strong>of</strong> single pixel diameter using two thresholds.<br />

The threshold at a field value <strong>of</strong> 3.21 × 10 6 V/m<br />

matches the data at high exposures <strong>and</strong> the threshold<br />

at a field value at 1.23 × 10 7 V/m matches the data at<br />

low exposures.<br />

Conclusions<br />

We have analytically compared the single pixel performance<br />

<strong>of</strong> both DMD <strong>and</strong> laser exposure processes for a<br />

600 dpi printer assuming an 85 µm wide Gaussian exposure<br />

for the laser exposure module. The salient difference<br />

between the two exposure processes is that the<br />

DMD exposure module is a static system <strong>and</strong> requires<br />

no rotating polygon scanner as does the laser exposure<br />

module. The rotating polygon scanner restricts the optical<br />

aperture <strong>and</strong> introduces distortions due to jitter<br />

<strong>and</strong> wobble. The images produced by the DMD exposure<br />

module had higher resolution than the laser exposure<br />

module. The increased resolution translates into<br />

smaller <strong>and</strong> sharper single pixel images on the<br />

photoconductor, the presence <strong>of</strong> stronger fringe fields,<br />

<strong>and</strong> tighter <strong>and</strong> more compact developed pixels with a<br />

DMD exposure module.<br />

We formulated a theory to explain the experimental<br />

observations that is an extension <strong>of</strong> Schein’ s equilibrium<br />

theory for solid area development to the problem<br />

<strong>of</strong> single pixel development. The extension is the inclusion<br />

<strong>of</strong> the weakening <strong>of</strong> the latent image field as the<br />

layers <strong>of</strong> developed toner grow further away from the<br />

photoconductor surface. We applied the extended equilibrium<br />

theory to compare the single pixels produced<br />

by the DMD <strong>and</strong> laser exposure modules. This is the<br />

first time, to our knowledge, that a theory <strong>of</strong> electrophotography<br />

is able to semiquan-titatively account for<br />

single pixel development. The model predicts larger pixels<br />

than observed at lower exposures. Inclusion <strong>of</strong> the<br />

transient effects <strong>of</strong> toner movement in the magnetic<br />

brush will likely have to be included to make the model<br />

complete.<br />

318 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Allen <strong>and</strong> Coit


Mean Diameter [µm]<br />

Figure 23. Prediction <strong>of</strong> pixel diameter using two thresholds.<br />

Figure 22. Comparison <strong>of</strong> experimentally measured <strong>and</strong> analytically<br />

predicted pixel diameters.<br />

Acknowledgment. The authors would like to thank Dr.<br />

W. E. Nelson, TI Fellow, for his support <strong>and</strong> encouragement<br />

without which this article could not have been<br />

written. The authors also wish to thank Dr . Lawrence<br />

B. Schein, consultant, for his encouragement <strong>and</strong> his<br />

many thoughtful suggestions <strong>and</strong> comments made to the<br />

authors which greatly enhanced the article.<br />

References<br />

1. L. J. Hornbeck <strong>and</strong> W. E. Nelson, Bistable Deformable Mirror Device,<br />

Technical Digest on Spatial Light Modulators <strong>and</strong> Applications Lake<br />

Tahoe, NV 8: , OSA, Washington, DC, 1988, p. 107.<br />

2. L. J. Hornbeck, Deformable-Mirror Spatial Light Modulators, Proc. SPIE<br />

1150, 86 (1989).<br />

3. W. E. Nelson <strong>and</strong> L. J. Hornbeck, Micromechanical Spatial Light Modulator<br />

for Electrophotographic Printers, SPSE’s Fourth International Congress<br />

on Advances in Non-Impact Printing Technologies, IS&T,<br />

Springfield VA, 1988, p. 427.<br />

4. W. E. Nelson, <strong>and</strong> R. L. Bhuva, Digital Micromirror Device <strong>Imaging</strong> Bar<br />

for Hardcopy, Proc. SPIE 2413, 130 (1995).<br />

5. W. E. Nelson, Tutorial on Optical Printheads, IS&T’s Eleventh International<br />

Congress on Advances in Non-Impact Printing Technologies, IS&T,<br />

Springfield VA, 1995.<br />

6. W. E. Nelson, in Digest IEEE/LEOS 1996 Summer Topical Meetings,<br />

Optical MEMS <strong>and</strong> Their Applications IEEE, Piscataway, NJ, 1996, paper<br />

WC3.<br />

7. L. B. Schein, Photogr. Sci. Eng. 19, 255 (1975).<br />

8. L. B. Schein <strong>and</strong> K. J. Fowler, J. <strong>Imaging</strong> Technol. 11, 295 (1985).<br />

9. J. W. Goodman, Introduction to Fourier Optics, McGraw-Hill, New York,<br />

1968, p. 113.<br />

10. L. B. Schein, Electrophotography <strong>and</strong> Development Physics, Laplacian<br />

Press, San Jose, 1992, p. 125.<br />

11. R. M. Schaffert, The Nature <strong>and</strong> Behavior <strong>of</strong> Electrostatic Images,<br />

Photogr. Sci. Eng. 6, 385 (1962).<br />

12. S. Jen <strong>and</strong> A. R. Lubinsky, Model for the Magnetic Brush Development<br />

<strong>of</strong> Line Images, Electrophotography, Fourth International Conference,<br />

IS&T, Springfield, VA, 1981, p. 239.<br />

13. W. D. Holl<strong>and</strong>, Tutorial on Optical Printheads, IS&T’s Tenth International<br />

Congress on Advances in Non-Impact Printing Technologies, IS&T,<br />

Springfield, VA, 1994, p. 75ff.<br />

Comparison <strong>of</strong> the Single Pixel Development <strong>of</strong> DMD ...Electrophotographic Printing <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 319


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Particle Size Effects in Pigmented Ink Jet Inks<br />

Alex<strong>and</strong>ra D. Bermel <strong>and</strong> D. E. Bugner<br />

Eastman Kokak Company, <strong>Imaging</strong> Research <strong>and</strong> Advanced Development, Rochester, New York<br />

Eastman Kodak Company has recently announced breatkthrough nanoparticulate ink technology which represents an improvement<br />

in both dye-based <strong>and</strong> pigment-based inks. These ultrafine pigmented inks exhibit average particle size approximately one<br />

order <strong>of</strong> magnitude smaller than other commercially available pigmented ink jet inks. In this article, we will discuss the effects<br />

<strong>of</strong> colorant particle size on reliability, image quality, <strong>and</strong> durability in an ink jet printing system. Comparisons will also bemade<br />

to conventional dye-based inks.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 320–324 (1999)<br />

Introduction<br />

Until recently, those involved in the business <strong>of</strong> producing<br />

large format ink jet prints have had to choose between<br />

two different types <strong>of</strong> ink sets depending on<br />

requirements <strong>of</strong> the intended application. For the highest<br />

image quality applications, dye-based inks have been<br />

preferred, but for signage applications where durability,<br />

especially lightfastness, is required, pigmented inks<br />

have become a very popular option. In addition to image<br />

quality limitations, such as inferior color gamut <strong>and</strong><br />

differential gloss, pigmented inks have also exhibited<br />

poorer reliability than dye-base inks, presumably caused<br />

by large pigment particles or agglomerates clogging the<br />

channels <strong>and</strong>/or nozzles <strong>of</strong> the ink jet heads.<br />

With the launch <strong>of</strong> the new Kodak Pr<strong>of</strong>essional Large<br />

Format 2000 series printer, there is no longer a need to<br />

choose between dyes <strong>and</strong> pigments. This value proposition<br />

is made possible by a breakthrough in pigmented<br />

ink technology, which yields pigment particle sizes that<br />

are approximately one-tenth the size <strong>of</strong> other manufacturers’<br />

pigmented inks. In theory, inks containing these<br />

pigment particles with average particle sizes <strong>of</strong> 50 nm<br />

or less, should show improved image quality <strong>and</strong> improved<br />

printhead reliability (i.e., less nozzle clogging)<br />

when compared to inks containing significantly larger<br />

particles. The purpose <strong>of</strong> this study was to determine<br />

the effect <strong>of</strong> pigment particle size on various ink properties<br />

<strong>and</strong> printing performance attributes. Specifically,<br />

this study considered the effects <strong>of</strong> pigment particle size<br />

on dispersion stability, optical density, color gamut,<br />

gloss, <strong>and</strong> lightfastness. The effects <strong>of</strong> pigment particle<br />

size were evaluated for cyan, magenta, <strong>and</strong> yellow inks.<br />

<strong>Additional</strong> studies are underway to quantify the effect<br />

<strong>of</strong> pigment particle size on printhead jetting reliability.<br />

<strong>Material</strong>s<br />

In this study, cyan, magenta, <strong>and</strong> yellow pigments were<br />

used. The cyan is a Kodak proprietary siloxane-bridged<br />

aluminum phthalocyanine obtained from the Synthetic<br />

Chemicals Division <strong>of</strong> Eastman Kodak Company . 1 The<br />

magenta pigment is pigment red 122 (PR 122), a<br />

quinacridone-type pigment obtained from Sun Chemica l<br />

Company as Sunfast Magenta 122. The yellow is pigment<br />

yellow 74 (PY 74), a non-benzidine yellow obtained<br />

from Clariant Chemical Company as Hansa Brilliant Yellow<br />

5GX-03. Sodium N-methyl-N-oleoyl taurate (OMT)<br />

was obtained from Rhone-Poulenc <strong>and</strong> was purified by<br />

the Synthetic Chemicals Division <strong>of</strong> Kodak. Diethylene<br />

glycol (DEG) <strong>and</strong> glycerol were obtained from Acros<br />

Chemical Co. <strong>and</strong> Aldrich Chemical Co., respectively.<br />

Methods<br />

The pigments were milled using a variation <strong>of</strong> the process<br />

described by Czekai <strong>and</strong> Bishop. 2 The milling formulations<br />

for the cyan, magenta, <strong>and</strong> yellow pigments,<br />

respectively, were 21, 20, <strong>and</strong> 20 wt% pigment, 13, 6,<br />

<strong>and</strong> 2.5 wt% OMT , with the balance being de-ionized<br />

water. For each pigment, particle size was monitored<br />

as a function <strong>of</strong> milling time, <strong>and</strong> two cuts were chosen<br />

with differing particle size distributions. The smaller<br />

cut will be referred to as “small” cyan, magenta or yellow,<br />

<strong>and</strong> the larger cut will be referred to as “large” cyan,<br />

magenta or yellow.<br />

Inks were prepared from the different particle size<br />

fractions by adding the pigment concentrate with stir -<br />

ring to a mixture <strong>of</strong> deionized water , DEG, <strong>and</strong> glycerol.<br />

The final cyan, magenta, <strong>and</strong> yellow ink<br />

formulations are given in Table I.<br />

TABLE I. Cyan, Magenta, <strong>and</strong> Yellow Ink Formulations<br />

Color Wt% Pigment Wt% OMT Wt% DEG Wt% Glycerol<br />

Original manuscript received September 8, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

Cyan 2.25 1.35 7.95 12.05<br />

Magenta 2.60 0.78 10.80 7.20<br />

Yellow 2.25 0.28 6.36 9.64<br />

320


Figure 1. Cyan inks incubated at 60°C: PSD vs. time.<br />

Figure 3. Yellow inks incubated at 60°C: PSD vs. time.<br />

TABLE II. Particle Size Distributions for the Cyan Inks <strong>of</strong> this<br />

Study along with Several Commercially Available Pigmented<br />

Cyan Inks<br />

Ink D 10 (nm) D 50 (nm) D 95 (nm) D 100 (nm)<br />

Small cyan 13 16 89 204<br />

Large cyan 49 122 267 486<br />

Commercial A 54 108 356 688<br />

Commercial B 57 98 178 344<br />

Commercial C 86 145 223 289<br />

TABLE III. Particle Size Distributions for the Magenta Inks <strong>of</strong><br />

this Study along with Several Commercially Available Pigmented<br />

Magenta Inks<br />

Figure 2. Magenta inks incubated at 60°C: PSD vs. time.<br />

Pigment particle size distributions (PSDs) were measured<br />

on a Leeds <strong>and</strong> Northrup Microtrac-UP A 150<br />

ultrafine particle size analyzer. To simulate the effect<br />

<strong>of</strong> shipping <strong>and</strong> h<strong>and</strong>ling, the inks were subjected to a<br />

“freeze/thaw” test. This test involves holding the inks<br />

for 24 hr at –20 °C, then for 24 hr at 60 °C, measuring<br />

particle size, <strong>and</strong> repeating this cycle four times.<br />

Samples were examined for sediment <strong>and</strong> then shaken<br />

prior to sampling for the PSD measurements. Shelf-life<br />

<strong>of</strong> the inks was evaluated by incubating samples <strong>of</strong> inks<br />

at several temperatures <strong>and</strong> evaluating them for sediment,<br />

filterability, <strong>and</strong> PSD as a function <strong>of</strong> time.<br />

For image quality <strong>and</strong> lightfastness evaluations, the<br />

inks were loaded into a Hewlett-Packard model 51626A<br />

printhead <strong>and</strong> printed onto Kodak Ektajet 50 semigloss<br />

paper MW8, resin-coated photo paper. Optical density<br />

<strong>and</strong> color gamut were determined by previously disclosed<br />

methods. 3 Gloss was measured on a BYK Gardner<br />

microgloss meter acccording to ASTM D523. Lightfastness<br />

was evaluated by exposing targets comprising several<br />

printed densities ranging from D-min to D-max with<br />

a 50 klux Xenon source filtered with window glass.<br />

4<br />

Optical densities were measured before <strong>and</strong> after differing<br />

lengths <strong>of</strong> exposure, <strong>and</strong> lightfastness is expressed<br />

as the percent retained optical density, corrected<br />

for D-min.<br />

Results<br />

The particle size distributions for the large <strong>and</strong> small<br />

cyan, magenta, <strong>and</strong> yellow inks are given in T ables II,<br />

III, <strong>and</strong> IV. Also included in the tables are the PSDs <strong>of</strong><br />

several commercially available pigmented inks. It<br />

should be noted that the commercially available cyan<br />

Ink D 10 (nm) D 50 (nm) D 95 (nm) D 100 (nm)<br />

Small magenta 9 11 55 122<br />

Large magenta 46 100 201 344<br />

Commercial A 67 146 326 688<br />

Commercial B 44 70 124 243<br />

Commercial C 188 335 749 1375<br />

TABLE IV. Particle Size Distributions for the Yellow Inks <strong>of</strong> this<br />

Study along with Several Commercially Available Pigmented<br />

Yellow Inks<br />

Ink D 10 (nm) D 50 (nm) D 95 (nm) D 100 (nm)<br />

Small yellow 9 11 37 122<br />

Large yellow 33 73 173 344<br />

Commercial A 67 146 326 688<br />

Commercial B 43 85 216 409<br />

Commercial C 82 148 254 409<br />

inks all appear to contain copper phthalocyanine as the<br />

cyan pigment. In the tables, the columns labeled D n<br />

represent<br />

the size <strong>of</strong> the particles at the nth percentile <strong>of</strong><br />

the distribution. Thus, the column labeled D 50<br />

is typically<br />

referred to as the average or mean particle size <strong>of</strong><br />

distribution, <strong>and</strong> D 100<br />

is the size <strong>of</strong> the largest particles<br />

in the distribution. Table V shows the effect <strong>of</strong> freeze/<br />

thaw cycling on the particle size (D 50<br />

<strong>and</strong> D 95<br />

) <strong>of</strong> the cyan,<br />

magenta, <strong>and</strong> yellow inks, respectively. Figures 1, 2 <strong>and</strong><br />

3 show the effect <strong>of</strong> incubating the inks at 60°C on the<br />

pigment particle size.<br />

Figure 4 compares the reflection spectra <strong>of</strong> the large<br />

<strong>and</strong> small inks. Table VI summarizes the effect <strong>of</strong> particle<br />

size on optical density <strong>and</strong> gloss, <strong>and</strong> T able VII<br />

compares the color gamut achieved with the small inks<br />

to that achieved with the large inks. In Table VIII, the<br />

Particle Size Effects in Pigmented Inkjet Inks <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 321


TABLE V. The Effect <strong>of</strong> Four Freeze/Thaw Cycles on the Inks <strong>of</strong><br />

this Study<br />

Ink Initial D 10 Final* D 50 Initial D 95 Final* D 95<br />

Large cyan 122 114 267 243<br />

Small cyan 16 14 89 80<br />

Large magenta 99 102 196 195<br />

Small magenta 13 12 68 60<br />

Large yellow 73 65 173 208<br />

Small yellow 11 14 37 87<br />

*Final: after four freeze/thaw cycles; 1 cycle = 24 hr at –20°C then 24 hr at<br />

+60°C<br />

TABLE VI. A Comparison <strong>of</strong> Optical Density <strong>and</strong> Gloss for the<br />

Inks <strong>of</strong> this Study<br />

Ink Optical density 60° gloss<br />

Small cyan 2.08 65<br />

Large cyan 1.23 72<br />

Small magenta 2.22 96<br />

Large magenta 1.76 85<br />

Small yellow 2.00 113<br />

Large yellow 1.67 93<br />

Figure 4. A comparison <strong>of</strong> reflection spectra for the small <strong>and</strong><br />

the large cyan, magenta, <strong>and</strong> yellow pigmented inks.<br />

TABLE VII. A Comparison <strong>of</strong> Color Gamut for the Inks <strong>of</strong> this<br />

Study<br />

Ink combination<br />

Color gamut<br />

Large cyan, large magenta, large yellow 53,390<br />

Small cyan, small magenta, small yellow 70,728<br />

TABLE VIII. Effect <strong>of</strong> Increasing Pigment Concentration in Large<br />

Cyan Ink<br />

Pigment Size Wt% pigment Optical density Color gamut*<br />

Large 2.25 1.28 59,838<br />

Large 3.00 1.73 67,963<br />

Large 3.50 1.68 65,897<br />

Large 4.00 1.63 65,119<br />

Small 2.25 2.07 70,728<br />

*The small magenta <strong>and</strong> small yellow inks were used in combination with the<br />

indicated cyan inks for the gamut calculations.<br />

Figure 5. Reflection spectra <strong>of</strong> large cyan ink containing 3.5%<br />

pigment (dashed) <strong>and</strong> small cyan ink containing 2.25% pigment<br />

(solid).<br />

effects <strong>of</strong> increasing the pigment concentration in the<br />

large cyan ink on the optical density <strong>and</strong> the color gamut<br />

are presented. Figure 5 compares the reflection spectrum<br />

<strong>of</strong> the small cyan ink at 2.25% pigment concentration<br />

with the large cyan ink containing a higher pigment<br />

concentration. In Fig. 6, the lightfastness results for the<br />

yellow inks are compared.<br />

Discussion<br />

Historically, the inks developed for the first commer -<br />

cially successful thermal drop-on-dem<strong>and</strong> ink jet printers<br />

employed <strong>of</strong>f-the-shelf dyes as colorants. Dyes are<br />

colorants that are soluble in the solvent(s) or vehicle<br />

used to make the ink. Each molecule <strong>of</strong> the dye is sur -<br />

rounded by the solvent(s) <strong>and</strong> is separated from other<br />

dye molecules. For applications requiring weatherability,<br />

especially lightfastness, pigmented inks have become<br />

increasingly popular. In contrast to dyes, pigments are<br />

colorants that are essentially insoluble in the ink<br />

solvent(s). It is important to note that the lightfastness<br />

Figure 6. Yellow lightfastness data: % retained density after<br />

8 weeks exposure to 50 Klux high-intensity daylight.<br />

322 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Bermel <strong>and</strong> Bugner


properties <strong>of</strong> pigments vary; some are extremely<br />

lightfast, while others fade as quickly as dyes.<br />

Pigmented inks are normally prepared in a two-step<br />

process. In the first step, a mixture <strong>of</strong> pigment <strong>and</strong> water<br />

is milled or otherwise mechanically sheared in the<br />

presence <strong>of</strong> a dispersant or stabilizer. During this step,<br />

the clumps <strong>of</strong> as-received pigment particles are broken<br />

down into their primary particles. The primary particles<br />

become coated with the dispersant molecules <strong>and</strong> are<br />

thereby stabilized against re-aggregation <strong>and</strong>/or settling.<br />

The pigment concentrate thus produced is then<br />

diluted in a second step to a working strength ink by<br />

addition <strong>of</strong> co-solvents, called humectants, <strong>and</strong> other<br />

addenda, such as surfactants or biocides. Commercially<br />

available pigmented inks produced by this method generally<br />

result in average particle sizes in the range <strong>of</strong><br />

100–200 nm, with particle size distributions <strong>of</strong>ten extending<br />

to greater than 400 nm.<br />

By using a new type <strong>of</strong> milling process, we have been<br />

2<br />

able to produce inks with much finer particles. Comparisons<br />

<strong>of</strong> inks produced by this process with commercially<br />

available pigmented inks have revealed several<br />

noticeable advantages to the smaller particle size distributions.<br />

However, there are many other differences<br />

between the commercially available inks <strong>and</strong> inks produced<br />

by this process, such as the pigment, dispersant,<br />

<strong>and</strong> humectant types <strong>and</strong> levels, so that it becomes difficult<br />

to isolate specific particle size effects on the various<br />

performance attributes. By preparing two inks with<br />

virtually identical chemical compositions, differing only<br />

in their particle size distributions, we hoped to better<br />

underst<strong>and</strong> which attributes are strongly affected by<br />

pigment particle size.<br />

Our goal was to prepare a set <strong>of</strong> cyan, magenta, <strong>and</strong><br />

yellow inks with PSDs comparable to those being <strong>of</strong>fered<br />

with the Kodak Pr<strong>of</strong>essional 2000 series printers (“small<br />

inks”), <strong>and</strong>, for comparison, a set <strong>of</strong> cyan, magenta, <strong>and</strong><br />

yellow inks with average particle sizes approximately<br />

ten times larger than the small inks (“large inks”). The<br />

large inks were designed to simulate other manufacturers’<br />

commercially available inks. Tables II, III, <strong>and</strong> IV<br />

indicate that we achieved that goal.<br />

The first requirement <strong>of</strong> a pigmented ink is for the<br />

pigment dispersion to be stable (i.e., no significant<br />

change in PSD) over a reasonable range <strong>of</strong> temperatures<br />

<strong>and</strong> times. Two types <strong>of</strong> studies were carried out to<br />

evaluate dispersion stability; freeze/thaw cycling <strong>and</strong><br />

Arrhenius testing. 5 Freeze/thaw cycling, as defined<br />

above, is essentially a “shipping <strong>and</strong> h<strong>and</strong>ling” simulation.<br />

The effect <strong>of</strong> freeze/thaw cycling on D 50 <strong>and</strong> D 95 for<br />

the cyan, magenta, <strong>and</strong> yellow inks is shown in Table V.<br />

The data indicate that the freeze/thaw cycling had<br />

essentially no effect on the particle size <strong>of</strong> the large <strong>and</strong><br />

small magenta <strong>and</strong> cyan inks. In addition, the optical<br />

density <strong>of</strong> a D-max patch printed with each magenta<br />

<strong>and</strong> cyan ink, before <strong>and</strong> after freeze/thaw cycling, exhibited<br />

essentially no change as a result <strong>of</strong> the treatment.<br />

The data indicate that there was some growth in<br />

the yellow inks as a result <strong>of</strong> the freeze/thaw testing.<br />

This growth was not observed in yellow inks that were<br />

stored at room temperature for up to one year . The<br />

growth is most apparent in the larger fractions <strong>of</strong> the<br />

small yellow ink.<br />

Arrhenius testing is a tool for estimating shelf-life<br />

for formulations that are sensitive to time <strong>and</strong> temperature.<br />

The basic concept is to measure the rate <strong>of</strong> a given<br />

phenomenon, in this case particle size growth, at three<br />

or more temperatures. For well-behaved systems with<br />

a single mechanism <strong>of</strong> degradation, these data can be<br />

used to estimate an energy <strong>of</strong> activation for the process,<br />

which, in turn, allows one to calculate the time, or shelflife,<br />

at any temperature within the range tested, that<br />

the dispersion will remain stable. Figures 1 <strong>and</strong> 2 show<br />

the effect <strong>of</strong> incubating the cyan <strong>and</strong> magenta inks at<br />

60°C. As shown in Figs. 1 <strong>and</strong> 2, there was no significant<br />

particle growth in the large <strong>and</strong> small cyan <strong>and</strong><br />

magenta inks over reasonable times at 60°C. <strong>Additional</strong><br />

studies indicated no particle growth in the cyan <strong>and</strong><br />

magenta inks for temperatures up to 80°C. Thus, as was<br />

the case with freeze/thaw cycling, there does not appear<br />

to be an effect <strong>of</strong> particle size on shelf-life for the magenta<br />

<strong>and</strong> cyan inks.<br />

In Fig. 3, the effect <strong>of</strong> incubating the yellow ink at<br />

60°C is presented. For both the small <strong>and</strong> large yellow<br />

ink, the D 50 value remains constant throughout the experiment.<br />

However, significant growth is observed in the<br />

D 95 value initially in the incubation period for both small<br />

<strong>and</strong> large inks, then the particles grow more slowly.<br />

Evaluation <strong>of</strong> the large particles using scanning electron<br />

microscopy indicates that large particles are not<br />

agglomerates <strong>of</strong> small particles, but rather they are<br />

plate-like in appearance. This suggests that the pigment<br />

is ripening with time. It appears that both large<br />

ink <strong>and</strong> small ink undergo the ripening phenomenon ,<br />

which appears to be a property <strong>of</strong> this pigment type,<br />

<strong>and</strong> is not due to particle size effects per se. We are<br />

currently evaluating how to prevent ripening in this<br />

pigment dispersion.<br />

The image quality attributes that we evaluated with<br />

respect to particle size included optical density , gloss,<br />

<strong>and</strong> color gamut. Figure 4 indicates that the maximum<br />

optical density achieved using the large inks is significantly<br />

lower than the maximum optical density that can<br />

be achieved using the small inks. The lower densities<br />

result in a significant reduction in color gamut (T able<br />

VII). In theory, increasing the pigment concentration in<br />

the large ink should increase the optical density <strong>and</strong><br />

improve the color gamut. This was done with the large<br />

cyan ink, <strong>and</strong> the results are given in T able VIII. The<br />

pigment concentration <strong>of</strong> the large cyan ink was increased<br />

from the st<strong>and</strong>ard level for the small cyan pigment<br />

<strong>of</strong> 2.25%, to 3.00%, 3.50%, <strong>and</strong> 4.00%. The data<br />

indicate that increasing the pigment concentration <strong>of</strong><br />

the large cyan ink does increase the optical density;<br />

however, it is not possible to achieve as high an optical<br />

density or as large <strong>of</strong> a color gamut with the large pigment<br />

as with the small pigment. In addition, when the<br />

pigment concentration was increased to 4.00% severe<br />

imaging artifacts, i.e., b<strong>and</strong>ing, were observed, which<br />

resulted in a decrease in optical density <strong>and</strong> the resulting<br />

color gamut. This is attributed to the fact that the<br />

cartridges are not designed to fire such high concentrations<br />

<strong>of</strong> pigment. In Fig. 5, it is also apparent that another<br />

effect <strong>of</strong> increasing the pigment concentration is<br />

to broaden the absorption curve <strong>of</strong> the ink, which is undesirable<br />

<strong>and</strong> will reduce color gamut.<br />

As expected, 6 the gloss levels <strong>of</strong> the small magenta<br />

<strong>and</strong> yellow inks were higher than the gloss levels <strong>of</strong> the<br />

corresponding large magenta <strong>and</strong> yellow inks. However,<br />

the large cyan ink exhibited a slightly higher gloss value<br />

than the small cyan ink at an angle <strong>of</strong> 60°. This observation<br />

was also confirmed at 20° <strong>and</strong> 85° viewing angles<br />

as well. This unexpected observation is currently under<br />

investigation.<br />

One <strong>of</strong> the concerns with using pigmented inks in ink<br />

jet systems has been that the color gamut would not be<br />

acceptable. However, as demonstrated above, the use <strong>of</strong><br />

very small pigment particles results in a color gamut<br />

Particle Size Effects in Pigmented Inkjet Inks <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 323


that approaches the best color gamuts achieved with<br />

dye-based inks (i.e., 76,000).<br />

After having determined that the use <strong>of</strong> small pigment<br />

particles is required to achieve an acceptable color<br />

gamut, it was important to investigate the claims 7 that<br />

pigmented inks containing very small pigment particles<br />

would exhibit poorer lightfastness than inks containing<br />

larger pigment particles. To determine the effect <strong>of</strong><br />

pigment size on lightfastness, step wedges <strong>of</strong> all the inks<br />

were printed with densities ranging from D-min to D-<br />

max. The large <strong>and</strong> small cyan <strong>and</strong> magenta inks were<br />

exposed for 16 wk to a high-intensity Xenon source filtered<br />

with window glass, which is estimated to be<br />

equivalent to > 50 yr <strong>of</strong> indoor exposure, <strong>and</strong> none <strong>of</strong><br />

the inks faded significantly. Thus for the cyan <strong>and</strong> magenta,<br />

there appears to be no effect <strong>of</strong> pigment particle<br />

size on lightfastness in the system studied.<br />

In Fig. 6, the results <strong>of</strong> exposing the small <strong>and</strong> large<br />

yellow inks for 8 wk under the same conditions are presented.<br />

There are several things to note in this graph.<br />

First, the yellow pigment used is not as lightfast as either<br />

the magenta or the cyan tested in this study, <strong>and</strong> a<br />

significant level <strong>of</strong> fade was observed for both the large<br />

<strong>and</strong> small pigment. Second, the large pigment appears<br />

to fade more than the small pigment, which is in contrast<br />

to the claim referenced previously. Third, the degree<br />

<strong>of</strong> fade was a function <strong>of</strong> the starting density <strong>of</strong> the<br />

image. This is particularly apparent in the data for the<br />

small yellow, where the high-density step retained about<br />

70% <strong>of</strong> its initial value, while the lower density steps<br />

only retained 40–50% <strong>of</strong> their initial value.<br />

Summary<br />

We have initiated a study <strong>of</strong> particle size effects in pigmented<br />

ink jet inks. In this study, dispersion stability,<br />

image quality, <strong>and</strong> lightfastness were evaluated for two<br />

C,M,Y sets <strong>of</strong> inks: one set containing pigment particles<br />

with average particle size


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Investigations <strong>of</strong> Nonreproducible Phenomena in Thermal Ink Jets with<br />

Real High-Speed Cine Photomicrography<br />

Christian Rembe, Stefan aus der Wiesche, Michael Beuten, <strong>and</strong> Eberhard P. H<strong>of</strong>er<br />

Department <strong>of</strong> Measurement, Control <strong>and</strong> Microtechnology, University <strong>of</strong> Ulm, Ulm, Germany<br />

In the ink jet printer industry the stroboscopic visualization method is a st<strong>and</strong>ard tool for the charactarization <strong>of</strong> printheads .<br />

However, this method fails for thermal ink jets owing to the existence <strong>of</strong> satellite droplets which are very critical with respect to<br />

print quality. This is also true for the bubble formation inside the ink chamber <strong>of</strong> the printhead. Detailed studies have shown<br />

that the phenomenon <strong>of</strong> satellite droplets is a nonreproducible dynamic process. Real high-speed cine photomicrography forms<br />

the basis <strong>of</strong> a new test setup that allows the visualization <strong>of</strong> such highly dynamic nonreproducible phenomena. This new setup<br />

has been used to study the ejection, the free flight, <strong>and</strong> the impact <strong>of</strong> droplets <strong>of</strong> an ink jet on print media under real printi ng<br />

conditions.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 325–331 (1999)<br />

Original manuscript received November 12, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

Introduction<br />

As a result <strong>of</strong> the rapidly growing field <strong>of</strong> microsystem<br />

technology numerous laboratory specimens <strong>of</strong><br />

microactuators have been developed, mainly at universities<br />

<strong>and</strong> research institutes. 1 However, only a few prototypes<br />

<strong>of</strong> micro devices exist that lead to industrial<br />

mass production. High speed visualization technique has<br />

supported the successful introduction <strong>of</strong> thermal ink jets<br />

into the market. 2–5 Curiously, there are only a few other<br />

examples <strong>of</strong> microdevices analyzed using photomicrography.<br />

6,7 This fact demonstrates the importance <strong>of</strong> high<br />

speed photomicrography for the analysis <strong>of</strong> dynamic<br />

processes in microdevices. The time durations <strong>of</strong> the<br />

processes in thermal ink jets are extremely short, e.g.,<br />

the bubble life time is approximately 15 µs <strong>and</strong> the droplet<br />

velocity is approximately 15 m/s which is comparatively<br />

fast considering the fact that optical<br />

magnifications up to 500 have to be used to generate<br />

high quality droplet images. This means that the microscopic<br />

droplet velocity <strong>of</strong> approximately 15 m/s cor -<br />

responds to a macroscopic projectile flying with a<br />

velocity <strong>of</strong> approximately 7500 m/s. The droplet visualization<br />

requires extremely short exposure times to avoid<br />

blur. Besides the short exposure times, very short<br />

interframe times are necessary to depict the dynamics<br />

<strong>of</strong> the fluidic phenomena in thermal ink jets. T o overcome<br />

the technical problems in the realization <strong>of</strong> high<br />

exposure rates the stroboscopic visualization method is<br />

utilized around the world for investigation <strong>of</strong> dynamic<br />

processes in thermal ink jets. Only a few investigations<br />

have been performed with real high-speed cinematography.<br />

5,8 The reproducibility <strong>of</strong> the process is the condition<br />

for the use <strong>of</strong> the stroboscopic visualization technique.<br />

9 The reproducible process is repeated several<br />

times <strong>and</strong> each measurement is observed at a different<br />

delayed point <strong>of</strong> time. This procedure results in a<br />

pseudocinematographic sequence <strong>of</strong> images. However ,<br />

many processes in thermal ink jets are not reproducible,<br />

e.g., the droplet ejection at high printing frequencies,<br />

the development <strong>of</strong> the bubble surface during the<br />

bubble growth <strong>and</strong> the generation <strong>of</strong> satellite droplets<br />

which have an important influence on the printing quality.<br />

These phenomena must be observed with real cinematographic<br />

visualization technique.<br />

Experimental Equipment<br />

Real high-speed cine photomicrography forms the basis<br />

<strong>of</strong> a newly developed advanced test setup (see Fig. 1)<br />

that allows the visualization <strong>of</strong> such highly dynamic<br />

nonreproducible phenomena. The first version <strong>of</strong> the<br />

setup was presented at the IS&T/SPIE International<br />

Symposium on Electronic <strong>Imaging</strong> in 1996. 8 The main<br />

part <strong>of</strong> the advanced experimental setup is the commercial<br />

high speed camera Imacon 468 by DRS Hadl<strong>and</strong><br />

Ltd. This camera is connected with the st<strong>and</strong>ard microscope<br />

Axioplan from Carl Zeiss Jena GmbH. The microscope<br />

images the object magnified on a fiber optic plate<br />

in the high-speed camera. Therefore, the beam-path in<br />

the microscope <strong>and</strong> the beam-path in the camera are<br />

uncoupled. Inside the camera, relay optics channel the<br />

light onto a special beamsplitter consisting <strong>of</strong> eight<br />

lenses <strong>and</strong> an eight-sided mirror pyramid from where it<br />

passes to eight CCD units. The CCD sensors which are<br />

arranged in a circle around the beamsplitter are amplified<br />

by micro channel plate units mounted in front <strong>of</strong><br />

the CCD camera sensors. These intensified CCD (ICCD)<br />

units act as high speed shutters to determine the ultra<br />

short exposure time <strong>of</strong> 10 ns <strong>of</strong> the camera. Our setup<br />

includes eight channels, therefore, a maximum number<br />

325


Figure 1. Schematic <strong>of</strong> experimental test setup.<br />

<strong>of</strong> eight frames can be taken <strong>of</strong> one single process. The<br />

spatial resolution <strong>of</strong> the setup is limited by<br />

122 . λ<br />

d =<br />

,<br />

NAobj<br />

+ NAcon<br />

where λ is the wavelength, NA obj is the numerical aperture<br />

<strong>of</strong> the objective <strong>and</strong> NA con is the numerical aper -<br />

ture <strong>of</strong> the condensor . Together with the pixel size <strong>of</strong><br />

the ICCD sensors, the spatial resolution <strong>of</strong> the setup<br />

results in d ≈ 500 nm.<br />

A specially designed pulsed light source fitted inside<br />

the lamp housing <strong>of</strong> the microscope ensures optimum<br />

illumination. The light source has been developed in cooperation<br />

with the Ernst Mach Institut <strong>of</strong> the<br />

Fraunh<strong>of</strong>er Gesellschaft. 10 The back mirror <strong>of</strong> the lamp<br />

housing images the flash tube in itself to make use <strong>of</strong><br />

the reflected light for illumination also. The pulse width<br />

<strong>of</strong> the light source which defines the maximum time<br />

window, can be chosen to be 100 µs or 200 µs. This light<br />

source produces a luminous intensity <strong>of</strong> approximately<br />

50 Mcd for the 100 µs pulse length <strong>and</strong> 28 Mcd for the<br />

200 µs pulse length. This is sufficient to achieve exposure<br />

times <strong>of</strong> 10 ns with the above described approach.<br />

The length <strong>of</strong> the light pulse is defined by the length <strong>of</strong><br />

a current pulse applied at the flash tube. A special self<br />

designed current supply is used to generate the current<br />

pulse. 10 For time windows wider than 200 µs we apply<br />

the continuous light source XBO 75W from Carl Zeiss<br />

Jena GmbH. This commercial light source is sufficient<br />

to realize exposure times up to 10 µs using the transmitted<br />

light method. For the reflected light method the<br />

shortest possible exposure time is 50 µs. The cameramicroscope<br />

combination is capable <strong>of</strong> generating high<br />

contrast images (256 gray levels) with exposure times<br />

as short as 10 ns if the pulsed light source is used for<br />

illumination. The setup can record a sequence <strong>of</strong> eight<br />

(1)<br />

images at frequencies as high as 100 million frames per<br />

second.<br />

A second different setup based on the stroboscopic<br />

principle is used for the visualization <strong>of</strong> reproducible<br />

events. The reproducible event is repeated with the frequency<br />

<strong>of</strong> a video camera (25Hz) <strong>and</strong> visualized at subsequent<br />

points <strong>of</strong> time, respectively. The exposure time<br />

<strong>of</strong> 250 ns is defined by the width <strong>of</strong> the stroboscopic<br />

flash. The interframe time is defined by the variation<br />

<strong>of</strong> the time duration between the event <strong>and</strong> the flash.<br />

Our pseudocinematographic setup is fully automated. 10<br />

The advantage <strong>of</strong> the pseudocinematographic visualization<br />

is the unlimited number <strong>of</strong> frames <strong>of</strong> the image<br />

sequence.<br />

The following measurements have been performed<br />

with the HP DeskJet 500 printhead developed in the<br />

11,12<br />

middle <strong>of</strong> the 1980s by Hewlett Packard. This<br />

printhead consists <strong>of</strong> 50 thermal actuators where every<br />

heating element has an area <strong>of</strong> 60 µm × 60 µm. With a<br />

pulse generator, each single actuator can be controlled<br />

directly by its own connection because no logical circuits<br />

are integrated on the microdevice. These microheaters<br />

transform electrical power produced by 3.3 µs long<br />

pulses with 6.5 W amplitude into heat. The energy diffuses<br />

through the passivation layers into the liquid <strong>and</strong><br />

heats the lowest liquid layer up to 320 °C. After an explosive<br />

vaporization the accelerated liquid column over<br />

the heating element is ejected from the nozzle <strong>of</strong> the<br />

thermal actuator <strong>and</strong> forms an ink droplet with several<br />

satellite droplets. The colorless ink Ink Jet 23-101 R<br />

from Franz Büttner AG was used for all measurements.<br />

Bubble Generation<br />

Our newly developed microactuator test rig has been<br />

used to investigate the nucleation <strong>and</strong> the bubble growth<br />

in a thermal ink jet printhead. The printhead has been<br />

prepared for these experimental studies. T o enable a<br />

view inside a single thermal actuator <strong>of</strong> the printhead<br />

326 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Rembe et al.


3.4<br />

time [µs]<br />

Figure 2. Two visualizations <strong>of</strong> bubble formation in a thermal ink jet printhead. The time scale starts at the beginning <strong>of</strong> the<br />

heating pulse. The exposure time <strong>of</strong> the images is 300 ns.<br />

the nozzle plate was removed <strong>and</strong> replaced by a glass<br />

plate. No droplet can be ejected in this closed pool ar -<br />

rangement. From other experiments where the nucleation<br />

<strong>of</strong> the vapor bubble was observed through the<br />

nozzle the same results follow . Therefore, we present<br />

the photo reproductions <strong>of</strong> the closed pool arrangement<br />

because these images are not distorted by the ejected<br />

droplet that otherwise would fly in the direction <strong>of</strong> the<br />

camera. Photo reproductions (see Fig. 2) prove that the<br />

structure <strong>of</strong> the bubble is completely different for two<br />

separate experiments using the same heating element<br />

<strong>and</strong> the same heating pulse.<br />

The bubble surface structure is different although the<br />

time point <strong>of</strong> nucleation is equal for every experiment<br />

carried out under unchanged conditions. The<br />

realcinematographic visualization allows to observe the<br />

nonrepoducible development <strong>of</strong> the bubble surface structure<br />

during the bubble expansion. An exposure time <strong>of</strong><br />

300 ns has been used for this visualization with an<br />

interframe time <strong>of</strong> 300 ns. W e have used the reflected<br />

light brightfield method for this visualization. The<br />

Hewlett Packard st<strong>and</strong>ard pulse <strong>of</strong> 6.5 W <strong>and</strong> a width<br />

<strong>of</strong> 3.3 µs was applied to generate the bubble. The experiments<br />

indicate that the phase boundary <strong>of</strong> liquid<br />

<strong>and</strong> vapor is an unstable phenomenon because it seems<br />

that little disturbances <strong>and</strong> thermal fluctuations lead<br />

to the differences in the bubble structure.<br />

A simple model <strong>of</strong> the exp<strong>and</strong>ing vapor bubble neglects<br />

the surface tension <strong>and</strong> describes the vaporization as<br />

an endothermic reaction. Then, the phase front between<br />

the vapor <strong>and</strong> the superheated liquid is unstable, i.e.,<br />

the flat interface between the two phases is not stable<br />

against small perturbations ζ . 13 Considering small perturbations<br />

<strong>of</strong> velocity v’ <strong>and</strong> pressure p’ added to the<br />

unperturbed functions v <strong>and</strong> p, the hydrodynamic equations<br />

in linearized form read as<br />

∂v'<br />

1<br />

div v' = 0,<br />

+ ( v⋅∇ ) v' = − grad p'.<br />

∂t<br />

ρ<br />

(2)<br />

In Eq. 2, the indices for liquid <strong>and</strong> vapor are suppressed<br />

for similarity. Without loss <strong>of</strong> generality, the unperturbed<br />

phase front may be traveling along the z-axis<br />

which is perpendicular to the heating element. Assuming<br />

exponential functions<br />

ζ = ζ 0 e i(kz–ωt) (3)<br />

as modes for the perturbation function which is a common<br />

approximation in linear perturbation theory , the<br />

hydrodynamic <strong>of</strong> Eq. 2 lead to positive values<br />

µ ⎡ 1 ⎤<br />

Ω= k v ⎢ 1+µ− −1 ⎥<br />

1 +µ ⎣⎢<br />

µ<br />

(4)<br />

⎦⎥<br />

for the frequency Ω = iω , where µ = ρ l /ρ v <strong>and</strong> ρ v <strong>and</strong> ρ l<br />

represent the densities for vapor <strong>and</strong> liquid respectively.<br />

Therefore, the perturbation (Eq. 3) will grow <strong>and</strong> hence<br />

the flat interface between the two phases is not stable<br />

<strong>and</strong> the phenomenon <strong>of</strong> bubble structure generation is<br />

a nonreproducible event. Consequently, the necessity <strong>of</strong><br />

the realcinematographic visualization method for the<br />

investigation <strong>of</strong> the development <strong>of</strong> the bubble structure<br />

versus time is required for the experiment.<br />

It is an interesting question if the differences <strong>of</strong> the<br />

bubble surface results only from statistical influences,<br />

e.g., thermal fluctuations. If this is the case the differences<br />

in the structure should disappear after averaging<br />

the images <strong>of</strong> a set <strong>of</strong> single experiments. W e have averaged<br />

the images <strong>of</strong> 99 bubble surfaces visualized at<br />

the same timepoint to check this assumption. The result<br />

can be seen in Fig. 3 for three different heating<br />

elements. Although the bubble surfaces are different for<br />

two separate experiments using the same heater the<br />

averaged images <strong>of</strong> the bubbles show a characteristic<br />

structure for each single heating element. The procedure<br />

has been performed by averaging the values <strong>of</strong><br />

every pixel, <strong>and</strong> it results in the same characteristic<br />

Investigations <strong>of</strong> Nonreproducible Phenomena in Thermal Ink Jets ...Photomicrography <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 327


Figure 3. Structures <strong>of</strong> bubble surfaces after the averaging <strong>of</strong> 99 images for three different heating elements.<br />

Figure 4. Break up <strong>of</strong> the liquid column into several satellite droplets.<br />

Figure 5. The ink jet <strong>of</strong> a thermal ink jet printer after the averaging <strong>of</strong> 80 images <strong>of</strong> the same time point.<br />

structure if the averaging is repeated with 99 new measurements.<br />

The visualizations were performed with the<br />

pseuodocinematographic setup, setting the interframe<br />

time to zero. The averaging was performed after the<br />

single frames were saved on hard disk.<br />

Although the surface <strong>of</strong> the vapor bubble is unstable,<br />

the averaged images <strong>of</strong> the bubble structure are char -<br />

acteristic for every heater . This leads to the assumption<br />

that the bubble structure is influenced by the heat<br />

distribution on the heating element. The roughness <strong>of</strong><br />

the heater surface does not influence the nucleation behavior<br />

directly because the nucleation <strong>of</strong> the very thin<br />

liquid layer on the heater is homogeneous <strong>and</strong> can be<br />

described as critical phenomenon. 14,15 The nucleation<br />

starts if the lowest liquid layer reaches the spinodal<br />

limit at a temperature <strong>of</strong> approximately 320°C. Impurities<br />

cannot act as nuclei because the critical size <strong>of</strong> a<br />

bubble nucleus is approximately 1 µm. 14,15 This is more<br />

than the height <strong>of</strong> the vaporized liquid layer, being thinner<br />

than 1µm. 8 A rougher heater surface enables better<br />

heat transfer into the liquid <strong>and</strong> influences indirectly<br />

the nucleation behavior. However, the differences in the<br />

averaged bubble structures are caused by differences <strong>of</strong><br />

the heat distribution inside the heating element. The<br />

procedure <strong>of</strong> the averaged images can be used for the<br />

characterization <strong>of</strong> the quality <strong>and</strong> the uniformity <strong>of</strong> the<br />

heater structure. An ideal heater should generate a<br />

uniform heat distribution.<br />

Droplet Ejection<br />

Using our new real cinematographic test rig we have also<br />

investigated satellite droplets <strong>of</strong> the liquid jet ejected from<br />

a thermal ink jet printhead. The break up <strong>of</strong> the liquid<br />

column into several satellite droplets has been visualized.<br />

The result is shown in Fig. 4. This visualization<br />

was taken with an exposure time <strong>of</strong> 250 ns <strong>and</strong> an<br />

interframe time <strong>of</strong> 10 µs. The first image shows the liquid<br />

jet 80 µs after the beginning <strong>of</strong> the heating pulse.<br />

Further experiments using the same thermal actuator ,<br />

under the same conditions, result in other positions <strong>and</strong><br />

velocities for the satellite droplets. Note, the velocity <strong>of</strong><br />

the main droplet is the same for each experiment.<br />

Averaging 80 images <strong>of</strong> satellite droplets taken with<br />

the pseudocinematographic setup shows a gray line <strong>of</strong><br />

dots (see Fig. 5). The single images used in the averag -<br />

328 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Rembe et al.


Figure 6. Integration <strong>of</strong> the prepared ink jet printer in the new test rig.<br />

ing procedure were taken 110 µs after the beginning <strong>of</strong><br />

the heating pulse with an exposure time <strong>of</strong> 250 ns. This<br />

experiment clearly demonstrates the nonreproducibility<br />

<strong>of</strong> the break up <strong>of</strong> the liquid jet. The reason is that small<br />

disturbances 16 r(t,z,ϕ) = R 0 + ε 0 e σt e i(kz+mϕ) (5)<br />

<strong>and</strong> small physical differences in the experiment lead to<br />

the instability <strong>of</strong> the jet. In Eq. 5, z denotes the direction<br />

<strong>of</strong> the cylindrical liquid column, ϕ the angle <strong>of</strong> the cylindrical<br />

coordinates, r(t,z,ϕ) the radius <strong>of</strong> the cylindrical<br />

liquid column, R 0 is the constant radius <strong>of</strong> the liquid column<br />

without disturbances, <strong>and</strong> ε 0 the amplitude <strong>of</strong> the<br />

disturbances. The wave number k <strong>of</strong> the disturbances in<br />

z-direction is a real variable <strong>and</strong> m is an integer. A cylindrical<br />

liquid column is unstable if any solution <strong>of</strong> the disturbances<br />

r(t,z,ϕ) with σ > 0 for any values for k <strong>and</strong> m<br />

exist. The formula for σ for an incompressible liquid jet<br />

was derived first by Lord Rayleigh 17<br />

σ<br />

2<br />

m<br />

T kR I' m( kR ) 2<br />

= 1−m<br />

−( kR0 ) 2 (6)<br />

R ρ I ( kR )<br />

0 0<br />

0 2 m 0<br />

( )<br />

with T the surface tension, ρ the density, I m (x) the modified<br />

Bessel functions <strong>of</strong> the first kind <strong>of</strong> order m for a<br />

purely imaginary argument, <strong>and</strong> I′ m (x) = dI′ m (x)/dx the<br />

derivative <strong>of</strong> I m (x) respect to the argument x. From Eq.<br />

6 it is apparent that<br />

2<br />

σ m < 0 for all m ≠ 0 <strong>and</strong> kR0<br />

> 0<br />

σ < 0 for x > 1 <strong>and</strong> σ> 0 for 0 < x < 1.<br />

0 2 0 2<br />

Therefore, no solution <strong>of</strong> the disturbances without a<br />

positive solution for σ exist for axisymmetric deformations.<br />

In other words, the liquid jet is unstable. From<br />

the instability <strong>of</strong> the jet follows the nonreproducibilty<br />

<strong>of</strong> the event, because the instability leads to a statistical<br />

distribution <strong>of</strong> the positions <strong>and</strong> the velocities <strong>of</strong> the<br />

satellite droplets after the break up. Only the position<br />

<strong>of</strong> the main droplet, <strong>and</strong> for some actuators, the position<br />

<strong>of</strong> the last satellite droplet are reproducible. As a<br />

result, the formation <strong>of</strong> the satellite droplets <strong>and</strong> their<br />

impact on the paper has to be investigated with real<br />

cinematographic visualization.<br />

(7)<br />

Visualization <strong>of</strong> the Real Printing Process<br />

Satellite droplets can influence the print quality negatively<br />

if the impact <strong>of</strong> the satellite droplets is outside a<br />

tolerable neighborhood <strong>of</strong> the main droplet. In further<br />

experiments, the ejection, the free flight, <strong>and</strong> the impact<br />

<strong>of</strong> droplets <strong>of</strong> an ink jet on print media under real<br />

printing conditions have been studied. Such experiments<br />

are necessary for the underst<strong>and</strong>ing <strong>of</strong> differences in<br />

the quality <strong>of</strong> different printers. The knowledge <strong>of</strong> the<br />

physics during the printing process can be used for the<br />

improvement <strong>of</strong> new printer generations.<br />

Accounting for the nonreproducibility <strong>of</strong> the break up<br />

<strong>of</strong> the ink jet, the experiment has to be performed with<br />

realcinematographic visualization. Because the droplet<br />

is ejected from the moving printhead with a defined<br />

velocity during the printing process, the printhead has<br />

to be moved with the same velocity in the experiment. A<br />

Hewlett Packard Desk Jet 500 printer has been prepared<br />

for the experiment to guarantee realistic conditions<br />

during the experiment. We have integrated the printer<br />

in our new test rig to visualize the printing process, with<br />

real high-speed cine photomicrography . The ink jet<br />

printhead is moved with the original drive under the<br />

objective <strong>of</strong> the microscope. This feature is important<br />

to ensure that the velocity <strong>of</strong> the printhead is realistic.<br />

All unnecessary parts <strong>of</strong> the printer <strong>and</strong> the<br />

printhead have been removed to avoid shadows in the<br />

beam path <strong>and</strong> to enable the use <strong>of</strong> the brightfield transmitted<br />

light method for ligh ting. Although the<br />

printhead was fixed back to front on the printhead<br />

carrier there was not enough room for the condenser<br />

<strong>of</strong> the microscope. The light intensity is sufficient to<br />

achieve a exposure time <strong>of</strong> 600 ns without condenser .<br />

The print medium is attached opposite to the printhead.<br />

Normal copying paper was chosen as print medium. The<br />

whole arrangement is shown in Fig. 6.<br />

It is interesting that no specification about the real<br />

distance between paper <strong>and</strong> printhead can be found in<br />

the literature. The aim <strong>of</strong> the experiment is not the exact<br />

measurement <strong>of</strong> the printing process in the HP Desk<br />

Jet 500 printer but the demonstration <strong>of</strong> the potential <strong>of</strong><br />

real high speed cine photomicrography for the characterization<br />

<strong>of</strong> ink jet printers. Therefore, the distance between<br />

printhead <strong>and</strong> paper was adjusted visually. When<br />

the printhead reaches the position under the objective a<br />

light barrier synchronizes the droplet ejection, the light<br />

pulse, <strong>and</strong> the recordings <strong>of</strong> the camera. The light barrier<br />

is fixed on the rail <strong>of</strong> the printhead to measure the<br />

Investigations <strong>of</strong> Nonreproducible Phenomena in Thermal Ink Jets ...Photomicrography <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 329


Figure 7. Flight <strong>of</strong> a droplet ejected from the moving ink jet printhead <strong>and</strong> its impact on paper.<br />

time point when the printhead reaches a defined position.<br />

The light barrier has a 5 V output if there is no<br />

interruption is in the light barrier. The output is zero if<br />

the slide <strong>of</strong> the printhead moves between the luminescent<br />

diode <strong>and</strong> the phototransistor <strong>of</strong> the light barrier.<br />

The signal <strong>of</strong> the light barrier with respect to time <strong>and</strong><br />

the length <strong>of</strong> the slide, 2.2 mm has been used to determine<br />

the velocity <strong>of</strong> the printhead as 0.68 m/s. The<br />

printhead generates a trigger signal if it meets the light<br />

barrier to synchronize the high speed camera. The delay<br />

generator in the camera synchronizes the shootings,<br />

the flash, <strong>and</strong> the droplet ejection.<br />

The prepared printer is attached to a table adjustable<br />

in height to enable the adjustment <strong>of</strong> the sharpness <strong>of</strong><br />

the image <strong>of</strong> the ejected droplet. After this adjustment,<br />

the delay between the trigger signal <strong>of</strong> the light barrier<br />

<strong>and</strong> the exposures are varied. The droplet is ejected<br />

under the objective <strong>of</strong> the microscope if the droplet is<br />

imaged in the middle <strong>of</strong> the camera sensor . Then, the<br />

arrangement is completely adjusted <strong>and</strong> the visualization<br />

<strong>of</strong> the printing process under real conditions can be<br />

performed. Figure 7 shows the flight <strong>of</strong> a droplet ejected<br />

from the moving ink jet printhead <strong>and</strong> its impact on the<br />

print medium. An exposure time <strong>of</strong> 600 ns <strong>and</strong> an<br />

interframe time <strong>of</strong> 20 µs were used for this visualization.<br />

The printhead moves from right to left. The visualization<br />

shows that the main droplet does not penetrate into the<br />

paper immediately. Because <strong>of</strong> the inertial impulse the<br />

ink jet is also tilted towards the direction <strong>of</strong> the moving<br />

printhead. Therefore, the impact <strong>of</strong> the satellite droplets<br />

is outside the neighborhood <strong>of</strong> the main droplet. Because<br />

<strong>of</strong> the penetration <strong>of</strong> the ink into the paper this does<br />

not influence the print quality negatively . The dot <strong>of</strong><br />

the main droplet is bigger than the sprinkled area on<br />

the paper which can be seen on the image sequence in<br />

Fig. 7.<br />

Conclusions<br />

In this article, the potential <strong>of</strong> the realcinematographic<br />

visualization method for investigation <strong>and</strong> character -<br />

ization <strong>of</strong> thermal ink jet printers is demonstrated. Our<br />

new test rig is described <strong>and</strong> the realcinematographic<br />

visualization <strong>of</strong> the bubble generation, the break up <strong>of</strong><br />

the liquid jet <strong>and</strong> the impact <strong>of</strong> the jet on a print medium<br />

is presented for the first time. This article shows<br />

that unstable phenomena lead to nonreproducible<br />

events. Nonreproducible events have to be investigated<br />

with real high-speed cinematograhy . The aim <strong>of</strong> this<br />

article is the demonstration <strong>of</strong> the necessity <strong>of</strong> the real<br />

high-speed cine photomicrography for the characterization<br />

<strong>of</strong> nonreproducible processes in microdevices. Future<br />

research is directed towards studying the<br />

phenomena in micro fluidic devices, e.g., the flow behavior<br />

inside a thermal ink jet printhead.<br />

References<br />

1. P. Egelhaaf <strong>and</strong> K. Mayer, Mikrosystemtechnik: Von der<br />

Forschung zu innovativen Produkten, Physikalische Blätter 52,<br />

900 (1996).<br />

2. M. Fong Ho <strong>and</strong> B. Keefe, Challenges in the development <strong>of</strong> high speed,<br />

true 600 dpi thermal ink jet printing, Proc. SPIE 2658, 51 (1996).<br />

3. G. Beurer, E. P. H<strong>of</strong>er <strong>and</strong> J. Patzer, Process control for improvement<br />

<strong>of</strong> print quality <strong>and</strong> life time <strong>of</strong> bubble-jet printers, Proc. SPIE<br />

2171, 101 (1995).<br />

4. M. O´Horo, J. Andrews <strong>and</strong> G. Russel, Effect <strong>of</strong> TIJ heater surface<br />

topology on vapor bubble nucleation, Proc. SPIE 2658, 58 (1996).<br />

5. K. Tsuchii, Y. Tumara, A. Asai, <strong>and</strong> H. Yaegashi, Analysis <strong>of</strong> bubble<br />

pressure in bubble jet printing technology, IS&T’s 9th International<br />

Congress on Non-Impact Printing Technologies/Japan Hardcopy,<br />

IS&T, Springfield, VA, 1993, p. 235.<br />

330 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Rembe et al.


6. S. D. Rapoport, M. Reed <strong>and</strong> L. Weiss, Fabrication <strong>and</strong> testing <strong>of</strong> a<br />

microynamic motor for blood flow measurements, J. Micromech.<br />

Microeng. 1, 60 (1991).<br />

7. L. Tavrow, S. Bart <strong>and</strong> J. Labg, Operational characteristics <strong>of</strong><br />

micr<strong>of</strong>abricated electric motors, Sensors <strong>and</strong> Actuators A, 35, 33<br />

(1992).<br />

8. C. Rembe, J. Patzer, E. P. H<strong>of</strong>er, <strong>and</strong> P. Krehl, Realcinematographic<br />

visualization <strong>of</strong> droplet ejection in thermal ink jets, J. <strong>Imaging</strong>. Sci.<br />

Technol. 40, 401 (1996).<br />

9. E. P. H<strong>of</strong>er, C. Rembe <strong>and</strong> M. Beuten, High speed cinematography<br />

<strong>of</strong> dynamical process in micro devices, J. Brazilien Society <strong>of</strong> Mech.<br />

Sci. RBCM: Revista, Brasileira de Ciências Mecânicas, 21, 71 (1999).<br />

10. P. Krehl, S. Engemann, C. Rembe, <strong>and</strong> E. P. H<strong>of</strong>er, Versatile microscope-coupled<br />

high-intensity pulsed light source for high-speed cine<br />

photomicrography <strong>of</strong> microactuators, Proc. SPIE 2869, 472 (1996).<br />

11. W. Bursik, D. Hackleman, S. Hall, P. Kanarek, R. Low, K. Trueba,<br />

<strong>and</strong> R. Van de Poll, Development <strong>of</strong> a high-resolution thermal inkjet<br />

printhead, Hewlett Packard <strong>Journal</strong>, 55 (October 1988).<br />

12. L. Jackson, K. Kelly, D. Pinkernell, S. Rasmussen, <strong>and</strong> J. Widder,<br />

DeskJet printer chassis <strong>and</strong> mechanism design, Hewlett Packard<br />

<strong>Journal</strong>, 67 (October 1988).<br />

13. L. D. L<strong>and</strong>au <strong>and</strong> E. M. Lifshitz, Hydrodynamics, Pergamon, New<br />

York, 1982.<br />

14. S. aus der Wiesche, C. Rembe <strong>and</strong> E. P. H<strong>of</strong>er, Boiling <strong>of</strong> superheated<br />

liquids near the spinodal: 1 general theory, Heat <strong>and</strong> Mass<br />

Transfer, 35 (1999).<br />

15. S. aus der Wiesche, C. Rembe <strong>and</strong> E. P. H<strong>of</strong>er, Boiling <strong>of</strong> superheated<br />

liquids near the spinodal: 2 application, Heat <strong>and</strong> Mass Transfer,<br />

35, 25 (1999).<br />

16. S. Ch<strong>and</strong>rasekhar, Hydrodynamic <strong>and</strong> hydromagnetic stability, Dover<br />

Publications Inc., 1981.<br />

17. Lord Rayleigh, On the instability <strong>of</strong> jets, Proc. Lond. Math. Soc. 10,<br />

pp. 4–18, (1879).<br />

Investigations <strong>of</strong> Nonreproducible Phenomena in Thermal Ink Jets ...Photomicrography <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 331


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

New Thermal Ink Jet Printhead with Improved Energy Efficiency<br />

Using Silicon Reactive Ion Etching<br />

Masahiko Fujii, ▲ Toshinobu Hamazaki* <strong>and</strong> Kenji Ikeda<br />

New Marking Development Department, Fuji Xerox Co., Ltd., Kanagawa-pref., Japan<br />

*Marking Device Development Department, Fuji Xerox Co., Ltd., Kanagawa-pref., Japan<br />

In thermal ink jet (TIJ) printhead design, in order to satisfy various market dem<strong>and</strong>s, it is important to consider how effectively<br />

the printhead transfers input energy to ejected drop performance. First, we defined energy efficiency as a ratio <strong>of</strong> ejected ink<br />

drop energy (the sum <strong>of</strong> kinetic <strong>and</strong> surface energy) to consuming electric energy in the heater <strong>of</strong> thermal ink jet printhead. We<br />

examined a method for increasing the energy efficiency in terms <strong>of</strong> printhead design, <strong>and</strong> we found that it relates with an<br />

inertance ratio <strong>of</strong> the rear fluid pass to the front. We proposed a new side shooter thermal ink jet printhead for improvement <strong>of</strong><br />

the inertance ratio, <strong>and</strong> we tried to fabricate channels on silicon wafers by a reactive ion etching (RIE). The printhead achieved<br />

higher energy efficiency when compared with the conventional design <strong>and</strong> it has been proved that high energy efficiency enables<br />

low consuming energy or high drop energy, <strong>and</strong> other good characteristics have been also obtained by the printhead.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 332–338 (1999)<br />

Introduction<br />

Since personal computers have been spread widely <strong>and</strong><br />

Internet environments have been prepared rapidly ,<br />

people can get various fine images that they want from<br />

all over the world. In addition, because digital cameras<br />

have become cheaper <strong>and</strong> the pixel number <strong>of</strong> CCD has<br />

increased (already exceeding ‘Mega-Pixel’), we can see<br />

high quality images on our computers at home easily .<br />

As a natural desire, we want to print these images on<br />

paper <strong>and</strong> see them in our h<strong>and</strong>s.<br />

Recently, most <strong>of</strong>fice documents have been colored to<br />

appeal to readers. So, the dem<strong>and</strong> for producing many<br />

high quality color documents at high speeds has been<br />

increased today.<br />

In these situations, small, inexpensive, high image<br />

quality, high speed <strong>and</strong> highly reliable color printers<br />

have become more desirable. We believe, <strong>and</strong> it is recognized<br />

in the market, that thermal ink jet (TIJ) printing<br />

has a high potential to satisfy these dem<strong>and</strong>s in both<br />

home <strong>and</strong> <strong>of</strong>fice environments because ink drop ejection<br />

<strong>and</strong> the printing mechanism in thermal ink jet are very<br />

simple.<br />

In order to respond to the above market dem<strong>and</strong>s, it is<br />

important to consider how little energy TIJ printhead<br />

consumes <strong>and</strong> the high performance it <strong>of</strong>fers. Namely ,<br />

we must consider such a printhead design that can effectively<br />

transfer input electric energy to a desired drop<br />

performance. We call this transformation efficiency energy<br />

efficiency <strong>of</strong> TIJ printhead. If we can get high efficiency,<br />

we will be able to achieve low energy consumption<br />

Original manuscript received July 10, 1998<br />

▲ IS&T Member<br />

©1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

to get a desired performance (drop volume), or get a high<br />

performance (drop velocity) at the same consuming energy.<br />

The former case makes the printer size smaller <strong>and</strong><br />

decreases its cost. The latter can widen the variety <strong>of</strong><br />

inks <strong>and</strong> decrease maintenance work load, <strong>and</strong> consequently<br />

achieve high image quality <strong>and</strong> high reliability.<br />

Energy Loss in Thermal Ink Jet <strong>and</strong> Definition <strong>of</strong><br />

Energy Efficiency<br />

Figure 1 shows the schematic diagram <strong>of</strong> a typical side<br />

shooter TIJ printhead. After an electric pulse <strong>of</strong> several<br />

microseconds is applied to the heater, the temperature<br />

on the heater surface increases rapidly <strong>and</strong> reaches to<br />

a superheat temperature. Homogeneous nucleation occurs,<br />

<strong>and</strong> a vapor bubble is generated with high pressure.<br />

The high pressure bubble pushes ink both forward<br />

(to the nozzle) <strong>and</strong> backward (to the reservoir). The<br />

pushed ink overcomes surface tension <strong>of</strong> the meniscus<br />

<strong>and</strong> forms an ink drop.<br />

In this process, when electric energy supplied from the<br />

power source is changed to ink drop energy , a great<br />

amount <strong>of</strong> energy loss occurs. The energy losses can be<br />

classified by physical phenomena or locations where they<br />

occur:<br />

1. Electric loss in electrode <strong>and</strong> driver (IR drop):<br />

electric energy changes only partially into heat due<br />

to the resistance <strong>of</strong> electrode <strong>and</strong> driver.<br />

2. Thermal transfer around the heater:<br />

heat generated at the heater layer is transferred not<br />

only to the upper , but also to the lower <strong>and</strong> side<br />

directions.<br />

3. Bubble generation:<br />

not all <strong>of</strong> the energy transferred to the interface <strong>of</strong><br />

heater surface <strong>and</strong> ink contributes to bubble<br />

generations <strong>and</strong> growth.<br />

332


Nozzle<br />

Ink Drop<br />

(5)<br />

Channel Substrate<br />

Front pass<br />

Rear pass<br />

(4)<br />

Bubble (3)<br />

Ink flow<br />

Inlet<br />

Reservoir<br />

Electrode2<br />

Ink Meniscus<br />

t p<br />

Electric Pulse<br />

(2)<br />

Heater<br />

Electrode1<br />

Heater Substrate<br />

Driver<br />

Id<br />

R (1)<br />

R<br />

h R 3<br />

1<br />

V d<br />

R 2 Electrode2<br />

Power Source<br />

Figure 1. Schematic diagram <strong>of</strong> a typical side shooter TIJ<br />

printhead. The number desginates the order in which phenomena<br />

occur or the locations where energy losses occur in the drop<br />

ejection process.<br />

4. Pressure propagation (distribution) in the fluid pass:<br />

bubble pressure pushes ink both to the nozzle <strong>and</strong> to<br />

the reservoir.<br />

5. Surface tension at the nozzle:<br />

surface tension resists ink movement <strong>and</strong> drop<br />

formation.<br />

In the above classification, the 4th term, pressure<br />

propagation (distribution), depends on the fluid pass design.<br />

IR drop <strong>and</strong> thermal transfer are <strong>of</strong> course important<br />

subjects in printhead design, but they will be<br />

argued on another occasion. Herein, we discuss the improvement<br />

<strong>of</strong> pressure propagation by modification <strong>of</strong><br />

fluid pass design.<br />

Transducer effectiveness as a relation <strong>of</strong> ejected drop<br />

volume <strong>and</strong> transducer displacement was investigated<br />

<strong>and</strong> the effectiveness was compared between Piezo <strong>and</strong><br />

TIJ printheads. 1<br />

First, we define energy efficiency (EF) in thermal ink<br />

jet printhead as a ratio <strong>of</strong> drop energy E d to consuming<br />

energy consumed by the heater E h . 2<br />

Ed<br />

EF = (1)<br />

E<br />

Energy consumed by the heater E h is estimated as<br />

h<br />

2<br />

Eh = Id ⋅Rh⋅tp<br />

where I d , R h <strong>and</strong> t p are electric current, heater resistance<br />

<strong>and</strong> pulse width, respectively . Defining this energy<br />

as Eq. 2 can exclude the effect <strong>of</strong> IR drop in the<br />

electrode <strong>and</strong> driver in this discussion. Drop energy is<br />

the sum <strong>of</strong> drop kinetic energy E k <strong>and</strong> surface energy E s<br />

given by 3 1 2<br />

Ek = ⋅md ⋅vd<br />

(3)<br />

2<br />

E<br />

s<br />

2<br />

d<br />

(2)<br />

= 4⋅π⋅r<br />

⋅σ (4)<br />

where m d , v d , r d are the mass <strong>of</strong> ejected ink drop, initial<br />

velocity, <strong>and</strong> drop radius respectively <strong>and</strong> σ is an ink<br />

surface tension. Drop radius r d is calculated as the radius<br />

<strong>of</strong> a complete sphere based on the measured mass,<br />

including satellite drops.<br />

Figure 2. Fuji Xerox conventional TIJ printhead (Slit Bypass<br />

[SB] design). Printhead has channels fabricated by ODE,<br />

heater pit <strong>and</strong> slit bypass characteristically. Nozzle shape is<br />

an isosceles triangle with 54.7° base angle. (Roman numerals<br />

indicate divided pass for calculation <strong>of</strong> inertance.)<br />

Comparison <strong>of</strong> Energy Efficiency <strong>and</strong> Inertance<br />

Ratio in Various TIJ Printheads<br />

Considering the ink motion by bubble growth in the fluid<br />

pass, we examined the relationship <strong>of</strong> ink mobility<br />

(namely, the reverse <strong>of</strong> pressure loss) with fluid pass<br />

structure. Pressure loss ∆p is described as 4<br />

∆p = L⋅ dq + Rq ⋅ (5)<br />

dt<br />

where L <strong>and</strong> R are inertance <strong>and</strong> resistance respectively,<br />

<strong>and</strong> q is the flow rate <strong>of</strong> ink. As we can see from this equation,<br />

in a rapid motion like a bubble growth (≤10 µs), the<br />

inertance is dominant in ink mobility.<br />

We considered that the ratio <strong>of</strong> heater rear inertance<br />

L r to heater front inertance L f relates to the efficiency <strong>of</strong><br />

bubble pressure propagation toward the nozzle. We defined<br />

the inertance ratio K as follows,<br />

Lr<br />

K =<br />

L + L<br />

Suffixes f <strong>and</strong> r mean the front <strong>and</strong> rear pass (refer to<br />

Fig. 1). We calculated the inertance <strong>of</strong> each pass as<br />

f<br />

r<br />

(6)<br />

li<br />

L = ρ ⋅∑<br />

s<br />

(7)<br />

where ρ is ink density, l <strong>and</strong> s are fluid pass length <strong>and</strong><br />

cross-sectional area.<br />

Figure 2 shows the schematic diagram <strong>of</strong> our conventional<br />

side shooter thermal ink jet printhead called as<br />

Slit Bypass (SB) design. 5 Channel (fluid pass) is formed<br />

by ODE (Orientation Dependent Etching) on a silicon<br />

i<br />

New Thermal Ink Jet Printhead with Improved Energy Efficiency ...Etching <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 333


channel wafer (C/W), hence the cross sectional shape <strong>of</strong><br />

the channel is an isosceles triangle with 54.7 ° base<br />

angle, <strong>and</strong> it is difficult to change the width in the middle<br />

<strong>of</strong> channel. Reservoir <strong>and</strong> inlet are also formed by ODE.<br />

A polyimide pattern on the silicon heater wafer (H/W)<br />

forms the heater pit <strong>and</strong> slit bypass. The heater pit prevents<br />

air ingestion from the nozzle 6 <strong>and</strong> the slit bypass<br />

introduces ink from the reservoir to the channel. The<br />

heater is located on the pit bottom. Poly-silicon with<br />

reduced resistivity by doping is used for the heater to<br />

heat ink. High doped polysilicon exists between the<br />

heater <strong>and</strong> Aluminum electrode. Tantalum covers over<br />

the heater polysilicon to prevent mechanical damages<br />

due to bubble cavitations. (not shown in Fig. 2).<br />

We analyzed our conventional <strong>and</strong> competitive TIJ<br />

printheads (available in the market) having various designs<br />

<strong>and</strong> different nozzle pitches (resolutions), <strong>and</strong> we<br />

calculated their inertance ratio K according to Eqs. 6<br />

<strong>and</strong> 7. In the calculation <strong>of</strong> inertance for our SB design,<br />

we divided fluid pass into six sections symbolized by<br />

roman numerals in Fig. 2, <strong>and</strong> calculated L f <strong>and</strong> L r by<br />

adding each sections’ inertance. In the case <strong>of</strong> cross sectional<br />

area changes in a section, e.g., section V, average<br />

area is used for Eq. 7. As for the ro<strong>of</strong> shooter design, it<br />

is difficult to divide the fluid pass into the front or rear<br />

part. We defined that the area above the heater is the<br />

front part <strong>and</strong> the area from the heater to the reservoir<br />

is the rear part.<br />

We also evaluated drop volume <strong>and</strong> drop velocity performances<br />

with our dye-based ink <strong>and</strong> calculated the<br />

energy efficiency under st<strong>and</strong>ard drive conditions (voltage<br />

<strong>and</strong> pulse width).<br />

Figure 3 shows the relationship <strong>of</strong> inertance ratio K<br />

with energy efficiency between Fuji Xerox <strong>and</strong> competitive<br />

TIJ printheads. When we compare them in terms<br />

<strong>of</strong> the energy efficiency, it is necessary to note that the<br />

energy loss in the thermal transfer process depends on<br />

heater layer structure. We neglected it here.<br />

The physical properties <strong>of</strong> dye-based ink used in evaluations<br />

are also shown in Fig. 3.<br />

Inertance ratio K has a good correlation with energy<br />

efficiency among various designs <strong>of</strong> printheads. In the<br />

experiments, Ro<strong>of</strong> Shooter B showed high efficiency because<br />

<strong>of</strong> high inertance ratio. As usual, the ro<strong>of</strong> shooter<br />

is obliged to have a 2D alignment <strong>of</strong> heaters <strong>and</strong> nozzles,<br />

<strong>and</strong> the space from heater to nozzle can become large.<br />

Therefore the ro<strong>of</strong> shooter can have a high inertance<br />

ratio. Thus, the printhead size becomes larger in a ro<strong>of</strong><br />

shooter.<br />

Latency in Ink Jet Printers<br />

High drop in kinetic energy is necessary to keep high<br />

reliability in ink jet printers for the following reason.<br />

When drop ejection is halted, ink viscosity near the<br />

nozzle becomes higher because <strong>of</strong> evaporation <strong>of</strong> ink<br />

components with low boiling point. 7 Therefore, the first<br />

ejected drop after idling may be misdirected or decelerated<br />

by viscous or solidified ink.<br />

Figure 4 shows how the transit time depends on the<br />

idle time. Transit time is the time required for an ejected<br />

drop to fly from the nozzle to a 1.5 mm distant position,<br />

which is measured by an optical drop sensor. 8 In the worst<br />

case (the idle time is too long), no drop is ejected.<br />

We evaluated the image quality ins<strong>of</strong>ar as it is affected<br />

by the idle time, <strong>and</strong> defined latency as the idle time<br />

generating no image defect. No image defect in our experiment<br />

infers that dot displacement from an ideal position<br />

is under 30 µm on paper at a 1.5 mm distance<br />

from the nozzle.<br />

Energy Efficiency [EF] (× 10 -4 )<br />

Fuji Xerox conventional side shooter [400/600/800dpi]<br />

Competitor A (side shooter) [360dpi]<br />

Competitor B (ro<strong>of</strong> shooter) [300dpi]<br />

Figure 3. Inertance ratio versus efficiency. Inertance ratio has<br />

a high correlation with energy efficiency. (Small triangle symbol<br />

designates Trench printhead data, explained later in this<br />

paper.)<br />

1400<br />

1200<br />

1000<br />

800<br />

600<br />

400<br />

200<br />

0<br />

26°C<br />

65%RH<br />

Inertance Ration [K]<br />

Carbon Ink<br />

1 10<br />

100<br />

Idle Time (s)<br />

Dye Ink<br />

Figure 4. Transit time depends on idle time <strong>and</strong> ink. Carbon<br />

black ink is worse in latency than dye-based ink.<br />

Figure 5 shows photographs <strong>of</strong> printed dots on paper.<br />

In Photo (a), the first dots’ displacement is under 30 µm<br />

<strong>and</strong> the image quality is judged as fair; the displacement<br />

in Photo (b) is just over 30 µm <strong>and</strong> defines this<br />

idle time as latency.<br />

If we can get a long latency, it is possible to extend<br />

the maintenance interval, namely by decreasing the<br />

amount <strong>of</strong> ink consumed by dummy jetting <strong>and</strong><br />

vacuuming to exhaust viscous ink, thereby enhancing<br />

productivity.<br />

334 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Fujii et al.


TABLE I. Physical Properties <strong>of</strong> Typical <strong>Material</strong>s for Channel<br />

Substrate<br />

<strong>Material</strong> Thermal Conductivity Coefficient <strong>of</strong> Thermal<br />

(W • m –1 • K –1 ) Expansion (10 –5 • K –1 )<br />

Silicon 168 0.415<br />

Polysulfone 0.15 5.5<br />

Polyethersulfone 0.26 5.5<br />

25<br />

20<br />

DJ850C<br />

Black Ink<br />

Figure 5. Image defects <strong>and</strong> latency criteria in terms <strong>of</strong> dot<br />

displacement. First dots in Photo (b) are 30 µm from an indeal<br />

position, <strong>and</strong> the idle time in this case is defined as latency.<br />

According to our experiments, latency also depends on<br />

ink components (formulations). Text quality with car -<br />

bon black ink is superior to that with dye-based ink.<br />

Our experiments, however, showed that carbon black<br />

ink is worse in latency than dye based ink. We also measured<br />

latency <strong>and</strong> performance with carbon black ink<br />

(HP Desk Jet 850C black ink).<br />

Figure 6 shows the relationship between measured<br />

latency <strong>and</strong> drop kinetic energy with 850C black ink<br />

(rectangular symbols with solid line). In this experiment,<br />

we obtained various kinetic energies by changing the<br />

drive conditions (voltage, pulse width) or using differ -<br />

ent designed printheads. W e can see from Fig. 6 that<br />

when the drop kinetic energy becomes higher , latency,<br />

one <strong>of</strong> printer reliability, becomes longer. In most cases,<br />

drop volume is fixed by image quality (dot size), so high<br />

kinetic energy means high velocity. High drop velocity<br />

is necessary to obtain a long latency.<br />

New TIJ Printhead with Channels Formed by Silicon<br />

Reactive Ion Etching (RIE)<br />

In our conventional design shown in Fig. 2, desired drop<br />

volume almost fixes the nozzle width <strong>and</strong> even the channel<br />

width, because the channel is shaped by ODE. If we<br />

want to increase the inertance ratio to improve the energy<br />

efficiency based on Fig. 3, the length <strong>of</strong> the rear<br />

channel will be long. But in this case, the resistance <strong>of</strong><br />

the rear channel will be also increased, <strong>and</strong> it deteriorates<br />

the efficiency <strong>of</strong> the ink refill, which occurs over a<br />

relatively long time (100 to 200 µs). To obtain higher<br />

drop velocity, the nozzle width is reduced further with<br />

larger heater size, <strong>and</strong> in this case, to keep a high<br />

inertance ratio, the rear resistance will be larger <strong>and</strong><br />

the energy consumed will be increased further because<br />

<strong>of</strong> large heater size.<br />

If we can narrow only the nozzle width that dominates<br />

the drop volume <strong>and</strong> velocity, <strong>and</strong> exp<strong>and</strong> pass width,<br />

we will be able to achieve a high inertance ratio with a<br />

low resistance. To realize this design concept, it is important<br />

to enlarge the difference between nozzle <strong>and</strong><br />

channel width.<br />

One <strong>of</strong> the methods to narrow the nozzle is plastic injection<br />

molding compiled with laser ablation. By this method,<br />

however, it is difficult to make a large difference in width<br />

due to fabrication problems. Another problem is that the<br />

15<br />

10<br />

5<br />

26°C<br />

65%RH<br />

0<br />

0 1 2 3 4 5 6<br />

Drop Kinetic Energy (nJ)<br />

Figure 6. Latency dependence on drop kinetic energy. High kinetic<br />

energy can extend Latency.(Triangle symbols with dotted<br />

line will be explained later in this paper.)<br />

difference in the thermal expansion coefficients is large<br />

between plastic <strong>and</strong> silicon materials comprising the<br />

heater substrate. Thermal conductivity is also low, which<br />

affects the thermal accumulation <strong>of</strong> the printhead.<br />

Table I shows the physical properties (the coefficient <strong>of</strong><br />

thermal expansion <strong>and</strong> thermal conductivity) <strong>of</strong> silicon<br />

<strong>and</strong> typical materials used in this plastic fabrication<br />

method. This method is unsuitable to increase the nozzle<br />

number with a long printhead due to the gap or stress<br />

being large between the channel <strong>and</strong> the heater substrate.<br />

Considering the above problems, namely , the difference<br />

between the nozzle <strong>and</strong> other pass width, thermal<br />

expansion, <strong>and</strong> thermal conductivity, we focused on silicon<br />

reactive ion etching (RIE) 9 as a channel fabrication<br />

method. We tried to fabricate a new printhead using this<br />

method to achieve better energy efficiency than our conventional<br />

printhead.<br />

Next, we explain the channel fabrication process in<br />

this new printhead. Inlet <strong>and</strong> reservoir are formed by<br />

ODE first, in the same manner as our conventional<br />

printhead. ODE has a high etching rate in comparison<br />

with RIE for silicon, hence it is useful to form a deep<br />

hole like a reservoir . Next, channels (fluid pass) are<br />

formed by RIE <strong>and</strong> a rectangular shaped nozzle is<br />

formed by dicing an aligned <strong>and</strong> bonded channel <strong>and</strong><br />

heater wafer. 10<br />

Figure 7 shows the schematic diagram <strong>of</strong> a new<br />

printhead with channels fabricated by silicon RIE.<br />

New Thermal Ink Jet Printhead with Improved Energy Efficiency ...Etching <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 335


Figure 8. SEM photograph <strong>of</strong> channels formed by RIE (without<br />

channel pit). Channels are aligned in 800 dpi.<br />

50<br />

45<br />

SB Printhead<br />

Figure 7. Fuji Xerox new Thermal Ink Jet Printhead (Trench<br />

Design). Channels are fabricated by RIE. Channel pit can be<br />

obtained by additional ODE process. (Roman numerals in top<br />

view means divided pass for calculation <strong>of</strong> inertance.<br />

40<br />

35<br />

Trench Printhead<br />

Channel height is fixed by etching time <strong>and</strong> rate, <strong>and</strong><br />

the etching rate depends on ion acceleration energy .<br />

Etching direction in RIE is also anisotropic because <strong>of</strong><br />

ion rectilinearity. We can obtain an accurate rectangular<br />

shape <strong>and</strong> size <strong>of</strong> channel over the printhead by controlling<br />

the etching time <strong>and</strong> energy.<br />

We squeezed the channel around the nozzle <strong>and</strong> at the<br />

entrance to the channel from the reservoir. We call this type<br />

<strong>of</strong> printhead the T rench design. In this design, the front<br />

squeezed length is important. If the length becomes longer,<br />

the front inertance will be larger. However, if it is too short,<br />

the meniscus after jetting will become extended <strong>and</strong> the<br />

capillary force will not act sufficiently in the refill process.<br />

If we add one more ODE process, we can obtain a channel<br />

pit as shown in Fig. 7. In this design, the channel<br />

size is extended, so the resistance <strong>of</strong> channel will be decreased<br />

further. 11 Also in the calculation <strong>of</strong> inertance for<br />

the Trench design, we divided fluid pass into twelve parts<br />

as shown in Fig. 7. L f is calculated by addition <strong>of</strong> each<br />

inertance from the part I to V. L r is from VII to XII.<br />

Figure 8 shows on SEM photograph <strong>of</strong> the channels<br />

formed by RIE from one <strong>of</strong> the new printhead designs.<br />

Nozzle pitch is about 32 µm, which corresponds to 800<br />

dpi. From this photo, it can be realized that channels are<br />

formed accurately even at a high resolution <strong>of</strong> 800 dpi.<br />

We believe this method can be applied to over 1600 dpi.<br />

We designed some printheads with nozzle pitches corresponding<br />

to 400 dpi <strong>and</strong> 800 dpi (with <strong>and</strong> without a<br />

channel pit), <strong>and</strong> we evaluated their performances using<br />

our dye-based ink <strong>and</strong> DJ850C black ink.<br />

Performances <strong>of</strong> a Newly Designed Printhead<br />

The performance <strong>of</strong> a new T rench design printhead is<br />

given in Table II. The performance <strong>of</strong> our conventional<br />

design (Slit Bypass) is also given in the same table for<br />

comparision. In both 400 dpi <strong>and</strong> 800 dpi/printheads,<br />

30<br />

25<br />

50% Coverage Image<br />

Drive Frequency : 5.4kHz<br />

20<br />

0 1 2 3 4 5<br />

Time (minute)<br />

Figure 9. Printhead temperature increase due to printing high<br />

coverage images. Both printhead have the same heat sink size.<br />

the energy efficiency <strong>of</strong> the new design (T rench) was<br />

more than 2 times greater, compared with the conventional<br />

design.<br />

The relationship between the intertance ratio <strong>and</strong> energy<br />

efficiency in the new T rench printhead also<br />

comforms to the trend in Fig. 3. (Small triangle symbols<br />

in Fig. 3 mean trench printheads’ data.) One <strong>of</strong> the<br />

trench printheads is a match for ro<strong>of</strong> shooter.<br />

In the 400 dpi printhead design, we intended to decrease<br />

the consuming energy especially, so the drop energy<br />

was increased only 1.4 times than the conventional<br />

design, whereas the consuming energy was decreased<br />

to 67%. In the 800 dpi design, we aimed to achieve high<br />

drop velocity because latency problem becomes more serious<br />

at high resolution. As shown in Table II, the kinetic<br />

energy with 850C ink increased 2.8 to 3.4 times<br />

<strong>and</strong> latency was extended 5 to 6 times.<br />

High energy efficiency enables low consumption energy<br />

or high drop energy depending on the balance <strong>of</strong><br />

nozzle <strong>and</strong> heater size in the printhead design.<br />

Figure 9 shows the increase <strong>of</strong> printhead temperature<br />

due to printing <strong>of</strong> high coverage images. The conventional<br />

336 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Fujii et al.


TABLE II. Comparison <strong>of</strong> Performances between New Trench <strong>and</strong> Conventional SB Design<br />

Slit Bypass Trench<br />

(Conventional) (New)<br />

Channel Pit - - A A B<br />

Nozzle Pitch (dpi) 400 800 400 800 800<br />

Inertance Ratio [K] 0.36 0.28 0.55 0.50 0.57<br />

Heater Energy [E h ] (µJ) 11.2 5.4 7.5 4.8 4.5<br />

Drop <strong>Vol</strong>ume [m d ] (ng) 37.8 10.6 43.4 14.0 12.3<br />

Drop Velocity [v d ] (m/s) 8.9 8.4 9.8 13.0 16.0<br />

Drop Kinetic Energy [E d ] (nJ) 1.50 0.37 2.08 1.18 1.57<br />

Surface Energy [E s ] (nJ) 0.19 0.08 0.21 0.10 0.09<br />

Energy Efficiency [EF] (×10 -4 ) 1.51 0.84 3.05 2.68 3.70<br />

Drop <strong>Vol</strong>ume [m d ] (ng) 44.2 10.3 50.5 19.1 14.3<br />

Drop Velocity [v d ] (m/s) 10.8 11.5 11.0 14.2 18.0<br />

Drop Kinetic Energy [E d ] (nJ) 2.58 0.68 3.05 1.92 2.32<br />

Latency (s) 10 2 20 10 12<br />

Channel Pit A: No Channel Pit<br />

B: Channel Pit Exists<br />

50<br />

45<br />

40<br />

Trench Printhead<br />

Peak<br />

Peak<br />

tube. Temperature increase due to printing generates<br />

bubbles from ink <strong>and</strong> enlarges their size. Enlarged<br />

bubbles prevent ink flow, so vacuuming is necessary periodically.<br />

Mobility <strong>of</strong> a bubble under vacuuming depends<br />

on its size <strong>and</strong> ink flow velocity, namely flow rate.<br />

According to Eq. 8, under the constant vacuum pressure<br />

P V , steady flow rate Q becomes larger as the total<br />

resistance <strong>of</strong> ink pass R T becomes smaller.<br />

35<br />

SB Printhead<br />

Q<br />

P V<br />

=<br />

R<br />

(8)<br />

T<br />

30<br />

25<br />

0 2 4 68 10 8 10 12 14 12 14 16<br />

Drive Frequency (kHz)<br />

Figure 10. Drop volume dependence on drive frequency. Peak <strong>of</strong><br />

Trench is 3kHz higher than that <strong>of</strong> SB.<br />

<strong>and</strong> new printheads have heat sinks <strong>of</strong> the same size.<br />

Heat accumulation was improved by the T rench<br />

printhead.<br />

Latency data <strong>of</strong> new designed printheads are shown<br />

in Fig. 6 again. (Small triangle symbols with dotted line).<br />

It appears that a different trend from the conventional<br />

exists. We believe that the reason why the Latency <strong>of</strong><br />

Trench printhead is better than the conventional trend<br />

is the effect <strong>of</strong> the squeezed part near the nozzle for<br />

evaporation.<br />

Figure 10 shows the change <strong>of</strong> drop volume as a function<br />

<strong>of</strong> drive frequency in 400 dpi printheads. Peak <strong>of</strong><br />

curve corresponds almost to the inverse <strong>of</strong> the refill time.<br />

Peak by the Trench design is about 9kHz—3kHz higher<br />

than that by the conventional printhead because <strong>of</strong> low<br />

flow resistance. It enables higher printing frequency in<br />

printer. The oscillation <strong>of</strong> the trench volume curve is<br />

larger than that <strong>of</strong> the SB for low resistance as well.<br />

Low flow resistance is good not only for refill speed<br />

but also bubble management in the reservoir <strong>and</strong> ink<br />

We can reduce R T by adopting the T rench printhead<br />

with small channel resistance R ch because R T is described<br />

as<br />

R<br />

T<br />

Rch<br />

⋅ RD<br />

=<br />

N ⋅ R + N ⋅R<br />

ch D D ch<br />

+ Rr<br />

+ Rpipe<br />

(9)<br />

where R ch , R d , R r <strong>and</strong> R pipe are the resistance <strong>of</strong> channel,<br />

dummy channel not being used for printing, reservoir<br />

<strong>and</strong> pipe from the ink tank to the printhead. N ch <strong>and</strong> N d<br />

are the number <strong>of</strong> channels <strong>and</strong> dummy channels.<br />

Figure 11 shows the distribution <strong>of</strong> calculated flow<br />

velocity in printheads for SB <strong>and</strong> T rench design with<br />

400 dpi nozzle pitch. In this figure, the flow velocity is<br />

slower as color gets darker . It is clear that the dead<br />

water area (low velocity area) in the trench printhead<br />

is smaller than the SB printhead. W e expect that the<br />

interval <strong>of</strong> vacuuming will be longer due to an increase<br />

in time for bubble growth to close channels.<br />

Conclusion<br />

We found that improvement <strong>of</strong> inertance ratio <strong>of</strong> the<br />

rear to the front is effective to increase the energy efficiency.<br />

Based on this point <strong>and</strong> other fabrication problems,<br />

we proposed a new thermal ink jet printhead with<br />

channels fabricated by silicon reactive ion etching. The<br />

new printhead showed high energy efficiency as we expected.<br />

It has been demonstrated that this high efficiency<br />

enables low energy consumption or high drop<br />

energy. The new printhead also showed other good<br />

characteristics (temperature accumulation, ink refill<br />

New Thermal Ink Jet Printhead with Improved Energy Efficiency ...Etching <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 337


Figure 11. Calculated ink flow velocity distribution in reservoir <strong>and</strong> channels. Dark tones indicate slow velocity area. Dead<br />

water area in Trench is smaller than that in SB. Velocity is high on both sides for dummy channels with reduced resistance.<br />

time <strong>and</strong> bubble management). The type <strong>of</strong> printhead<br />

that we proposed herein has advantages for high quality<br />

<strong>and</strong> high speed printing which satisfies the mar -<br />

ket dem<strong>and</strong>s.<br />

Acknowledgment. We would like to thank M. Murata<br />

<strong>and</strong> R. Nayve for suggestions on printhead design from<br />

the st<strong>and</strong>point <strong>of</strong> RIE process <strong>and</strong> channel fabrication.<br />

We are also thankful to A. Tohma for assistance with<br />

performance evaluations.<br />

References<br />

1. S. F. Pond, Drop-On-Dem<strong>and</strong> Ink Jet Transducer Effectiveness, IS&T’s<br />

Tenth International Congress on Advances in Non-Impact Printing<br />

Technologies, IS&T, Springfield, VA, 1994, p. 414.<br />

2. B. Hockwind, Design <strong>of</strong> Micromechanical Bubble-Jet Devices, IS&T’s<br />

9th International Congress on Advances in Non-Impact Printing Technologies,<br />

1993, IS&T, Springfield, VA, p. 237.<br />

3. S. Hirata, IEICE TRANS. ELECTRON E80-C, 214 (1997).<br />

4. N. Deshap<strong>and</strong>e, J. <strong>Imaging</strong> Sci. Technol. 40, 396, (1996).<br />

5. M. Fujii, Japan Patent H03-348525 (1991).<br />

6. P. A. Torpey, Prevention <strong>of</strong> Air Ingestion in a Thermal Ink Jet Device,<br />

IS&T’s 4th International Congress on Advances in Non-<br />

Impact Printing Technologies, 1988, IS&T, Springfield, VA, p. 275 .<br />

7. P. A. Torpey, Evaporation <strong>of</strong> A Two-Component Ink from The Nozzles<br />

<strong>of</strong> A Thermal Ink Jet Printhead, IS&T’s 6th International Congress on<br />

Advances in Non-Impact Printing Technologies, 1990, IS&T, Springfield,<br />

VA, p. 453.<br />

8. M. Fujii, Optical Drop Sensor <strong>of</strong> Continuos Ink Jet Printer, Proc. <strong>of</strong><br />

the Nineteenth Joint Conference on Image <strong>Technology</strong>, 1988, Tokyo,<br />

Japan, p. 83 (In Japanese).<br />

9. J. K. Bhaerdwaj, SPIE 2639, 224 (1995).<br />

10. R. Nayve <strong>and</strong> M. Fujii, Japan Patent H09-341658 (1997).<br />

11. M. Murata <strong>and</strong> M. Fujii, Japan Patent H09-341659 (1997).<br />

338 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Fujii et al.


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Thermal Dye Transfer Printing with Chelate Compounds<br />

Takao Abe, Shigeru Mano, Yorihiro Yamaya, <strong>and</strong> Atsushi Tomotake<br />

Konica Corporation, Central Research Laboratory, Tokyo, Japan<br />

With its excellent color <strong>and</strong> tone reproduction, thermal dye transfer printing produces continuous-tone color images that rival silver<br />

halide photography. However, conventional thermal dye transfer images fade easily when subjected to light or heat. T o solve this<br />

problem, we have studied a chelate compound system <strong>and</strong> have found that certain sets <strong>of</strong> azo dyes <strong>and</strong> transition metal cationproviding<br />

compounds produce dye-metal complexes, or “chelate compounds”, that provide exceptionally high image stability.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 339–344 (1999)<br />

Original manuscript received October 15, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

Introduction<br />

For many years, the only practical method <strong>of</strong> producing<br />

high-quality continuous-tone color images was silver halide<br />

photography. But today, several new technologies<br />

<strong>of</strong>fer images so beautiful that they are <strong>of</strong>ten mistaken<br />

for color photographs. Thermal dye transfer printing,<br />

with its excellent color <strong>and</strong> tone reproduction, is one<br />

such technology.<br />

Unfortunately, thermal dye transfer prints typically<br />

suffer from poor image stability when exposed to visible<br />

or ultraviolet light or if subjected to heat. Many<br />

approaches have been taken to solve this serious problem,<br />

including the addition <strong>of</strong> a protective layer over<br />

the dye receiver sheet, 1 addition <strong>of</strong> UV-light-absorbing<br />

agents <strong>and</strong> antioxidizing agents to the dye receiving<br />

layer, 2–4 addition <strong>of</strong> dye adsorbents to the dye receiving<br />

layer, 5,6 hardening <strong>of</strong> the dye receiving layer after thermal<br />

printing, 7 <strong>and</strong> employment <strong>of</strong> chemical reactions between<br />

reactive dyes <strong>and</strong> chemical agents in the dye<br />

receiving layer. 8–12<br />

Each <strong>of</strong> these approaches has had some success, but<br />

the latter approach has been most promising. In exploring<br />

the utility <strong>of</strong> chemical reactions between reactive<br />

dyes <strong>and</strong> chemical agents in the dye receiving layer, four<br />

likely avenues suggest themselves: the control <strong>of</strong> mor -<br />

dants by ionic bonding force, the production <strong>of</strong> relatively<br />

high molecular weight dyes within the dye receiving<br />

layer, the reaction <strong>of</strong> special agents such as UV-absorbing<br />

<strong>and</strong>/or antioxidant agents with dyes, <strong>and</strong> the chelate<br />

reaction <strong>of</strong> dyes.<br />

Examples <strong>of</strong> mordants controlled by an ionic bond<br />

include a dye with a phenolic OH group <strong>and</strong> a mordant<br />

with a base, as reported by Fuji Photo Film researchers,<br />

12 <strong>and</strong> a mixture <strong>of</strong> cationic dyes <strong>and</strong>alkylammoniummodified<br />

montmorillonite clays that provide protection<br />

from organic solvents <strong>and</strong> from hot water , as reported<br />

by Sony researchers. 13<br />

An example <strong>of</strong> a high molecular weight dye produced<br />

in the dye receiving layer is an arylidene dye produced<br />

by the reaction between a coupling agent <strong>and</strong> an electrophilic<br />

compound, as seen in an Eastman Kodak<br />

patent. 8<br />

While the reaction with dyes <strong>of</strong> such special agents<br />

as UV-absorbing <strong>and</strong>/or antioxidant agents holds promise,<br />

no published reports <strong>of</strong> research in this area are<br />

currently available.<br />

However, perhaps the most successful avenue has<br />

been to exploit the chelate reaction <strong>of</strong> dyes. 14,15 In this<br />

study, we investigated newly synthesized dyes <strong>and</strong> transition<br />

metal cation-providing compounds. W e utilized<br />

the chelate reaction <strong>of</strong> azo dyes with transition metal<br />

cations to form stable dye-metal complexes, that we refer<br />

to as chelate compounds, <strong>and</strong> observed dramatically<br />

enhanced image stability under exposure to light <strong>and</strong><br />

heat.<br />

Experimental<br />

The basic structure <strong>of</strong> the samples studied are shown in<br />

Fig. 1. For the dye donor sheet, a PET film substrate was<br />

used, with a thin backing layer to prevent sticking against<br />

the thermal heads. In addition to lubricants such as silicone<br />

compounds, the backing layer was occasionally composed<br />

<strong>of</strong> a resin hardened by chemical reaction with such<br />

compounds as isocyanate in order to make the backing<br />

layer heat resistant. On the obverse side <strong>of</strong> the dye donor<br />

sheet, a subbing layer was coated. Following that,<br />

dyes dissolved in an organic solvent with polymers were<br />

coated to create a dye donating layer . The relative dye<br />

concentration was about 40% in weight. These four layers<br />

constituted the basic structure <strong>of</strong> the dye donor sheet.<br />

For the dye receiver sheet, either resin-coated or synthetic<br />

paper could have been used as the substrate because<br />

the whiteness <strong>and</strong> touch <strong>of</strong> each are similar to<br />

photographic paper. We chose to use synthetic paper be-<br />

339


Figure 1. Structure <strong>of</strong> samples studied.<br />

cause <strong>of</strong> its higher thermal transfer sensitivity allowed<br />

easier observation <strong>of</strong> the systems under study. The reverse<br />

side consisted <strong>of</strong> a polyethylene layer <strong>and</strong> then a<br />

backing layer. The obverse side consisted <strong>of</strong> a TiO 2 white<br />

layer, then an adhesion layer, <strong>and</strong>, finally, a dye receiving<br />

layer. The receiving layer contained vinyl chloride–<br />

vinyl acetate copolymer as a binder <strong>and</strong> a metal<br />

cation-providing compound to produce dye-metal complexes.<br />

The relative concentration <strong>of</strong> the metal cationproviding<br />

compound was about 40% in weight. The<br />

whiteness <strong>of</strong> the receiver sheet was similar to conventional<br />

silver halide photographic paper <strong>and</strong> the values<br />

<strong>of</strong> (L, a*, b*) were (93–95, 0.5, –2.0).<br />

All <strong>of</strong> the metallizable dyes <strong>and</strong> metal cation-providing<br />

compounds were synthesized in our laboratory. The<br />

matters concerning the synthesis are described in another<br />

paper. 16<br />

Thermal dye transfer printing was performed by an<br />

<strong>of</strong>f-the-shelf CHC-S845-5C (Shinko Electric Co.) printer.<br />

No modification <strong>of</strong> hardware was made to accommodate<br />

the thermal dye transfer material samples fabricated<br />

for study, <strong>and</strong> color management was performed using<br />

computer s<strong>of</strong>tware, not computer hardware.<br />

The absorption spectra <strong>of</strong> dyes <strong>and</strong> chelate compounds<br />

were measured with an Hitachi U-3300 spectrophotometer,<br />

<strong>and</strong> we examined the effects <strong>of</strong> light <strong>and</strong> heat upon<br />

the stability <strong>of</strong> printed images. The lightfastness <strong>of</strong><br />

printed images was evaluated by measuring optical density<br />

after irradiation with a xenon lamp. To determine<br />

color fading, printed image samples were placed in an<br />

incubator at controlled temperatures for prescribed periods,<br />

<strong>and</strong> the optical density <strong>of</strong> the printed images were<br />

then measured. In addition, the degradation <strong>of</strong> imageedge<br />

sharpness was evaluated by measuring the optical<br />

density around image-edges with a microdensitometer.<br />

Results <strong>and</strong> Discussion<br />

The system utilizing chelate compounds consisted <strong>of</strong><br />

metallizable dyes <strong>and</strong> transition metal cation-providing<br />

compounds <strong>and</strong> Fig. 2 shows the fundamental structure<br />

<strong>of</strong> the metallizable dyes. From the report on metal<br />

complexes <strong>of</strong> o-hydroxyazobenzenes, 17 the chelate sites<br />

are expected to be located as shown in Fig. 2.<br />

These metallizable dyes had to meet a long list <strong>of</strong> requirements.<br />

They had to have sufficient reactivity with<br />

transition metal cation-providing compounds to produce<br />

the dye-metal complexes that we refer to as chelate compounds.<br />

The dyes had to be highly soluble in organic<br />

solvents in order to provide high manufacturing productivity<br />

<strong>of</strong> the dye donor sheets. They had to transfer<br />

efficiently from the dye donor sheet to the dye receiver<br />

sheet under the heating conditions <strong>of</strong> a conventional<br />

Figure 2. Metallizable dyes. Azo dyes with three metal chelating<br />

sites performed best.<br />

thermal dye transfer printing system. Also, they had to<br />

serve product development dem<strong>and</strong>s for long shelf life,<br />

faithful color reproduction, product safety, <strong>and</strong> environmental<br />

protection. To all <strong>of</strong> these dem<strong>and</strong>s, the best performance<br />

was found in azo dyes with three metal<br />

chelating sites for a transition metal cation.<br />

The transition metal cation-providing compounds<br />

that function as metal cation sources consist <strong>of</strong> a transition<br />

metal cation, lig<strong>and</strong>s, <strong>and</strong> counter anions (if the<br />

lig<strong>and</strong> has no charge), as shown in Fig. 3. The transition<br />

metal cation strongly affects the hue, light stability,<br />

<strong>and</strong> heat stability <strong>of</strong> the printed images, as well as<br />

reactivity with the metallizable dyes; we examined cobalt,<br />

copper, zinc, <strong>and</strong> nickel. The metal chelating lig<strong>and</strong>s<br />

influence reactivity with metallizable dyes, as well as<br />

shelf life, whiteness, <strong>and</strong> the solubility <strong>of</strong> the transition<br />

metal-cation-providing compound in organic solvents; we<br />

examined ethylene diamine, α-amino acid amide, <strong>and</strong><br />

β-diketone lig<strong>and</strong>s. The counter anions, when present,<br />

also influence solubility in organic solvents.<br />

As reported previously, 18 high performance, in terms<br />

<strong>of</strong> the requirements listed above, was best obtained with<br />

chelate compounds that resulted from azo dyes in reaction<br />

with a nickel metal cation <strong>and</strong> β-diketone lig<strong>and</strong>s.<br />

The image stability described below is the image stability<br />

<strong>of</strong> this chelate compound.<br />

Generally, chelate reactions result in a marked shift <strong>of</strong><br />

the light absorption spectra <strong>of</strong> a chemical compound, <strong>and</strong><br />

observation <strong>of</strong> this spectrum shift can <strong>of</strong>ten be used to<br />

determine if a chelate reaction has occurred. We observed<br />

340 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Abe et al.


Figure 3. Transition metal cation-providing compounds. M =<br />

transition metal cation, Lig = lig<strong>and</strong>, X = counter anions.<br />

Figure 5. Chelating system.<br />

Figure 4. Absorption spectra <strong>of</strong> Dye 1, Fig. 2. 1 = Dye 1 before<br />

chelate reaction, 1' = Dye 1 after chelate reaction.<br />

just such shifts <strong>of</strong> absorption spectra in this study, as<br />

seen in Fig. 4, strongly suggesting that chelate reactions<br />

were occurring in the dye receiving layers.<br />

Figure 5 shows the chelate reaction as we applied it.<br />

When metallizable azo dyes move from the dye donor<br />

sheet to the dye receiver sheet, the dye molecules take<br />

the place <strong>of</strong> the lig<strong>and</strong>s <strong>of</strong> the transition metal cationproviding<br />

compounds waiting in the dye receiving layer,<br />

resulting in chelate compounds. We will refer to a thermal<br />

dye transfer printing system that employs this process<br />

as a chelating system.<br />

An important point to note when comparing the<br />

chelating system under study with a conventional thermal<br />

dye transfer system is that achieving higher optical<br />

density does not necessarily depend on higher<br />

Figure 6. Higher optical density versus higher thermal transfer<br />

sensitivity. X = hypothetical substance acting as dye molecule<br />

sink, A = chelating system, B = conventional system.<br />

thermal transfer sensitivity. As seen in Fig. 6, if a hypothetical<br />

substance in the dye receiving layer acts as<br />

a sink for the dye molecules, the diffusion <strong>of</strong> the dyes<br />

through the dye receiving layer can be expected to accelerate,<br />

<strong>and</strong> this higher thermal transfer sensitivity<br />

would, <strong>of</strong> course, result in higher optical density. However,<br />

note that dye transfer from the dye donating layer<br />

into the dye receiving layer with an actual chelating<br />

system begins at the same thermal energy level as a<br />

Thermal Dye Transfer Printing with Chelate Compounds <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 341


Figure 7. Color fading <strong>of</strong> printed images exposed to a 70000 lx Xenon lamp.<br />

conventional thermal dye transfer system, with the<br />

threshold <strong>of</strong> the characteristic curves almost the same<br />

for both. This suggests that the transition metal cations<br />

do not act as a sink for the dye molecules. Yet the<br />

characteristic curve <strong>of</strong> the chelating system rises more<br />

steeply because the chelate compounds here have larger<br />

coefficients <strong>of</strong> light absorption than the conventional<br />

dyes, indicating higher optical density . At any point<br />

along the two characteristic curves, the chelating system<br />

exhibits approximately twice the absorbance at<br />

λmax, which may be explained by the chelate compound<br />

having a light absorption coefficient <strong>of</strong> 32300 at 456<br />

nm in acetone as compared to the conventional dye’ s<br />

13500 at 392 nm in acetone.<br />

The chelating system dramatically improves the light<br />

stability <strong>of</strong> printed images, bringing light stability almost<br />

to the level <strong>of</strong> silver halide photographic paper .<br />

Figure 7 shows the degree <strong>of</strong> color fading when the<br />

printed images have been exposed to a 70000 lx xenon<br />

lamp. For comparison here, if the illuminance <strong>of</strong> a typical<br />

room is assumed to be 500 lx, ten hours per day, our<br />

experimental condition <strong>of</strong> 70000 lx, 24 hours per day ,<br />

for 20 days would be equivalent to about 18.4 years <strong>of</strong><br />

typical room illuminance. Because the same kind <strong>of</strong> polymer<br />

binders were used in both the chelating <strong>and</strong> conventional<br />

systems here, the increased light stability that<br />

is evident can be attributed to the greater stability <strong>of</strong><br />

the chelate compound over conventional dyes.<br />

As seen in Fig. 8, the chelating system also strongly<br />

inhibits color fading when printed images are subjected<br />

to high temperatures, even to temperatures above the<br />

glass transition temperature <strong>of</strong> the dye receiving layer,<br />

<strong>and</strong> it is important to note here that two color fading<br />

mechanisms appear to be active. At temperatures below<br />

the dye receiving layer’s glass transition temperature<br />

<strong>of</strong> approximately 70°C, fading depends chiefly on<br />

the stabilities <strong>of</strong> the colorants. In the case <strong>of</strong> the chelating<br />

system, note carefully that the colorant consists not<br />

<strong>of</strong> the dyes, but <strong>of</strong> the chelate compounds <strong>of</strong> which the<br />

dyes are a part. In the conventional systems, however,<br />

the colorant is constituted by the dyes themselves. The<br />

lower intrinsic stability <strong>of</strong> the dyes in the conventional<br />

system explains the compensation provided by adding<br />

a protective layer, which acts as a barrier against air.<br />

At temperatures above the dye receiving layer’s glass<br />

transition temperature, a second mechanism <strong>of</strong> fading<br />

takes additional effect. Above the glass transition temperature,<br />

the colorants suddenly have much greater freedom<br />

<strong>of</strong> movement, resulting in lateral diffusion <strong>of</strong> the<br />

colorants, which not only physically disperses the<br />

colorants but also results in greater exposure to such<br />

reactive agents as oxidizing <strong>and</strong> reducing agents. The<br />

result is a decrease in optical density. As seen here, both<br />

the chelating <strong>and</strong> the conventional systems are subject<br />

to this mechanism, but the chelating system is less<br />

strongly affected because the chelate compounds, composed<br />

<strong>of</strong> two dye molecules <strong>and</strong> a transition metal cation,<br />

are relatively large <strong>and</strong> heavy <strong>and</strong> are thus more<br />

inhibited in their movement. A complex composed <strong>of</strong> dye/<br />

metal/lig<strong>and</strong> = 1/1/1 may exist together with the [dye/<br />

metal = 2/1] complex. However, the results <strong>of</strong> spectroscopic<br />

<strong>and</strong> elementary-analytical study have indicated<br />

342 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Abe et al.


Figure 8. Color fading <strong>of</strong> printed images at high temperatures.<br />

that the main part <strong>of</strong> the complexes is composed <strong>of</strong> dye/<br />

metal = 2/1. We report the results concerning the composition<br />

in Ref. 16.<br />

Directly related to this inhibited movement is the<br />

chelate system’s resistance to the degradation <strong>of</strong> image<br />

edges, as seen in Fig. 9. In conventional systems, a degradation<br />

<strong>of</strong> image edges is <strong>of</strong>ten observed when printed<br />

images are subjected to high temperatures. Like the accelerated<br />

color fading that occurs at temperatures above<br />

the glass transition temperature <strong>of</strong> the dye receiving<br />

layer, this degradation <strong>of</strong> image edges results from the<br />

lateral diffusion <strong>of</strong> dyes. However, this degradation is<br />

not observed in the chelating system. If the dye-metal<br />

complexes are insoluble in the polymer matrix <strong>of</strong> the<br />

dye receiving layer, the complexes are not expected to<br />

move easily. However, we have observed the complexes<br />

show relatively high solubility there. Accordingly it is<br />

valid to consider again the size <strong>and</strong> weight <strong>of</strong> the chelate<br />

compounds inhibit their movement in the dye receiving<br />

layer.<br />

Beyond the superior light stability, resistance to image<br />

fading at high temperatures, <strong>and</strong> minimized degradation<br />

<strong>of</strong> image edges reported above, the chelating<br />

system also showed performance better than or equal to<br />

conventional systems by such measures as image transfer<br />

to PVC plastic sheets, color fading caused by finger<br />

prints, <strong>and</strong> image fading in the presence <strong>of</strong> ethanol.<br />

Conclusion<br />

A chelating system for thermal dye transfer printing<br />

that produces chelate compounds in the dye receiving<br />

layer consisting <strong>of</strong> a set <strong>of</strong> azo dyes, a nickel cation, <strong>and</strong><br />

a β-diketone lig<strong>and</strong> dramatically increased light stability,<br />

reduced image fading, <strong>and</strong> minimized the degradation<br />

<strong>of</strong> image edges.<br />

Acknowledgements. The authors express great appreciation<br />

to Mr. Hiroshi Watanabe, Ms. Kaori Fukumuro,<br />

<strong>and</strong> Mr. Tomomi Yoshizawa for their invaluable discussion<br />

<strong>and</strong> constant encouragement.<br />

References<br />

1. S. Honda <strong>and</strong> Y. Fujiwara, Japanese Patent 1771210 (1993).<br />

2. R. Takiguchi, Y. Nakamura <strong>and</strong> N. Egashira, Japanese Patent Publication<br />

Heisei 04-211995 (1992).<br />

Thermal Dye Transfer Printing with Chelate Compounds <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 343


Figure 9. Degradation <strong>of</strong> image edges.<br />

3. K. Kushi, T. Iseki, M. Fujiwara, K. Hisafuku, <strong>and</strong> A. Ueda, Japanese<br />

Patent Publication Heisei 05-301466 (1993).<br />

4. S. Yoneyama <strong>and</strong> T. Shimazaki, Japanese Patent Publication Heisei<br />

05-318953 (1993).<br />

5. A. Imai, H. Matsuda, K. Yubagami, <strong>and</strong> N. Taguchi, Japanese Patent<br />

2126053 (1997).<br />

6. K. Renda <strong>and</strong> N. Yokota, Japanese Patent Publication Heisei 04-<br />

267196 (1992).<br />

7. H. Moriguchi, Japanese Patent Publication Heisei 02-70488 (1990).<br />

8. L. Shuttleworth <strong>and</strong> M. J. McManus, U. S. Patent 5011811 (1991).<br />

9. Y. Yamamoto, Japanese Patent 1720122 (1992).<br />

10. T. Niwa, Y. Murata <strong>and</strong> S. Maeda, Japanese Patent 1798935 (1993).<br />

11. M. Tanaka, T. Kamozaki <strong>and</strong> T. Tateishi, Japanese Patent Publication<br />

Heisei 06- 64343 (1994).<br />

12. S. Fujita, Japanese Patent 1808718 (1993).<br />

13. K. Ito, N. Zhou, K. Fukunishi, <strong>and</strong> Y. Fujiwara, J. Imag. Sci. Technol.<br />

38, 575 (1994).<br />

14. T. Abe, Poly. Mat. Sci. Eng. (ACS) 72, 62 (1995).<br />

15. T. Abe, S. Mano, Y. Yamaya, <strong>and</strong> K. Fukumuro, Proc. IS&T’s PICS<br />

Conference, 1998, p. 110.<br />

16. A. Tomotake, S. Kida, H. Watanabe, S. Mano, <strong>and</strong> T. Abe, J. Soc.<br />

Photogr. Sci. Technol. Japan 62, 228 (1999).<br />

17. J. Griffiths, A. N. Manning <strong>and</strong> D. Rhodes, J. Soc. Dyers Colourists<br />

88, 400 (1972).<br />

18. N. Miura, T. Komamura <strong>and</strong> T. Abe, IS&T’s 9th International Congress<br />

on Advances in Non-Impact Printing Technologies/Japan Hardcopy<br />

‘93, 1993, p. 314.<br />

344 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Abe et al.


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Dot Allocations in Dither Matrix with Wide Color Gamut<br />

Ryoichi Saito <strong>and</strong> Hiroaki Kotera<br />

Faculty <strong>of</strong> Engineering, Chiba University, Chiba, Japan<br />

The color gamut in bi-level digital printers depends on the allocation <strong>of</strong> the CMY primary ink dots placed in dithering matrices.<br />

The typical color mixture model is based on Neugebauer theory, where CMY dots are placed at r<strong>and</strong>om, but recent digital printers<br />

don’t obey that theory. The simplest method used in digital printers is “coaxial” allocation, where the CMY ink dots are<br />

placed in the same positions in each color dither matrix. The coaxial model produces sharp edges, but may generate too many<br />

secondary colors with unsaturated chromaticities. A mixture <strong>of</strong> C <strong>and</strong> M inks may produce a more brilliant bluish color when the<br />

C <strong>and</strong> M dots are placed side-by-side to avoid overlapping. In this article, “min-med”, “min-max” <strong>and</strong> “min” models with side-byside<br />

dot allocation are discussed. These are designed to suppress the occurrence <strong>of</strong> secondary colors. The corresponding color<br />

gamuts are analyzed <strong>and</strong> compared.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 345–352 (1999)<br />

Introduction<br />

Today, low cost, high quality color printers are being<br />

widely used. Beautiful color images are reproduced by<br />

digital halftoning <strong>and</strong> color rendition technologies.<br />

The color gamut in bi-level printers depends on the<br />

allocation <strong>of</strong> the CMY dots placed in the dithering matrices.<br />

The Neugebauer model has been applied for conventional<br />

printing, where CMY dots are placed at<br />

r<strong>and</strong>om, as given by Demichel. 1 The unit area is composed<br />

<strong>of</strong> at most, eight colored areas; white (W), three<br />

primary colors (C, M, Y), the secondary colors (R, G, B),<br />

<strong>and</strong> the 3rd-order color (K), caused by r<strong>and</strong>om mixing<br />

<strong>of</strong> the C, M, Y colorants. These eight basic colors form<br />

the 12 outer edges <strong>of</strong> a color solid, regardless <strong>of</strong> color<br />

mixing methods. The surfaces <strong>of</strong> the color solid within<br />

these 12 edges are determined by the allocation <strong>of</strong> the<br />

primary color dots. We previously reported 2 the highly<br />

saturated colors that come from mixture <strong>of</strong> two primary<br />

colors placed on white paper.<br />

In this article, we reconsider the colors produced by<br />

bi-level printers, <strong>and</strong> discuss dot allocation problems to<br />

provide wider color gamuts.<br />

Color Gamut <strong>of</strong> Dot Allocations<br />

Color Dot Allocation Models. Classically, the theoretical<br />

model <strong>of</strong> color mixture in a bi-level printer is<br />

described by the well-known Neugebauer equation 1,2<br />

that is applied for conventional printing using halftone<br />

screens. Figure 1a shows the r<strong>and</strong>om mixture model <strong>of</strong><br />

3 primary color inks given by Demichel. However , the<br />

color dot allocations in recent digital printers differ from<br />

Demichel’s. For example, Fig. 1b illustrates a typical<br />

model, that we call “coaxial” (Balasubramanian 3 intro-<br />

Original manuscript received June 24, 1998<br />

Supplemental materials—Figure 4 (in color) <strong>and</strong> T able III can be found<br />

on the IS&T website (www.imaging.org) for a period <strong>of</strong> no less than 2 years<br />

from the date <strong>of</strong> publication, <strong>and</strong> on the JIST CD-ROM<br />

©1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

duced it as “dot-on-dot”), where the CMY primary ink<br />

dots are placed in the same dot position in each color<br />

matrix <strong>and</strong> the unit area is composed <strong>of</strong> at most, 4 colored<br />

areas; one primary, one secondary, black (K), <strong>and</strong><br />

white (W). The coaxial model can be realized because <strong>of</strong><br />

the precise control <strong>of</strong> dot positioning that is possible in<br />

digital technology. It produces sharp edges, but may give<br />

a narrow color gamut due to the frequent occurrence <strong>of</strong><br />

secondary colors with unsaturated chromaticities.<br />

Figure 1c, 1d <strong>and</strong> 1e show three different models, “minmed”,<br />

“min-max” <strong>and</strong> “min,” to suppress the occurrence<br />

<strong>of</strong> secondary colors. Here, the primary color inks P , Q<br />

<strong>and</strong> S are placed in the unit area with dot area ratios p,<br />

q <strong>and</strong> s. In the min-med model, the dots <strong>of</strong> P <strong>and</strong> Q are<br />

placed on opposite sides to minimize overlapping, while<br />

S is placed perpendicular to P <strong>and</strong> Q, which results in<br />

medium overlapping. The min-max model differs from<br />

the min-med model only in that S is placed in the same<br />

position as P or Q. In the min model, the starting points<br />

<strong>of</strong> P, Q <strong>and</strong> S are equally separated by one-third <strong>of</strong> the<br />

unit area to minimize the average overlap.<br />

Surfaces <strong>of</strong> Color Solid. Figure 2 illustrates that the<br />

outer surface <strong>of</strong> the color solid is composed <strong>of</strong> the following<br />

6 faces.<br />

1. M <strong>and</strong> Y inks on W : W-M-Y-(R)<br />

2. C <strong>and</strong> Y inks on W : W-C-Y-(G)<br />

3. C <strong>and</strong> M inks on W : W-C-M-(B)<br />

4. M <strong>and</strong> Y inks on C : C-(B)-(G)-(K)<br />

5. C <strong>and</strong> Y inks on M : M-(B)-(R)-(K)<br />

6. C <strong>and</strong> M inks on Y : Y-(G)-(B)-(K)<br />

The bracket ( ) denotes second- <strong>and</strong> third-order colors.<br />

Each face is not flat, but is formed by a tetrahedral surface<br />

depending on the allocation <strong>of</strong> the primary ink dots.<br />

Area Ratio Equations <strong>and</strong> Tables<br />

The tristimulus vector T <strong>of</strong> the unit area is given by the<br />

additive mixture <strong>of</strong> tristimulus vector T i for each colored<br />

area i as follows.<br />

345


W<br />

P<br />

P<br />

W<br />

Q S<br />

p<br />

P<br />

W<br />

q<br />

Q<br />

p<br />

s q p q<br />

S P W Q P Q S<br />

s<br />

Q S<br />

s S<br />

1<br />

1 1 1 1/3 1/3 1/3<br />

(a) Neugebauer (b) coaxial (c) min-med (d) min-max (c) min<br />

Figure 1. Basic models <strong>of</strong> color allocations in bi-level printer.<br />

3) C C& & M inks on W W: :<br />

W-C-M-(B)<br />

C<br />

W<br />

M<br />

G<br />

1) M M& & Y inks on W W: :<br />

W-M-Y-(R)<br />

Y<br />

2) C & Y inks on W W: :<br />

W-C-Y-(G)<br />

5) C & Y inks on M ink:<br />

:<br />

M-(B)-(R)-(K)<br />

R<br />

B<br />

4) M & Y inks on C ink : :<br />

C-(B)-(G)-(K)<br />

K<br />

6) C & M inks on Y ink:<br />

:<br />

Y-(G)-(R)-(K)<br />

Figure 2. Outer surface is composed <strong>of</strong> 6 planes.<br />

Neugebauer Model. As well known, eight colored areas<br />

appear as a result <strong>of</strong> r<strong>and</strong>om mixture <strong>of</strong> C, M <strong>and</strong> Y.<br />

8<br />

T = ∑ aT;<br />

i i<br />

i=<br />

1<br />

i = W, C, M, Y, R, G, B, K (1)<br />

Coaxial Model. At most, four colored areas appear; six<br />

different cases occur for the selections <strong>of</strong> P <strong>and</strong> Q from<br />

CMY.<br />

4<br />

T = ∑ aT i i ;<br />

i=<br />

1<br />

i = W, P, PQ,<br />

K<br />

P = max( C, M, Y)<br />

PQ = max( C, M, Y) ∩mid( C, M, Y)<br />

P <strong>and</strong> PQ denote one <strong>of</strong> the primary <strong>and</strong> secondary colors.<br />

Min-Med Model. Six different cases occur; three selections<br />

for S from CMY <strong>and</strong> two conditions for p + q ≤ 1 or<br />

p + q > 1. Each case includes six colored areas,<br />

6 ⎧W, C, M, Y, PS, QS ; for p + q ≤1<br />

T = ∑ aT i i ; i=<br />

⎨<br />

i=<br />

1 ⎩ PQRGBK , , , , , ; for p+ q><br />

1<br />

Min-Max Model. Six different cases occur, as for the<br />

min-med model. Each case includes at most four colored<br />

areas,<br />

4<br />

T = ∑ aT i i<br />

i=<br />

1<br />

(2)<br />

(3)<br />

(4)<br />

Min Model. This model is very complicated. In total,<br />

sixty different cases appear , each including i = 4 ~ 6<br />

colored areas, according to the combinations <strong>of</strong> the<br />

ranges for,<br />

1 1 2 2<br />

0 ≤ pqs , , < , ≤ pqs , , < , ≤ pqs , , ≤1 (5)<br />

3 3 3 3<br />

Tables I, II, <strong>and</strong> III ( Supplemental materials—Table<br />

III can be found on the IS&T website (www .imaging.org)<br />

for a period <strong>of</strong> no less than 2 years from the date <strong>of</strong> publication,<br />

<strong>and</strong> on the JIST CD-ROM) show examples <strong>of</strong> equations<br />

for colored dot area ratios. T able I shows the<br />

min-med model compared with the Neugebauer <strong>and</strong> coaxial<br />

models. Here, C <strong>and</strong> M are placed side by side <strong>and</strong><br />

Y is perpendicular to them. Table II gives the area ratios<br />

for the min-max model. Here, C <strong>and</strong> M are again<br />

placed side by side, but Y is placed in the same position<br />

as C. Table III shows the area ratios for the min model.<br />

Results<br />

Calculation Condition <strong>and</strong> Dither Matrix . Table<br />

IV shows the tristimulus values <strong>of</strong> the eight basic colors<br />

printed by an inkjet printer (EPSON PM700C). The<br />

color chips were printed without color correction <strong>and</strong><br />

their tristimulus values were measured by spectrocolorimeter<br />

(GRETAG Spectrolino). These values are<br />

used for simulation.<br />

Figure 3 illustrates an example <strong>of</strong> the ordered dither<br />

matrices to simulate the dot allocation models. Figure<br />

346 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Saito <strong>and</strong> Kotera


TABLE I. Colored Dot Area Ratios in Min–Med Model<br />

Neugebauer coaxial model min–med model (C||M⊥Y)<br />

color i area ratio a i<br />

color i area ratio a i<br />

color i area ratio a I<br />

(c + m < 1) area ratio a I<br />

(c + m > 1)<br />

W (1 – c)(1 – m)(1 – y) W 1 – Max(c,m,y) W (1 – c – m)(1 – y) 0<br />

C c(1 – m)(1 – y) P Max(c,m,y) – Mid(c,m,y) C c(1 – y) (1 – m)(1 – y)<br />

M (1 – c)m(1 – y) PQ Mid(c,m,y) – Min(c,m,y) M m(1 – y) (1 – c)(1 – y)<br />

Y (1 – c)(1 – m)y K Min(c,m,y) Y y(1 – c – m) 0<br />

R (1 – c)my B 0 (c + m – 1)(1 – y)<br />

G c(1 – m)y G cy (1 – m)y<br />

B cm(1 – y) R my (1 – c)y<br />

K cmy K 0 (c + m – 1)<br />

TABLE II. Colored Dot Area Ratios in Min–Max Model<br />

min – max model W C M Y B G R K<br />

c + m < 1, c < y 1 – c + m c – y m 0 0 y 0 0<br />

m + y < 1, y > c 1 – m – y 0 m y – c 0 c 0 0<br />

c + y > 1, m + y < 1 0 1 – m – y 1 – c 0 c + m – 1 y 0 0<br />

m + y > 1, c + m < 1 0 0 1 – y 1 – c – m 0 c m + y – 1 0<br />

m + y > 1, c > y 0 0 1 – c 0 c – y 1 – m 0 m + y – 1<br />

c + m > 1, c < y 0 0 1 – y 0 0 1 – m y – c c + m – 1<br />

0<br />

8<br />

2<br />

10<br />

15 7 13 5 0<br />

8<br />

2<br />

10<br />

12 4 14<br />

6<br />

3<br />

11<br />

1<br />

9<br />

12 4 14<br />

6<br />

3<br />

11<br />

1<br />

9<br />

12 4 14<br />

6<br />

3<br />

11<br />

1<br />

9<br />

15 7 13 5 0<br />

8<br />

2<br />

10<br />

15<br />

7<br />

13<br />

5<br />

cyan magenta yellow<br />

(a) min-max model<br />

0<br />

3<br />

8<br />

2<br />

12 4 14<br />

11<br />

1<br />

10<br />

6<br />

9<br />

11<br />

15 7 13 5 10 2 8 0<br />

7<br />

14<br />

3<br />

15<br />

6<br />

13<br />

9<br />

12<br />

5<br />

1<br />

4<br />

6<br />

2<br />

9<br />

5<br />

14<br />

1<br />

8<br />

3<br />

0<br />

10 4 12<br />

cyan magenta yellow<br />

(b) min model<br />

Figure 3. Examples <strong>of</strong> ordered dither matrix in side-by-side<br />

dot allocation model.<br />

13<br />

7<br />

15<br />

11<br />

Blue<br />

Green<br />

Red<br />

(a) Coaxial(Max)<br />

Blue<br />

Green<br />

Red<br />

(b) Min(Side by Side)<br />

Figure 4. Color chips <strong>of</strong> RGB tone in equal mixing <strong>of</strong> two primary<br />

colors (Screen-dot dither). ( Supplemental materials—Figure<br />

4, in color, can be found on the IS&T website (www.imaging.<br />

org) for a period <strong>of</strong> no less than 2 years from the date <strong>of</strong> publications,<br />

<strong>and</strong> on the JIST CD-ROM)<br />

3a shows the min-max model. Here, for instance, the<br />

threshold values <strong>of</strong> C are arranged in forward order but<br />

those <strong>of</strong> M are reversed to minimize overlapping, <strong>and</strong> Y<br />

is set the same as C. Figure 3b shows the min model, where<br />

threshold values are placed rotationally shifted by onethird<br />

from each other to minimize average overl apping.<br />

This example uses the well known 4 × 4 Bayer’s matrix.<br />

The other matrices are designed in the same manner.<br />

Analysis <strong>of</strong> Secondary Color . Figure 4 shows most<br />

typical color differences between color tones printed by<br />

two different models. Here, RGB gradation patterns are<br />

generated by half <strong>and</strong> half mixtures <strong>of</strong> two primaries,<br />

C+M, C+Y <strong>and</strong> M+Y. Figure 4a is the coaxial model <strong>and</strong><br />

Fig. 4b is the side by side model. In the coaxial model,<br />

for example, the perfectly overlapped C <strong>and</strong> M produces<br />

unsaturated blue tones, while side by side location <strong>of</strong> C<br />

<strong>and</strong> M produces different bluish colors. The red <strong>and</strong><br />

green tones also differ between the models (Supplemental<br />

materials—Figure 4, in color can be found on the IS&T<br />

website (www.imaging.org) for a period <strong>of</strong> no less than 2 years<br />

from the date <strong>of</strong> publication, <strong>and</strong> on the JIST CD-ROM).<br />

Figure 5 illustrates how the RGB color tones differ<br />

between the models. For example, the red tones trace<br />

Dot Allocations in Dither Matrix with Wide Color Gamut <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 347


<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 345s<br />

TABLE III. Colored Dot Area Ratios in Min Model<br />

W C M Y B G R K<br />

1 c


Figure 5. Chromatic locus in equal mixing <strong>of</strong> two primary colors.<br />

Figure 6. Outer surface <strong>of</strong> color gamut in each model (ink-jet printer).<br />

different loci when M <strong>and</strong> Y are mixed in equal percentages.<br />

In the coaxial model, the locus <strong>of</strong> red tone is on<br />

the straight line from W to R, whereas in the side by<br />

side model, its locus is broken into two just at the point<br />

<strong>of</strong> the 50% dot area ratio, <strong>and</strong> goes into very different<br />

hue angle directions, as shown in the bending broken<br />

line. This is because the M <strong>and</strong> Y inks are placed side<br />

by side without overlapping at below 50%, but at above<br />

50%, M <strong>and</strong> Y begin to overlap, causing the secondary<br />

color R. The measured color plots are reasonably<br />

matched to the theoretical calculations in CIELAB<br />

space.<br />

Outer Surface <strong>and</strong> Color Distribution. The outer<br />

surface <strong>of</strong> the color solid is constructed from six faces,<br />

each comprising the tetrahedral color points W-M-Y-(R),<br />

W-C-Y-(G), W-C-M-(B), C-(B)-(G)-(K), M-(B)-(R)-(K), Y-<br />

(G)-(B)-(K). The 3D outer surface <strong>of</strong> the color solid is<br />

synthesized from the six tetrahedral faces. Figure 6<br />

shows a calculated result for an inkjet printer. The color<br />

gamuts differ in each model. For example, W, C, M <strong>and</strong><br />

B are not in the same plane, but make a specified tetrahedron<br />

in each dot allocation model.<br />

The coaxial model appears the smallest in volume.<br />

The min-med <strong>and</strong> min-max models are calculated for<br />

348 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Saito <strong>and</strong> Kotera


Figure 7. Comparison <strong>of</strong> color gamut in each model (ink-jet printer).<br />

the case that C <strong>and</strong> M are placed side by side. The<br />

gamut <strong>of</strong> the min model has a ragged surface, but it<br />

appears to give a larger volume than the min-med <strong>and</strong><br />

min-max models.<br />

Details <strong>of</strong> the color gamuts were inspected inside the<br />

color solid. Figure 7 shows a comparison <strong>of</strong> 3D plots inside<br />

the color solids when the (c, m, y) area ratios <strong>of</strong> the<br />

primary color inks are changed from 0 to 1 in steps <strong>of</strong><br />

0.1, generating 11 3 = 1331 colors. In the coaxial model,<br />

the population is very irregular <strong>and</strong> includes empty<br />

space. The Neugebauer model results in better-balanced<br />

populations than the coaxial model. The min-med <strong>and</strong><br />

min-max models show similar distributions <strong>and</strong> give fine<br />

densities. <strong>Additional</strong>ly, the min model seems to give<br />

balanced mixtures <strong>of</strong> CMY, like Neugebauer’s model.<br />

<strong>Vol</strong>ume <strong>of</strong> Color Solid. The problem <strong>of</strong> gamut description<br />

has no definitive solution yet. Tanaka, Berns, <strong>and</strong><br />

Fairchild reported a means <strong>of</strong> calculating gamut using<br />

tetrahedron. 4 Kappele reported 5 a means <strong>of</strong> calculating<br />

gamut using Green’s theorem. 6 Mahy introduced the idea<br />

that it is possible to determine gamut analytically in<br />

the case <strong>of</strong> the localized Neugebauer equations. 7<br />

Green’s theorem provides a means <strong>of</strong> calculating<br />

gamut. It states that the area size A inside a simple<br />

closed curve S can be calculated as follows:<br />

1<br />

A = ∫ S ( xdy −ydx) (6)<br />

2<br />

where S is the perimeter <strong>of</strong> the gamut plot in the simple<br />

closed curve or polygon. The integral A can be approximated<br />

as a sum. First we calculate the mean value between<br />

two neighboring coordinates, such as a* i <strong>and</strong> a* i+1 ,<br />

or b* i <strong>and</strong> b* i+1 , that is, half <strong>of</strong> the coordinates’ sum. Next,<br />

we compute the differential distances between these two<br />

neighboring coordinates. Finally, we substitute these<br />

values for Eq. 6 <strong>and</strong> get Eq. 7.<br />

1 ⎧a* i+<br />

1 + a* i<br />

b i+<br />

+ b i ⎫<br />

A = ∑ S ⎨ (<br />

* * * 1 *<br />

bi+<br />

1 −bi<br />

) −<br />

(<br />

* *<br />

ai+<br />

1 − ai<br />

) ⎬ (7)<br />

2 ⎩ 2 2<br />

⎭<br />

Therefore A can be estimated by calculating all <strong>of</strong> the<br />

mean values <strong>and</strong> differential distances between two<br />

neighboring coordinates for a* <strong>and</strong> b* in a counterclockwise<br />

direction, combining <strong>and</strong> summing as given in Eq. 7.<br />

The details <strong>of</strong> color gamuts are inspected by slicing<br />

the 3D color solid into 2D planes. Figure 8 shows the<br />

comparison <strong>of</strong> the a* - b* plane sliced in 41 < L* < 45 for<br />

the outer surface <strong>of</strong> the color solids when the (c, m, y)<br />

area ratios <strong>of</strong> primary color inks are changed from 0 to<br />

1 in steps <strong>of</strong> 0.04, generating 26 2 × 6 = 4056 colors.<br />

Using Eq. 7, we calculated the gamut area in each<br />

model sliced by L* value. Figure 9 shows the calculated<br />

area per L* (every four slice levels) for the Neugebauer,<br />

coaxial <strong>and</strong> min-max models. The coaxial model has a<br />

large area in the low lightness region. In Fig. 8, the coaxial<br />

model is supposed to have a slightly larger area in<br />

the Y region. As the Y ink itself is a highly saturated<br />

bright color, it produces still saturated colors in the<br />

lower lightness region in spite <strong>of</strong> occurrence <strong>of</strong> unsaturated<br />

secondary color. This effect widens the color gamut<br />

on the dark side <strong>of</strong> the Y region. The min-max model<br />

shows a wider gamut in the middle to high lightness<br />

regions, because <strong>of</strong> side by side dot allocation, that, in<br />

turn, produce brilliant colors by suppressing the secondary<br />

colors. In particular, when C <strong>and</strong> M are placed<br />

side by side <strong>and</strong> overlapping by more than 50%, the resultant<br />

bluish colors give the wider color gamut to the<br />

bright side. The min-med <strong>and</strong> min models were similar<br />

to the min-max model, but slightly narrower.<br />

Consideration <strong>of</strong> n-Value. To predict the tones <strong>of</strong> halftone<br />

reproduction on the paper, the optical dot-gain is<br />

<strong>of</strong>ten considered. Yule <strong>and</strong> Nielsen considered the effect<br />

<strong>of</strong> the penetration <strong>of</strong> light into the paper. 8 Their model<br />

Dot Allocations in Dither Matrix with Wide Color Gamut <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 349


TABLE IV. Tristimulus Values <strong>of</strong> Eight Basic Colors<br />

color i X Y Z L* a* b*<br />

W 82.97 84.46 78.95 93.65 2.98 –8.11<br />

C 10.33 14.61 43.25 45.1 –25.85 –55.99<br />

M 33.8 16.98 14.29 48.23 75.7 –0.78<br />

Y 66.54 62.74 4.27 83.31 13.84 96.65<br />

CM(B) 5.22 4.19 15.33 24.29 15.5 –44.71<br />

CY(G) 5.44 10.49 4.59 38.71 –44.03 17.94<br />

MY(R) 32.22 17.48 4.24 48.86 67.43 37.44<br />

CMY(K) 1.87 1.92 1.66 15.06 0.46 –0.87<br />

(a) Neugebauer (b) coaxial (c)min-med<br />

b*<br />

a*<br />

(d) min-max<br />

(e) min<br />

Figure 8. Outer surface in a* – b* plane for 41 < L* < 45 <strong>and</strong> calculation points.<br />

Areas<br />

Neugebauer<br />

coaxial<br />

min-max<br />

Figure 9. Areas per L* in each model (ink jet printer).<br />

L*<br />

350 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Saito <strong>and</strong> Kotera


TABLE V. Area Values <strong>of</strong> Each Model<br />

Neugebauer coaxial min – max min – med min<br />

0 < L* < 50 30187.62 32342.82 30506.68 30187.80 30032.20<br />

n = 1 50 < L* < 100 28443.46 28835.67 31521.70 29404.90 28217.92<br />

Total 58631.08 61178.49 62028.37 59592.70 58250.11<br />

0 < L* < 50 28295.42 30142.09 27457.18 27223.64 27500.78<br />

n = 2 50 < L* < 100 36651.40 38465.88 39327.71 36537.35 35892.68<br />

Total 64946.81 68607.97 66784.89 63760.99 63393.45<br />

n=1<br />

n=2<br />

L*<br />

where n is the Yule-Nielsen parameter. The n-value depends<br />

upon several factors; the dot size, dot overlapping<br />

<strong>and</strong> type <strong>of</strong> paper are perhaps the most important three.<br />

We calculated the Neugebauer model for typical case<br />

<strong>of</strong> n = 2 using Eq. 8. Figure 10 shows L* – a* plots <strong>of</strong><br />

outer points <strong>of</strong> color solid. Large light points show the<br />

result <strong>of</strong> calculated for n = 1, <strong>and</strong> small dark points show<br />

that for n = 2. As a whole, the lightness in the case <strong>of</strong> n<br />

= 2 is lower than the case <strong>of</strong> n = 1. In the high lightness<br />

region, as opposed to the middle one, the case <strong>of</strong> n = 2<br />

has the wider chromaticity than that <strong>of</strong> n = 1. Figure 11<br />

shows calculated gamut area per L* using Eq. 7 on the<br />

Neugebauer model. The gamut area <strong>of</strong> n = 2 is smaller<br />

than that <strong>of</strong> n = 1 in low lightness region, but shows the<br />

wider gamut from middle to high lightness regions.<br />

The other four models also show similar results. Table<br />

V shows calculated total areas <strong>of</strong> each models. It is noa*<br />

Figure 10. Outer surface in L* – a* plane at the Neugebauer model.<br />

was for a single-color halftone tint. T aking the Yule-<br />

Nielsen effect into consideration, the Neugebauer model<br />

is given by,<br />

8<br />

1<br />

T = ∑ ( aT )<br />

i=<br />

1<br />

i i<br />

n n<br />

(8)<br />

ticed that the gamut <strong>of</strong> coaxial model is widen by the<br />

Yule-Nielsen effect for the larger n-value than unity. In<br />

each model, the n-value may be different according to<br />

dot’s allocations. The more detailed calculations <strong>of</strong><br />

gamut volumes need to use the actual n-values measured<br />

by halftone dot analyzer <strong>and</strong> will be discussed in<br />

future works.<br />

Discussion <strong>and</strong> Conclusion<br />

The additive mixture <strong>of</strong> CMY inks can produce a wider<br />

color gamut than that <strong>of</strong> a subtractive mixture in bilevel<br />

printers. Here the 3D color gamuts in three side<br />

by side dot allocation models are analyzed <strong>and</strong> compared<br />

with that <strong>of</strong> the typical coaxial model.<br />

The coaxial model shows very irregular populations<br />

including partially unpopulated areas in the colors produced.<br />

On the other h<strong>and</strong>, the side by side models produce<br />

well-balanced populations <strong>and</strong> give fine densities.<br />

The volume <strong>of</strong> the color solid can be calculated by summing<br />

the areas <strong>of</strong> (a*–b*) planes sliced by an L* value.<br />

Comparing these color solid volumes, the coaxial model<br />

shows the larger gamut on the low lightness side, while<br />

the side by side models show the larger gamut on the<br />

middle to high lightness side.<br />

Dot Allocations in Dither Matrix with Wide Color Gamut <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 351


Areas<br />

Figure 11. Areas per L* in the Neugebauer model (using n-value).<br />

Yule-Nielsen parameter n-value affects the gamut<br />

volume <strong>of</strong> each model. The accurate computations <strong>of</strong><br />

gamut volume need to measure the actual n-value <strong>of</strong><br />

each model. On the other h<strong>and</strong>, V iggiano reported the<br />

spectral Neugebauer model. 9 In each model, spectral<br />

tristimulus n-value may be also considered.<br />

The extension <strong>of</strong> the fundamental ideas to dot placement<br />

in the error diffusion method will be continued in<br />

further studies.<br />

L*<br />

n=1<br />

n=2<br />

Acknowledgement. The authors wish to thank<br />

Tateishi <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Foundation, Kyoto for<br />

their financial support <strong>of</strong> part <strong>of</strong> this work.<br />

References<br />

1. H. E. J. Neugebauer, Die Theoretischen Grundlagen des<br />

Mehrfarbendruckes, Z. Wiss. Photo. 36(4), 73 (1937).<br />

2. K. Kanamori <strong>and</strong> H. Kotera, Analysis <strong>of</strong> Color Gamut for Hardcopy<br />

based on Neugebauer Theory, Neugebauer Memorial Seminar on<br />

Color Reproduction, SPIE Japan Chapter, Tokyo, pp.36–42 (1989).<br />

3. R. Balasublamanian, Color Hard Copy <strong>and</strong> Graphic Arts IV, Proc.<br />

SPIE 2413, 356 (1995)<br />

4. T. Tanaka, R. Berns <strong>and</strong> M. Fairchild, Predicting the Image Quality<br />

<strong>of</strong> Color Overhead Transparencies Using a Color-Appearance<br />

Model, J. Electron. Imag. 6(2), 154 (1997)<br />

5. W. D. Kappele, Quantifying Color Gamut, IS&T’s NIP13: International<br />

Conference on Digital Printing Technologies, IS&T, Springfield,<br />

VA, 1997, pp. 470–474.<br />

6. Thomas <strong>and</strong> Finney, Calculus <strong>and</strong> Analytic Geometry, 5th ed.,<br />

Addison-Wesley, 1980, p.711.<br />

7. M. Mahy, Gamut Calculation <strong>of</strong> Color Reproduction Devices, Fourth<br />

Color <strong>Imaging</strong> Conf.: Color <strong>Science</strong>, Systems <strong>and</strong> Applications,<br />

IS&T, Springfield, VA, 1996, pp. 145–150.<br />

8. J. A. C. Yule <strong>and</strong> W. J. Nielsen, The Penetration <strong>of</strong> Light into Paper<br />

<strong>and</strong> Its Effect on Halftone Reproduction, Proc. TAGA, 65–76<br />

(1951).<br />

9. J. A. S. Viggiano, Modeling the Color <strong>of</strong> Multi-Colored Halftones,<br />

Proc. TAGA, 44–62 (1990).<br />

352 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Saito <strong>and</strong> Kotera


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Symmetry Properties <strong>of</strong> Halftone Images I:<br />

Scattering Symmetry <strong>and</strong> Pattern Symmetry<br />

Jonathan S. Arney ▲<br />

Center for <strong>Imaging</strong> <strong>Science</strong>, Rochester Institute <strong>of</strong> <strong>Technology</strong>, Rochester, New York<br />

<strong>and</strong> Shinya Yamaguchi<br />

Nippon Paper Industries, <strong>Imaging</strong> <strong>Technology</strong> Center, Saitama, Japan<br />

Previous work has shown that the mechanism <strong>of</strong> color <strong>and</strong> tone reproduction in halftone imaging systems can be described<br />

quantitatively by modeling functions for mean level probability, P ij , for light scattering from region i to region j, where regions i<br />

<strong>and</strong> j may be, for example, regions <strong>of</strong> the printed paper covered by different inks in the halftone process. The value <strong>of</strong> P ij has been<br />

shown to be a function <strong>of</strong> the area fractions <strong>of</strong> the regions, f i <strong>and</strong> f j . In the past, the P ij functions were written empirically to fit<br />

observed data or determined by convolution calculations involving the paper point spread function, PSF, <strong>and</strong> the transmittance<br />

geometry <strong>of</strong> the halftone pattern, T(x,y). In the current work it is shown that characteristics <strong>of</strong> the P ij functions can be deduced<br />

from symmetry properties <strong>of</strong> light scattering in paper <strong>and</strong> symmetry properties <strong>of</strong> the halftone pattern. This allows some P ij<br />

functions to be derived directly without the need to carry out a convolution with the point spread function <strong>of</strong> the paper . Models <strong>of</strong><br />

these symmetry properties <strong>and</strong> methods for experimental analysis are presented.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 353–358 (1999)<br />

Probability Model<br />

Tone <strong>and</strong> color reproduction by the halftone process is<br />

based on the Murray–Davies equation, where R is the<br />

reflectance <strong>of</strong> the image as we see it, Ri <strong>and</strong> Rp are the<br />

reflectance <strong>of</strong> the ink <strong>and</strong> the paper, <strong>and</strong> F <strong>and</strong> (1 – F)<br />

are the area fractions <strong>of</strong> ink <strong>and</strong> paper. 1<br />

R = F⋅ Ri<br />

+ ( 1 −F)<br />

⋅Rp<br />

(1)<br />

The Neugebauer equation is an exp<strong>and</strong>ed form <strong>of</strong> this<br />

expression for color halftones, with f i the area fractions<br />

<strong>of</strong> each R i color making up the image. 2 Equation 2 is an<br />

example for a cmy halftone system where the dots are<br />

assumed to overlap r<strong>and</strong>omly.<br />

8<br />

R = ∑ fi<br />

⋅Ri<br />

i=<br />

1<br />

Equations 1 <strong>and</strong> 2 appear to be liner functions in terms<br />

<strong>of</strong> dot area fraction, F, or f i . R. However, it is commonly<br />

observed that the printed image reflectance, R, <strong>of</strong> a halftone<br />

image are not linear functions <strong>of</strong> the dot area fractions,<br />

F, or f i . 1 This is not due to a failure <strong>of</strong> Eqs. 1 <strong>and</strong><br />

2. Indeed, these equations must be correct because they<br />

are a form <strong>of</strong> the law <strong>of</strong> conservation <strong>of</strong> energy. The rea-<br />

Original manuscript received September 23, 1998<br />

▲ IS&T member<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

(2)<br />

son R is not linear in F is that R i <strong>and</strong> R p are not constants,<br />

as <strong>of</strong>ten assumed, but are themselves functions <strong>of</strong> the<br />

area fractions, F <strong>and</strong> f i . 1 Therefore, in order to model<br />

tone <strong>and</strong> color reproduction, we must model the R i <strong>and</strong><br />

R p as functions <strong>of</strong> area fractions. 3<br />

As shown earlier, the relationship between area fractions,<br />

F, <strong>and</strong> the reflectance values <strong>of</strong> R i <strong>and</strong> R p can be<br />

modeled with probability functions, P ij , for the scattering<br />

<strong>of</strong> light from region i <strong>of</strong> area fraction f i to region j <strong>of</strong><br />

area fraction f j . 5,6 This is illustrated in Fig. 1 as a schematic<br />

drawing <strong>of</strong> a halftone image with two regions (regions<br />

0 <strong>and</strong> 1) on a substrate <strong>of</strong> reflectance R g ,<br />

illuminated with light at irradiance I a (units <strong>of</strong> photons/<br />

sec/area). The regions are ink dots with Beer–Lambert<br />

transmittance values <strong>of</strong> T 0 <strong>and</strong> T 1 . For T 0 = 1 <strong>and</strong> T 1 < 1<br />

we have a single ink system, <strong>and</strong> the “ink” in region 0 is<br />

air. The amount <strong>of</strong> light that encounters region 0 is I a. F 0 .<br />

Similarly, I a. F 1 hits region 1. These are attenuated by<br />

the transmittance <strong>of</strong> the ink layer, so I a. F 0. T 0 <strong>and</strong> I a. F 1. T 1<br />

photons enter the paper in regions 0 <strong>and</strong> 1 respectively.<br />

The light is further attenuated by the absorption <strong>of</strong> the<br />

paper, leaving so I a. F 0. T 0. Rg <strong>and</strong> I a. F 1. T 1. Rg photons to<br />

return to the surface <strong>of</strong> the paper substrate. However ,<br />

scattering in the paper means some <strong>of</strong> the light from<br />

region 0 returns to region 0, <strong>and</strong> some to region 1.<br />

The probability <strong>of</strong> returning to region 0 from region 0<br />

is P 00 , <strong>and</strong> similarly for P 11 , P 10 , <strong>and</strong> P 01 . Thus, the total<br />

amount <strong>of</strong> light returning to the surface <strong>of</strong> region 0 is<br />

the sum ( I a. F 0. T 0. Rg . P 00 ) + ( I a. F 1. T 1. Rg . P 10 ). Similarly,<br />

(I a. F 1. T 1. Rg . P 11 ) + (I a. F 0. T 0. Rg . P 01 ) returns to the surface<br />

<strong>of</strong> region 1. Finally, the light is attenuated a second time<br />

by the inks in regions 0 <strong>and</strong> 1, so the total light reflected<br />

353


multiplication <strong>of</strong> probabilities that lead to Eqs. 3 <strong>and</strong> 4.<br />

This also lets us sum the light so that we can write the<br />

following.<br />

P01 = 1− P00<br />

(5)<br />

P10 = 1− P11<br />

(6)<br />

If we consider the special case <strong>of</strong> Fig. 1 in which R g = T 0<br />

= T 1 = 1 (no light is absorbed), then we know that R p =<br />

R i = 1. In this special case, we can equate the right h<strong>and</strong><br />

sides <strong>of</strong> Eqs. 3 <strong>and</strong> 4 <strong>and</strong> combine with Eqs. 5 <strong>and</strong> 6 to<br />

derive the following two expressions.<br />

P 10. F 1 = P 01. F 0 (7)<br />

P 11 =1 – (1 – P 00 ) . (F 0 /F 1 ) (8)<br />

Figure 1. A unit area <strong>of</strong> a halftone image <strong>of</strong> two regions.<br />

from regions 0 <strong>and</strong> 1 are [( I a. F 0. T 0. T 1. Rg . P 00 ) +<br />

(I a. F 1. T 1<br />

2.<br />

Rg . P 10 )] <strong>and</strong> [(I a. F 1. T 1. T 0. Rg . P 11 ) + (I a. F 0. T 0<br />

2.<br />

Rg . P 01 )].<br />

Dividing by the amounts incident at each region, I a. F 0<br />

<strong>and</strong> I a. F 1 , gives the reflectance values one would measure<br />

experimentally for regions 0 <strong>and</strong> 1. Calling these<br />

reflectance values R p <strong>and</strong> R i gives us the following.<br />

F<br />

Rp = Rg ⋅ T ⋅ ⎛<br />

T ⋅ P +⎛ ⎞<br />

⎜<br />

T P<br />

⎝ ⎜ F<br />

⎟<br />

⎝<br />

⎠<br />

⋅ ⋅<br />

⎞<br />

1<br />

1 0 00<br />

⎟<br />

⎠<br />

⎛ F<br />

Ri = Rg⋅T ⋅ T ⋅ P + ⎛ T<br />

⎝ ⎜ 0<br />

⎞<br />

0 ⎜ 1 11 ⎟<br />

⎝ F ⎠<br />

⋅<br />

1<br />

0<br />

1 10 (3)<br />

⋅<br />

⎞<br />

P ⎟<br />

⎠<br />

0 01 (4)<br />

These expressions give us a way to model the reflectance<br />

<strong>of</strong> the halftone inks, R i , <strong>and</strong> the paper between<br />

the halftone dots, R p , for a single ink system. Note that<br />

F1 = F <strong>and</strong> F0 = 1–F in Eq. 1. Thus, Eqs. 1, 3, <strong>and</strong> 4<br />

model halftone reflectance, R versus F provided the<br />

probability functions can be modeled.<br />

The Symmetry <strong>of</strong> Scattering<br />

In previous reports, the probability functions, P ij , were<br />

shown to be useful both for tone <strong>and</strong> color modeling. 4,6<br />

The functions that were employed were derived empirically<br />

to fit observed experimental data. Rogers has<br />

shown these functions can be derived from convolution<br />

calculations with the more fundamental probability<br />

function, PSF, that describes the point spread function<br />

for lateral scattering in paper. 5 On an even more fundamental<br />

level, one might attempt to derive the PSF<br />

from, for example, a r<strong>and</strong>om walk model <strong>of</strong> scattering,<br />

as was done by Gustavson <strong>and</strong> Kruse. 7 In this article,<br />

we will remain at an empirical level to describe the P ij<br />

functions. However, by exploring some basic symmetry<br />

characteristics <strong>of</strong> light scatter <strong>and</strong> <strong>of</strong> halftone patterns,<br />

we can deduce some useful properties <strong>of</strong> the P ij<br />

functions without resorting to more complex scatter -<br />

ing models.<br />

The simplifying assumption on which the current<br />

analysis <strong>of</strong> P ij rests is that scattering <strong>and</strong> absorption<br />

are independent probabilities. That is, the P ij <strong>and</strong> the<br />

absorption probability Rg are assumed to be independent.<br />

For the two region case <strong>of</strong> Fig. 1, this allows the<br />

Equations 7 <strong>and</strong> 8 are based on the assumption <strong>of</strong> the<br />

symmetry <strong>of</strong> light scattering. Light scatters to the right<br />

<strong>and</strong> to the left equally. If we also assume scattering <strong>and</strong><br />

absorption are independent, then Eqs. 7 <strong>and</strong> 8, which<br />

contain no terms for absorption, must be true for any<br />

values <strong>of</strong> R g , T 0 , <strong>and</strong> T 1 . In other words, Eq. 8 must apply<br />

for all systems regardless <strong>of</strong> the reflectance <strong>of</strong> the<br />

paper or the absorption <strong>of</strong> the inks. The practical significance<br />

<strong>of</strong> these equations is that they relate all four<br />

probabilities, P 00 , P 01 , P 10 , <strong>and</strong> P 11 , together. It is necessary,<br />

therefore, to model only one probability function,<br />

P 00 for example, in order to model tone reproduction, R<br />

versus F. We can apply Eq. 8 to Eqs. 3 <strong>and</strong> 4 <strong>and</strong> obtain<br />

the following.<br />

( )<br />

Rp = Rg⋅T0⋅ P00⋅( T0 − T1) + T1<br />

(9)<br />

( )<br />

Ri = Rg ⋅ T1 ⋅ P11 ⋅ ( T1 − T0) + T0<br />

(10)<br />

Measuring <strong>and</strong> Modeling Tone Reproduction<br />

An example <strong>of</strong> the use <strong>of</strong> these functions to model tone<br />

reproduction is illustrated with a halftone gray scale<br />

printed by <strong>of</strong>fset lithography. Figure 2 shows the microdensitometry<br />

data with reflectance values <strong>and</strong> the<br />

dot area fractions, F, measured by histogram analysis<br />

as described previously. The P 00 function can be modeled<br />

empirically, as described previously , 6 for an AM<br />

halftone with the following function.<br />

( )<br />

w w<br />

P00 = 1−F⋅ 2−F −( 1−F) (11)<br />

With this expression for P 00 , we apply Eqs. 8, 9, 10 <strong>and</strong><br />

then Eq. 1 in sequence to model the data. The value <strong>of</strong><br />

Rg was measured as the average image R at F = 0. The<br />

value <strong>of</strong> T 0 is 1.0 for air (no ink), <strong>and</strong> T 1 was calculated<br />

by assuming Beer–Lambert ink (zero scattering) <strong>and</strong><br />

measuring R min at F = 1 (the solid ink region). Then, T 1<br />

= (R min /Rg) 1/2 . The value <strong>of</strong> the power constant, w in<br />

Eq. 11, was adjusted to give the least RMS deviation<br />

between the R p data <strong>and</strong> the line. The result was w =<br />

0.37. By fitting the model only to the R p data, the model<br />

also resulted in a good fit to the R i <strong>and</strong> R data, indicating<br />

the model is a reasonable description <strong>of</strong> P 00 <strong>and</strong><br />

tone reproduction with this halftone system. The physical<br />

meaning <strong>of</strong> the power factor, w, has been described<br />

previously. 4<br />

354 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> Yamaguchi


1Reflectance<br />

1<br />

P 00 P 11<br />

R<br />

R p<br />

Probability<br />

R i<br />

0<br />

0 F<br />

1<br />

Figure 2. Microdensitometry data for a 65 LPI, AM halftone<br />

gray scale printed by <strong>of</strong>fset lithography.<br />

0<br />

0 F<br />

1<br />

Figure 3. P 00 <strong>and</strong> P 11 versus dot area fraction, F, calculated<br />

from the data in Fig. 2.<br />

Measuring <strong>and</strong> Modeling P 00<br />

<strong>and</strong> P 11<br />

The experimental data on R p <strong>and</strong> R i can also be used to<br />

generate experimental estimates <strong>of</strong> P 00 <strong>and</strong> P 11 as follows.<br />

First, Eqs. 9 <strong>and</strong> 10 are solved for P 00 <strong>and</strong> P 11 .<br />

(A)<br />

P<br />

00<br />

P<br />

11<br />

Rp<br />

−Rg⋅T1⋅T0<br />

=<br />

Rg⋅T ⋅( T −T<br />

)<br />

0 0 1<br />

Ri<br />

−Rg⋅T1⋅T0<br />

=<br />

Rg⋅T ⋅( T −T<br />

)<br />

1 1 0<br />

(12)<br />

(13)<br />

F= 0.1 F= 0.8<br />

(B)<br />

With experimental estimates <strong>of</strong> Rg, T 1 , <strong>and</strong> T 0 = 1, Eqs.<br />

12 <strong>and</strong> 13 convert experimental data on R p <strong>and</strong> R i versus<br />

F into data on P 00 <strong>and</strong> P 11 versus F, as illustrated in<br />

Fig. 3. In this analysis, the values <strong>of</strong> P 00 <strong>and</strong> P 11 were<br />

calculated from data on R p <strong>and</strong> R i respectively. The line<br />

through the P 00 data is Eq. 12, <strong>and</strong> the line through the<br />

P 11 data is Eq. 13 converted to P 11 with Eq. 8.<br />

The Symmetry <strong>of</strong> the Halftone Pattern<br />

The results shown in Fig. 3 are quite symmetrical. However,<br />

this is not a result <strong>of</strong> the scattering symmetry that<br />

lead to Eq. 7, rather , this is a property <strong>of</strong> the halftone<br />

pattern produced by the printing process. Indeed, Rogers 5<br />

carried out a rigorous analysis <strong>of</strong> the convolution <strong>of</strong> a<br />

paper point spread function with a symmetrical halftone<br />

pattern <strong>and</strong> predicted exactly the functional shape for<br />

the probability functions observed in the data in Fig. 3.<br />

It is not uncommon for halftones to show a pattern symmetry<br />

where the halftone dots <strong>of</strong> ink fraction 0 < F 1 < 0.5<br />

are the same shape as the paper “dots” <strong>of</strong> paper fraction<br />

0 < F 0 < 0.5. In other words, if for F > 0.5 the paper became<br />

the ink <strong>and</strong> the ink became the paper (negative<br />

image), it would be identical to the ink gray scale for F <<br />

0.5. Figure 4 illustrates two halftone patterns; one with<br />

pattern symmetry <strong>and</strong> one without.<br />

If a halftone image has pattern symmetry, then it is<br />

necessary only to know the P 00 function from F = 0 to F =<br />

Figure 4. Example <strong>of</strong> halftone patterns with <strong>and</strong> without pattern<br />

symmetry.<br />

0.5 in order to model the entire halftone system. For example,<br />

at any value <strong>of</strong> F = x (where x is some value 0 < x<br />

< 0.5), the value <strong>of</strong> P 00 at F = x produces the corresponding<br />

value <strong>of</strong> P 11 at F = x by the application <strong>of</strong> Eq. 8. Moreover,<br />

pattern symmetry requires that the value <strong>of</strong> P 00 at<br />

F = (1 – x) equals the value <strong>of</strong> P 11 at F = x, <strong>and</strong> that the<br />

value <strong>of</strong> P 11 at F = (1 – x) equals the value <strong>of</strong> P 00 at F = x.<br />

This is illustrated schematically in Fig. 5 where point<br />

(A) on the line representing P 00 leads to point (B) for P 11<br />

at the same value <strong>of</strong> F. This is a result <strong>of</strong> scattering symmetry<br />

<strong>and</strong> Eq. 8. Then points (C) <strong>and</strong> (D) for P 00 <strong>and</strong> P 11<br />

respectively are known as a result <strong>of</strong> pattern symmetry.<br />

In the example shown in Fig. 5, the values <strong>of</strong> P 00 from<br />

F = 0 to F = 1 were chosen in such a way that the corresponding<br />

value <strong>of</strong> P 11 over this range is zero by Eq. 8.<br />

This in turn produced the mirror image function for P 11 .<br />

Consideration <strong>of</strong> Eq. 8 leads to the following equation<br />

for this example <strong>of</strong> P 00 .<br />

1 2 F<br />

P00<br />

= − ⋅<br />

for F < = 0.5, <strong>and</strong> P<br />

1−<br />

F<br />

00 = 0 for F > 0.5 (14)<br />

Symmetry Properties <strong>of</strong> Halftone Images I: Scattering Symmetry <strong>and</strong> Pattern Symmetry <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 355


1<br />

Incident Light<br />

Probability<br />

A<br />

P 00 P 11<br />

C<br />

Region 1Region 0Region 0 Region 1Region 0<br />

N Pa<br />

0 B<br />

D<br />

0 F<br />

1<br />

F = x<br />

F = 1 - x<br />

Figure 5. Modeling by assuming both scattering <strong>and</strong> pattern<br />

symmetry.<br />

Because probabilities must be greater than or equal<br />

to zero, this represents a limiting boundary for possible<br />

values <strong>of</strong> P 00 <strong>and</strong> P 11 in a system that has both scattering<br />

symmetry <strong>and</strong> pattern symmetry . Values must be<br />

equal to or greater than the values indicated by the<br />

curves in Fig. 4.<br />

It should be noted that Eq. 14 marks limits for the P 00<br />

function when both scattering symmetry <strong>and</strong> pattern<br />

symmetry apply. Scattering symmetry is a fundamental<br />

property <strong>and</strong> must apply. However, pattern symmetry,<br />

as we will see subsequently, does not have to apply.<br />

In the case <strong>of</strong> the AM system shown in Fig. 2, Eq. 1 1<br />

was chosen to model P 00 because it provides this property<br />

<strong>of</strong> pattern symmetry.<br />

Components <strong>of</strong> the P 00<br />

Function<br />

<strong>Additional</strong> insights into the nature <strong>of</strong> the P 00 function<br />

can be obtained by considering the paths <strong>of</strong> light in the<br />

substrate in more detail. Recall that P 00 is a fraction <strong>of</strong><br />

light which emerges from region 0 after entering region<br />

0. However, as illustrated in Fig. 6, there are many regions<br />

0. The particular region 0 to which the light travels<br />

may or may not be the same region 0 it came from<br />

originally. To describe this, we can divide P 00 into two<br />

parts, as illustrated in Fig. 6. An amount <strong>of</strong> light, N,<br />

enters a particular region 0. A fraction <strong>of</strong> this light, P a ,<br />

returns to the surface after scattering <strong>and</strong> exits the same<br />

region 0. Another fraction (1 – P a ) scatters <strong>and</strong> leaves<br />

this region 0. Thus, N•(1 – P a ) is the amount <strong>of</strong> light<br />

that leaves this region 0. Of the light that leaves the<br />

original region 0, some will emerge under a region 1,<br />

but some will emerge at a different region 0. Define P b<br />

as the fraction <strong>of</strong> the amount <strong>of</strong> light N•(1 – P a ) that<br />

emerges under a different region 0. The total amount <strong>of</strong><br />

light which emerges under any <strong>of</strong> the regions 0 is N•P a<br />

+ N•(1 – P a )•P b . Thus, the P 00 function can be written as<br />

follows.<br />

P 00 = P a + P b. (1 – P a ) (15)<br />

By decomposing P 00 into the smaller functions P a <strong>and</strong><br />

P b , it is easier to model the nature <strong>of</strong> the P 00 function.<br />

Figure 6. Components <strong>of</strong> the P 00 function. For a single ink<br />

system, region 0 is paper <strong>and</strong> region 1 is ink.<br />

For example, consider the P a function for a digital, FM<br />

halftone where the size <strong>of</strong> the individual regions 0 <strong>and</strong><br />

1 are fixed. This means the value <strong>of</strong> P a is a constant at<br />

all values <strong>of</strong> P a . The value <strong>of</strong> this constant could easily<br />

be calculated by a convolution <strong>of</strong> a single region with<br />

the PSF <strong>of</strong> the paper.<br />

The P b part <strong>of</strong> the function carries information about<br />

the digital halftone. For example, if all the halftone regions<br />

are r<strong>and</strong>omly distributed on the paper, the probability<br />

that the light N•(1 – P a ) will emerge under a given<br />

region will be proportional to its area fraction. This, for<br />

a completely r<strong>and</strong>om FM halftone, we can immediately<br />

write Eq. 16 for P b .<br />

P b = (1 – F) (16)<br />

Note that we identify region 0 as paper between ink dots<br />

<strong>and</strong> region 1 as ink dots <strong>of</strong> area fraction F. Note also<br />

that two or more <strong>of</strong> the same type <strong>of</strong> region may occur<br />

side by side in a r<strong>and</strong>om system.<br />

Experimental Analysis <strong>of</strong> Pattern Symmetry<br />

We can apply the P a , P b model to describe an FM halftone<br />

system, as shown in Fig. 7. The halftone gray scale<br />

was printed by <strong>of</strong>fset lithography on plain paper using<br />

black ink. The halftone pattern used in this system was<br />

generated digitally by a proprietary algorithm. The lines<br />

in Fig. 7 were modeled as follows. First, Eq. 16 was used<br />

to model P b . Then P 00 was modeled by Eq. 15 with P a as<br />

an arbitrary constant between 0 <strong>and</strong> 1. P 11 was calculated<br />

with Eq. 8, then Eqs. 9, 10, <strong>and</strong> 1 were applied to<br />

calculate the lines in Fig. 7. The value <strong>of</strong> Rg was measured<br />

independently, <strong>and</strong> T i was calculated as before<br />

from (R min /Rg) 1/2 , assuming Beer–Lambert. The value <strong>of</strong><br />

P a was the only arbitrary constant in the model, <strong>and</strong><br />

the lines shown in Fig. 7 were drawn with P a = 0.34.<br />

Figure 8 shows the data used with Eqs. 12 <strong>and</strong> 13 to<br />

measure P 00 <strong>and</strong> P 11 experimentally. Because measured<br />

values <strong>of</strong> R i are small, there is significant experimental<br />

error in using R i <strong>and</strong> Eq. 13 to estimate experimental<br />

values <strong>of</strong> P 11 . Nevertheless, the symmetry <strong>of</strong> the halftone<br />

pattern is evident in Fig. 8.<br />

Figure 9 illustrates another FM halftone printed by<br />

<strong>of</strong>fset lithography. This system was identical to the system<br />

in Fig. 7 except that it was printed on a coated<br />

paper, <strong>and</strong> the halftone pattern was generated by a proprietary,<br />

error diffusion algorithm. This system was<br />

356 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> Yamaguchi


1Reflectance<br />

1Reflectance<br />

R p<br />

R p<br />

R<br />

R<br />

0<br />

R i<br />

0 F<br />

1<br />

Figure 7. Microdensitometry data for an error diffusion, FM<br />

halftone printed on plain paper with black ink by <strong>of</strong>fset lithography.<br />

The error diffusion process was proprietary <strong>and</strong> produced<br />

square halftone regions 0.13 mm on a side. Output was<br />

to film <strong>and</strong> then to plate.<br />

0<br />

R i<br />

0 F<br />

1<br />

Figure 9. Microdensitometry data for an error diffusion, FM<br />

halftone printed on coated paper. The system is the same as in<br />

Fig. 7, but a different error diffusion algorithm was used to<br />

generate the halftone pattern.<br />

1<br />

1<br />

Probability<br />

P 00 P 11<br />

Probability<br />

P 00<br />

P 11<br />

0<br />

0 F<br />

1<br />

Figure 8. P 00 <strong>and</strong> P 11 versus dot area fraction, F, calculated<br />

from the data in Fig. 7.<br />

0<br />

0 F<br />

1<br />

Figure 10. P 00 <strong>and</strong> P 11 versus dot area fraction, F, calculated<br />

from the data in Fig. 9.<br />

modeled similarly to the system in Fig. 7 except that<br />

an arbitrary power factor, m, was added to the model<br />

for P b .<br />

P b = (1 – F) m (17)<br />

By selecting P a = 0.72 <strong>and</strong> m = 2.7, the model lines shown<br />

in Fig. 9 resulted. Applying Eqs. 12 <strong>and</strong> 13 produced<br />

Fig. 10. From this analysis <strong>of</strong> the halftone data, it is<br />

evident that pattern symmetry is not a property <strong>of</strong> this<br />

halftone system.<br />

Conclusion<br />

By noting the symmetry properties intrinsic to the behavior<br />

<strong>of</strong> light scattering <strong>and</strong> the symmetry <strong>of</strong> the halftone<br />

pattern, it is possible to deduce properties <strong>of</strong> tone<br />

reproduction in a halftone system. In the case <strong>of</strong> a completely<br />

r<strong>and</strong>om halftone system with both scattering<br />

<strong>and</strong> pattern symmetry, the exact function for the scattering<br />

probability, P 00 , can be derived without resorting<br />

to a convolution calculation involving the PSF <strong>of</strong><br />

the paper, as was illustrated in Fig. 8. Perhaps, <strong>of</strong> more<br />

practical utility, however, is the result represented by<br />

Symmetry Properties <strong>of</strong> Halftone Images I: Scattering Symmetry <strong>and</strong> Pattern Symmetry <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 357


Pb<br />

1<br />

0<br />

m = 1<br />

m = 2.7<br />

0 F<br />

1<br />

Figure 11. P b versus F for m = 2.7 in Eq. 17.<br />

Eqs. 12 <strong>and</strong> 13. These expressions are based on the<br />

symmetry <strong>of</strong> light scatter but do not require pattern<br />

symmetry. The only other assumptions on which these<br />

two equations depend are that the ink dots are on top<br />

<strong>of</strong> the substrate (good hold-out) <strong>and</strong> obey Beer–Lambert.<br />

Then these equations can be applied to experimental<br />

data on R i <strong>and</strong> R p to provide a direct analysis<br />

<strong>of</strong> P 00 <strong>and</strong> P 11 . This, in turn, can indicate otherwise hidden<br />

properties <strong>of</strong> a halftone system, such as the presence<br />

or absence <strong>of</strong> pattern symmetry. In the example<br />

shown in Fig. 9 the absence <strong>of</strong> pattern asymmetry was<br />

not evident to the authors on visual inspection, but the<br />

data in Fig. 9 provides a basis for a quantitative evaluation<br />

<strong>of</strong> the degree <strong>of</strong> asymmetry.<br />

The algorithm that produced the FM halftones used<br />

in this project were proprietary <strong>and</strong> not available to the<br />

authors. However, the power factor m = 2.7 suggests an<br />

interesting characteristic <strong>of</strong> the error diffusion algorithm<br />

<strong>of</strong> Fig. 8. A value <strong>of</strong> m = 1 makes sense for a totally<br />

r<strong>and</strong>om halftone pattern, but a value <strong>of</strong> m > 1<br />

indicates a rapid decline versus F at low values <strong>of</strong> F as<br />

illustrated in Fig. 11. This means that as light scatters<br />

out <strong>of</strong> its original region 0, it has a lower probability ,<br />

P b , <strong>of</strong> encountering another region 0 compared to the<br />

expectation based on totally r<strong>and</strong>om chance. This can<br />

be rationalized if the halftone pattern is designed in such<br />

a way as to maximize the distance between like regions.<br />

Indeed, the visual noise associated with traditional r<strong>and</strong>om<br />

granularity can be decreased in many error diffusion<br />

algorithms by applying a “blue noise filter” which<br />

shifts the granularity to higher spatial frequencies. Such<br />

a shift might be expected to result in a shift toward more<br />

space between dots <strong>and</strong> less clustering, that in turn<br />

might indeed result in m > 1. Thus, the techniques <strong>of</strong><br />

microdensitometry analysis <strong>of</strong> P 00 <strong>and</strong> P 11 suggested in<br />

this study appear to be <strong>of</strong> practical utility.<br />

Acknowledgment. Special thanks to our lab colleagues,<br />

Akio Tsujita <strong>and</strong> Katsuya Ito for stimulating<br />

discussions <strong>and</strong> challenging arguments. Thanks also to<br />

Ge<strong>of</strong>frey Rogers for stimulating thoughts, <strong>and</strong> for pointing<br />

the way.<br />

References<br />

1. An excellent introduction to the topic by Peter G. Engeldrum, The Color<br />

Between the Dots, J. Imag. Sci. Technol. 38, 545 (1994).<br />

2. J. A. S. Viggiano, TAGA Proc. 37, 647 (1985).<br />

3. J. S. Arney, P. G. Engeldrum <strong>and</strong> H. Zeng, An exp<strong>and</strong>ed Murray-<br />

Davies Model <strong>of</strong> Tone Reproduction in Halftone <strong>Imaging</strong>, J. Imag.<br />

Sci. Technol. 39, 502 (1995).<br />

4. J. S. Arney <strong>and</strong> M. Katsube, A Probability Description <strong>of</strong> the Yule-<br />

Nielsen Effect, J. Imag. Sci. Technol. 41, 633 <strong>and</strong> 637 (1997).<br />

5. G. L. Rogers, Optical Dot Gain: Lateral Scattering Probabilities, J.<br />

Imag. Sci. Technol. 42, 341 (1998).<br />

6. J. S. Arney, T. Wu <strong>and</strong> C. Blehm, Modeling the Yule-Nielsen effect<br />

on Color Halftones, J. Imag. Sci. Technol. 42, 335 (1998).<br />

7. S. Gustavson, Modeling <strong>of</strong> light scattering effects in Print, Thesis<br />

LIU-ISBN:91-7871-623-3, <strong>and</strong> J. Imag. Sci. Technol. 41, 283<br />

(1997).<br />

358 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> Yamaguchi


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Symmetry Properties <strong>of</strong> Halftone Images II:<br />

Accounting for Ink Opacity <strong>and</strong> Dot Sharpness<br />

Jonathan S. Arney ▲<br />

Center for <strong>Imaging</strong> <strong>Science</strong>, Rochester Institute <strong>of</strong> <strong>Technology</strong>, Rochester, New York<br />

<strong>and</strong> Akio Tsujita<br />

Hitachi Koki Co., Ltd., Katsuta Research Laboratory, Japan<br />

Previous work has shown that tone reproduction characteristics <strong>of</strong> halftone images can be modeled with knowledge <strong>of</strong> the probability<br />

function P 00 , for light to reflect from the paper between the halftone dots after having entered the paper between the<br />

halftone dots. In the current report, experimental measurements <strong>of</strong> the micro-reflectance, R p , <strong>of</strong> the paper between the dots is<br />

measured as a function <strong>of</strong> dot area fraction, F, <strong>and</strong> used with the model to calculate experimental values for P 00 versus F. It is<br />

then shown that the model can be modified to account for inks that have significant scattering. The model is shown to fit data on<br />

halftones printed with electrophotography toner which is highly opaque. In addition, the model is further modified to account orf<br />

the effects <strong>of</strong> the non-sharpness <strong>of</strong> the edges <strong>of</strong> halftone dots. Using both <strong>of</strong> these effects, the model is shown to fit well wit h<br />

measured data from a variety <strong>of</strong> AM <strong>and</strong> FM halftones printed at different resolutions with different colorants. In addition, the<br />

model is shown to fit experimental data on the tone reproduction characteristics <strong>of</strong> a continuous tone, electrophotographic, <strong>of</strong>f ice<br />

copy machine.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 359–364 (1999)<br />

Introduction<br />

The overall reflectance, R, <strong>of</strong> a halftone image is described<br />

by the Murray–Davies Eq. 1 in which R i <strong>and</strong> R p<br />

are the reflectance values <strong>of</strong> the ink <strong>and</strong> paper in the<br />

halftone for an ink fractional area coverage <strong>of</strong> F.<br />

R = F⋅ Ri<br />

+ ( 1 −F)<br />

⋅Rp<br />

(1)<br />

This equation accurately describes the relationship between<br />

the dot area fraction <strong>and</strong> the reflectance <strong>of</strong> a halftone<br />

image provided the values <strong>of</strong> R i <strong>and</strong> R p are<br />

expressed as functions <strong>of</strong> F. 1 In the accompanying report,<br />

2 probability functions P ij were employed to model<br />

the R i <strong>and</strong> R p versus F functions. The P ij functions describes<br />

the lateral scattering <strong>of</strong> light in the paper substrate.<br />

Light which enters a region i <strong>of</strong> the paper has a<br />

probability, P ij , <strong>of</strong> scattering to another region, j, <strong>and</strong><br />

exiting as reflected light. For example, in a one ink halftone<br />

we define regions 0 <strong>and</strong> 1 as the regions between<br />

the halftone dots <strong>and</strong> the region <strong>of</strong> the substrate under<br />

the halftone dots, respectively. The previous report describes<br />

the halftone model based on these probability<br />

functions. 2 The current report describes how this model<br />

can be modified to account for artifacts commonly encountered<br />

in halftone systems. These artifacts are (1)<br />

Original manuscript received September 23, 1998<br />

▲ IS&T Member<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

opaque inks that scatter as well as absorb light, <strong>and</strong> (2)<br />

inks that form halftone dots with diffuse, poorly defined<br />

edges.<br />

The model begins with the P 00 function which describes<br />

the probability that the light that enters the paper between<br />

the halftone dots will also exit as reflected light<br />

between dots. Another fraction <strong>of</strong> the light, P 01 = 1 – P 00 ,<br />

enters the paper in the region between the dots <strong>and</strong><br />

emerges under a dot. P 10 <strong>and</strong> P 11 are similarly defined,<br />

<strong>and</strong> as described previously the symmetry <strong>of</strong> scattering<br />

leads to the following relationship between P 00 <strong>and</strong> P 11 ,<br />

with F 1 = F defined as the area fraction <strong>of</strong> the halftone<br />

dot <strong>and</strong> F 0 = 1 – F the area fraction between the dots. 2<br />

P 11 = 1 – (1 – P 00 ) . (F 0 /F 1 ) (2)<br />

The reflectance factors for the two regions <strong>of</strong> the halftone<br />

were shown to be related to the probability functions<br />

as follows. 2<br />

( )<br />

Rp = Rg⋅T0⋅ P00⋅( T0 − T1) + T1<br />

(3)<br />

( )<br />

Ri = Rg⋅T1⋅ P11⋅( T1− T0) + T0<br />

(4)<br />

In these expressions, Rg is the reflectance <strong>of</strong> the unprinted<br />

paper, T 1 is the Beer–Lambert T ransmittance<br />

<strong>of</strong> the ink, <strong>and</strong> T 0 is the transmittance <strong>of</strong> the “ink” over<br />

region 0. T 0 = 1 when region 0 is bare paper. By applying<br />

these equations for R p <strong>and</strong> R i to Eq. 1, we can calculate<br />

the overall reflectance <strong>of</strong> the halftone image, R.<br />

359


1Reflectance<br />

1<br />

P 00 P 11<br />

R<br />

R p<br />

Probability<br />

R i<br />

0<br />

0 F<br />

1<br />

Figure 1. Microdensitometry data for a 65 LPI, AM halftone<br />

gray scale printed by <strong>of</strong>fset lithography with magenta ink.<br />

0<br />

0 F<br />

1<br />

Figure 2. P 00 versus F measured from R p using Eq. 5 <strong>and</strong> fit to<br />

a polynomial (solid line). P 11 (dashed line) from Eq. 1 using the<br />

regression line for P 00 .<br />

Thus, in order to model halftones, R versus F, we need<br />

to know the P 00 function.<br />

Modeling the P 00 Function<br />

In other reports it has been shown that the P 00 function<br />

may be modeled starting from the point spread function<br />

<strong>of</strong> the substrate, 3 starting from empirical functions<br />

for P 00 found to fit many common halftones,<br />

4<br />

or from<br />

symmetry properties <strong>of</strong> light scattering. 2 In the current<br />

work we will model P 00 empirically from indirect, experimental<br />

measurements <strong>of</strong> P 00 . This can be done by<br />

measuring the reflectance <strong>of</strong> the paper between the halftone<br />

dots, R p , using microdensitometric techniques described<br />

previously. 1,5 Equation 3 is then solved for P 00 ,<br />

as shown in Eq. 5, <strong>and</strong> the measured values <strong>of</strong> R p are<br />

used to calculate the corresponding values <strong>of</strong> P 00 .<br />

Rp<br />

−Rg⋅T1⋅T0<br />

P00<br />

=<br />

Rg⋅T0⋅( T0 −T1)<br />

Thus, experimental values <strong>of</strong> R p versus F provide experimental<br />

estimates <strong>of</strong> P 00 versus F. In the work described<br />

below, the P 00 versus F data was fit to a<br />

seventh-order polynomial by a regression analysis. Then<br />

tone reproduction was modeled by applying the polynomial<br />

function for P 00 to Eqs. 2, 3, 4, <strong>and</strong> 1.<br />

Well Behaved System<br />

Figure 1 shows microdensitometry data for a traditional<br />

AM halftone printed at 65 LPI by <strong>of</strong>fset lithography. Reflectance<br />

values were measured for the overall image,<br />

R, the halftone dots, R i , <strong>and</strong> the paper between the dots,<br />

R p , as described previously. 1,5 P 00 values were calculated<br />

from the measured R p by Eq. 5, with Rg measured as<br />

the image reflectance, R, at F = 0. The value <strong>of</strong> T 0 is 1.0<br />

for air (no ink), <strong>and</strong> T 1 was calculated by assuming Beer–<br />

Lambert ink (zero scattering) <strong>and</strong> measuring R min at F<br />

= 1 (the solid ink region). Then, T 1 = (R min /Rg) 1/2 . The<br />

resulting values <strong>of</strong> P 00 are shown in Fig. 2.<br />

(5)<br />

A polynomial regression was performed to fit the data<br />

in Fig. 2 (solid line). Then the corresponding model for<br />

P 11 was calculated from Eq. 2 (dashed line). Finally, R p ,<br />

R i , <strong>and</strong> R versus F were modeled. The results are shown<br />

as the solid lines in Fig. 1. The model must, <strong>of</strong> course,<br />

fit the data for R p , but the agreement between the model<br />

<strong>and</strong> the R i <strong>and</strong> R data shows the halftone to be quite<br />

well described by the probability model.<br />

Scattering in the Halftone Dot<br />

Thus far we have assumed the ink in the halftone dot<br />

obeys Beer–Lambert optics so that T 1 = (R min /Rg) 1/2 . That<br />

is, only absorption occurs, <strong>and</strong> light scatter is confined<br />

to the paper substrate. However, scattering within the<br />

ink might be expected to contribute significantly to the<br />

reflectance, R i , <strong>of</strong> some halftone systems. Also, as shown<br />

earlier, 6 penetration <strong>of</strong> ink into the substrate behaves<br />

as if the scattering coefficient <strong>of</strong> the ink itself increases.<br />

Another system in which light scatter in the ink is<br />

expected to play a significant role is electrophotography.<br />

Toner particles are highly opaque, <strong>and</strong> most <strong>of</strong> the<br />

light reflected from a halftone dot made <strong>of</strong> toner par -<br />

ticles can be expected to come from the toner bulk <strong>and</strong><br />

the surface <strong>of</strong> the toner. For example, the data in Fig.<br />

3 was measured for a 36 LPI AM halftone printed by a<br />

laser printer using a proprietary algorithm for generating<br />

traditional, clustered halftone dots. The lines<br />

through the data were modeled exactly as described<br />

above for the 65 LPI system <strong>of</strong> Fig. 1. Clearly the model,<br />

based on Beer–Lambert optics, does not fit the observed<br />

behavior <strong>of</strong> the electrophotographic halftone. The<br />

model was modified to account for the opacity <strong>of</strong> the<br />

colorant.<br />

A layer <strong>of</strong> ink <strong>of</strong> thickness x at F = 1 (solid coverage)<br />

on top <strong>of</strong> a scattering substrate <strong>of</strong> reflectance Rg can be<br />

modeled with the Kubelka–Munk absorption <strong>and</strong> scattering<br />

coefficients, K <strong>and</strong> S, both in units <strong>of</strong> mm –1 . The<br />

equations for the system are as follows.<br />

(A) The reflectance, R min , <strong>of</strong> the solid ink region <strong>of</strong> the<br />

halftone:<br />

360 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> T sujita


1Reflectance<br />

1Reflectance<br />

R<br />

R p<br />

R<br />

R p<br />

R i<br />

R i<br />

0<br />

0<br />

0 F<br />

1<br />

Figure 3. Microdensitometry data for a 35 LPI, AM halftone<br />

gray scale printed by electrophotography with a proprietary<br />

laser printer using a clustered dot halftone algorithm. Modeled<br />

with Beer–Lambert optics.<br />

0 F<br />

1<br />

Figure 4. Microdensitometry data for a 35 LPI, AM halftone<br />

gray scale printed by electrophotography with a proprietary<br />

laser printer using a clustered dot halftone algorithm. Modeled<br />

with Kubelka–Munk optics <strong>and</strong> k = 0.99.<br />

1 Rg [ a b coth( b S x)]<br />

Rmin<br />

= − ⋅ − ⋅ ⋅ ⋅<br />

a− Rg+ b⋅coth( b⋅S⋅x)]<br />

where a = (S/K + 1), <strong>and</strong> b = (a 2 – 1) 1/2 .<br />

(6)<br />

convert experimental values <strong>of</strong> R p versus F into P 00 versus<br />

F. Then we perform the polynomial regression to<br />

model P 00 , <strong>and</strong> Eq. 2 models P 11 . Equation 3 then models<br />

R p versus F as before. We approximate a model for<br />

R i versus F by adding R o to Eq. 4.<br />

(B) The fraction <strong>of</strong> light, T KM , that penetrates all the<br />

way through the ink to the paper:<br />

b<br />

T KM = a ⋅ b ⋅ S ⋅ x + b ⋅ b ⋅ S ⋅ (7)<br />

Sinh(<br />

) Cosh(<br />

x )<br />

(C) The reflectance, R 0 , the ink would have with a black<br />

background:<br />

R<br />

0<br />

1<br />

= (8)<br />

a − b ⋅coth( b ⋅ S ⋅ x )<br />

R 0 is the light which reflects from the colorant without<br />

penetrating all the way to the paper. R min is the reflectance<br />

we measure experimentally for the solid ink<br />

region <strong>of</strong> the halftone at F = 1. We define an index <strong>of</strong><br />

opacity, k, as the ratio (R 0 / R min ). For a completely opaque<br />

colorant k = 1, <strong>and</strong> for a Beer–Lambert colorant with no<br />

scattering, k = 0.<br />

R0 = k ⋅ Rmin (9)<br />

We will treat k as an arbitrary variable in the P 00 model.<br />

By measuring R min <strong>and</strong> selecting a value for k, we obtain<br />

R 0 . Then by inverting Eqs. 6 <strong>and</strong> 8 (using numerical techniques)<br />

we can solve for the values <strong>of</strong> Kx = K•x <strong>and</strong> Sx =<br />

S•x. Then Eq. 7 is used to calculate T KM .<br />

The value <strong>of</strong> T KM from Eq. 7 is used as an estimate <strong>of</strong><br />

the amount <strong>of</strong> light which enters the paper substrate<br />

under the halftone dot. W e use T KM for T 1 in Eq. 5 to<br />

( ) +<br />

Ri = Rg⋅T1⋅ P11⋅( T1− T0) + T0 R0<br />

(10)<br />

Finally, R versus F is modeled with Eq. 1.<br />

The model contains a single arbitrary constant, k.<br />

With k = 0, the model reduces exactly to the model <strong>of</strong><br />

Figs. 1 <strong>and</strong> 2. However, by adjusting k = 0.99 to achieve<br />

a minimum RMS difference between the model <strong>and</strong> the<br />

data for R i , the model shown in Fig. 4 results. This is<br />

clearly an improvement over the results shown in Fig.<br />

3. Moreover, the resulting model <strong>of</strong> R versus F also<br />

agrees well with the observed data.<br />

Sharpness <strong>of</strong> Halftone Dots<br />

The most common approximation implied in most halftone<br />

models is that halftones have discrete, definable<br />

edges, as illustrated on the right side <strong>of</strong> Fig. 5. However,<br />

real halftones suffer from effects such as feathering<br />

<strong>of</strong> the ink; edge raggedness, or misplaced ink<br />

particles (satellite drops, loose toner, etc.) as illustrated<br />

on the left <strong>of</strong> Fig. 5. It is important to distinguish between<br />

such dot edge effects <strong>and</strong> physical dot gain. Dot<br />

gain is the difference between the size <strong>of</strong> the dot comm<strong>and</strong>ed<br />

by the printing process (halftone screen or digital<br />

signal) <strong>and</strong> the actual size <strong>of</strong> the dot that ends up on<br />

the paper. The edge effect, on the other h<strong>and</strong>, has to do<br />

with the sharpness <strong>of</strong> the edge, as illustrated in Fig. 6.<br />

All <strong>of</strong> the effects illustrated in Fig. 5 can lead to an effective<br />

edge s<strong>of</strong>tness as shown in Fig. 6. In the experimental<br />

work described in this article, dot gain is not a<br />

factor because the actual dot size is measured experimentally<br />

from the printed samples, but the sharpness<br />

<strong>of</strong> the edge can influence tone reproduction.<br />

Symmetry Properties <strong>of</strong> Halftone Images II: Accounting for Ink Opacity <strong>and</strong> Dot Sharpnes s <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 361


Figure 5. Illustration <strong>of</strong> s<strong>of</strong>t edges on halftone dots.<br />

Figure 7. Experimental histogram <strong>of</strong> a typical halftone, as<br />

seen by microdensitometry, where H(R) is the relative frequency<br />

<strong>of</strong> occurrence <strong>of</strong> each gray level, R, measured by the<br />

microdensitometer.<br />

Figure 6. Illustration <strong>of</strong> physical dot gain <strong>and</strong> the edge effect.<br />

(A) are dots comm<strong>and</strong>ed by the printer . (B) are dots actually<br />

printed.<br />

When dot edges are poorly defined, the meaning <strong>of</strong><br />

“dot edge” becomes a matter <strong>of</strong> arbitrary definition. It<br />

is common to resort to an experimental “threshold” reflectance,<br />

R t , to define the edge <strong>of</strong> dots, as illustrated in<br />

Fig. 7. Then the two state approximation <strong>of</strong> Eq. 1 can<br />

be applied with area fractions <strong>and</strong> reflectance values<br />

defined as metrics from the histogram. In the current<br />

work, the values <strong>of</strong> R i , R p , <strong>and</strong> F were defined in terms<br />

<strong>of</strong> the peak <strong>and</strong> valley points illustrated in Fig. 7.<br />

As a result <strong>of</strong> this method <strong>of</strong> defining dot edges, the<br />

apparent reflectance values <strong>of</strong> R i <strong>and</strong> R p vary with F<br />

not only because <strong>of</strong> the Yule–Nielsen effect <strong>of</strong> light scatter,<br />

but also because <strong>of</strong> overlap <strong>of</strong> colorant when dots<br />

get close together. For example, when dot edges get close<br />

together, the space between the dots will fill in with some<br />

amount <strong>of</strong> colorant, as illustrated in Fig. 5. The impact<br />

<strong>of</strong> this effect on T 0 <strong>and</strong> T 1 may be approximated by the<br />

following empirical functions, as suggested in earlier<br />

work. 1 v<br />

T = 1−( 1−T ) ⋅( 1−F<br />

) (11)<br />

0 KM 0<br />

v<br />

1 KM 1<br />

T = 1−( 1−T ) ⋅F<br />

(12)<br />

Figure 8. Data for the 35 LPI, AM halftone gray scale <strong>of</strong> Fig.<br />

6 printed by electrophotography <strong>and</strong> modeled with a dot opacity<br />

k = 0.99 <strong>and</strong> dot sharpness v = 0.05.<br />

In these expressions, T KM is the transmittance <strong>of</strong> the<br />

solid colorant layer described in Eq. 7, <strong>and</strong> the power<br />

factor, v, is an empirical index <strong>of</strong> dot sharpness. Note<br />

that at v = 0, Eqs. 11 <strong>and</strong> 12 revert to T 0 = 1 <strong>and</strong> T 1 =<br />

T KM for perfectly sharp dots.<br />

The addition <strong>of</strong> Eqs. 11 <strong>and</strong> 12 to the model provides<br />

a model containing two arbitrary parameters, k <strong>and</strong> v.<br />

By adjusting both k <strong>and</strong> v, the RMS deviation between<br />

the model <strong>and</strong> the data for R i was minimized to produce<br />

the solid lines shown in Fig. 8. This is clearly a much<br />

improved fit.<br />

Modeling Different Halftone Systems<br />

The model modified to include ink opacity , k, <strong>and</strong> the<br />

dot edge effect, v, was applied to a variety <strong>of</strong> halftone<br />

362 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> T sujita


1Reflectance<br />

TABLE I. Opacity <strong>and</strong> Edge Indices Required to Fit Halftone<br />

Gray Scales<br />

System k v<br />

AM 65 LPI Offset 0.00 0.00<br />

AM 150 LPI Offset 0.00 0.12<br />

AM 35 LPI EP 0.98 0.04<br />

Con-tone EP 1.00 0.12<br />

FM 191 DPI Offset 0.00 0.00<br />

FM 1200 DPI Offset 0.70 0.07<br />

FM 300 DPI Ink Jet 0.94 0.00<br />

Offset = <strong>of</strong>fset lithography<br />

EP = laser electrophotography<br />

Con-tone EP = electrophotographic <strong>of</strong>fice copy machine<br />

Ink Jet = thermal ink jet on plain paper<br />

Contact = halftones on silver halide film pressed in close contact with the paper.<br />

LPI = lines per inch for an AM clustered dot halftone<br />

DPI = inverse <strong>of</strong> dot size in inches for an AM halftone<br />

R i<br />

R<br />

R p<br />

H(R)<br />

0<br />

0<br />

R mean = 0.124, F=0.85<br />

R mean = 0.296, F=0.39<br />

Figure 9. Histograms from two different gray levels printed<br />

by the continuous tone, electrophotographic copy machine.<br />

systems. In every case the agreement between data <strong>and</strong><br />

the model was as good as that shown in Fig. 8. T able I<br />

summarizes the observations.<br />

One system in T able I is not typically considered a<br />

halftone. That was a gray scale image generated by placing<br />

samples <strong>of</strong> different reflectance on a Xerox model<br />

5365 <strong>of</strong>fice copy machine. Such a copy machine is generally<br />

considered to be a continuous tone imaging system.<br />

However, microdensitmetric examination <strong>of</strong> the mid<br />

tones produced by such a copy machine shows toner<br />

particles distributed r<strong>and</strong>omly in much the same way<br />

as printed dots in a stochastic halftone. The histograms<br />

from microdensitometric analysis <strong>of</strong> these gray levels<br />

<strong>of</strong>ten show the same bi-modal distribution typical <strong>of</strong><br />

printed halftones. Figure 9 illustrates two histograms<br />

for two copied gray levels produced by the 5365 machine.<br />

The exposure that produced the mean reflectance <strong>of</strong><br />

0.296 in Fig. 9 is clearly bi-modal, though the two gray<br />

populations are much overlapped. Visual inspection <strong>of</strong><br />

the image with a loupe had the appearance <strong>of</strong> a r<strong>and</strong>om<br />

distribution <strong>of</strong> toner “dots”, <strong>and</strong> the eye could clearly<br />

distinguish these dots.<br />

Bi-modal behavior is also suggested by the skewed<br />

shape <strong>of</strong> the histogram <strong>of</strong> mean reflectance R mean = 0.124.<br />

R<br />

1<br />

0<br />

0 F<br />

1<br />

Figure 10. Microdensitometry data for the continuous tone,<br />

electrophotographic copy machine. Experimental data, (O), <strong>and</strong><br />

model (solid lines) with k = 1 <strong>and</strong> v = 0.12.<br />

Here also visual inspection clearly distinguishes the<br />

toner from the paper. The toner “dot” area fractions, F,<br />

for a set <strong>of</strong> copier images were determined by fitting a<br />

bi-modal histogram model to the experimental histograms,<br />

as described previously. 5 From the area fraction,<br />

the transition reflectance, R t , <strong>and</strong> then the mean reflectance<br />

values on each side <strong>of</strong> the transition reflectance,<br />

R i <strong>and</strong> R p were determined. The results are shown in<br />

Fig. 10. The R p versus F data in Fig. 10 was fit by a<br />

polynomial regression, <strong>and</strong> the rest <strong>of</strong> the tone reproduction<br />

model was carried out as described above. With<br />

k = 1.00 (completely opaque toner) <strong>and</strong> v = 0.12 (a very<br />

s<strong>of</strong>t “dot”), the results displayed as lines in Figs. 10 <strong>and</strong><br />

11 resulted.<br />

Discussion<br />

The probability model, modified to include colorant opacity,<br />

k, <strong>and</strong> non-sharpness <strong>of</strong> the edges <strong>of</strong> the halftone<br />

dots, v, fit the observed experimental model for all the<br />

halftones in this study quite well. Moreover, the values<br />

<strong>of</strong> k <strong>and</strong> v in Table I, make physical sense. For example,<br />

high values <strong>of</strong> k were observed for all <strong>of</strong> the toner systems,<br />

as one would expect. Values <strong>of</strong> k = 0 fit the data<br />

for the <strong>of</strong>fset lithographic prints, <strong>and</strong> indeed transparency<br />

is a common assumption used in most models reported<br />

in the literature for lithographic halftones. The<br />

ink jet system utilized a water based dye known to be<br />

transparent. However, the ink jet system fit best with k<br />

= 0.94. As shown previously, this can be a result <strong>of</strong> the<br />

colorant penetrating the surface so that the ink behaves<br />

as if it has the opacity <strong>and</strong> scattering power <strong>of</strong> the substrate.<br />

Only the system labeled “FM 1200 DPI Offset”<br />

seems out <strong>of</strong> line in Table I. In this case, however, one<br />

might speculate that the transparent dots, being quite<br />

small (1/1200 inch in diameter) may interact with the<br />

paper substrate (calendered plain paper in this case) to<br />

induce behavior similar to a scattering ink. Clearly ,<br />

additional investigation would be required to resolve<br />

this observation.<br />

Symmetry Properties <strong>of</strong> Halftone Images II: Accounting for Ink Opacity <strong>and</strong> Dot Sharpnes s <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 363


1<br />

Probability<br />

0<br />

P 00<br />

P 11<br />

0 F<br />

1<br />

Figure 11. Measured P 00 versus F for data in Fig. 10 <strong>and</strong> fit to<br />

a polynomial (solid line). P 11 (dashed line) from Eq. 1 using the<br />

regression line for P 00 .<br />

The edge sharpness parameter, v, also seems reasonable<br />

for the samples examined. For the low frequency<br />

samples, edge sharpness is <strong>of</strong> less significance, so v = 0.0<br />

for the 65 LPI AM system <strong>and</strong> the 191 DPI FM system.<br />

The ink jet image produced small drops, but they were<br />

heated on contact with the paper (HP1600C printer) <strong>and</strong><br />

formed very well defined dots. The result was a halftone<br />

system with v = 0.0.<br />

A particularly interesting case is the contone gray<br />

scale from the Xerox 5365. In this case the value <strong>of</strong> k =<br />

1.00 makes sense for an opaque toner system. However,<br />

toner particles intrinsically have very sharp, well defined<br />

edges. Indeed, examination <strong>of</strong> the toner image<br />

through a microscope clearly revealed toner particles<br />

that were well defined, sharp edged particles. Never -<br />

theless a value <strong>of</strong> v = 0.12 was required to fit the data.<br />

The authors would like to suggest that for very small<br />

halftone dots (toner particles 10 µm <strong>and</strong> smaller) the<br />

diffraction <strong>of</strong> light around the dots may cause an apparent<br />

edge s<strong>of</strong>tness <strong>and</strong> require v > 0. If this indeed is<br />

the origin <strong>of</strong> v > 0 in the analysis <strong>of</strong> the copy machine<br />

image, then the edge effect has both a physical <strong>and</strong> an<br />

optical component, much as does dot gain.<br />

The magnitude <strong>of</strong> a refraction effect at the edges <strong>of</strong><br />

toner particles is a function <strong>of</strong> the numerical aperture<br />

<strong>of</strong> the densitometer used to measure the image. Thus<br />

if refraction does play a significant role in toner systems,<br />

one would expect the numerical aperture <strong>of</strong> the<br />

densitometer to influence the measured tone <strong>and</strong> color<br />

reproduction <strong>of</strong> halftone images. To the author’s knowledge,<br />

such an effect has not been reported or explored.<br />

One additional feature <strong>of</strong> the model applied to the<br />

continuous tone image should be noted. The experimental<br />

shape <strong>of</strong> the P 00 curve in Fig. 11 is not symmetrical<br />

with respect to the corresponding P 11 curve (dotted<br />

line). This indicates the open spaces between toner near<br />

F = 1 are not the negative image <strong>of</strong> the toner on the<br />

paper near F = 0. This non-symmetry is not surprising,<br />

but the apparent minimum in P 00 near F = 0.6 <strong>and</strong><br />

the limiting value <strong>of</strong> P 00 as F approaches 1.00 are difficult<br />

to rationalize. The easy explanation is to suggest<br />

these apparent observations are just experimental artifacts<br />

which result from the uncertainty in the analysis<br />

<strong>of</strong> the histograms. Nevertheless, it is also tempting<br />

to believe there may be significance to these curves <strong>and</strong><br />

that this type <strong>of</strong> analysis might lead to useful insights<br />

about image formation in electrophotographic <strong>and</strong><br />

other systems. The authors hope to explore these effects<br />

in more detail. Perhaps eventually a unified tone<br />

reproduction model might evolve that describes everything<br />

from macroscopic halftones to molecular level<br />

“dots” <strong>of</strong> colorant.<br />

Acknowledgment. Special thanks to our lab colleague<br />

Katsuya Ito for stimulating discussions <strong>and</strong> challenging<br />

arguments. Thanks also to Ge<strong>of</strong>frey Rogers for<br />

stimulating thoughts, <strong>and</strong> for pointing the way.<br />

References<br />

1. J. S. Arney, P. G. Engeldrum <strong>and</strong> H. Zeng, An exp<strong>and</strong>ed Murray-<br />

Davies Model <strong>of</strong> Tone Reproduction in Halftone <strong>Imaging</strong>, J. Imag.<br />

Sci. Technol. 39, 502 (1995).<br />

2. J. S. Arney <strong>and</strong> S. Yamaguchi, Symmetry Properties <strong>of</strong> Halftone Images<br />

I: Scattering Symmetry <strong>and</strong> Pattern Symmetry, J. Imag. Sci.<br />

Technol. 43, 353 (1999).<br />

3. G. L. Rogers, Optical Dot Gain: Lateral Scattering Probabilities, J.<br />

Imag. Sci. Technol. 42, 341 (1998).<br />

4. S. Gustavson, Modeling <strong>of</strong> light scattering effects in Print, Thesis<br />

LIU-ISBN:91-7871-623-3, <strong>and</strong> J. Imag. Sci. Technol.41, 283 (1997).<br />

5. J. S. Arney <strong>and</strong> Y. Wong, Histogram analysis <strong>of</strong> the microstructure<br />

<strong>of</strong> halftone images, Proc. IS&T’s PICS Conference, IS&T, Springfield,<br />

VA, 1998, p. 206.<br />

6. J. S. Arney <strong>and</strong> M. Alber, Optical Effects <strong>of</strong> Ink Spread <strong>and</strong> Penetration<br />

on Halftones Printed by Thermal Ink Jet, J. Imag. Sci. Technol.<br />

42, 331 (1998).<br />

364 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney <strong>and</strong> T sujita


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Kubelka–Munk Theory <strong>and</strong> the Yule–Nielsen Effect on Halftones<br />

Jonathan S. Arney ▲ <strong>and</strong> Eric Pray<br />

Center for <strong>Imaging</strong> <strong>Science</strong>, Rochester Institute <strong>of</strong> <strong>Technology</strong>, Rochester, New York<br />

<strong>and</strong> Katsuya Ito<br />

Toyobo Co. Ltd., Film Research Laboratory, Otsu-city Shiga, Japan<br />

This report experimentally relates the Yule–Nielsen n parameter for optical dot gain to the scattering <strong>and</strong> absorption parameters,<br />

S <strong>and</strong> K, <strong>of</strong> Kubelka–Munk theory. The relationship between the parameters is made through another metric <strong>of</strong> light<br />

scatter, k p , defined as the inverse <strong>of</strong> the frequency, ω in cy/mm, at which the MTF <strong>of</strong> the paper equals 1/2. The value <strong>of</strong> n is related<br />

exponentially to k p , as shown in earlier work, <strong>and</strong> the current work indicates that k p = c/S, where c is a constant equal approximately<br />

to 10. However, contrary to some intuition <strong>and</strong> to previous theoretical projections, the absorption coefficient <strong>of</strong> the paper,<br />

K, has no significant influence on k p or the MTF <strong>of</strong> paper.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 365–370 (1999)<br />

Introduction<br />

The overall reflectance, R, <strong>of</strong> a halftone image is described<br />

by the Murray–Davies Eq. 1 in which R i <strong>and</strong><br />

R p are the reflectance values <strong>of</strong> the ink <strong>and</strong> the paper<br />

when the halftone is at an ink area fraction, F, between<br />

0 <strong>and</strong> 1. 1 R = F • R i + (1 – F) • R p (1)<br />

Equation 1 appears to indicate a linear relationship<br />

between R <strong>and</strong> F, but the reflectance values, R i <strong>and</strong> R p ,<br />

are also functions <strong>of</strong> F. 2,3 This occurs because light scatters<br />

laterally inside the paper substrate, increasing the<br />

probability it will encounter ink <strong>and</strong> be absorbed. However,<br />

it is common practice to assume R i = R b <strong>and</strong> R p =<br />

R g , where R b <strong>and</strong> R g are the reflectance values <strong>of</strong> the<br />

ink at F = 1 (black) <strong>and</strong> the reflectance <strong>of</strong> the paper at F<br />

= 0 (ground). When these approximations are used in<br />

Eq. 1, the calculated values <strong>of</strong> R are generally higher<br />

than the actual measured values. In order to compensate,<br />

an empirical n parameter can be used. 1,2,3<br />

[ ]<br />

1/ b n 1/<br />

g n n<br />

R = F⋅ R + ( 1 −F) ⋅R<br />

(2)<br />

Equation 2, the Yule–Nielsen equation, has been applied<br />

successfully to model tone <strong>and</strong> color reproduction in<br />

many halftone systems. If light does not scatter later -<br />

ally in the paper to any significant extent, then n = 1,<br />

Original manuscript received October 13, 1998<br />

▲ IS&T Member<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

R i = R b , R p = R g , <strong>and</strong> Eq. 2 reduces to Eq. 1. If light<br />

scatters thoroughly in the paper <strong>and</strong> becomes completely<br />

scrambled over distances much larger than the dot size,<br />

then n = 2. 2–4 Thus, the n factor can be used as an index<br />

<strong>of</strong> the effect <strong>of</strong> light scattering on the halftone image.<br />

The purpose <strong>of</strong> this article is to examine how n is related<br />

to other indices <strong>of</strong> light scatter in printing substrates<br />

such as paper.<br />

Which Dot Fraction? The effect <strong>of</strong> lateral light scatter<br />

on halftone images is called the Yule–Nielsen effect, but<br />

the term “optical dot gain” has also been used to characterize<br />

the phenomenon. If we assume n = 1 but increases<br />

the values <strong>of</strong> F in Eq. 2 to a larger value, called F’, then<br />

the value <strong>of</strong> R we calculate can be made to fit the experimental<br />

value <strong>of</strong> R. In other words, it is assumed the ink<br />

dots behave as if they were larger than they really are,<br />

<strong>and</strong> an index called “optical dot gain” is defined as G o =<br />

F’ – F. Plots <strong>of</strong> G o versus F are commonly reported in the<br />

literature. The G o metric was developed by analogy with<br />

the “physical dot gain” metric, G p = F – F c , where F c is<br />

the dot area fraction comm<strong>and</strong>ed by the printing process<br />

(screen, digital signal, etc.) The G p metric actually measures<br />

the difference between the intended dot size <strong>and</strong><br />

the size <strong>of</strong> the dot that is actually formed on the paper .<br />

By using F c in Eq. 2, the empirical n parameter can still<br />

model tone <strong>and</strong> color reproduction in many halftone systems,<br />

but n values greater than 2 are <strong>of</strong>ten observed. The<br />

focus <strong>of</strong> the current work is on Yule–Nielsen effect <strong>of</strong> light<br />

scatter, <strong>and</strong> F values reported below are those measured<br />

by microdensitometry analysis <strong>of</strong> the printed images, as<br />

described perviously. 1,5<br />

Relating n to Other Scattering Metrics. Two theories<br />

commonly applied to describe the optical behavior<br />

<strong>of</strong> paper <strong>and</strong> other printing substrates are Kubelka–<br />

Munk theory 6 <strong>and</strong> Linear Systems theory . The former<br />

365


describes reflectance <strong>and</strong> transmittance properties <strong>of</strong><br />

scattering materials in terms <strong>of</strong> a scattering coefficient,<br />

S, <strong>and</strong> an absorption coefficient, K. Linear Systems<br />

theory uses a point spread function, PSF( r), that describes<br />

the probability <strong>of</strong> light emerging from a paper<br />

at distance r from the point at which it entered the paper.<br />

7,8 The PSF is <strong>of</strong>ten described in the Fourier domain<br />

as the Modulation Transfer Function, MTF(ω), where ω<br />

is spatial frequency in units <strong>of</strong> 1/ r. Intuition suggests<br />

that the Yule–Nielsen parameter, n, must be related both<br />

to the MTF <strong>of</strong> the substrate <strong>and</strong> also the S <strong>and</strong> K parameters<br />

<strong>of</strong> Kubelka–Munk theory.<br />

The MTF is <strong>of</strong>ten modeled empirically as follows.<br />

1<br />

MTF =<br />

1 + ( ⋅<br />

m<br />

k p ω)<br />

In this function, ω is spatial frequency in cy/mm <strong>and</strong><br />

k p is a constant proportional to the mean distance light<br />

scatters in paper between entering <strong>and</strong> exiting as reflected<br />

light. The m parameter is an empirical parameter<br />

used to adjust the shape <strong>of</strong> the function to fit<br />

experimental data. The value <strong>of</strong> k p is equal to 1/ω o , where<br />

ω o is the value <strong>of</strong> ω where MTF = 1/2. Thus, regardless<br />

<strong>of</strong> the value <strong>of</strong> m, k p is a definable, experimental metric<br />

for lateral scattering in the paper.<br />

The k p metric <strong>and</strong> the n metric are clearly related,<br />

but attempts to derive n quantitatively from application<br />

<strong>of</strong> linear systems theory leads only to approximations<br />

because n is really an empirical parameter used<br />

to fit an empirical model to experimental data. However,<br />

within typical limits <strong>of</strong> experimental error, it has<br />

been shown experimentally that n can be related to k p<br />

through the following expression. 10<br />

{ }<br />

(3)<br />

n ≅ 2 −exp −( A⋅k p ⋅υ )<br />

(4)<br />

The value <strong>of</strong> the constant A is dependent on the particular<br />

geometric pattern <strong>of</strong> the halftone. 10 For an AM<br />

clustered dot halftone, ν is the frequency <strong>of</strong> occurrence<br />

<strong>of</strong> halftone dots. For an FM halftone, ν is the inverse <strong>of</strong><br />

the distance, L, between the centers <strong>of</strong> adjacent dots in<br />

the halftone. Note that ν is in mm –1 for both AM <strong>and</strong> FM<br />

systems, <strong>and</strong> k p is in mm.<br />

Equation 5 has been derived by Engeldrum <strong>and</strong><br />

Pridham 11 from Kubelka–Munk theory to relate the MTF<br />

<strong>of</strong> a material to the S <strong>and</strong> K constants.<br />

⎡<br />

/<br />

j<br />

R πω<br />

MTF( ω)<br />

= ⋅ ⋅ + ⎛ −<br />

⎡<br />

− ln( − R ) j j ⎝ ⎜ ⎞ ⎤ ⎤<br />

∞ 2 2<br />

3 2<br />

1 ⎢ ∞ 2<br />

⎢ ⎟ ⎥ ⎥<br />

∑ 1<br />

2<br />

1 ⎢ ⎢ jbS⎠<br />

⎥ ⎥<br />

∞ = 1 2<br />

⎣⎢<br />

⎣ ⎦ ⎦⎥<br />

In this function a = 1 + K/S, b = (a 2 – 1) 1/2 , <strong>and</strong> R ∞ = a – b.<br />

If Eq. 5 is correct, then one need only measure K <strong>and</strong> S<br />

<strong>of</strong> the printed substrate to calculate MTF versus ω. Then<br />

the value <strong>of</strong> ω = ω o at which MTF = 1/2 should provide<br />

the value k p = 1/ω o . The value <strong>of</strong> k p can then be applied<br />

to Eq. 4 to calculate the Yule–Nielsen n factor.<br />

Equation 5 indicates that the absorption coefficient K<br />

should have a significant impact on k p , <strong>and</strong> in turn, on<br />

the Yule–Nielsen n factor. In addition, because K is<br />

strongly dependent on the wavelength <strong>of</strong> light, λ, then<br />

Eq. 5 also predicts a strong influence <strong>of</strong> k p <strong>and</strong> n on λ.<br />

However, as will be shown, the impact <strong>of</strong> K on k p is not<br />

significant, <strong>and</strong> n is not strongly dependent on λ.<br />

(5)<br />

CCD camera<br />

Illumination<br />

Microscope<br />

black video tape<br />

Crisper TM<br />

Figure 1. Microdensitometer.<br />

4.0 mm<br />

Scan<br />

Monitor<br />

Cover<br />

glass<br />

Measuring MTF<br />

A sample <strong>of</strong> a commercial plastic substrate called<br />

Crisper (Toyobo Co., Ltd.) was placed under a reflection<br />

microscope with a CCD video camera as shown in<br />

Fig. 1. The camera was attached to a frame grabber ,<br />

<strong>and</strong> digital pixel values in this system were linearly<br />

related to sample luminance. This system was used as<br />

a reflection microdensitometer, <strong>and</strong> the MTF <strong>of</strong> the instrument<br />

was measured as 0.5 at 40 cy/mm. A piece <strong>of</strong><br />

black video tape, 20 µm thick, was placed on top <strong>of</strong> the<br />

Crisper sample with the edge <strong>of</strong> the tape positioned<br />

to run through the center <strong>of</strong> the field <strong>of</strong> view <strong>of</strong> the microdensitometer.<br />

The tape was clamped in place with a<br />

microscope cover glass, <strong>and</strong> the tape edge was illuminated<br />

with two fiber optic bundles 45 degrees from the<br />

vertical on each side, <strong>and</strong> in directions collinear with<br />

the tape edge. The image <strong>of</strong> the edge was captured, as<br />

illustrated in Fig. 1, <strong>and</strong> s<strong>of</strong>tware was used to scan a<br />

section <strong>of</strong> the edge. With the edge in the vertical direction<br />

as shown, the scan was done in the horizontal direction<br />

across 4 mm <strong>of</strong> the sample. The scan was<br />

achieved by averaging pixel values in a vertical column<br />

<strong>of</strong> 100 pixels (0.8 mm) to produce an average pixel value<br />

at each horizontal pixel position in the scan. The scanned<br />

edge <strong>of</strong> the plastic substrate is shown in Fig. 2 as pixel<br />

value, P, versus position, x, in millimeters.<br />

The MTF was calculated from the edge scan by Fourier<br />

analysis. The P versus x data from Fig. 2 was differences<br />

point-to-point, dP = (P i+1 - P i ) , to calculate the<br />

derivative <strong>of</strong> the edge as shown in Fig. 3. The pixels<br />

under the tape edge could not be measured experimentally<br />

<strong>and</strong> were assumed to have the same distribution<br />

as the pixel values on the measured side <strong>of</strong> the edge.<br />

Thus, the derivative at x < 0 (under the edge) was assumed<br />

to be the same as x > 0 where the data was taken.<br />

A Fourier transform algorithm was applied to the data,<br />

<strong>and</strong> the MTF <strong>of</strong> the reference material was calculated<br />

as the modulus <strong>of</strong> the Fourier transform, normalized to<br />

1.00 at zero frequency, as shown by the data points in<br />

Fig. 4. The data was fit by Eq. 3 with m = 1.2 <strong>and</strong> k p =<br />

0.14 millimeters.<br />

Measuring the Yule–Nielsen Effect<br />

The k p <strong>of</strong> other printing substrates might be found<br />

through a similar line scan analysis. However , many<br />

printing substrates have rough surfaces <strong>and</strong> are not<br />

easily measured by this technique. The rough surface<br />

366 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney et al.


150<br />

P<br />

1<br />

MTF<br />

k p = (1/7.1) mm<br />

k p = 0.14 mm<br />

80<br />

0 X Millimeters<br />

0.3<br />

X (mm)<br />

Figure 2. Edge scan <strong>of</strong> Crisper TM as pixel value, P, versus position<br />

in millimeters. X = 0 at the edge.<br />

0<br />

0 (7.1) 10<br />

20<br />

ω, cy/mm<br />

Figure 4. Crisper TM st<strong>and</strong>ard. The dots (O) were calculated<br />

from the edge scan, <strong>and</strong> the line is Eq. 3 with k p = 0.14 mm<br />

<strong>and</strong> m = 1.2<br />

1<br />

dP<br />

R p /Rg<br />

0<br />

-0.2<br />

0 0.2<br />

X (mm)<br />

0<br />

(R p /R g ) = 0.59 at F = 1<br />

0 F<br />

1<br />

Figure 3. Derivative <strong>of</strong> edge scan in Fig. 2.<br />

Figure 5. Crisper TM R p versus F.<br />

adds significant noise to the edge scan, <strong>and</strong> many scans<br />

must be averaged to estimate the average k p <strong>of</strong> the<br />

sample. An alternative approach is to place a halftone<br />

image on the paper <strong>and</strong> measure the average Yule–<br />

Nielsen effect <strong>of</strong> the substrate <strong>and</strong> relate the effect to<br />

the value <strong>of</strong> k p . In the current work, the Yule–Nielsen<br />

effect was measured by placing a graphic arts “lith” film<br />

with a stochastic halftone wedge ( F = 0 to F = 1) in<br />

vacuum contact with the substrate, emulsion to paper.<br />

The stochastic halftone was generated by a proprietary<br />

error diffusion process <strong>and</strong> printed on a commercial<br />

image-setter. The halftone dot pattern was generated<br />

as a grid <strong>of</strong> square dots <strong>and</strong> spaces <strong>of</strong> L = 0.042 mm on<br />

each side. Figure 5 shows R p versus F measured from a<br />

histogram analysis <strong>of</strong> this halftone using microdensitometric<br />

analysis techniques described perviously. 1,5<br />

The R p versus F function for a stochastic halftone has<br />

been shown to be well modeled with Eq. 6 when R i is<br />

zero, 10 <strong>and</strong> the value <strong>of</strong> R i was zero within experimental<br />

error in the current work.<br />

[ ]<br />

B<br />

Rp<br />

/ Rg<br />

= 1−w⋅ 1−( 1 −F)<br />

(6)<br />

A power factor <strong>of</strong> B = 1.2 was found to fit measurements<br />

made with the halftone film in contact with all<br />

paper <strong>and</strong> synthetic printing substrates used in this<br />

study. The value <strong>of</strong> w is the value <strong>of</strong> (1 – R p /R g ) extrapolated<br />

to F = 1.<br />

The value <strong>of</strong> w has been shown experimentally to be<br />

related to k p by Eq. 7. 10,12<br />

or<br />

⎧−Ak<br />

⋅ p ⎫<br />

w = 1−exp ⎨ ⎬<br />

(7a)<br />

⎩ L ⎭<br />

Kubelka–Munk Theory <strong>and</strong> the Yule–Nielsen Effect on Halftones <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 367


1<br />

100<br />

K.100<br />

R<br />

50<br />

mm –1<br />

S<br />

0<br />

500 600<br />

Figure 6. Reflection spectrum <strong>of</strong> yellow plain paper at infinite<br />

thickness, R∞ (O), <strong>and</strong> over black, R b (X). Paper is 0.072<br />

mm thick.<br />

L w<br />

kp = − ⋅ln( 1 − )<br />

(7b)<br />

A<br />

The value <strong>of</strong> L = 0.042 mm for this stochastic halftone,<br />

k p = 0.14 mm <strong>and</strong> w = 0.59 for the Crisper TM reference<br />

material. Thus, the value <strong>of</strong> A = 0.267 can be calculated.<br />

The physical justification for Eq. 7 is based on the<br />

probability model <strong>of</strong> halftone optics discussed previously.<br />

8,13 For R i = 0, P a = (1 – w) where P a is defined as<br />

the fraction <strong>of</strong> light which emerges from a single square<br />

area <strong>of</strong> the paper <strong>of</strong> dimension L after entering that same<br />

area <strong>and</strong> scattering within the paper . The value <strong>of</strong> P a<br />

must be unity for a paper <strong>of</strong> zero scattering length, k p =<br />

0, with w = 0. But as the scattering length, k p , increases,<br />

P a decreases <strong>and</strong> w increases. As k p approaches infinity,<br />

w must approach unity <strong>and</strong> P a must approach zero asymptotically.<br />

Equation 7 has the required limit <strong>of</strong> w = 0<br />

at k p = 0 <strong>and</strong> w = 1 as k p ∞ <strong>and</strong> thus is a reasonable<br />

empirical model for w versus k p .<br />

The values <strong>of</strong> L = 0.042 mm <strong>and</strong> A = 0.267 were used<br />

with this halftone film to measure R p versus F for all<br />

substrates in this project. Equation 7 was applied to calculate<br />

the corresponding value <strong>of</strong> the MTF constant k p .<br />

By using 20 nm b<strong>and</strong> pass filters, k p values versus λ<br />

were measured.<br />

K <strong>and</strong> S for Yellow Plain Paper. K <strong>and</strong> S values for<br />

several papers <strong>and</strong> synthetic substrates were deter -<br />

mined by measuring the reflectance, R ∞ , <strong>of</strong> a thick stack<br />

<strong>of</strong> the substrate <strong>and</strong> then measuring R b , the reflectance<br />

<strong>of</strong> a single sheet <strong>of</strong> the substrate with a black background.<br />

The thickness <strong>of</strong> the substrate was also measured,<br />

<strong>and</strong> the values <strong>of</strong> K <strong>and</strong> S were calculated by a<br />

numerical solution <strong>of</strong> the Kubelka–Munk equations for<br />

R∞ <strong>and</strong> R b . 6 As a check <strong>of</strong> the experimental method, an<br />

integrating sphere spectrophotometer was used to measure<br />

the total transmitted light through the samples,<br />

T, <strong>and</strong> values <strong>of</strong> K <strong>and</strong> S were calculated from the<br />

Kubelia–Munk equations for R ∞ <strong>and</strong> T. The two methods<br />

gave the same K <strong>and</strong> S values within experimental<br />

error. T data lead to lower experimental error for highly<br />

absorbing samples.<br />

λ<br />

0<br />

500 600<br />

Figure 7. Values <strong>of</strong> S in mm –1 <strong>and</strong> 100 . K in mm –1 from data in<br />

Fig. 6.<br />

Figure 6 shows R ∞ <strong>and</strong> R b for a commercially manufactured<br />

sample <strong>of</strong> yellow plain paper. The corresponding<br />

values calculated for <strong>of</strong> K <strong>and</strong> S are shown in Fig. 7.<br />

Note the value <strong>of</strong> S does not change significantly , but<br />

the value <strong>of</strong> K does. Equation 5 was applied to each pair<br />

<strong>of</strong> K <strong>and</strong> S values to calculate the MTF versus ω function.<br />

The value <strong>of</strong> ω = ω o at which MTF = 0.5 was noted.<br />

Table I summarizes the values <strong>of</strong> K, S, k p , <strong>and</strong> 1/ ω o . If<br />

Eq. 5 is correct, then 1/ ω o should be a good correlate <strong>of</strong><br />

k p . However, as shown in Fig. 8, the change in K over<br />

the range <strong>of</strong> this experiment does not result in the<br />

change in k p predicted by 1/ ω o from Eq. 5.<br />

K <strong>and</strong> S for Coated Paper <strong>and</strong> Crisper TM . An experimental<br />

correlation between S <strong>and</strong> k p has previously<br />

been shown. 14 In the current work five substrates,<br />

shown in Table II, were examined at two wavelengths,<br />

500 nm <strong>and</strong> 580 nm, using 20 nm b<strong>and</strong> pass filters.<br />

Values <strong>of</strong> S, K, <strong>and</strong> k p were measured as described<br />

above, <strong>and</strong> the results are summarized in T able II.<br />

These samples show only small differences in K but<br />

significant differences in S. Figure 9 shows the relationship<br />

between k p <strong>and</strong> 1/S. For a negligible absorption<br />

coefficient, then, this data indicates Eq. 8 is an<br />

adequate model <strong>of</strong> k p versus S within experimental error,<br />

with a unitless constant <strong>of</strong> c = 10.<br />

k p = c/S (8)<br />

In order to determine the impact <strong>of</strong> higher values <strong>of</strong> K<br />

on k p , samples <strong>of</strong> the Crisper TM st<strong>and</strong>ard were dyed by<br />

boiling in a proprietary cyan dye solution. The dye was<br />

meant for use with this type <strong>of</strong> sample <strong>and</strong> produced<br />

darker cyan color as a function <strong>of</strong> boiling time. Samples<br />

λ<br />

TABLE I. Spectral Data on Yellow Plain Paper<br />

k p<br />

, in mm, measured 1/ω o<br />

, in mm,<br />

λ, nm S in mm –1 K in mm –1 from R p<br />

versus F from Eq. 5<br />

480 43 2.66 0.23 0.22<br />

500 45 0.89 0.24 0.32<br />

540 45 0.38 0.23 0.44<br />

568 45 0.23 0.28 0.53<br />

580 45 0.20 0.24 0.56<br />

600 44 0.17 0.26 0.60<br />

640 43 0.26 0.29 0.61<br />

368 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney et al.


k p <strong>and</strong> (1/ω o ), in mm<br />

0.5<br />

0<br />

1/ω o<br />

k p<br />

500 600<br />

Discussion<br />

Figure 11 does not indicate any significant impact <strong>of</strong><br />

the Kubelka–Munk absorption coefficient K on the Yule–<br />

Nielsen effect, represented by the k p metric. Intuition<br />

might suggest that a high value <strong>of</strong> K would decrease<br />

the average distance that light scatters before emergλ,<br />

nm<br />

Figure 8. k p <strong>and</strong> 1/ω ο versus wavelength.<br />

TABLE II. Scattering Properties <strong>of</strong> Different Substrates<br />

<strong>Material</strong> λ, nm S, mm –1 K, mm –1 kp, mm<br />

coated paper 500 39.8 0.51 0.21<br />

coated paper 580 36.5 0.70 0.27<br />

Crisper TM 500 85.7 0.26 0.13<br />

Crisper TM 580 77.8 0.17 0.19<br />

HS plastic 500 143.0 0.23 0.10<br />

HS plastic 580 130.0 0.20 0.12<br />

LS plastic 500 23.6 0.05 0.37<br />

LS plastic 580 22.8 0.05 0.41<br />

plain paper 500 45 0.89 0.24<br />

plain paper 580 45 0.20 0.24<br />

1<br />

0.04<br />

1/S, mm<br />

0.02<br />

0<br />

0 0.2 0.4<br />

k p , mm<br />

Figure 9. 1/S versus k p from Table II.<br />

R ×<br />

Figure 10. Spectra <strong>of</strong> coated paper at three dye levels.<br />

16<br />

0<br />

450 λ, nm 650<br />

<strong>of</strong> the coated paper were also dyed by soaking in an aqueous<br />

solution <strong>of</strong> a proprietary cyan ink jet dye. Again,<br />

dying time governed the darkness <strong>of</strong> the color . Figure<br />

10 illustrates the reflection spectra for the coated paper<br />

samples.<br />

Both the dyed <strong>and</strong> not dyed samples <strong>of</strong> both substrates<br />

were analyzed for K <strong>and</strong> S values as before. S was found<br />

not to change, but K increased with the dying time, as<br />

expected. Measurements <strong>of</strong> k p were made at 500 nm<br />

where R ∞ <strong>and</strong> K changed only slightly, <strong>and</strong> at 580 nm<br />

where a significant changes in R ∞ <strong>and</strong> K were observed.<br />

The results are summarized in T able III. Figure 1 1<br />

shows the K as a function <strong>of</strong> k p .<br />

K, mm -1<br />

0<br />

500 nm<br />

580 nm<br />

0 0.3<br />

k p , mm<br />

Figure 11. Dye concentration series, K versus k p for: Coated<br />

paper at 500 nm (O); Coated paper at 580 nm (●); <strong>and</strong> Crisper TM<br />

at both at 500 <strong>and</strong> 580 nm, (X).<br />

Kubelka–Munk Theory <strong>and</strong> the Yule–Nielsen Effect on Halftones <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 369


TABLE III. The Effect <strong>of</strong> Cyan Dye on the Properties <strong>of</strong> Substrates<br />

Paper/dye K in mm at 500 nm k p in mm at 500 nm R ∞ at 500 nm K in mm at 580 nm k p in mm at 580 nm R∞ at 580 nm<br />

P.Paper_0 0.51 0.21 0.830 0.70 0.27 0.823<br />

P.Paper_1 0.56 0.20 0.853 1.41 0.27 0.744<br />

P.Paper_2 0.65 0.19 0.842 3.80 0.25 0.574<br />

P.Paper_3 0.16 0.20 0.736 15.10 0.21 0.278<br />

Crisper_0 0.26 0.13 0.925 0.17 0.19 0.935<br />

Crisper_1 0.95 0.14 0.854 3.25 0.18 0.704<br />

Crisper_2 1.39 0.16 0.834 6.93 0.19 0.600<br />

1.5<br />

1<br />

K -1 , mm<br />

R ×<br />

0 0 0.3<br />

k p , mm<br />

Figure 12. Coated Paper at 580 nm.<br />

0<br />

1 2<br />

Figure 13. Coated paper <strong>and</strong> Crisper TM at both at 580 nm.<br />

Calculated from the data shown in Fig. 11 with A = 0.267 <strong>and</strong><br />

a dot size <strong>of</strong> 80 µm.<br />

n<br />

ing from the paper substrate. Thus, one might expect a<br />

decrease in k p as K increases. The only data that might<br />

suggest such behavior is the dyed coated paper at 580 nm<br />

in Fig. 11. This data was re-plotted as K –1 versus k p as<br />

shown in Fig. 12, <strong>and</strong> there is no convincing evidence for<br />

the kind <strong>of</strong> linear trend observed between k p <strong>and</strong> S –1 .<br />

It is not possible to reach the conclusion that K has<br />

no impact on the Yule–Nielsen effect. However, it is possible<br />

to reach practical conclusions. Figure 13 shows the<br />

values <strong>of</strong> R ∞ versus n for the dyed samples at 580 nm,<br />

where n is calculated from the k p values in Table III by<br />

using Eq. 4. Over this range <strong>of</strong> R ∞ there is no evidence<br />

<strong>of</strong> a correlation <strong>of</strong> any kind between K <strong>and</strong> k p or n. Therefore,<br />

if K has an effect on k p it is not <strong>of</strong> sufficient magnitude<br />

to be <strong>of</strong> any practical significance. Thus, Eq. 7<br />

rather than Eq. 5, coupled with Eq. 4, provides a useful<br />

connection between Kubelka –Munk theory <strong>and</strong> the<br />

Yule–Nielsen effect.<br />

A final caution about experimental accuracy in this<br />

work is in order. The measured values <strong>of</strong> k p are internally<br />

consistent <strong>and</strong> are based on the same experimental<br />

technique. The experimental precision is indicated<br />

by the scatter in the data. However , the experimental<br />

accuracy is based on a single Fourier analysis <strong>of</strong> an edge<br />

scan <strong>of</strong> a reference material. Thus, while the trends <strong>and</strong><br />

functional relationships are well represented, the calibration<br />

constants A <strong>and</strong> c may or may not be accurate.<br />

Moreover, the particular value <strong>of</strong> A may depend on the<br />

particular geometry <strong>of</strong> the halftone one uses. While it is<br />

easy to compare relative values <strong>of</strong> k p , absolute values<br />

are much more difficult to measure with confidence.<br />

Acknowledgment. Special thanks to our lab colleagues,<br />

A. Tsujita <strong>and</strong> S. Yamaguchi for stimulating<br />

discussions <strong>and</strong> challenging arguments.<br />

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paper spread function measurements, Proc. TAGA, 339 (1995).<br />

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14. J. S. Arney, C. D. Arney, M. Katsube, <strong>and</strong> P. G. Engeldrum, An MTF<br />

Analysis <strong>of</strong> Papers, J. Imag. Sci. Technol. 40, 19 (1996).<br />

370 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Arney et al.


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

The Free Radicals <strong>and</strong> Iron <strong>of</strong> Photographic Gelatin Doped with Na 2<br />

S 2<br />

O 3<br />

*<br />

Yi-Heng Zhang,* Ji Tan , Jie Li, Tian-Tang Yan, Shu-qin Yu †<br />

* Department <strong>of</strong> Applied Chemistry, University <strong>of</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> <strong>of</strong> China, Hefei, Anhui Province, Peoples Republic <strong>of</strong> China<br />

†<br />

Department <strong>of</strong> Chemical Physics, University <strong>of</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> <strong>of</strong> China, Hefei, Anhui Province, Peoples Republic <strong>of</strong> China<br />

Si-Yong Zhuang<br />

Research Institute <strong>of</strong> Fine Chemicals, East China University <strong>of</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>, Shanghai, Peoples Republic <strong>of</strong> China<br />

Bi-Xian Peng<br />

Institute <strong>of</strong> Photographic Chemistry, Academia Sinica, Beijing, Peoples Republic <strong>of</strong> China<br />

Five kinds <strong>of</strong> gelatins were investigated, <strong>and</strong> varying amount <strong>of</strong> sodium thiosulfate was added to study the effect <strong>of</strong> Na 2 S 2 O 3 on<br />

photographic gelatin. The ubiquinone <strong>and</strong> RS• radicals were detected <strong>and</strong> the change <strong>of</strong> their concentrations in photographic<br />

gelatins were studied by electron spin resonance (ESR). The concentration <strong>of</strong> ubiquinone, which was dependent on the equilibrium<br />

among the hydroubiquinone, ubiquinone radical <strong>and</strong> ubiquinone compounds, increased to a maximum value <strong>and</strong> then<br />

decreased with the increasing amount <strong>of</strong> sodium thiosulfate. The study <strong>of</strong> the chemical state <strong>of</strong> iron in gelatin with varying<br />

amounts <strong>of</strong> sodium thiosulfate by x-ray photoelectron spectroscopy (XPS) showed that the state <strong>of</strong> iron in gelatin was not affect ed<br />

by adding sodium thiosulfate.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 371–374 (1999)<br />

Introduction<br />

Although many people have tried to substitute synthetic<br />

materials for photographic gelatin, gelatin is still a basic<br />

material in preparing photographic emulsions. Gelatin<br />

affects almost every step <strong>of</strong> the photographic process.<br />

Sodium thiosulfate is one <strong>of</strong> the most commonly used<br />

sensitizer. 1 The sensitization mechanism owing to the<br />

interaction between sodium thiosulfate <strong>and</strong> silver halide<br />

grains has been widely reported. The main function<br />

<strong>of</strong> sodium thiosulfate in the sensitization is that it<br />

reacts with silver halide, forming sensitization centers<br />

on the surface <strong>of</strong> silver halide grains. 2,3,4 However, few<br />

studies <strong>of</strong> the interaction between sodium thiosulfate<br />

<strong>and</strong> gelatin have been disclosed so far. It is well known<br />

that during the production <strong>of</strong> gelatin in industry , foreign<br />

iron may be unaviodably introduced into gelatin<br />

by the raw materials, accessory materials <strong>and</strong> equipment.<br />

The foreign iron, which complexes with gelatin,<br />

has strong desensitization effect on the photographic<br />

emulsion. 5 During the sulfur sensitization, the change<br />

Original manuscript received July 7, 1998<br />

* This project was financially supported by National Nature <strong>Science</strong><br />

Foundation <strong>of</strong> China (29876038)<br />

† To whom correspondence should be addressed<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

<strong>of</strong> the chemical state <strong>of</strong> foreign iron, which acts as a<br />

deep electron trap, is a subject that interests many photographic<br />

scientists. In this paper , the composition <strong>of</strong><br />

active free radicals <strong>and</strong> their changes in gelatin before<br />

<strong>and</strong> after the addition <strong>of</strong> sodium thiosulfate were studied<br />

by electron spin resonance (ESR) technique <strong>and</strong> the<br />

effect <strong>of</strong> the amount <strong>of</strong> sodium thiosulfate on foreign<br />

iron in gelatin was studied by x-ray photoelectron spectrometry<br />

(XPS). The study <strong>of</strong> the interaction between<br />

thiosulfate <strong>and</strong> photographic gelatin undoubtedly will<br />

give new experimental evidences to the mechanism <strong>of</strong><br />

the sulfur sensitization.<br />

Experimental<br />

The Preparation <strong>of</strong> Samples for ESR <strong>and</strong> XPS Measurement.<br />

Five kinds <strong>of</strong> photographic gelatins, A:<br />

Baotou gelatin 600 # (Baotou, China), B: Kaiping gelatin<br />

(Kaiping, China), C: Rousselot gelatin N51811 (France),<br />

D: Japanese gelatin NCH 1-3, <strong>and</strong> E: Japanese gelatin<br />

2104 were used. Samples A, B, C <strong>and</strong> D are limed processing<br />

gelatin, <strong>and</strong> E is from IAG. The gelatins <strong>of</strong> each<br />

kind were soaked in water at room temperature for 30<br />

min., then heated to 50 ° C <strong>and</strong> dissolved. After varying<br />

amounts <strong>of</strong> an aqueous solution <strong>of</strong> sodium thiosulfate<br />

was added (see Table I), the gelatin solutions were coated<br />

onto film bases. After drying at room temperature, thin<br />

film samples were obtained which were used directly<br />

for XPS measurement. For ESR measurement the gelatin<br />

films were separated from the film bases <strong>and</strong> ground<br />

to powder.<br />

371


TABLE I. Series Numbers <strong>and</strong> Amounts <strong>of</strong> Added Sodium<br />

Thiosulfate<br />

The amount <strong>of</strong> Na 2 S 2 O 3 Five kinds <strong>of</strong> gelatins<br />

mg/ g gelatin A B C D E<br />

0 A-a B-a C-a D-a E-a<br />

2.44 A-b B-b C-b D-b E-b<br />

14.80 A-c B-c C-c D-c E-c<br />

27.10 A-d B-d C-d D-d E-d<br />

39.50 A-e B-e C-e D-e E-e<br />

49.30 A-f B-f C- f D-f E-f<br />

ESR Measurement. The ESR measurement <strong>of</strong> the<br />

sample powder was carried out in an electron spin resonance<br />

spectrometer, Varian E115 (Varian Co. U. S. A.)<br />

at room temperature. The ESR spectrometer worked at<br />

X b<strong>and</strong> <strong>and</strong> the magnetic modulation was 100 kHz. The<br />

first order derivative ESR spectra were recorded at room<br />

temperature. DPPH (diphenyl-picryl-hydrazyl, g =<br />

2.0036) <strong>and</strong> the distance between the third peak <strong>and</strong><br />

the fourth peak <strong>of</strong> the ESR spectrum <strong>of</strong> ZnS • Mn 2+ (6.81<br />

mT) were used as the st<strong>and</strong>ards to determine the parameters<br />

<strong>of</strong> ESR spectra <strong>of</strong> the samples. The L<strong>and</strong>é g-<br />

factor is determined by the equation:<br />

Figure 1. The ESR spectra <strong>of</strong> gelatin A with varying amount<br />

<strong>of</strong> Na 2 S 2 O 3. a: to f: the amounts <strong>of</strong> Na 2 S 2 O 3 are 0, 2.44, 14.8,<br />

27.1, 39.5, 49.3 mg/g gelatin, respectively.<br />

⎡ HR<br />

− HS<br />

⎤<br />

gS<br />

= gR⎢1<br />

+ ⎥<br />

⎣ HS<br />

⎦<br />

where:<br />

S — the samples measured,<br />

R — the st<strong>and</strong>ard samples,<br />

H — the intensities <strong>of</strong> the resonance magnetic<br />

field <strong>of</strong> the corresponding samples.<br />

The spin signals <strong>of</strong> gelatins A <strong>and</strong> D were quantitatively<br />

analyzed by weighing samples <strong>and</strong> integrating the<br />

areas under the ESR spectral curves. DPPH 9.7 × 10 15<br />

spin/g was taken as the st<strong>and</strong>ard to determine the spin<br />

concentrations <strong>of</strong> the corresponding free radicals.<br />

XPS Measurement. ESCA analysis was carried out<br />

with a multi-function X-ray photoelectron spectrometer,<br />

Model ESCALAB MK II (VG Co. Engl<strong>and</strong>). The pressure<br />

in the ultrahigh vacuum chamber <strong>of</strong> the spectrometer<br />

was lower than 5 × 10 –7 Pa. Mg Ka radiation with<br />

photon energy hν = 1253.6 eV was used as a radiation<br />

source. The power <strong>of</strong> the X-ray target was 320 W <strong>and</strong><br />

the pass energy was 30 eV . Carbon deposited on the<br />

sample surface which exhibits the sharp peak <strong>of</strong> C1s at<br />

284.6 ± 0.1 eV was used as the st<strong>and</strong>ard <strong>of</strong> binding energy.<br />

The characteristic peak <strong>of</strong> Fe(2p 3/2 ) was used in<br />

the analysis. Because the iron content was very low in<br />

the gelatins, the XPS signal <strong>of</strong> iron was accumulated<br />

several times.<br />

Results <strong>and</strong> Discussion<br />

The Effect <strong>of</strong> Na 2 S 2 O 3 on the Photographic Gelatin.<br />

The ESR spectra <strong>of</strong> all five series <strong>of</strong> gelatin samples<br />

are shown in Figs. 1 through 5. The figures show that<br />

the five gelatin samples in which no Na 2 S 2 O 3 was added<br />

can exhibit free radical signals at g = 2.004 <strong>and</strong>, except<br />

D, all other four series <strong>of</strong> gelatins in which varying amount<br />

<strong>of</strong> Na 2 S 2 O 3 was added show the same signals. Zweier <strong>and</strong><br />

co-workers <strong>and</strong> Zhao <strong>and</strong> co-workers 6,7,8,9 thought that<br />

in the biological system the free radicals that could exist<br />

at room temperature <strong>and</strong> could give ESR signals at<br />

Figure 2. The ESR spectra <strong>of</strong> gelatin B with varying amount<br />

<strong>of</strong> Na 2 S 2 O 3. a: to f: the amounts <strong>of</strong> Na 2 S 2 O 3 are 0, 2.44, 14.8,<br />

27.1, 39.5, 49.3 mg/g gelatin, respectively.<br />

g = 2.004 were ubiquinone or ubiquinone-like free radicals,<br />

whose structure can be expressed below:<br />

R<br />

R<br />

O.<br />

OH<br />

CH 3<br />

CH 3<br />

-<br />

n =5 – 10<br />

-<br />

CH 2 CH C CH 2 H<br />

-<br />

-n<br />

This class <strong>of</strong> free radicals acts mainly as electron or<br />

hydrogen carriers in redox reaction in the biological<br />

system. 7,8 Gelatin is a mixture made up from various<br />

biological materials, so that the signal at g = 2.004 obtained<br />

in this study must be contributed by ubiquinone<br />

or ubiquinone-like radicals.<br />

372 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Zhang et al.


TABLE II. Effect <strong>of</strong> the Amount <strong>of</strong> Na 2 S 2 O 3 on the Spin<br />

Concentration <strong>of</strong> a Radical with g = 2.004 in Gelatin<br />

The spin concentration (× 10 16 spin/g)<br />

The gelatin series A B C D E<br />

0 0.7 0.2 0.4 0.4 0.5<br />

The amount <strong>of</strong> 2.4 2.9 1.9 1.5 / 0.8<br />

Na 2 S 2 O 3 14.8 2.6 1.6 2.1 / 0.8<br />

(mg/g gelatin) 27.1 2.3 1.6 2.4 / 1.6<br />

39.5 1.3 1.1 2.1 / 1.8<br />

49.3 1.1 0.5 0.8 / 1.5<br />

TABLE III. Effect <strong>of</strong> the Amount <strong>of</strong> Na 2 S 2 O 3 on the Binding<br />

Energy <strong>of</strong> Iron in Gelatin<br />

The amount <strong>of</strong> Na 2 S 2 O 3 The binding energy<br />

Gelatin (mg/g gelatin) <strong>of</strong> Fe (2p 3/2 , eV)<br />

0 707.3<br />

A 27.1 707.6<br />

49.3 707.4<br />

0 706.8<br />

D 27.1 707.5<br />

49.3 707.6<br />

Figure 3. The ESR spectra <strong>of</strong> gelatin C with varying amount<br />

<strong>of</strong> Na 2 S 2 O 3. a: to f: the amounts <strong>of</strong> Na 2 S 2 O 3 are 0, 2.44, 14.8,<br />

27.1, 39.5, 49.3 mg/g gelatin, respectively.<br />

Figure 5. The ESR spectra <strong>of</strong> gelatin E with varying amount<br />

<strong>of</strong> Na 2 S 2 O 3. a: to f: the amounts <strong>of</strong> Na 2 S 2 O 3 are 0, 2.44, 14.8,<br />

27.1, 39.5, 49.3 mg/g gelatin, respectively.<br />

Figure 4. The ESR spectra <strong>of</strong> gelatin D with varying amount<br />

<strong>of</strong> Na 2 S 2 O 3. a: to f: the amounts <strong>of</strong> Na 2 S 2 O 3 are 0, 2.44, 14.8,<br />

27.1, 39.5, 49.3 mg/g gelatin, respectively.<br />

In addition, samples A-a, B-a <strong>and</strong> E-a give ESR signals<br />

at g 1 = 2.246 <strong>and</strong> g 2 = 1.934, that gradually disappear<br />

with increase <strong>of</strong> the amount <strong>of</strong> Na 2 S 2 O 3 . Sample<br />

C-a did not exhibit ESR signals at g 1 = 2.246 <strong>and</strong> g 2 =<br />

1.934, but these signals appear <strong>and</strong> their intensities<br />

increase with increase <strong>of</strong> the amount <strong>of</strong> Na 2 S 2 O 3 . It was<br />

reported that the signals at g 1 = 2.246 <strong>and</strong> g 2 = 1.934<br />

corresponded to g // <strong>and</strong> g ⊥ <strong>of</strong> RS • radicals, respectively. 10,11<br />

We presume the RS • radicals come from the low level <strong>of</strong><br />

cysteine/cystine present in gelatins.<br />

The ESR spectra <strong>of</strong> gelatin D are quite different from<br />

the others. Among six samples <strong>of</strong> gelatin D only the<br />

sample without addition <strong>of</strong> Na 2 S 2 O 3 (D-a) exhibits an ESR<br />

signal at g = 2.004 This result indicates that there are<br />

relatively few active groups in Roussalot gelatin that may<br />

be considered as an inert gelatin with high purity.<br />

It is well known that a free radical has high reactivity,<br />

so the free radicals in gelatin can certainly be expected<br />

to influence the photographic properties <strong>of</strong> an<br />

emulsion, in which gelatin is a principal component.<br />

Figures 1 through 5 show that the kinds <strong>and</strong> contents<br />

<strong>of</strong> radicals are obviously different in five gelatins. This<br />

is possible because the raw materials <strong>and</strong> the technologies<br />

<strong>of</strong> the production <strong>of</strong> gelatin are different for different<br />

gelatins.<br />

Because the ESR spectra <strong>of</strong> almost all gelatin<br />

samples exhibit the signal <strong>of</strong> the ubiquinone radical,<br />

the spin concentrations <strong>of</strong> five series <strong>of</strong> gelatin samples<br />

were quantitatively determined by using DPPH 9.7 ×<br />

10 15 spin/g as the st<strong>and</strong>ard. The results are listed in<br />

Table II.<br />

Table II indicates that for gelatins A, B, C <strong>and</strong> E,<br />

the spin concentrations <strong>of</strong> the ubiquinone radical (g =<br />

2.004) change when Na 2 S 2 O 3 is added. The spin concentration<br />

<strong>of</strong> the ubiquinone radical increases first to<br />

a maximum value <strong>and</strong> then decreases with the increasing<br />

amount <strong>of</strong> Na 2 S 2 O 3 . The amounts <strong>of</strong> Na 2 S 2 O 3 that<br />

The Free Radicals <strong>and</strong> Iron <strong>of</strong> Photographic Gelatin Doped with Na 2 S 2 O 3 * <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 373


correspond to the maximum spin concentration are different<br />

for different gelatins. The effect <strong>of</strong> the amount<br />

<strong>of</strong> Na 2 S 2 O 3 on the spin concentration may be interpreted<br />

by the following.<br />

In the gelatin system there are two reversible successive<br />

reactions, shown in Eqs. 1 <strong>and</strong> 2:<br />

R<br />

R<br />

R<br />

R<br />

R<br />

R<br />

R<br />

R<br />

O<br />

O<br />

OH<br />

OH<br />

O.<br />

OH<br />

O.<br />

OH<br />

CH 3<br />

CH 3<br />

-<br />

-<br />

CH 2 CH C CH 2 H<br />

-<br />

-n<br />

CH 3<br />

CH 3<br />

-<br />

-<br />

CH 2 CH C CH 2 H<br />

-<br />

-n<br />

+ H + + e<br />

(1)<br />

CH 3<br />

CH 3<br />

-<br />

-<br />

CH 2 CH C CH 2 H<br />

-<br />

-n<br />

(2)<br />

CH 3<br />

CH 3<br />

-<br />

-<br />

CH 2 CH C CH 2 H<br />

-<br />

-n<br />

+ H + + e<br />

Because Na 2 S 2 O 3 is a reducing agent, it can provide<br />

electrons. When Na 2 S 2 O 3 is added the equilibria <strong>of</strong> both,<br />

reactions 1 <strong>and</strong> 2 shift to the left. The change <strong>of</strong> the<br />

concentration <strong>of</strong> the ubiquinone radical has two contributions:<br />

it is formed by the reverse <strong>of</strong> reaction 2, but is<br />

depleted by the reverse <strong>of</strong> reaction 1. Therefore, as<br />

Na 2 S 2 O 3 is constantly added the concentration <strong>of</strong> the<br />

ubiquinone radical rises first, <strong>and</strong> then drops. The<br />

change <strong>of</strong> the concentration <strong>of</strong> the RS • free radical <strong>and</strong><br />

the equilibrium relationship have yet to be studied.<br />

The Effect <strong>of</strong> Na 2 S 2 O 3 on the Chemical State <strong>of</strong> Iron.<br />

To study the effect <strong>of</strong> Na 2 S 2 O 3 on the chemical state <strong>of</strong><br />

iron, the XPS spectra <strong>of</strong> gelatins A <strong>and</strong> D with varying<br />

amount <strong>of</strong> Na 2 S 2 O 3 were measured. The binding energy<br />

values <strong>of</strong> iron are shown in Table III.<br />

The iron binding energy values for both gelatins without<br />

adding Na 2 S 2 O 3 are 707.3 eV <strong>and</strong> 706.8 eV, respectively.<br />

In comparison with the binding energy <strong>of</strong> typical<br />

ferric ions, e.g. 711.4 eV for FeCl 3<br />

12<br />

, notable chemical<br />

shifts to lower value occur. The shift values are 4.1 eV<br />

to 4.6 eV, indicating that in both gelatins the concentration<br />

<strong>of</strong> outmost shell electron cloud <strong>of</strong> iron is higher<br />

than that <strong>of</strong> FeCl 3 <strong>and</strong> the iron in the gelatin is not in<br />

the trivalent state, but in a complex state with lower<br />

valence, bivalence, univalence or zero valence. 9 Table<br />

III also indicates that the addition <strong>of</strong> Na 2 S 2 O 3 has no<br />

effect on the iron state in gelatin.<br />

Conclusion<br />

Five kinds <strong>of</strong> gelatins with varying amount <strong>of</strong> Na 2 S 2 O 3<br />

were studied by ESR technique. The ubiquinone radical<br />

<strong>and</strong> RS • radical were detected in these gelatins. The<br />

kinds <strong>and</strong> concentrations <strong>of</strong> the free radicals are closely<br />

related to both Na 2 S 2 O 3 amount <strong>and</strong> the kind <strong>of</strong> the gelatin.<br />

The concentration <strong>of</strong> ubiquinone is dependent on<br />

the equilibrium among the hydroubiquinone, ubiquinone<br />

<strong>and</strong> ubiquinone compound. The addition <strong>of</strong> Na 2 S 2 O 3 has<br />

no effect on the state <strong>of</strong> iron in gelatin.<br />

References<br />

1. T. H. James, The Theory <strong>of</strong> Photographic Process, 4th ed., New York,<br />

Macmillan Publishing Co., 1977.<br />

2. J. W. Mitchell, Photogr. Sci. Eng. 22, 49 (1972).<br />

3. J. W. Mitchell, Photogr. Sci. Eng. 29, 1 (1979).<br />

4. E. Moisar, J. Photogr. Sci. 16, 102 (1968).<br />

5. R. Wang <strong>and</strong> B. Peng, Photogr. Sci. Photochem. (Chinese) 7, 35<br />

(1988).<br />

6. J. L. Zweier, P. Kuppusamy <strong>and</strong> R. Williams, J. Biological Chem.<br />

264(32), 18890 (1989).<br />

7. B. Zhao, W. Xi <strong>and</strong> Y. Chen, J. Biological Phys. (Chinese) 10(1), 170<br />

(1994).<br />

8. J. Xu, G. Liu <strong>and</strong> R. Zhen, J. Spectroscopy (Chinese) 12(6), 635<br />

(1995).<br />

9. Y.-H. Zhang, J. Li, T-T. Yan, S.-Q. Yu, S.-Y. Zhuang, <strong>and</strong> B.-X. Peng,<br />

<strong>Imaging</strong> Sci. J. 46(4), 25 (1998).<br />

10. L. D. Kisprt <strong>and</strong> L. A. Files, J. Chem. Phys. 78, 4858 (1983).<br />

11. T. P. Nguyen, M. Giffard <strong>and</strong> P. Molinie, J. Chem. Phys. 100(11), 8340<br />

(1994).<br />

12. C. D. Wagner, H<strong>and</strong>book <strong>of</strong> X-ray Photoelectron Spectroscopy, Minnesota,<br />

Perkin-Elmer Co., 1979.<br />

374 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Zhang et al.


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Calculated Properties <strong>of</strong> Sulfur Centers on AgCl Cubic Surfaces<br />

Roger C. Baetzold<br />

<strong>Imaging</strong> Research <strong>and</strong> Advanced Development, Eastman Kodak Company, Rochester, New York<br />

Calculations <strong>of</strong> various sulfur-containing centers adsorbed to sites on the AgCl surface are presented. A density functional method<br />

followed by a classical lattice ion relaxation is employed in this work. Several different centers such as Ag 4 S 2 have energy levels<br />

positioned to trap holes, while Ag 3 S + <strong>and</strong> Ag 5 S 2<br />

+<br />

have levels positioned to trap electrons. It is found that a sulfide ion at a kink site<br />

that is compensated by interstitial silver ion undergoes relaxation in the presence <strong>of</strong> an electron leading to a trap depth <strong>of</strong><br />

several tenths <strong>of</strong> an electronvolt. It appears that this may be an important step in chemical sensitization. These results are<br />

consistent with stepwise addition <strong>of</strong> electrons <strong>and</strong> silver ions resulting in latent image formation.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 375–381 (1999)<br />

Introduction<br />

While the importance <strong>of</strong> S sensitization <strong>of</strong> silver halide<br />

emulsion grains is well established, 1 the microscopic description<br />

<strong>of</strong> the structure, composition <strong>and</strong> function <strong>of</strong><br />

the active centers is still being elaborated. In Hamilton’ s<br />

analysis 2 <strong>of</strong> latent image formation, the improved efficiency<br />

<strong>of</strong> the photographic response is attributed to an<br />

increase in efficiency <strong>of</strong> the nucleation step whereby a<br />

stable two-electron center is formed. In this model it is<br />

thought that small sensitizing aggregates <strong>of</strong> Ag 2 S provide<br />

electron trapping levels adjacent to surface-positive<br />

kink sites, that enhance the probability <strong>of</strong> electron<br />

trapping leading to latent image. A further analysis 3 <strong>of</strong><br />

electron coupling to the silver halide surface sites led<br />

to a concept whereby electron trapping at a silver atom<br />

is promoted by the chemical sensitization center . This<br />

is due to an electron-trapping level roughly 0.2–0.3 eV<br />

below the conduction b<strong>and</strong> that is associated with the<br />

sensitization center. This allows for a more efficient initial<br />

trapping into a shallow level followed by de-excitation<br />

into a deeper level at the silver center.<br />

Different viewpoints about the role <strong>and</strong> energy levels<br />

<strong>of</strong> silver sulfide in sulfur sensitization have been expressed.<br />

Several experiments have been cited 4 that are<br />

consistent with an electron trapping role <strong>of</strong> the sulfide<br />

centers. For example, thermally stimulated current<br />

spectra measured 5 on emulsion grains have given an<br />

electron trap depth <strong>of</strong> 0.39 eV at sulfur centers. Experimental<br />

electron lifetime <strong>and</strong> ionic conductivity data 6<br />

were analyzed for cubic AgBr emulsions to give a 0.31<br />

eV electron trap depth for S sensitized grains. The temperature<br />

dependence <strong>of</strong> the efficiency <strong>of</strong> red light sensitivity<br />

<strong>of</strong> S sensitized emulsions was measured to be 0.33<br />

Original manuscript received November 9, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

eV 4 , which was interpreted to represent the electron trap<br />

depth. Later experiments by Zhang <strong>and</strong> Hailstone, 7 however,<br />

led to an interpretation that the technique measures<br />

the activation energy for hole release from the<br />

excited center rather than electron release. Overall,<br />

however, there seems to be agreement as to the electron<br />

trapping role <strong>of</strong> the S sensitization centers.<br />

Tani 8 has characterized S sensitization centers on<br />

AgBr emulsion grains through photoconductivity, sensitometry<br />

<strong>and</strong> a variety <strong>of</strong> physical measurements. The<br />

results were interpreted in terms <strong>of</strong> hole trapping at<br />

monomers <strong>of</strong> Ag 2 S <strong>and</strong> electron trapping at (Ag 2 S) 2 centers<br />

in the AgBr solid solution. The Ag 2 S cluster was<br />

thought be a fog center if located on the AgBr grain surface.<br />

Attention was drawn to the role <strong>of</strong> dimeric chalcogenides<br />

as hole trapping centers in silver halide in the<br />

review by Spoonhower <strong>and</strong> Marchetti. 9 Keevert <strong>and</strong><br />

Gokhale 10 have presented evidence that the sensitizing<br />

center consists <strong>of</strong> dimers <strong>of</strong> Ag 2 S. Kanzaki <strong>and</strong><br />

Tadakuma 11 has also presented physical evidence for two<br />

S atoms as involved in the sensitization center . An interesting<br />

physical model is presented that seems to focus<br />

on attraction <strong>of</strong> interstitial silver ions to the S<br />

centers. The interstitial silver ion is known to be a shallow<br />

electron trap, <strong>and</strong> it is argued that two S centers<br />

can attract two Ag + interstitial ions <strong>and</strong> form a deeper<br />

electron trap. The deep trapped state is postulated to<br />

result from the displacement <strong>of</strong> interstitial silver ions<br />

near the sensitization center.<br />

The purpose <strong>of</strong> this report is to investigate some <strong>of</strong><br />

the concepts discussed above in terms <strong>of</strong> the electronic<br />

properties <strong>of</strong> S centers on <strong>and</strong> in the silver chloride surface.<br />

We hope to identify the positions <strong>of</strong> energy levels<br />

which could be involved in electron or hole trapping.<br />

Then it should be possible to construct a geometric model<br />

for the sensitization center <strong>and</strong> evaluate whether latent<br />

image formation is possible at such a site according<br />

to the nucleation <strong>and</strong> growth mechanism.<br />

<strong>Additional</strong>ly, we hope to underst<strong>and</strong> to what degree the<br />

properties <strong>of</strong> S centers in, as compared to on, the silver<br />

375


Figure 1. Sketch <strong>of</strong> the models used in this calculation. (a)<br />

Hemispherical point-charge array showing placement <strong>of</strong> the<br />

cluster. (b) Ag 5 Cl 4 cluster used for (100) surface. (c) Ag 4 Cl 4 cluster<br />

used for positive kink. (d) Ag 4 Cl 3 S cluster used for single<br />

kink.<br />

halide surface may differ . In Part II we describe the<br />

methods <strong>of</strong> calculation used in this work. The results<br />

for free <strong>and</strong> adsorbed S centers are given in Part III.<br />

The results are discussed in Part IV where we evaluate<br />

the likely geometric structure <strong>of</strong> the S sensitization center.<br />

Conclusions are given in Part V. We begin our studies<br />

on the (100) AgCl surface because <strong>of</strong> its<br />

computational ease compared to AgBr. Future work will<br />

concentrate on the AgBr surfaces.<br />

Method<br />

These calculations have been performed quantum mechanically<br />

with the local density method using the BLYP<br />

functional, which has worked well for studies <strong>of</strong> silver<br />

clusters. 12 The overall model consists <strong>of</strong> an array <strong>of</strong> point<br />

charges to which a cluster unit treated quantum mechanically<br />

is attached. The point-charge array contains<br />

roughly 1200 unit charges placed at silver <strong>and</strong> halide<br />

sites, has a hemispherical shape. The flat surface <strong>of</strong> this<br />

array has the (100) surface. Studies on the (100) sur -<br />

face are carried out by embedding a planar Ag 5 Cl 4 unit<br />

into the surface <strong>and</strong> treating the entire unit quantum<br />

mechanically. The entire unit has 0 charge in the ground<br />

state. Sketches <strong>of</strong> these pieces are shown in Fig. 1. A<br />

kink site is modeled by adding a partial layer <strong>of</strong> point<br />

charges to the flat surface <strong>and</strong> embedding a Ag 4 Cl 4 unit,<br />

sketched in Fig. 1(c). Kink sites containing one S ion<br />

are treated in much the same way as shown in Fig. 1(d).<br />

We employ a Ag 4 Cl 3 S embedded cluster to represent the<br />

single positive kink. The sulfur ions must be properly<br />

compensated in this model. The sulfur ion is compensated<br />

by adding an interstitial silver ion at the adjacent<br />

interstitial position. A silver center is treated by<br />

placing a number <strong>of</strong> silver atoms on these clusters <strong>and</strong><br />

determining their optimum position. In this calculation<br />

the long-range Coulomb field <strong>of</strong> the crystal is provided<br />

by the point-ion array, while the atoms <strong>of</strong> the silver center<br />

interact directly with other quantum mechanical<br />

ions. Then a second calculation is performed in order to<br />

account for the lattice polarization energy. This is a classical<br />

atomistic calculation for surfaces performed with<br />

the MIDAS/CHAOS code. 13 The ions represented quantum<br />

mechanically are fixed at their positions determined<br />

in the first calculation <strong>and</strong> assigned a charge determined<br />

Figure 2. Sketches <strong>of</strong> calculated equilibrium structure for<br />

Ag 2 S, Ag 3 S + , Ag 4 S ++ , Ag 4 S 2 , <strong>and</strong> Ag 6S 2<br />

++<br />

. Bond angles <strong>and</strong> distances<br />

(Å) are given.<br />

from the Mulliken procedure. All <strong>of</strong> the silver <strong>and</strong> halide<br />

ions are allowed to displace to an equilibrium position<br />

in response to the cluster . The energy change for<br />

this step is added to the quantum mechanical energy<br />

determined in the first part to give the total system<br />

energy. Total energies <strong>of</strong> the appropriate charge states<br />

are subtracted to give the ionization potential or electron<br />

affinity <strong>of</strong> the cluster.<br />

The CADPAC code 14 is employed for the quantum<br />

mechanical calculations. A double zeta plus polarization<br />

full basis is used for S <strong>and</strong> Cl basis functions. The Ag<br />

atom is described by a model potential 15 with a double<br />

zeta plus polarization basis. We have previously shown 12<br />

the accuracy <strong>of</strong> this type <strong>of</strong> calculation by comparison<br />

<strong>of</strong> calculated ionization potential values for silver clusters<br />

with experimental values. The agreement with our<br />

experiment is within a few tenths <strong>of</strong> an eV.<br />

There are several approximations in this first treatment<br />

<strong>of</strong> the sulfur sensitization centers adsorbed to<br />

the silver chloride surface. The use <strong>of</strong> larger fragments<br />

representing the defect surface site in the quantum mechanical<br />

part <strong>of</strong> the calculation would be desirable. This<br />

would prevent the possible unphysical penetration <strong>of</strong><br />

wave functions from the quantum mechanical unit into<br />

the point ions. A second approximation involves the<br />

computation <strong>of</strong> the lattice polarization energy by a procedure<br />

that attempts to achieve self-consistency between<br />

the quantum mechanical unit <strong>and</strong> the rest <strong>of</strong><br />

the crystal. This gives a lattice polarization energy <strong>of</strong><br />

the order <strong>of</strong> a few electronvolts for some <strong>of</strong> the charged<br />

silver centers <strong>and</strong> cannot be neglected. Overall, there<br />

is no independent means to specify the absolute accuracy<br />

<strong>of</strong> these calculations without experimental data,<br />

thus, we emphasize the relative values for different<br />

sized silver clusters.<br />

Results<br />

Free Ag n S m (n = 1 to 6; m = 1, 2). A good starting place<br />

for the study <strong>of</strong> sensitization by silver sulfide centers is<br />

376 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Baetzold


TABLE I. Calculated Properties <strong>of</strong> Silver Sulfide Clusters at<br />

Optimized Geometry<br />

A. Reaction Energy (eV)a<br />

Reaction<br />

∆E<br />

1 –0.08<br />

2 –2.70<br />

3 1.60<br />

4 –2.58<br />

5 –0.76<br />

B. Ionization Potentials (IP) <strong>and</strong> Electron Affinity (EA)<br />

Cluster IP EA<br />

Ag 2 S 7.40 1.23<br />

Ag 3 S + 12.11 5.89<br />

Ag 4 S + 10.33 5.87<br />

Ag 4 S 2 5.38 2.17<br />

Ag 5 S<br />

+<br />

2 9.91 5.74<br />

++<br />

Ag 6 S 2 13.96 8.68<br />

a<br />

Negative values indicate exothermic reactions.<br />

Figure 3. The kink model containing sulfide <strong>and</strong> a compensating<br />

silver ion is shown in top view. The ions surrounded by<br />

squares are in the top plane <strong>and</strong> ions surrounded by circles<br />

are in the second plane. The starred ions also contain a second<br />

plane <strong>of</strong> ions underneath. The hemispherical point ions complete<br />

this model.<br />

the free clusters. We determine the optimized geometry<br />

<strong>of</strong> several small clusters as well as their ionization potential<br />

(IP) <strong>and</strong> electron affinity (EA). The optimized<br />

geometry is shown in Fig. 2 for several <strong>of</strong> these clusters.<br />

Note the nonlinear bond angles in Ag 2 S <strong>and</strong> Ag 3 S +<br />

characteristic <strong>of</strong> directional covalent bonding as contrasted<br />

to ionic bonding. The Ag 3 S + <strong>and</strong> Ag 4 S ++ cluster<br />

geometry deviates from planar by the indicated bond<br />

angles. We also show some larger Ag 4 S 2 <strong>and</strong> Ag 6 S 2<br />

++<br />

clusters<br />

that are slightly favored in a three-dimensional<br />

versus entirely planar structure. These cyclic structures<br />

are favored, which can be visualized to result from coupling<br />

<strong>of</strong> fragments like Ag 2 S.<br />

We now turn to the reactions <strong>of</strong> the small chalcogenide<br />

clusters with silver ion because the latter species is <strong>of</strong>ten<br />

available for reaction in silver halide grains. The<br />

reactions considered include:<br />

Ag 2 S + Ag 2 S → Ag 4 S 2 (1)<br />

Ag 2 S + Ag + → Ag 3 S + (2)<br />

Ag 3 S + + Ag + → Ag 4 S ++ (3)<br />

Ag 4 S 2 + Ag + → Ag 5 S 2<br />

+<br />

(4)<br />

Ag 5 S 2<br />

+<br />

+ Ag + → Ag 6 S 2<br />

++<br />

(5)<br />

We have computed the energy change for each <strong>of</strong> these<br />

forward reactions from the total quantum mechanical<br />

energy <strong>of</strong> each species <strong>and</strong> give these values in Table I.<br />

Several comments are noteworthy. Dimerization <strong>of</strong> Ag 2 S<br />

units is exothermic. The addition <strong>of</strong> a silver ion to Ag 2 S<br />

is very exothermic to form Ag 3 S + , but addition <strong>of</strong> a second<br />

silver ion becomes endothermic. In the case <strong>of</strong> the<br />

dimerized species Ag 4 S 2 , addition <strong>of</strong> the first silver ion<br />

is very exothermic <strong>and</strong> similarly for a second silver ion.<br />

Both reaction 3 <strong>and</strong> reaction 5 involve the addition <strong>of</strong> a<br />

silver ion to a positively charged species. Reaction 5 is<br />

more favorable energetically because the relative weak<br />

stability <strong>of</strong> the Ag 5 S 2<br />

+<br />

intermediate species <strong>of</strong> low symmetry<br />

while Ag 3 S + is <strong>of</strong> higher symmetry. Thus, forming<br />

the product Ag 6 S 2<br />

++<br />

is relatively favored <strong>and</strong> accounts<br />

for the exothermicity <strong>of</strong> reaction 5. These results suggest<br />

that there will be a monomeric <strong>and</strong> dimeric charged<br />

species containing excess silver ions in an emulsion system<br />

depending upon the availability <strong>of</strong> silver ion concentration.<br />

We will consider this possibility when we<br />

treat these clusters adsorbed to the surface in later parts<br />

<strong>of</strong> this report.<br />

The ability <strong>of</strong> silver sulfide clusters to trap electrons<br />

or holes is determined by their electron affinity (EA) or<br />

ionization potential (IP), respectively. These values are<br />

strongly perturbed by the number <strong>of</strong> bound silver ions<br />

in the cluster as shown by the data in Table I. This effect<br />

is due to the net charge <strong>of</strong> the cluster. As more silver<br />

ions are associated with the cluster , it becomes a<br />

better electron trap. In this way the ionic equilibria in<br />

silver halide, which controls the availability <strong>of</strong> interstitial<br />

silver ions, is coupled to the electronic factors that<br />

control electron or hole trapping. Secondly, the dimeric<br />

fragments generally have smaller IP <strong>and</strong> larger EA values<br />

than their monomeric analogues, as can be seen by<br />

comparing the values for Ag 2 S <strong>and</strong> Ag 4 S 2 in Table I. Both<br />

<strong>of</strong> these trends promote carrier trapping at the dimers<br />

relative to the monomer.<br />

Electronic Effect <strong>of</strong> Sulfide at Kink Sites. Earlier<br />

work has shown that the positive kink site is a likely<br />

site for the nucleation <strong>and</strong> growth <strong>of</strong> latent image. Thus,<br />

we have examined whether the initial electron trapping<br />

<strong>of</strong> an electron at these sites is affected by a structural<br />

relaxation as proposed 3 in strong coupling models <strong>of</strong> this<br />

process. A positive kink containing sulfide with a compensating<br />

silver ion is considered, as shown in Fig. 3.<br />

This surface defect is represented by a Ag 9 Cl 6 S + quantum<br />

mechanical model embedded in fixed point ions <strong>of</strong><br />

the type discussed before. Five <strong>of</strong> the quantum ions are<br />

blocked from view in Fig. 3. Two silver ions <strong>and</strong> two<br />

chloride ions are included below the starred ions to complete<br />

a cube <strong>of</strong> ions. The fifth ion is an interstitial silver<br />

ion placed at the center <strong>of</strong> this cube. In the first stage <strong>of</strong><br />

the calculation, the quantum mechanical ions in the top<br />

layer <strong>and</strong> the interstitial silver ion are allowed to relax<br />

to their equilibrium positions. This corresponds to the<br />

equilibrium kink site. Then, an electron is added <strong>and</strong><br />

the quantum mechanical ions are allowed to relax to<br />

Calculated Properties <strong>of</strong> Sulfur Centers on AgCl Cubic Surfaces <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 377


TABLE II. Calculated Equilibrium Positions for Ag Clusters at<br />

Ag 4 Cl 3 S Kink Model<br />

Cluster X Y Z<br />

Ag° 0.15 0.25 0.18<br />

Ag 2 ° –0.16 0.65 1.32<br />

4.61 0.65 1.36<br />

Ag 3 ° –0.95 5.31 0.87<br />

5.61 0.05 1.25<br />

0.06 0.17 1.05<br />

Ag 4 ° 0.31 0.41 0.56<br />

6.86 –0.23 0.08<br />

–2.75 4.60 –0.30<br />

6.67 4.73 0.19<br />

Positions (au) relative to (000) at the kink center.<br />

TABLE III. Calculated Properties <strong>of</strong> Ag n Centers Adsorbed to<br />

Various S Kink Models<br />

A. Properties at S Kink on AgCl<br />

Cluster Binding Energy (eV) Average Charge IP (eV) EA (eV)<br />

Ag 1.77 –0.10 6.48 4.69<br />

Ag 2 3.16 –0.04 6.13 4.33<br />

Ag 3 4.12 –0.05 5.43 4.73<br />

Ag 4 6.79 –0.03 6.75 4.43<br />

B. Electron Trap Depths (eV)<br />

Cluster S Kink, AgCl Single Kink, AgCl<br />

Ag 1.09 1.31<br />

Ag 2 0.73 0.10<br />

Ag 3 1.13 1.85<br />

Ag 4 0.83 1.80<br />

find new equilibrium positions. We associate the change<br />

in energy, which occurs in this second relaxation, with<br />

a deepening <strong>of</strong> the electron trap caused by the interaction<br />

<strong>of</strong> the electron with lattice ions.<br />

Prior to this step, the trap depth <strong>of</strong> the electron is determined<br />

by coulombic effects <strong>and</strong>, according to effective<br />

mass considerations, would be expected to amount to a<br />

few hundredths <strong>of</strong> an electronvolt. The calculated energy<br />

change due to relaxation is 0.31eV, which dominates the<br />

effective mass trap depth. The approximate quantitative<br />

nature <strong>of</strong> this calculation is emphasized because <strong>of</strong> the<br />

small quantum cluster size. Qualitatively , this result<br />

provides support for the concepts involved in the strongcoupling<br />

model <strong>of</strong> sensitization proposed by Hamilton. 3<br />

Figure 4. Electron affinity <strong>and</strong> ionization potential are shown<br />

for Ag n , n = 1 to 4 clusters adsorbed next to kink model S with<br />

<strong>and</strong> without sulfide.<br />

Latent Image Formation at Kinks Containing S<br />

Ions. Some proposals 8,11 for the function <strong>of</strong> S sensitization<br />

attribute the collection <strong>of</strong> excess silver ions as leading<br />

to a sensitizer site. These silver ions might be<br />

interstitial or on the surface <strong>of</strong> the grain. W e consider<br />

these possibilities near a positive kink site, which our<br />

previous calculations have shown 12,16 to be a favorable<br />

site for latent image formation in the absence <strong>of</strong> sulfur.<br />

A single positive kink was considered, as sketched in<br />

Fig. 1. In the single kink the double charge <strong>of</strong> the sulfur<br />

ion substituted for halide is balanced by an adjacent<br />

interstitial silver ion. This model is represented through<br />

Ag 4 Cl 3 S quantum mechanical units embedded in a pointcharge<br />

array containing the appropriate charges for S,<br />

Cl, or Ag ions.<br />

When silver atoms are adsorbed to the S kink model<br />

their optimized geometry is calculated to be near planar,<br />

similar to earlier findings at kink sites 12 in the absence<br />

<strong>of</strong> S. W e report the calculated equilibrium<br />

geometries in Table II for the S kink model. The bond<br />

lengths in the silver clusters are similar to those calculated<br />

in the gas phase <strong>and</strong> suggest that the silver cluster<br />

retains its integrity. For example, we calculate 2.52<br />

Å for Ag 2 <strong>and</strong> 2.95 <strong>and</strong> 2.94 Å for Ag 3 . Turning to other<br />

properties <strong>of</strong> the cluster in T able III, we see a significant<br />

binding energy for these clusters that represents<br />

the sum <strong>of</strong> adsorption energy <strong>and</strong> the intra-atomic bonding<br />

terms. The silver atom has a significant adsorption<br />

energy. The average Mulliken charge <strong>of</strong> these clusters<br />

is very close to neutral. The ionization potential (IP)<br />

<strong>and</strong> electron affinity (EA) <strong>of</strong> these centers are considerably<br />

larger than the conduction b<strong>and</strong> edge for AgCl,<br />

which we calculated 12 at 3.6 eV as a reference level.<br />

Thus, electron capture at the silver centers is energetically<br />

possible at all sizes <strong>and</strong> permits latent image formation<br />

according to the nucleation <strong>and</strong> growth mechanism.<br />

The valence b<strong>and</strong> edge is positioned at 6.8 eV as<br />

derived from the AgCl b<strong>and</strong> gap <strong>and</strong> is such that<br />

photoholes could attack any <strong>of</strong> these clusters.<br />

We can compare the electron trap depths with <strong>and</strong><br />

without S ions present. We employ data from our ear -<br />

lier calculations 12 in Table III for this comparison. On<br />

AgCl the electron affinity <strong>of</strong> the Ag° is slightly decreased<br />

in the presence <strong>of</strong> S by 0.22 eV at the kink. At Ag 2 , the<br />

situation is reversed <strong>and</strong> electron trapping at this stage<br />

may be important for latent image growth. In the absence<br />

<strong>of</strong> S the trap depth is only 0.1 eV for Ag 2 but increases<br />

to 0.73 eV at the S kink model. The electron trap<br />

depth at cluster sizes greater than these are quite large<br />

<strong>and</strong> should not provide a barrier to latent image growth.<br />

Thus, these results suggest that an important role <strong>of</strong> S<br />

in AgCl is to assist electron trapping at Ag 2 , which has<br />

the smallest electron trap depth <strong>of</strong> a size series <strong>of</strong> silver<br />

clusters. These energy levels are plotted in Fig. 4 to facilitate<br />

this comparison.<br />

An interstitial silver ion can add to the latent image<br />

center after an electron is trapped. This process is assisted<br />

by Coulomb attraction as in the nucleation <strong>and</strong><br />

growth model. In this mechanism, it is worth emphasizing<br />

the electron capture ability <strong>of</strong> the silver atom<br />

state. Its electron affinity is 4.69 eV, as shown in<br />

Table III, which makes it a deep electron trap. This re-<br />

378 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Baetzold


Figure 5. Sketch <strong>of</strong> the equilibrium structure calculated for Ag 3 S + , Ag 2 S, <strong>and</strong> Ag 4 S 2 on the (100) AgCl surface in top view.<br />

sult may be surprising in view <strong>of</strong> the approximately 1eV<br />

electron affinity <strong>of</strong> the free atom. The difference occurs<br />

because <strong>of</strong> the partial charge <strong>of</strong> the kink site <strong>and</strong> the<br />

lattice polarization <strong>of</strong> silver halide. Thus, there are no<br />

thermodynamic barriers to the formation <strong>of</strong> latent image<br />

by stepwise addition <strong>of</strong> electrons <strong>and</strong> silver ions to<br />

the silver atom center.<br />

Ag n S m Clusters (n = 1 to 5; m = 1, 2) on AgCl Flat<br />

Surfaces. We consider the energy levels <strong>of</strong> various silver<br />

sulfide clusters adsorbed to the (100) AgCl surface.<br />

The models are sketched in Fig. 1 where the Ag n S m clusters<br />

are placed on the Ag 5 Cl 4 fragment embedded in point<br />

ions. A geometry optimization was performed to determine<br />

the relaxed cluster structure registry <strong>and</strong> height<br />

above the surface. A sketch <strong>of</strong> the structure <strong>of</strong> some<br />

adsorbed clusters is shown in Fig. 5 along with geometric<br />

information. The Ag 2 S molecule is adsorbed with its<br />

S atom over the top <strong>of</strong> a lattice silver ion. The Ag-S-Ag<br />

bond angle is 100°, which is very close to the free cluster<br />

value. The Ag 3 S + molecule also is adsorbed with the<br />

sulfur atom over a lattice silver ion. In the case <strong>of</strong> Ag 4 S 2 ,<br />

both sulfur atoms are positioned nearly on top <strong>of</strong> underlying<br />

silver ions while the silver atoms are positioned<br />

nearly on top <strong>of</strong> lattice chloride ions.<br />

The calculated ionization potential <strong>and</strong> electron affinity<br />

<strong>of</strong> the adsorbed Ag n S m clusters are shown in Fig.<br />

6 for various sizes. The levels are labeled by the initial<br />

<strong>and</strong> final cluster charge when an electron is added to<br />

the cluster. Thus, electron trapping at Ag 2 S is represented<br />

by the label 0/–1 which can be seen to lie above<br />

the conduction b<strong>and</strong> <strong>of</strong> AgCl. Therefore, Ag 2 S on the<br />

(100) AgCl surface is not able to trap an electron. The<br />

same is true for the neutral Ag 4 S 2 molecule although its<br />

electron accepting level is within 0.2 eV <strong>of</strong> the conduction<br />

b<strong>and</strong> edge <strong>and</strong> this difference is less than our estimated<br />

possible error <strong>of</strong> this calculation. When one or<br />

two silver ions are added to Ag 2 S or Ag 4 S 2 , there are<br />

electron accepting levels within the b<strong>and</strong> gap. In order<br />

to trap a photohole the level must lie in the b<strong>and</strong> gap.<br />

Interestingly, Ag 2 S does not have such a level in the b<strong>and</strong><br />

Figure 6. The calculated ionization energies are shown for various<br />

silver sulfide clusters adsorbed to the (100) AgCl surface.<br />

The notation gives the cluster charge before/after ionization.<br />

gap. The other clusters that have the best chance <strong>of</strong> trapping<br />

a hole must have a zero or negative charge, in order<br />

to avoid Coulombic repulsion. The clusters filling<br />

this criterion are Ag 3 S°, Ag 4 S°, Ag 4 S 2 °, <strong>and</strong> Ag 5 S 2 °. The<br />

positively charged clusters such as Ag 3 S + , Ag 4 S + , <strong>and</strong><br />

Ag 5 S 2<br />

+<br />

would capture electrons. This finding again points<br />

to the importance <strong>of</strong> the ionic equilibria in a grain that<br />

determines the concentration <strong>of</strong> interstitial silver ions<br />

that in turn controls the majority species such as Ag 2 S<br />

or Ag 3 S + on the surface.<br />

Ag n Clusters on Flat AgCl Surfaces Containing Sulfide.<br />

We now consider (100) AgCl surfaces where oneor<br />

two-chloride ions are replaced by sulfide. The quantum<br />

mechanical surface fragment that is then embedded<br />

in point ions is shown in Fig. 7 for the two cases.<br />

The Ag atoms are first placed on the surface near the<br />

hollow site between two cations <strong>and</strong> two anions <strong>and</strong> then<br />

Calculated Properties <strong>of</strong> Sulfur Centers on AgCl Cubic Surfaces <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 379


Figure 7. Cluster units containing one or two sulfide ions that<br />

were used to treat adsorption next to sulfide.<br />

its lateral <strong>and</strong> vertical position is optimized. The total<br />

energy is then calculated for several charge states in<br />

order to determine the energy levels in Fig. 8. It is clear<br />

that many neutral Ag n clusters would not be stable near<br />

the sulfide ion on this (100) surface. These clusters have<br />

the level +1/0 above the conduction b<strong>and</strong> edge, which<br />

indicates that they would release an electron to the conduction<br />

b<strong>and</strong> if they were ever formed on this surface.<br />

The exceptions to this behavior are Ag 2 at both sites <strong>and</strong><br />

Ag 4 near the two S model. By the same token these neutral<br />

clusters have the correct charge <strong>and</strong> energy levels<br />

to become hole traps. All <strong>of</strong> the other clusters with energy<br />

levels in the b<strong>and</strong> gap should not trap holes because<br />

<strong>of</strong> their positive charge. Thus, it is clear that a<br />

silver ion must be associated with the sulfide-silver cluster<br />

in order to permit electron trapping. Therefore, centers<br />

such as Ag 2<br />

++<br />

, Ag 3<br />

++<br />

, <strong>and</strong> Ag 4<br />

++<br />

near one-sulfide ion<br />

or Ag 2+ , Ag 4+ , or Ag 5<br />

++<br />

near two-sulfide ions would be<br />

needed to trap electrons at these centers.<br />

Discussion<br />

We have examined silver-sulfur clusters on a silver chloride<br />

crystal surface where the cluster was adsorbed to<br />

the surface or in which the sulfur ions have replaced<br />

halide ions in different surface sites. The adsorbed clusters<br />

show size-dependent properties. On the flat (100)<br />

AgCl surface Ag 2 S or Ag 4 S 2 have electron accepting levels<br />

slightly above the conduction b<strong>and</strong> edge. When associated<br />

with a silver ion, these molecules become<br />

electron traps. The Ag 4 S 2 molecule has an occupied level<br />

in the b<strong>and</strong> gap that could trap a hole. When sulfide<br />

replaces halide ions in the flat (100) AgCl surface, the<br />

resulting centers are generally not electron traps unless<br />

they have adsorbed sufficient silver ions to acquire<br />

+<br />

a positive charge. The Ag 2 cluster near one-sulfide ion<br />

+<br />

or Ag 2+ , Ag 4 near two-sulfide ions have electron trapping<br />

levels just larger than the crystal. It is possible<br />

that this type <strong>of</strong> species is responsible for the S center<br />

trapping levels in the range <strong>of</strong> 0.3 – 0.4 eV observed<br />

experimentally 4–6 in AgBr systems. However, these centers<br />

may not be the ones directly active in latent image<br />

growth, while they may play an important role in the<br />

overall process.<br />

In considering the overall role <strong>of</strong> S sensitization it is<br />

well to appeal to some <strong>of</strong> the classic experiments that<br />

have helped to define the situation. A variety <strong>of</strong> workers<br />

have referred to the role <strong>of</strong> the sensitization in over -<br />

coming the inherit negative surface potential in silver<br />

chloride <strong>and</strong> bromide that opposes the movement <strong>of</strong> photoelectrons<br />

to the surface. In this regard, the classic experiments<br />

<strong>of</strong> Saunders, Tyler, <strong>and</strong> West 17 are worthy <strong>of</strong><br />

attention. They demonstrated in unsensitized AgBr<br />

sheet single crystal an insensitivity for the formation<br />

<strong>of</strong> surface latent image because <strong>of</strong> the space-charge potential<br />

opposing the motion <strong>of</strong> electrons to the surface.<br />

The same effects were demonstrated 18 in emulsion<br />

Figure 8. The calculated ionization energies are shown for<br />

Ag n (n = 1 to 5) for adsorption next to one S or two S ions in the<br />

(100) AgCl surface.<br />

grains where the sensitization centers were placed at<br />

different positions. With sensitization centers placed on<br />

the surface, latent image only formed on the surface,<br />

but when the sensitization center was in the grain interior<br />

no surface latent image formed. The role <strong>of</strong> the surface<br />

sensitization centers in overcoming the<br />

space-charge potential in this manner has also been<br />

emphasized by Slifkin. 19<br />

The distribution <strong>of</strong> development centers in a model<br />

silver bromide emulsion was studied by Spencer, Brady,<br />

<strong>and</strong> Hamilton. 20 The effect <strong>of</strong> S sensitization on highintensity<br />

exposures was striking. At high intensities the<br />

number <strong>of</strong> development centers increase when S sensitization<br />

is applied. This effect is not observed at low<br />

intensities. The effect has been interpreted to indicate<br />

an increase in nucleation efficiency 21 as caused by S sensitization.<br />

In the absence <strong>of</strong> S sensitization the nucleation<br />

efficiency is very low.<br />

These experimental results <strong>and</strong> calculations are consistent<br />

regarding a role for S sensitization in silver<br />

halide. There is a temporary trapping <strong>of</strong> electrons that<br />

reach the surface in opposition to the space-charge<br />

potential. At a surface defect site such as a kink containing<br />

sulfide a relaxation involving small ion displacements<br />

can take place to stabilize the electron. This<br />

initial shallow trapping is important in leading to a deexcitation<br />

<strong>of</strong> the electron 3 permitting electron trapping<br />

at the silver atom where the calculated electron affinity<br />

is 1.1 eV greater than the crystal electron affinity .<br />

Thus, the net effect is to increase the probability <strong>of</strong> electron<br />

trapping at the silver atom in competition with<br />

recombination. Possibly, there is a second function <strong>of</strong><br />

the sulfur center that increases the electron trap depth<br />

at Ag 2 .<br />

The luminescence-modulation spectroscopic measurements<br />

<strong>of</strong> Kanzaki <strong>and</strong> Tadakuma 11 on sulfur sensitization<br />

centers in AgBr emulsions give evidence for<br />

deep carrier trapping at S centers. A thermal trap depth<br />

for electrons <strong>of</strong> 0.3 eV is associated with the sulfur<br />

dimer centers on the basis <strong>of</strong> the concentration dependence<br />

<strong>of</strong> peaks in the modulation spectra. These centers<br />

were thought to consist <strong>of</strong> two adjacent<br />

substitutional sulfide ions that attract two interstitial<br />

silver ions <strong>and</strong> is supposed to lead to an enhancement<br />

<strong>of</strong> the interstitial electron trapping function. In this<br />

mechanism, the displacement <strong>of</strong> interstitial silver ions<br />

leads to the relaxed state with a thermal trap depth <strong>of</strong><br />

380 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Baetzold


0.3 eV. This mechanism has some similarities with the<br />

kink relaxation mechanism <strong>and</strong> could be investigated<br />

in more detail.<br />

These first calculations have dealt with the AgCl surface<br />

because <strong>of</strong> computational ease. In many cases we<br />

have assumed that the electronic properties <strong>of</strong> the sensitizer<br />

centers will be similar on AgCl <strong>and</strong> AgBr. This<br />

assumption will have to be tested computationally.<br />

Conclusions<br />

We have applied state-<strong>of</strong>-the-art computations to describe<br />

the electronic properties <strong>of</strong> sulfur sensitization on AgCl.<br />

1. There is a tendency for free Ag 2 S centers to dimerize<br />

to Ag 4 S 2 clusters <strong>and</strong> the clusters could add one or<br />

more silver ions depending upon the availability <strong>of</strong><br />

these ions for reaction. The dimers are better electron<br />

traps than the corresponding monomers.<br />

2. Sulfur centers at a kink site can promote electron<br />

trapping through relaxation <strong>of</strong> its ions. This trap<br />

deepening promotes electron de-excitation to deeper<br />

latent image precursor levels.<br />

3. The properties <strong>of</strong> sulfur-silver centers adsorbed to flat<br />

surfaces are different than if the sulfur is incorporated<br />

into the surface to form a sulfide.<br />

4. On the (100) AgCl surface, electron trapping centers<br />

include Ag 3 S + , Ag 4 S + , <strong>and</strong> Ag 5 S 2+ .<br />

5. When sulfide is introduced into the (100) AgCl surface<br />

silver ions are required to compensate its charge.<br />

Electron trapping can occur at (Ag 2 S) but not (AgS)<br />

centers. At dimeric S centers, electron trapping is<br />

more favorable.<br />

References<br />

1. J. M. Harbison <strong>and</strong> H. E. Spencer, The Theory <strong>of</strong> the Photographic<br />

Process, T. H. James, Ed., 4th ed., Macmillan Publishing<br />

Co., New York, 1977.<br />

2. J. F. Hamilton, Adv. Phys. 37, 359 (1988).<br />

3. J. F. Hamilton, J. <strong>Imaging</strong> Sci. 34, 1 (1990).<br />

4. J. F. Hamilton, J. M. Harbison <strong>and</strong> D. L. Jeanmaire, J. <strong>Imaging</strong><br />

Sci. 32, 17 (1988).<br />

5. L. Kellogg <strong>and</strong> J. Hodes, IS&T’s 46th Annual Conference, IS&T,<br />

Springfield, VA, 1987, p. 179.<br />

6. T. Kaneda, J. <strong>Imaging</strong>. Sci. 33, 115 (1989).<br />

7. D. Zhang <strong>and</strong> R. Hailstone, J. <strong>Imaging</strong> Sci. 37, 61 (1993).<br />

8. T. Tani, J. <strong>Imaging</strong> Sci. 39, 386 (1995).<br />

9. J. P. Spoonhower <strong>and</strong> A. P. Marchetti, J. Phys. Chem. Solids 51,<br />

793 (1990).<br />

10. J. E. Keevert <strong>and</strong> V. V. Gokhale, J. <strong>Imaging</strong>. Sci. 31, 243 (1987).<br />

11. H. Kanzaki <strong>and</strong> Y. Tadakuma, J. Phys. Chem. Solids 55, 631<br />

(1994); 58, 221 (1997).<br />

12. R. C. Baetzold, J. Phys. Chem. 101, 8180 (1997).<br />

13. P. W. Tasker, Philos. Mag. 39, 119 (1979).<br />

14. CADPAC: The Cambridge Analytical Derivatives Package, Cambridge,<br />

1996, Version 6, R. D. Amos with contributions from I. L.<br />

Alberts, J. S. Andrews, S. M. Colwell, N. C. H<strong>and</strong>y, D. Jayatilaka,<br />

P. J. Knowles, R. Kobayashi, K. E. Laidig, G. Laming, A. M. Lee,<br />

P. E. Maslen, C. W. Murray, J. E. Rice, E. D. Sim<strong>and</strong>iras, A. J.<br />

Stone, M.–D. Su <strong>and</strong> D. J. Tozer.<br />

15. Y. Sakai, E. Miyoshi, M. Klobukwski, <strong>and</strong> S. Huzinaga, J. Comp.<br />

Chem. 8, 256 (1987).<br />

16. J. F. Hamilton <strong>and</strong> R. C. Baetzold, Photogr. Sci. Eng. 25, 189<br />

(1981).<br />

17. (a) V. I. Saunders, R. W. Tyler, <strong>and</strong> W. West, Photogr. Sci. Eng.<br />

12, 90 (1968); (b) F. Trautweiler, Photogr. Sci. Eng. 12, 98 (1968).<br />

18. R. Matejec <strong>and</strong> E. Moisar, Photogr. Sci. Eng. 12, 133 (1968).<br />

19. L. Slifkin, Mater. Res. Soc. Bull. 36 (1989).<br />

20. H. E. Spencer, L. E. Brady, <strong>and</strong> J. F. Hamilton, J. Opt. Soc. Am.<br />

54, 492 (1964).<br />

21. (a) J. F. Hamilton, Photogr. Sci. Eng. 26, 263 (1982); (b) R. K.<br />

Hailstone, N. B. Liebert <strong>and</strong> M. Levy, J. <strong>Imaging</strong> Sci. 34, 169<br />

(1990).<br />

Calculated Properties <strong>of</strong> Sulfur Centers on AgCl Cubic Surfaces <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 381


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

The Measurement <strong>of</strong> Diffuse Optical Densities.<br />

Part II: The German St<strong>and</strong>ard Reference Densitometers<br />

E. Buhr, D. Hoeschen <strong>and</strong> D. Bergmann<br />

Physikalisch-Technische Bundesanstalt, D-38116 Braunschweig, Bundesallee 100, Germany<br />

This article describes the design <strong>and</strong> performance <strong>of</strong> two densitometers used for high-accuracy measurements <strong>of</strong> visual diffuse<br />

optical transmission densities. The two densitometers were developed <strong>and</strong> constructed at the Physikalisch-T echnische<br />

Bundesanstalt (PTB), the German National Institute <strong>of</strong> Metrology. Both devices comply with the ISO st<strong>and</strong>ards 5-2 <strong>and</strong> 5-3 <strong>and</strong><br />

are primarily used for the calibration <strong>of</strong> st<strong>and</strong>ard step tablets. One <strong>of</strong> these densitometers, the PTB’ s inverse square law<br />

densitometer, is the national st<strong>and</strong>ard reference densitometer capable <strong>of</strong> measuring with high accuracy optical densities up to<br />

D = 3.3. The other densitometer, called fiber densitometer, measures densities up to D = 6. For both densitometers, the exp<strong>and</strong>ed<br />

ISO uncertainty <strong>of</strong> density measurement (coverage factor k = 2) is 0.003 for densities below 1.5 <strong>and</strong> increases to 0.006 at density<br />

6 for the fiber densitometer with spectrally neutral samples.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 382–387 (1999)<br />

Introduction<br />

Accurate values <strong>of</strong> diffuse optical densities <strong>of</strong> scattering<br />

samples are needed for many purposes: quality<br />

assurance in medical x-ray diagnostics, industrial nondestructive<br />

x-ray testing, applications in molecular<br />

biology (DNA sequencing, for example), quality control<br />

in graphic arts, <strong>and</strong>, <strong>of</strong> course, for characterizing<br />

photographic materials. For the calibration <strong>and</strong> testing<br />

<strong>of</strong> densitometers, suitable test objects, e.g., st<strong>and</strong>ard<br />

step tablets, with well-known optical densities are used.<br />

Such step tablets are calibrated by calibration services<br />

which need reference st<strong>and</strong>ards. For reasons <strong>of</strong><br />

traceability, these reference st<strong>and</strong>ards are calibrated<br />

with very high accuracy by National Institutes <strong>of</strong><br />

Metrology such as NIST <strong>and</strong> PTB. They develop<br />

st<strong>and</strong>ard measuring equipment that is capable <strong>of</strong><br />

measuring optical densities directly, without any step<br />

tablets being needed for calibration. The PTB has<br />

developed two such densitometers for the measurement<br />

<strong>of</strong> visual diffuse transmission densities. In this article<br />

we present the measuring arrangements <strong>and</strong> principles<br />

used in these two devices, discuss the performance <strong>of</strong><br />

these densitometers <strong>and</strong> their measurement<br />

uncertainties.<br />

ISO St<strong>and</strong>ards for the Measurement <strong>of</strong> Optical<br />

Densities<br />

The definition <strong>of</strong> optical density <strong>and</strong> the conditions <strong>of</strong><br />

the measuring systems are given in the International<br />

St<strong>and</strong>ards ISO 5, parts one to four. We present here only<br />

Original manuscript received September 17, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

a very brief survey <strong>of</strong> these st<strong>and</strong>ards, especially with<br />

respect to the measurement <strong>of</strong> visual diffuse<br />

transmission density.<br />

According to ISO 5-1, 1 the optical transmission density<br />

D is defined as<br />

D =−log 10 T<br />

(1)<br />

where the transmittance factor T is the ratio <strong>of</strong> the<br />

measured flux transmitted by the specimen to the flux<br />

measured when the specimen is removed from the<br />

sampling aperture <strong>of</strong> the densitometer.<br />

The geometric measuring conditions are specified in<br />

ISO 5-2 2 <strong>and</strong> ISO/DIS 5-2 6 for transmission density <strong>and</strong><br />

in ISO 5-4 4 for reflection density . The ISO st<strong>and</strong>ard<br />

diffuse transmission density is based on a method, where<br />

the sample is in “close contact” with the surface <strong>of</strong> a<br />

diffuse illuminating or receiving system. Because this<br />

surface is mostly realized by an opal glass, this method<br />

is usually called “opal glass” method. The term “close<br />

contact” means that there is a close proximity with an<br />

air gap to simulate conditions <strong>of</strong> the practice where<br />

inter-reflections between sample <strong>and</strong> opal glass are<br />

present. Because these inter -reflections influence the<br />

measurement result, ISO 5-2 specifies the reflection<br />

factor <strong>of</strong> the opal glass. ISO 5-2 also specifies the<br />

diffusion coefficient <strong>of</strong> the diffuser. In part I <strong>of</strong> this series<br />

<strong>of</strong> articles, 5 the ISO geometric conditions for determining<br />

diffuse transmission densities were discussed in detail.<br />

The spectral conditions for the measurement <strong>of</strong> optical<br />

densities are described in ISO 5-3, 3 where both the<br />

spectral energy distribution <strong>of</strong> the incident radiant flux<br />

<strong>and</strong> the spectral product <strong>of</strong> the measuring system (i.e.,<br />

the product <strong>of</strong> the influx spectrum <strong>and</strong> the spectral<br />

response <strong>of</strong> the densitometer) are specified for various<br />

applications. For transmission density measurements,<br />

382


Figure 1. Set-up <strong>of</strong> inverse square law densitometer.<br />

Figure 2. (a) Modulation scheme applied in inverse square<br />

law densitometer. <strong>and</strong> (b) reference <strong>and</strong> sample beam, both<br />

signals have the same waveform which is out-<strong>of</strong>-phase by 180°.<br />

(c) detector output signal with the sample beam attenuated by<br />

sample. (d) <strong>and</strong> (e) chopper reference output signals.<br />

the spectral distribution <strong>of</strong> the influx is the CIE<br />

st<strong>and</strong>ard illuminant A, modified by the transmittance<br />

<strong>of</strong> a typical heat-absorbing filter to protect the specimen<br />

<strong>and</strong> the optical system from heat. The functional<br />

notation <strong>of</strong> this influx spectrum is S H according to ISO<br />

5-3. The spectral product required for the visual<br />

transmission density is defined as the product <strong>of</strong> S H <strong>and</strong><br />

a spectral response <strong>of</strong> the receiver, V T , in order that this<br />

product be equal to the product <strong>of</strong> the spectral luminous<br />

efficiency function for photopic vision, V(λ), <strong>and</strong> the<br />

spectral distribution <strong>of</strong> CIE st<strong>and</strong>ard illuminant A.<br />

PTB’s Inverse Square Law Densitometer. The PTB’s<br />

inverse square law densitometer is the German national<br />

st<strong>and</strong>ard reference densitometer capable <strong>of</strong> measuring<br />

visual diffuse transmission densities according to<br />

ISO 5-2 <strong>and</strong> ISO 5-3. It applies the “diffuse efflux mode”<br />

measuring configuration, 2 where the film sample is<br />

illuminated directionally <strong>and</strong> the transmitted flux is<br />

measured by means <strong>of</strong> a diffuse receiver . 5 The<br />

densitometer is a dual-beam device: The luminous flux<br />

is time-shared by the reference <strong>and</strong> sample path, <strong>and</strong> it<br />

is detected by applying phase-sensitive lock-in<br />

techniques. Besides the well-known advantages <strong>of</strong> the<br />

dual-beam technique, the influence <strong>of</strong> low-frequency<br />

noise contributions is reduced. The densitometer uses a<br />

null-balance measuring configuration based on the<br />

fundamental photometric inverse square law , <strong>and</strong><br />

therefore linearity <strong>of</strong> the optical detector system is not<br />

an indispensable prerequisite.<br />

Densitometer Set-Up <strong>and</strong> Measuring Principle. The<br />

diagram <strong>of</strong> the measuring set-up <strong>of</strong> the densitometer is<br />

shown in Fig. 1. The light <strong>of</strong> a tungsten halogen lamp is<br />

split into two beams, the reference <strong>and</strong> the sample beam.<br />

A mechanical chopper, equipped with a specially shaped<br />

chopping blade, is used to chop both light beams<br />

simultaneously. The resulting modulation waveforms<br />

are shown in Fig. 2. The two light beams show repetitive<br />

pulse groups, each <strong>of</strong> which consists <strong>of</strong> four equal squarewave<br />

light pulses. The repetition frequency <strong>of</strong> the pulse<br />

groups is f = 72 Hz, <strong>and</strong> the frequency <strong>of</strong> the single<br />

pulses is 8f. The frequencies are chosen so as to avoid<br />

any low-order harmonic <strong>of</strong> f <strong>and</strong> 8 f coinciding with a<br />

low-order harmonic <strong>of</strong> the power line frequency . The<br />

modulation frequencies f <strong>and</strong> 8 f are phase-locked to<br />

avoid possible low-frequency beating due to the same<br />

chopper blade being used to create these waveforms. The<br />

waveforms <strong>of</strong> the reference <strong>and</strong> the sample beam are<br />

out-<strong>of</strong>-phase by 180 ° with respect to each other , i.e.,<br />

whenever light from the reference beam reaches the<br />

photodetector, light from the sample beam is blocked,<br />

<strong>and</strong> vice versa.<br />

The Measurement <strong>of</strong> Diffuse Optical Densities.Part II: ... <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 383


Figure 3. Diffuser used in the inverse square law densitometer.<br />

The luminous flux <strong>of</strong> the reference beam, Φ R , passes<br />

neutral grey filters <strong>and</strong> a variable beam aperture (for<br />

intensity adjustment). It then directly reaches an<br />

integrating sphere (sphere diameter: 1 1 cm; coating:<br />

barium sulphate), which is provided with a<br />

photodetector (EMI 9558 photomultiplier). An optical<br />

filter combination mounted in front <strong>of</strong> the photomultiplier<br />

is used to meet the ISO spectral conditions<br />

for measuring visual densities. The sample is in contact<br />

with an opal glass that is located in another opening <strong>of</strong><br />

the integrating sphere, see Fig. 3. The sample beam is<br />

directed onto the sample via two mirrors mounted on a<br />

long-travel linear translation-stage (length: about 6 m).<br />

Variation <strong>of</strong> the translation stage position leads to a<br />

change in the length <strong>of</strong> the sample beam path <strong>and</strong>, as a<br />

consequence, to a corresponding change <strong>of</strong> the incident<br />

luminous flux because <strong>of</strong> the photometric inverse square<br />

law. The length <strong>of</strong> the reference beam path is not altered<br />

if the translation stage position is varied.<br />

Because the photodetector captures both the reference<br />

beam flux Φ R <strong>and</strong> the transmitted sample beam flux Φ S ,<br />

its output signal comprises the superposed contributions<br />

from the reference <strong>and</strong> sample beam signals. The<br />

photodetector output signal is amplified <strong>and</strong><br />

subsequently fed to two equal digital lock-in amplifiers<br />

(Stanford SR 810). Lock-in amplifier No. 1, which is<br />

locked to the frequency f, detects the difference between<br />

reference <strong>and</strong> sample beam flux, Φ S – Φ R , whereas lockin<br />

amplifier No. 2, synchronized by the 8 f-reference<br />

output signal from the chopper , detects the sum <strong>of</strong><br />

reference <strong>and</strong> sample beam flux, Φ S + Φ R . The digital<br />

lock-in output signals are transmitted to a computer that<br />

calculates the ratio <strong>of</strong> the sum <strong>and</strong> the difference <strong>of</strong> the<br />

two lock-in output signals, yielding Φ S / Φ R as the result.<br />

Density measurements are performed in two steps:<br />

1. The first measurement is made with the sample<br />

removed. An adjustment is made to ensure that the<br />

photodetector signal contributions coming from the<br />

reference beam <strong>and</strong> the sample beam are equal, i.e.,<br />

Φ S / Φ R = 1. To attain this balance condition, the<br />

luminous flux <strong>of</strong> the sample beam is adjusted by<br />

positioning the translation stage on the optical bench.<br />

This stage position is measured <strong>and</strong> the corresponding<br />

sample path length, s 100% , is determined.<br />

2. The second measurement is performed with the<br />

sample arranged in front <strong>of</strong> the opal glass. The<br />

photodetector output signal contribution resulting<br />

from detecting the sample beam flux is reduced<br />

according to the transmittance factor T <strong>of</strong> the sample<br />

(see Fig. 2c), <strong>and</strong> the quantity computed from the<br />

two lock-in output signals, Φ S / Φ R , then directly<br />

yields the desired transmittance factor T. However,<br />

this value <strong>of</strong> T may be affected by possible<br />

nonlinearities <strong>of</strong> the characteristic curve <strong>of</strong> the<br />

photodetector/amplifier combination. In order to<br />

neglect this contribution to the measurement<br />

uncertainty, the translation stage is moved to a new<br />

position on the optical bench (closer to the lamp)<br />

where the null-balance condition, Φ S – Φ R = 0 or ,<br />

equivalently, Φ S / Φ R = 1, is fulfilled as was the case<br />

without sample. If the length <strong>of</strong> this shorter sample<br />

path is denoted as s T , the sample transmittance<br />

factor is easily obtained by applying the inverse<br />

square law:<br />

sT<br />

T = ⎛ 2<br />

⎞<br />

⎝ ⎜ s<br />

⎟<br />

100%<br />

⎠<br />

Therefore, the measurement <strong>of</strong> the optical density is<br />

reduced to two length measurements which can be<br />

performed with sufficient accuracy . The measuring<br />

range is limited to densities <strong>of</strong> up to about 1.65 because<br />

<strong>of</strong> the maximum <strong>and</strong> minimum sample path lengths<br />

possible. However, with the help <strong>of</strong> an auxiliary sample<br />

with a density <strong>of</strong> about 1.65 (which has to be well-known)<br />

<strong>and</strong> by attenuating the reference beam flux accordingly,<br />

it is possible to achieve the balance condition once again<br />

at large sample path lengths. This procedure renders it<br />

possible to measure sample densities up to twice the<br />

value <strong>of</strong> 1.65, i.e., up to 3.3. A third follow-up measurement<br />

is not possible because <strong>of</strong> a too low signal-to-noise<br />

ratio, which is due to the relatively weak radiation<br />

emitted by the tungsten lamp.<br />

ISO Geometric <strong>and</strong> Spectral Conditions. The<br />

densitometer complies with the geometric conditions<br />

specified in ISO 5-2, i.e., the diffusion coefficient value<br />

is larger than 0.90 <strong>and</strong> the reflectance factor <strong>of</strong> the<br />

diffuser is between 0.50 <strong>and</strong> 0.60.<br />

Figure 3 shows in detail the arrangement <strong>of</strong> the<br />

diffuser. It consists <strong>of</strong> an opal glass combined with an<br />

integrating sphere. This arrangement was chosen<br />

because the diffusion coefficient value <strong>of</strong> the 0.42 mm<br />

thick opal glass alone is not high enough. The thickness<br />

<strong>of</strong> the opal glass was selected to achieve a reflectance<br />

factor <strong>of</strong> 0.55 <strong>of</strong> the combination (sphere <strong>and</strong> opal glass)<br />

for a wavelength <strong>of</strong> about 570 nm which is the peak<br />

wavelength <strong>of</strong> the spectral product for visual density<br />

measurements. Due to light scattering, the reflectance<br />

factor <strong>of</strong> the diffuser decreases with increasing<br />

wavelength from 0,60 for a wavelength <strong>of</strong> 420 nm to 0.50<br />

for 710 nm.<br />

The geometrical distribution <strong>of</strong> the diffuse receiving<br />

system is shown in Fig. 4, together with the distribution<br />

<strong>of</strong> a perfect diffuse receiver that has a cosine spatial<br />

response, <strong>and</strong>, by definition, a diffusion coefficient <strong>of</strong> 1.<br />

The diffusion coefficient <strong>of</strong> the real diffuser is 0.945<br />

calculated according to Annex C <strong>of</strong> ISO 5-2. If the<br />

proposed new definition, given in the revised Draft ISO<br />

St<strong>and</strong>ard ISO/DIS 5-2, 6 is applied, the diffusion<br />

coefficient is 0.909. Please note, that the value for the<br />

diffusion coefficient, stated in the first part <strong>of</strong> this series<br />

<strong>of</strong> papers, 5 no longer holds because the instrument was<br />

meantime modified.<br />

The measuring aperture (size: 5 mm × 3 mm) is<br />

defined by a diaphragm that is located between sample<br />

(2)<br />

384 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Buhr et al.


Figure 5. Spectral product as specified in ISO 5-3 <strong>and</strong><br />

measured for the inverse square law densitometer . The<br />

difference between both curves is also shown.<br />

Figure 4. Geometrical distribution <strong>of</strong> the diffuse receiving<br />

system <strong>of</strong> the PTB’s inverse square law densitometer.<br />

<strong>and</strong> opal glass. T o assure that sample <strong>and</strong> opal glass<br />

are in close contact with each other , the diaphragm is<br />

inlaid into the opal glass such that there is a smooth<br />

surface.<br />

Figure 5 shows the spectral product for visual<br />

densities according to ISO 5-3 together with the spectral<br />

product <strong>of</strong> the densitometer , that was obtained by<br />

multiplying the measured emission spectrum <strong>of</strong> the<br />

tungsten lamp by the spectral response <strong>of</strong> the complete<br />

diffuse receiver system. If the CIE error definition used<br />

for the specification <strong>of</strong> the spectral response <strong>of</strong><br />

photometers is applied, 7 a value <strong>of</strong> 1.4% for f′ 1 is<br />

measured.<br />

Measurement Uncertainty. To determine the<br />

combined measurement uncertainty, the ISO Guidelines<br />

for the expression <strong>of</strong> uncertainty in measurement are<br />

applied. 8 The exp<strong>and</strong>ed uncertainty U(D) is specified,<br />

which is obtained by multiplying the combined st<strong>and</strong>ard<br />

uncertainty by a coverage factor k. The value <strong>of</strong> the<br />

coverage factor chosen is 2.<br />

The repeatability <strong>of</strong> measurement (repeated<br />

measurement <strong>of</strong> the same sample under unchanged<br />

conditions) was measured; the corresponding exp<strong>and</strong>ed<br />

uncertainty is U(D) < 0.001 for D < 1.65 <strong>and</strong><br />

U(D) = 0.0025 for D > 1.65.<br />

Systematic uncertainty components originate from the<br />

uncertainty where the determination <strong>of</strong> the sample path<br />

lengths s 100% <strong>and</strong> s T are affected: Here, the problem is<br />

not the measurement <strong>of</strong> the translation stage position<br />

on the optical bench, but proper knowledge <strong>of</strong> the<br />

effective distance between lamp source <strong>and</strong> detector<br />

along the optical beam path. In practice, the problem is<br />

to accurately measure an “<strong>of</strong>fset” distance which has to<br />

be added to the readings <strong>of</strong> the translation stage<br />

positions. We determine this <strong>of</strong>fset distance by means<br />

<strong>of</strong> the inverse square law , by extrapolation to zero<br />

distance. For this measurement, a linear photodetector<br />

is needed. The possible non-linearity <strong>of</strong> the<br />

photodetector <strong>and</strong> the extrapolation to zero distance lead<br />

to an uncertainty <strong>of</strong> the <strong>of</strong>fset distance. This in turn<br />

results in a corresponding uncertainty <strong>of</strong> the density<br />

measurement which is density dependent <strong>and</strong> can be<br />

described by U(D) = 0.0016•D.<br />

Another item concerns the photometric inverse square<br />

law itself. The largest dimensions <strong>of</strong> the tungsten light<br />

source <strong>and</strong> <strong>of</strong> the sampling aperture are 5mm, which is<br />

much smaller than the nearest distance between light<br />

source <strong>and</strong> detector (about 1700 mm). Therefore, the<br />

conditions for the applicability <strong>of</strong> the inverse square law<br />

are by far fulfilled; the uncertainty contribution due to<br />

this effect is far below 0.001. However, due to additional,<br />

undesirable signal contributions (e.g., stray light from<br />

the mirrors or other sources), small deviations from the<br />

ideal inverse square law occur. Careful measurements<br />

<strong>of</strong> these deviations show a stable <strong>and</strong> systematic<br />

behavior which is taken into account in the<br />

measurement evaluation. The residual uncertainty <strong>of</strong><br />

measurement caused by this effect is density dependent,<br />

U(D) = 0.0007•D.<br />

Other sources <strong>of</strong> error are due to spatial nonuniformities<br />

<strong>of</strong> the radiation emitted by the lamp, <strong>and</strong><br />

due to residual lock-in phase variations between the<br />

reference <strong>and</strong> the sample beam signals when the<br />

translation stage moves along the optical bench. The<br />

reason for both errors is that the solid angle <strong>of</strong> that part<br />

<strong>of</strong> the light beam that contributes to the signal, changes<br />

with the stage position. For instance, a larger distance<br />

between the sampling aperture <strong>and</strong> the lamp results in<br />

a smaller solid angle <strong>of</strong> the light beam falling onto the<br />

sampling aperture. Because the chopper blades hit the<br />

beam perpendicularly, the chopped light undergoes a<br />

phase variation. Other contributions to the uncertainty<br />

are the measurement uncertainties <strong>of</strong> the lock-in<br />

amplifiers. The total effect <strong>of</strong> all these uncertainties can<br />

be estimated to be below 0.002.<br />

The slight deviations <strong>of</strong> the spectral product <strong>of</strong> the<br />

densitometer from the ISO spectral product will lead to<br />

corresponding systematic measurement errors if the<br />

spectral transmission <strong>of</strong> the sample depends on the<br />

The Measurement <strong>of</strong> Diffuse Optical Densities.Part II: ... <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 385


Figure 7. Spectral product as specified in ISO 5-3 <strong>and</strong><br />

measured for the fiber densitometer. The difference between<br />

both curves is also shown.<br />

Figure 6. Set-up <strong>of</strong> fiber densitometer.<br />

wavelength. These systematic measurement errors can<br />

be corrected if the relative spectral transmission <strong>of</strong> the<br />

sample is known. For example, for medical x-ray films<br />

with their typical bluish base, the densitometer<br />

described here will indicate density values that deviate<br />

by about 0.001 from those <strong>of</strong> an ideal densitometer with<br />

exactly the spectral product specified in ISO 5-3.<br />

The effects <strong>of</strong> the diffusion coefficient value on the<br />

density values measured have already been discussed<br />

in detail in part I <strong>of</strong> this series <strong>of</strong> papers especially with<br />

respect to the inverse square law densitometer . 5 This<br />

discussion need not be repeated here, <strong>and</strong> the total<br />

uncertainty values stated below do not take this aspect<br />

into account.<br />

The resulting total measurement uncertainty for the<br />

ISO visual transmission density <strong>of</strong> spectrally neutral<br />

samples depends on density <strong>and</strong> can be expressed by<br />

U(D) = 0.0024 •D for densities above 1.5; for densities<br />

below 1.5 the uncertainty is U(D) = 0.003.<br />

PTB’s Fiber Densitometer. The fiber densitometer is<br />

specially designed for the measurement <strong>of</strong> high optical<br />

densities <strong>of</strong> neutral samples, <strong>and</strong> it thus complements<br />

the field <strong>of</strong> application <strong>of</strong> the inverse square law<br />

densitometer. 9 It is a single-beam densitometer that<br />

applies the “diffuse influx mode” configuration 2 using<br />

an opal glass as a diffuser. In this measuring mode, the<br />

sample is illuminated by diffuse light, <strong>and</strong> the<br />

transmitted luminous flux is detected with a directional<br />

receiver.<br />

Densitometer Set-Up <strong>and</strong> Measuring Principle. A<br />

diagram <strong>of</strong> the densitometer is shown in Fig. 6. The light<br />

<strong>of</strong> a tungsten halogen lamp, <strong>of</strong> which the IR radiation is<br />

removed with a heat-absorbing filter, is coupled into a<br />

so-called r<strong>and</strong>omly mixed glass fiber cable (length: 1 m,<br />

diameter: 13 mm), where the input <strong>and</strong> output positions<br />

<strong>of</strong> the single fibers do not c orrelate. This ensures<br />

uniform light emission over the sectional area <strong>of</strong> the<br />

fiber cable output, despite the fact that illumination <strong>of</strong><br />

the cable input area is not quite homogeneous. In<br />

addition, this arrangement also leads to a very high<br />

luminous flux at the sample, without necessity <strong>of</strong><br />

removing the heat produced by the lamp. The opal glass<br />

(thickness: 0.50 mm) is located about 5 mm apart from<br />

the output end <strong>of</strong> the fiber cable. The sampling aperture<br />

(6 mm × 3 mm) is defined by a diaphragm which is placed<br />

at the side <strong>of</strong> the opal glass facing the sample; as in the<br />

case <strong>of</strong> the inverse square law densitometer , the<br />

diaphragm is inlaid into the opal glass to achieve close<br />

contact <strong>of</strong> sample <strong>and</strong> opal glass. The combination <strong>of</strong> fiber<br />

cable <strong>and</strong> opal glass makes it possible to meet the ISO<br />

conditions regarding uniformity, diffusivity (diffusion<br />

coefficient: 0.952 according to ISO 5-2 Annex C, <strong>and</strong> 0.918<br />

according to ISO/DIS 5-2) <strong>and</strong> reflectance (reflectance<br />

factor: 0.54 at 570 nm) <strong>of</strong> the diffuse illuminator.<br />

The transmitted luminous flux is collected within a<br />

cone with a half angle <strong>of</strong> about 8° (maximum permissible<br />

half angle according to ISO 5-2: 10°). After collimation,<br />

the flux is filtered by means <strong>of</strong> an optical filter<br />

arrangement <strong>and</strong> detected with a silicon photodiode<br />

(Hamamatsu S1227-1010BQ). The spectral product <strong>of</strong><br />

the densitometer is not as good as that <strong>of</strong> the PTB’ s<br />

inverse square law densitometer (see Fig. 7); the value<br />

<strong>of</strong> the f’ 1 error parameter is 6.5%. Because the device is<br />

intended primarily for the measurement <strong>of</strong> spectrally<br />

neutral samples, this is actually no disadvantage.<br />

Optional grey filters (one filter or two filters in t<strong>and</strong>em<br />

arrangement) serving as spectrally neutral attenuators<br />

can be positioned in front <strong>of</strong> the photodetector. The grey<br />

filters are glass plates coated with a durable metallic<br />

alloy. These plates ensure uniform attenuation <strong>of</strong> the<br />

radiation over a wide spectral range. The filters are used<br />

to attenuate the luminous flux obtained without a<br />

sample, which renders it possible to reduce the ratio<br />

between the signals recorded with <strong>and</strong> without a sample<br />

to values ranging between 1 <strong>and</strong> 30. This has the<br />

advantage that the same amplifier setting can be used<br />

for both signals. The attenuation provided by the grey<br />

filters must be known with high accuracy . These<br />

calibrations are performed in situ, with all densitometer<br />

386 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Buhr et al.


components present to include possible effects <strong>of</strong> interreflections.<br />

The measurement procedure is straightforward. First,<br />

the measurement with the sample is performed using<br />

an appropriate amplifier setting. The second<br />

measurement is conducted with the sample removed <strong>and</strong><br />

with a suitable grey filter inserted. The density value<br />

obtained corresponds to the difference between sample<br />

density <strong>and</strong> the known grey filter density . The signalto-noise<br />

ratio is high enough to measure diffuse densities<br />

up to about D = 6 with sufficient accuracy . The light<br />

flux emitted by the tungsten lamp is recorded with an<br />

additional photodiode to detect possible changes <strong>of</strong> the<br />

light flux that might occur between the measurement<br />

with <strong>and</strong> without a sample.<br />

Measurement Uncertainty<br />

Intercomparison measurements between the inverse<br />

square law densitometer <strong>and</strong> the fiber densitometer<br />

have shown that the values indicated by both devices<br />

agree for spectrally neutral samples within the<br />

measurement uncertainty <strong>of</strong> the inverse square law<br />

densitometer. This is confirmed by the measurement<br />

uncertainty analysis. The repeatability <strong>of</strong> measurements<br />

(k = 2) is better than 0.002 for densities below 2, for<br />

densities between 2 <strong>and</strong> 4, U(D) = 0.002, <strong>and</strong> for<br />

densities above 4, U(D) = 0.004. The linearity <strong>of</strong> the type<br />

<strong>of</strong> photodetector used in this densitometer has been<br />

tested to be better than 0.1% within a range <strong>of</strong> two<br />

decades; 10 the contribution to uncertainty due to this<br />

effect is therefore below 0.001 in optical density. The in<br />

situ calibration <strong>of</strong> the attenuation provided by the<br />

neutral grey filters is another source <strong>of</strong> measurement<br />

uncertainty: U(D)=0.002 for densities below 4, <strong>and</strong><br />

U(D) = 0.004 for D > 4. For spectrally neutral samples<br />

the total measurement uncertainty ( k = 2) is<br />

U(D) = 0.003 for densities below 2, U(D) = 0.004 for<br />

24.<br />

In the case <strong>of</strong> non-neutral samples the densities<br />

measured with the fiber densitometer may differ<br />

significantly from that measured with the inverse<br />

square law densitometer; these differences might be due<br />

to the worse match <strong>of</strong> the spectral product <strong>of</strong> the fiber<br />

densitometer.<br />

Conclusions<br />

We have developed <strong>and</strong> set up two densitometers that<br />

fulfill the ISO geometric <strong>and</strong> spectral conditions for the<br />

measurement <strong>of</strong> visual diffuse optical densities.<br />

However, relatively great effort was necessary to meet<br />

the ISO geometric conditions; an opal glass alone serving<br />

as the diffuser was not sufficient to meet both the<br />

reflectance <strong>and</strong> the diffusivity conditions. Thin opal<br />

glasses may have the proper reflectance factor, but their<br />

diffusion coefficient is low, whereas thick opal glasses,<br />

where diffusion coefficients are large enough have<br />

reflectance factors that exceed the specified value <strong>of</strong> 0.55<br />

by more than the permissible tolerance.<br />

The intercomparisons between both PTB densitometers<br />

have shown that the single-beam instrument<br />

which is not a null-balance device, furnishes the same<br />

results as the sophisticated dual-beam inverse square<br />

law densitometer. It is possible to build a st<strong>and</strong>ard<br />

reference densitometer with the much simpler geometric<br />

<strong>and</strong> optical arrangement <strong>of</strong> a single-beam device. This<br />

device should be able to meet the customer ’s dem<strong>and</strong>s<br />

with regard to measuring range, measurement accuracy<br />

<strong>and</strong> also calibration cost.<br />

Intercomparison measurements with NIST’ s newly<br />

established st<strong>and</strong>ard densitometer 11 have been<br />

performed. The results <strong>of</strong> these intercomparison<br />

experiments will soon be submitted for publication in<br />

this <strong>Journal</strong>.<br />

References<br />

1. ISO 5-1: Photography - Density measurements - Part 1: Terms, symbols<br />

<strong>and</strong> notations, 1984.<br />

2. ISO 5-2: Photography - Density measurements - Part 2: Geometric<br />

conditions for transmission density, 1991.<br />

3. ISO 5-3: Photography - Density measurements - Part 3: Spectral conditions,<br />

1984.<br />

4. ISO 5-4: Photography - Density measurements - Part 4: Geometric<br />

conditions for reflection density, 1983.<br />

5. E. Buhr, D. Hoeschen <strong>and</strong> D. Bergmann, The Measurement <strong>of</strong> Diffuse<br />

Optical Densities. Part I: The Diffusion Coefficient, J. <strong>Imaging</strong><br />

Sci. Technol. 39, 453 (1995).<br />

6. Revision <strong>of</strong> ISO 5-2, ISO/DIS 5-2, 1998.<br />

7. CIE publication no. 53 (TC-2.2): Methods <strong>of</strong> characterizing the performance<br />

<strong>of</strong> radiometers <strong>and</strong> photometers, Paris, 1982, sect. 3.2.3.<br />

8. Guide to the expression <strong>of</strong> uncertainty in measurement, ISO, Geneva,<br />

1993.<br />

9. D. Bergmann, Entwicklung und Realisierung eines Einstrahldensitometers<br />

für hohe optische Dichten, Diploma thesis, Fachhochschule<br />

Iserlohn, 1993.<br />

10. K. Stock, PTB department Light <strong>and</strong> Radiation, private communication,<br />

see also in: PT Jahresbericht 1997, Braunschweig, 1998, sect.<br />

2.4.1, p. 222.<br />

11. E. A. Early, T. R. O’Brian, R. D. Saunders, <strong>and</strong> A. C. Parr, Film Step<br />

Tablet St<strong>and</strong>ards <strong>of</strong> Diffuse Visual Transmission Density - SRM 1001<br />

<strong>and</strong> SRM 1008, NIST Special Publication 260-135, Washington,<br />

1998; E. A. Early, C. L. Cromer, X. Xiong, D. J. Dummer, T. R. O’Brien,<br />

<strong>and</strong> A. C. Parr, J. <strong>Imaging</strong>. Sci. Technol. 43, 388 (1999).<br />

The Measurement <strong>of</strong> Diffuse Optical Densities.Part II: ... <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 387


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

NIST Reference Densitometer for Visual Diffuse Transmission Density<br />

Edward A. Early, Christopher L. Cromer, Xiaoxiong Xiong, Daniel J. Dummer, Thomas R. O’Brian, <strong>and</strong> Albert C. Parr<br />

Optical <strong>Technology</strong> Division, National Institute <strong>of</strong> St<strong>and</strong>ards <strong>and</strong> <strong>Technology</strong>, Gaithersburg, Maryl<strong>and</strong><br />

The Optical <strong>Technology</strong> Division <strong>of</strong> the National Institute <strong>of</strong> St<strong>and</strong>ards <strong>and</strong> <strong>Technology</strong> has developed a new reference densitometer<br />

for measuring visual diffuse transmission densities using the diffuse influx mode. This densitometer is used to calibrate both<br />

x-ray <strong>and</strong> photographic film step tablet St<strong>and</strong>ard Reference <strong>Material</strong>s. The design, characterization, <strong>and</strong> operation <strong>of</strong> the densitometer<br />

are detailed. The densitometer was fully characterized both to verify compliance with the applicable documentary st<strong>and</strong>ards<br />

<strong>and</strong> to determine the combined uncertainty in transmission density associated with the calibrations.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 388–397 (1999)<br />

Visual diffuse transmission density is an important<br />

physical property for exposed films, <strong>and</strong> therefore has<br />

great industrial dem<strong>and</strong> for process control in the fields<br />

<strong>of</strong> medicine, non-destructive testing, photography, <strong>and</strong><br />

graphic arts. St<strong>and</strong>ards for visual diffuse transmission<br />

density are provided by the National Institute <strong>of</strong> St<strong>and</strong>ards<br />

<strong>and</strong> <strong>Technology</strong> (NIST) in the form <strong>of</strong> St<strong>and</strong>ard<br />

Reference <strong>Material</strong>s (SRMs). These st<strong>and</strong>ards are film<br />

step tablets, 254 mm long by 35 mm wide, with steps<br />

extending the width <strong>of</strong> each film <strong>and</strong> equally spaced<br />

along its length. A double emulsion x-ray film is used<br />

for SRM 1001, while a single emulsion photographic film<br />

is used for SRM 1008. The steps have increasing visual<br />

diffuse transmission densities from approximately 0.1<br />

to 4 from one end <strong>of</strong> the film to the other. SRM 1001 has<br />

17 steps, while SRM 1008 has 23 steps.<br />

The visual diffuse transmission densities <strong>of</strong> film step<br />

tablets for both SRMs are determined with a new reference<br />

densitometer using the diffuse influx mode. Diffuse<br />

illumination is achieved with a lamp, filter , <strong>and</strong><br />

flash opal, while directional detection is accomplished<br />

with a lens, filter, <strong>and</strong> photodiode system. The densitometer<br />

is designed to automatically measure many films<br />

using computerized data acquisition <strong>and</strong> control.<br />

This article states the relevant measurement equations<br />

for determining visual diffuse transmission density,<br />

describes the densitometer’s design <strong>and</strong> operation,<br />

<strong>and</strong> details the characterization <strong>of</strong> the densitometer <strong>and</strong><br />

the resulting uncertainties in the measurement. <strong>Additional</strong><br />

details can be found in Ref. 1.<br />

Measurement Equations<br />

The purpose <strong>of</strong> the measurement equation derived in<br />

this section is to obtain a mathematical description <strong>of</strong><br />

the measurement <strong>of</strong> visual diffuse transmission density.<br />

This is useful for calculating the transmission density<br />

Original manuscript received December 7, 1998<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

from the experimental results, for determining the uncertainty<br />

in these values, <strong>and</strong> for relating measurements<br />

made with the densitometer to those that would be made<br />

by an ideal densitometer—one that exactly conforms to<br />

all the relevant documentary st<strong>and</strong>ards.<br />

As specified in the documentary st<strong>and</strong>ards, 2–4 visual<br />

diffuse transmission density is essentially a photopic<br />

transmission measurement using a hemispherical/directional<br />

geometry, with the added complication that the<br />

transmission is determined with the sample in contact<br />

with an opal. Therefore, the nomenclature <strong>and</strong> equations<br />

from photometry <strong>and</strong> spectrophotometry will be<br />

used as much as possible to derive the measurement<br />

equation.<br />

Following the nomenclature given in Refs. 2 <strong>and</strong> 5,<br />

visual diffuse transmission density is determined from<br />

two luminous fluxes, the aperture flux Φ j <strong>and</strong> the transmitted<br />

flux Φ τ . The first is the flux emerging from the<br />

sampling aperture in the directions <strong>and</strong> parts <strong>of</strong> the<br />

spectrum used in the measurement; the second is the<br />

flux that passes through the sample, emerging from a<br />

surface other than that on which the incident flux falls,<br />

<strong>and</strong> then used in the measurement. In terms <strong>of</strong> these<br />

fluxes, the visual diffuse transmittance factor T v is given<br />

by<br />

T V<br />

= Φ Φτ<br />

<strong>and</strong> the visual diffuse transmission density D T is defined<br />

by<br />

j<br />

(1)<br />

D T = – log 10 T V . (2)<br />

To this point, neither the spatial nor spectral properties<br />

<strong>of</strong> the fluxes have been specified. For the spatial<br />

properties, some nomenclature must first be defined.<br />

The incident flux is referred to as the influx, while the<br />

transmitted flux is referred to as the efflux. These fluxes<br />

can either be hemispherical (in all directions) or directional<br />

(in one specified direction). For visual diffuse<br />

transmission density, there are two possible equivalent<br />

measurement geometries, with equivalence being as-<br />

388


sumed by the Helmholtz reciprocity theorem.<br />

6<br />

In the<br />

diffuse influx mode the influx is diffuse <strong>and</strong> detection<br />

<strong>of</strong> the efflux is directional; in the diffuse efflux mode<br />

the influx is directional <strong>and</strong> detection <strong>of</strong> the efflux is<br />

diffuse. 3 Using the terminology from spectrophotometry,<br />

these geometries are hemispherical/directional <strong>and</strong> directional/hemispherical,<br />

respectively.<br />

For visual diffuse transmission density, the spectral<br />

product <strong>of</strong> the influx <strong>and</strong> the detector are specified 4 so<br />

that the integral is a luminous flux. In general, luminous<br />

flux Φ v [lm] is defined as<br />

Φ V = K m • ∫ dλ S(λ) • V λ (λ), (3)<br />

where K m = 683 lm/W is the maximum spectral luminous<br />

efficacy for photopic vision, λ [nm] is the wavelength,<br />

S(λ) [W/nm] is the spectral flux distribution, <strong>and</strong><br />

V λ (λ) is the spectral luminous efficiency function. For<br />

visual diffuse transmission density , the spectral flux<br />

distribution <strong>of</strong> the incident flux is denoted by S H (λ) <strong>and</strong><br />

the relative spectral response function V(λ) <strong>of</strong> the detection<br />

system is denoted by V T (λ). Note that V(λ) is a<br />

normalized, unitless function, as is V λ (λ). S H (λ) is based<br />

on the spectral flux distribution <strong>of</strong> CIE St<strong>and</strong>ard<br />

Illuminant A, S A (λ), modified at infrared wavelengths<br />

to protect the sample <strong>and</strong> optical elements from excessive<br />

heat, <strong>and</strong> V T (λ) is defined so that<br />

S H (λ) • V T (λ) = S A (λ) • V λ (λ). (4)<br />

Therefore, because the spectral product on the righth<strong>and</strong>-side<br />

<strong>of</strong> Eq. 4 is the same as that integrated in Eq.<br />

3, visual diffuse transmission density is determined from<br />

luminous fluxes.<br />

In terms <strong>of</strong> the definitions <strong>and</strong> concepts presented in<br />

the previous paragraph, the densitometer measures visual<br />

diffuse transmission density using the diffuse influx<br />

mode. The important components <strong>of</strong> the densitometer are<br />

shown in Fig. 1, as well as a spherical coordinate system.<br />

The film step tablet is in contact with the opal that<br />

provides an influx with a hemispherical geometry <strong>and</strong><br />

a spectral flux distribution S H (λ). The efflux is collected<br />

within an acceptance cone at normal incidence to the<br />

film surface <strong>and</strong> having a half-angle κ less than 10 °,<br />

<strong>and</strong> with a relative spectral response function V T (λ). The<br />

aperture stop <strong>of</strong> the optical system is the collecting lens,<br />

while the opal is the aperture that defines the aperture<br />

flux. Using the functional notation specified in Refs. 2,<br />

3, <strong>and</strong> 5, the measured visual diffuse transmission density<br />

is described by<br />

D T (90° opal; S H :≤ 10°;V T ). (5)<br />

The aperture flux Φ j measured by the densitometer is<br />

given by<br />

Ij<br />

Φj = Km ⋅∫<br />

dAj∫<br />

dΩj∫<br />

dλLj( Aj, θj, φ j; λ) ⋅ V( λ)<br />

=<br />

R<br />

, (6)<br />

j<br />

where A j [m 2 ] is the area over which the aperture flux<br />

emerges, Ω j [sr] is the projected solid angle over which<br />

the aperture flux is collected, θ j <strong>and</strong> φ j are the polar <strong>and</strong><br />

azimuth angle, respectively, <strong>of</strong> the aperture flux, L j<br />

[W/(m 2 sr nm)] is the aperture spectral radiance from<br />

the opal, I j [A] is the current from the photodiode for<br />

the aperture flux, <strong>and</strong> R j [A/lm] is the photometric<br />

responsivity <strong>of</strong> the detector. For a Lambertian spectral<br />

radiance, the integrals over A j <strong>and</strong> Ω j yield the throughput<br />

<strong>of</strong> the densitometer. An immediate simplifying assumption<br />

for Eq. 6 is that the spectral radiance L j is<br />

Figure 1. Schematic diagram <strong>of</strong> the important components <strong>of</strong><br />

the visual diffuse transmission densitometer.<br />

uniform over the area A j , <strong>and</strong> that A j is small enough so<br />

that Ω j is the same at all points <strong>of</strong> this area. This is<br />

reasonable because the flux from the opal varies by less<br />

than 8% from its value at the center <strong>and</strong> the opal is<br />

much smaller than the aperture stop <strong>of</strong> the detection<br />

system. Then, Eq. 6 becomes<br />

Ij<br />

Φj = Km ⋅Aj⋅∫<br />

dΩj∫<br />

dλLj( Aj, θj, φ j; λ) ⋅ V( λ)<br />

=<br />

R<br />

. (7)<br />

j<br />

Similarly, the transmitted flux Φ τ measured by the densitometer<br />

is given by<br />

Ω<br />

Iτ<br />

= Km ⋅A ⋅∫<br />

dΩ<br />

∫ d λL ( θ , φ ; λ) ⋅ V( λ)<br />

=<br />

R<br />

, (8)<br />

τ τ τ τ τ τ<br />

where A τ [m 2 ] is the area over which the transmitted<br />

flux emerges, Ω τ [sr] is the projected solid angle over<br />

which the transmitted flux is collected, θ τ <strong>and</strong> φ τ are the<br />

polar <strong>and</strong> azimuth angle, respectively, <strong>of</strong> the transmitted<br />

flux, L τ [W/(m 2 sr nm)] is the transmitted spectral<br />

radiance from the sample, I τ [A] is the current from the<br />

photodiode from the transmitted flux, <strong>and</strong> R τ [A/lm] is<br />

the photometric responsivity <strong>of</strong> the detector . The<br />

transimpedance amplifier with gain G [V/A] converts<br />

the current from the photodiode to a voltage signal N [V]<br />

for both fluxes.<br />

The sample has a spectral hemispherical/directional<br />

transmittance τ(2π; θ τ , φ τ ; λ), where 2π indicates that the<br />

incident flux is over the entire hemisphere. This transmittance<br />

is related to the bi-directional transmittance<br />

distribution function (BTDF) f t (θ i , φ i ; θ τ , φ τ ; λ) [sr –1 ] by<br />

τ<br />

NIST Reference Densitometer for Visual Diffuse Transmission Density <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 389


1<br />

τ( 2π; θτ, φτ; λ) = ⋅∫ f t ( θ i , φ i ; θτ, φτ; λ)<br />

dΩ i , (9)<br />

π<br />

where the integral <strong>of</strong> the projected solid angle is over<br />

the entire hemisphere. Note that the BTDF is the transmittance<br />

analog <strong>of</strong> BRDF, <strong>and</strong> relates the incident irradiance<br />

to the transmitted radiance. As specified in the<br />

documentary st<strong>and</strong>ards, the sample is in contact with<br />

the opal, 3 <strong>and</strong> therefore the radiant flux transmitted by<br />

the sample also includes flux from the inter-reflections<br />

between the sample <strong>and</strong> the opal. This situation is described<br />

by the spectral hemispherical/directional transmittance<br />

factor T(2π; θ τ , φ τ ; λ), that depends on both the<br />

spatial <strong>and</strong> spectral variables <strong>and</strong> is given by<br />

τ( 2π; θτ, φτ; λ)<br />

T( 2πθ ; τ, φτ; λ)<br />

=<br />

1 − ρo( 2π; θτ, φτ; λ) ⋅ ρ( 2π; θτ, φτ; λ)<br />

. (10)<br />

The spectral hemispherical/directional reflectance <strong>of</strong> the<br />

opal <strong>and</strong> sample are ρ o (2π; θ τ , φ τ ; λ) <strong>and</strong> ρ(2π; θ τ , φ τ ; λ),<br />

respectively. Thus, the transmitted spectral radiance L τ<br />

is<br />

Lτ( θτ, φτ; λ) = Lj( 2π; λ) ⋅T( 2 π; θτ, φτ; λ)<br />

, (11)<br />

where L j (2π; λ) is the spectral radiance incident on the<br />

sample from the entire hemisphere. As with transmittance,<br />

the spectral hemispherical/directional transmittance<br />

factor is related to the bi-directional transmittance<br />

factor distribution function (BTFDF) f T (θ i , φ i ; θ τ , φ τ ; λ)<br />

[sr –1 ] by<br />

1<br />

T( 2πθ ; τ, φτ; λ) = ⋅∫ fT( θi, φi; θτ, φτ; λ)<br />

dΩ i . (12)<br />

π<br />

Combining Eqs. 7, 8, <strong>and</strong> 11, the visual diffuse transmittance<br />

factor T v measured by the densitometer is given<br />

by<br />

T<br />

v<br />

Φτ<br />

= =<br />

Φ<br />

j<br />

Aτ ⋅ ∫ dΩτ∫<br />

dλ Lj( 2π; λ) ⋅T( 2 π; θτ, φτ; λ) ⋅V( λ)<br />

N Gj<br />

R<br />

τ<br />

j .(13)<br />

= ⋅ ⋅<br />

A ⋅ ∫ dΩ<br />

∫ dλ L ( θ , φ ; λ) ⋅ V( λ)<br />

N G R<br />

j j j j j j<br />

The analysis is simplified by assuming that the spatial<br />

<strong>and</strong> spectral variables can be separated in Eq. 13, which<br />

is equivalent to assuming that the spatial properties <strong>of</strong> T<br />

<strong>and</strong> L j<br />

are independent <strong>of</strong> wavelength. Therefore, Eq. 13<br />

becomes<br />

A ∫ dΩ<br />

lj<br />

⋅T<br />

τ τ ( 2π) ( 2π; θτ, φτ)<br />

∫ d λS( λ) ⋅T( λ) ⋅V( λ)<br />

Tv<br />

= ⋅<br />

⋅<br />

Aj<br />

∫ dΩ<br />

jlj( θj, φj) ∫ dλS( λ) ⋅V( λ)<br />

, (14)<br />

where l j (2π) <strong>and</strong> l j (θ j , φ j ) [1/(m 2 sr)] are the relative spatial<br />

radiance distributions over the entire hemisphere<br />

<strong>and</strong> within the acceptance cone, respectively, T(2π; θ τ , φ τ )<br />

is the spatial transmittance factor, <strong>and</strong> T(λ) is the spectral<br />

transmittance factor.<br />

For the ideal densitometer, the relative spatial radiance<br />

distribution l j (θ i , φ i ) is constant for all angles, the<br />

spectral flux distribution is S A (λ), <strong>and</strong> the relative spectral<br />

response function is V λ (λ). The ideal visual diffuse<br />

transmittance function T v,id is then given by<br />

τ<br />

τ<br />

T<br />

v,id<br />

Aτ ∫ dΩτ T( 2πθ ; τ, φτ)<br />

∫ d λSA( λ) ⋅To( λ) ⋅Vλ<br />

( λ)<br />

= ⋅ ⋅<br />

, (15)<br />

Aj<br />

∫ dΩ<br />

j ∫ dλSA<br />

( λ) ⋅Vλ<br />

( λ)<br />

where T o (λ) is the spectral transmittance factor for an<br />

opal with a reflectance specified in the documentary<br />

st<strong>and</strong>ards. The spatial <strong>and</strong> spectral terms <strong>of</strong> Eqs. 14<br />

<strong>and</strong> 15 are given by the first two fractions <strong>and</strong> the last<br />

fraction, respectively. For the spectral term, the spectral<br />

correction factor C s is given by<br />

Tv,id<br />

∫ d λSA( λ) ⋅To( λ) ⋅Vλ<br />

( λ)<br />

∫ d λS( λ) ⋅V( λ)<br />

Cs<br />

= =<br />

⋅<br />

Tv<br />

∫ d λS( λ) ⋅T( λ) ⋅V( λ)<br />

∫ dλSA<br />

( λ) ⋅Vλ<br />

( λ) . (16)<br />

For the spatial terms, the geometrical correction factor<br />

C g is given by<br />

Tv,id<br />

∫ dΩτ T( 2πθ<br />

; τ, φτ)<br />

∫ dΩ<br />

jlj( θj, φj)<br />

Cg<br />

= =<br />

⋅<br />

, (17)<br />

Tv<br />

∫ dΩτ lj( 2π) ⋅T( 2π; θτ, φτ)<br />

∫ dΩ<br />

j<br />

which in terms <strong>of</strong> the BTFDF from Eq. 12, is<br />

∫ dΩτ ∫ dΩi fT( θi, φi; θτ, φτ)<br />

∫ dΩ<br />

jlj( θj, φj) Cg<br />

=<br />

⋅<br />

. (18)<br />

∫ dΩτ ∫ dΩi lj( θi, φi) ⋅ fT( θi, φi; θτ, φτ)<br />

∫ dΩ<br />

j<br />

Therefore, C g depends on both the relative spatial radiance<br />

distribution <strong>of</strong> the incident radiant flux <strong>and</strong> on the<br />

transmitting properties <strong>of</strong> the sample.<br />

Consider two extreme examples. First, assume that<br />

the sample does not scatter the incident flux, but simply<br />

absorbs it. Then, f T is given by<br />

2 2<br />

T i i<br />

f<br />

= 2 ⋅T( λ) ⋅δ(sin θτ −sin θ ) ⋅δ( φτ − π ± φ ), (19)<br />

where δ(x) is the Dirac delta-function. Performing the<br />

integrals over dΩ i with this expression for f T , Eq. 18<br />

becomes<br />

∫ dΩτ<br />

∫ dΩ<br />

jlj( θj, φj) Cg<br />

= ⋅<br />

, (20)<br />

∫ dΩτ lj( θτ, φτ)<br />

∫ dΩ<br />

j<br />

which, for the reasonable assumption that the acceptance<br />

cones for the aperture <strong>and</strong> transmitted fluxes are<br />

the same, becomes C g = 1. Second, assume that the<br />

sample is a Lambertian diffuser, so that f T = 1/π. Then,<br />

C g becomes<br />

C<br />

g<br />

∫ dΩi<br />

∫ dΩ<br />

jlj( θj, φ j)<br />

= ⋅<br />

, (21)<br />

∫ dΩi lj( θi, φi)<br />

∫ dΩ<br />

j<br />

where, assuming that the relative spatial radiance distribution<br />

is Lambertian within the acceptance cone, reduces<br />

to<br />

∫ dΩi<br />

1<br />

Cg<br />

= = , (22)<br />

∫ dΩ i lj( θi, φi)<br />

d<br />

where d is the diffusion coefficient for the opal. From<br />

these two extreme cases, the range <strong>of</strong> C g is 1 ≤ C g ≤ 1/d.<br />

Finally, the visual diffuse transmittance <strong>of</strong> the sample<br />

measured with an ideal densitometer, τ v,id , is given by<br />

τ<br />

v,id<br />

∫ d λSA<br />

( λ) ⋅τ( λ) ⋅Vλ<br />

( λ)<br />

=<br />

, (23)<br />

∫ dλSA<br />

( λ) ⋅V<br />

( λ)<br />

λ<br />

390 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Early et al.


where τ(λ) is the spectral transmittance <strong>of</strong> the sample.<br />

The transmittance correction factor C t is then given<br />

by<br />

C<br />

t<br />

τv,id<br />

d SA<br />

V<br />

= =<br />

∫ λ ( λ) ⋅τ( λ) ⋅ λ ( λ)<br />

T ∫ dλS ( λ) ⋅T( λ) ⋅V<br />

( λ) . (24)<br />

v,id<br />

Combining, Eqs. 13, 16, <strong>and</strong> 17, the visual diffuse<br />

transmittance factor <strong>of</strong> a sample measured on an ideal<br />

densitometer in terms <strong>of</strong> the measurements <strong>and</strong> characteristics<br />

<strong>of</strong> the actual densitometer is given by<br />

A<br />

T = T ⋅C ⋅C<br />

v,id V S g<br />

N G R<br />

τ j j<br />

= ⋅ ⋅ ⋅<br />

N G R C S⋅<br />

C<br />

j<br />

τ<br />

τ<br />

λ<br />

g<br />

(25)<br />

<strong>and</strong>, including Eq. 24, the visual diffuse transmittance<br />

<strong>of</strong> a sample measured by an ideal densitometer without<br />

an opal in contact with the sample is given by<br />

τ<br />

= T ⋅C<br />

N G<br />

v,id v,id t<br />

R<br />

R C C C . (26)<br />

τ j j<br />

= ⋅ ⋅ ⋅ S⋅ g ⋅ t<br />

Nj<br />

Gτ<br />

τ<br />

Note that because all three correction factors are ratios,<br />

only relative values <strong>of</strong> the integrated quantities<br />

are needed.<br />

By combining Eqs. 2 <strong>and</strong> 13, the visual diffuse transmission<br />

density measured by the densitometer is given<br />

by<br />

D<br />

T<br />

⎛ Φ j⎞<br />

Nj<br />

G R<br />

=− TV<br />

= ⎜ ⎟<br />

⎝ ⎠<br />

= ⎛<br />

N<br />

⋅ G<br />

⋅<br />

⎞<br />

τ τ<br />

log10 log10 log10<br />

Φ<br />

⎜<br />

⎝ j R<br />

⎟ , (27)<br />

τ τ j⎠<br />

which is used both to calculate D T from the experimental<br />

values <strong>and</strong> to determine the uncertainty in D T from<br />

the uncertainties in the variables. By combining Eqs.<br />

25 <strong>and</strong> 27, the visual diffuse transmission density for<br />

an ideal densitometer D T,id is given by<br />

D T,id = D T – log 10 (C S ) – log 10 (C g ), (28)<br />

which is also used to calculate the uncertainty in D T<br />

due to the non-ideal characteristics <strong>of</strong> the actual densitometer.<br />

Finally, the visual diffuse transmittance density<br />

for an ideal densitometer without an opal, from Eqs.<br />

25 to 28, is given by<br />

D τ,id = D T – log 10 (C S ) – log 10 (C g ) – log 10 (C t ). (29)<br />

For convenience, visual diffuse transmission density will<br />

<strong>of</strong>ten be referred to simply as transmission density for<br />

the remainder <strong>of</strong> the paper.<br />

Description <strong>and</strong> Operation <strong>of</strong> the Densitometer<br />

The densitometer was designed <strong>and</strong> built to automatically<br />

measure the visual diffuse transmission density <strong>of</strong> each<br />

step <strong>of</strong> film step tablets using computerized data acquisition<br />

<strong>and</strong> control. A side view <strong>of</strong> the mechanical, optical,<br />

<strong>and</strong> electrical components <strong>of</strong> the densitometer, as well as<br />

the connections between them <strong>and</strong> the optical path from<br />

the lamp housing to the detector, is shown in Fig. 2. The<br />

densitometer is conveniently divided into three systems:<br />

source, film transport, <strong>and</strong> detector.<br />

The source system provides diffuse illumination to the<br />

film step tablet with spectral flux distribution S(λ), using<br />

a lamp <strong>and</strong> housing, an infrared filter assembly , a<br />

shutter, <strong>and</strong> an opal. A 100 W quartz-tungsten-halogen<br />

lamp is contained in the lamp housing <strong>and</strong> operated at<br />

a constant dc current from the lamp power supply . An<br />

elliptical reflector focuses the light from this lamp at<br />

approximately the position <strong>of</strong> the opal. The infrared filter<br />

consists <strong>of</strong> a flow <strong>of</strong> chilled water between two glass<br />

plates; the top optical filter is chosen so that the transmittance<br />

<strong>of</strong> the infrared filter modifies the spectral flux<br />

distribution from the lamp to one closely approximating<br />

S H (λ). The lamp housing is also cooled with chilled<br />

water, <strong>and</strong> if the flow <strong>of</strong> water is interrupted, the flow<br />

meter disables the power supply, preventing the infrared<br />

filter from overheating. An electronically controlled<br />

shutter blocks all light from reaching the opal for a<br />

measurement <strong>of</strong> the dark signal. A flash opal with a diameter<br />

<strong>of</strong> 3 mm <strong>and</strong> a thickness <strong>of</strong> 1.5 mm is the source<br />

<strong>of</strong> diffuse illumination. The opal is mounted in a sleeve<br />

<strong>and</strong> the top is centered in <strong>and</strong> flush with the vacuum<br />

plate described below. Black enamel paint is applied to<br />

the sides <strong>of</strong> the opal so that all the influx originates<br />

from the top <strong>of</strong> the opal, which defines the sampling<br />

aperture.<br />

The film transport system picks up film from a tray<br />

using a holder, positions the film to measure the transmission<br />

density <strong>of</strong> each step, <strong>and</strong> drops the film in another<br />

tray. A top view <strong>of</strong> this system is shown in Fig. 3.<br />

The film holder is attached to a vertical spring-loaded<br />

stage on a vertical translation stage, that in turn is attached<br />

to a horizontal translation stage. The film holder<br />

<strong>and</strong> translation stages move the film to the appropriate<br />

locations. A vacuum holds the film on the holder <strong>and</strong><br />

brings the film into direct contact with the opal. The<br />

vacuum is applied through solenoids, <strong>and</strong> an additional<br />

solenoid brings air into the holder when the film is<br />

dropped in the tray. The film holder has a groove along<br />

its outer edge, so that when the holder is in contact with<br />

a film <strong>and</strong> vacuum is applied to this groove, the film is<br />

attached to the holder <strong>and</strong> can be moved. When a film is<br />

on the vacuum plate <strong>and</strong> a vacuum is applied, small holes<br />

in the vacuum plate pull the film down onto the opal.<br />

The detector system collects <strong>and</strong> detects the radiant<br />

flux from the opal or the step. The lenses collect the<br />

flux within the acceptance cone, collimate it through a<br />

photopic filter, <strong>and</strong> focus it onto a Si photodiode detector.<br />

A transimpedance amplifier converts the current from the<br />

photodiode to a voltage, that is then measured with a<br />

digital voltmeter. A baffle with a diameter <strong>of</strong> 10 mm reduces<br />

scattered light in the detector system. The spectral<br />

transmittance <strong>of</strong> the photopic filter is such that, in<br />

combination with the spectral responsivity <strong>of</strong> the photodiode,<br />

the spectral response function <strong>of</strong> the detector<br />

system closely approximates V λ (λ). The photopic filter<br />

is slightly tilted so that the light reflected from it does<br />

not travel back down to the opal. The 4 mm by 4 mm Si<br />

photodiode is contained in a package that provides thermoelectric<br />

temperature control <strong>and</strong> transimpedance amplification<br />

with a gain that can be selected either<br />

manually or automatically. The aperture stop <strong>of</strong> the<br />

optical system is the collecting lens that defines an acceptance<br />

cone with a half-angle κ = 9.5°. If the opal is<br />

included in the optical system, it is the field stop; if it is<br />

not, the photodiode is the field stop. W ith this second<br />

choice for defining the field stop, the field <strong>of</strong> view has a<br />

NIST Reference Densitometer for Visual Diffuse Transmission Density <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 391


Figure 2. Schematic diagram <strong>of</strong> all the components <strong>of</strong> the visual diffuse transmission densitometer <strong>and</strong> their electrical <strong>and</strong><br />

mechanical connections.<br />

Figure 3. Top view <strong>of</strong> the film transport system <strong>of</strong> the visual diffuse transmission densitometer.<br />

392 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Early et al.


diameter <strong>of</strong> 10 mm at the plane <strong>of</strong> the opal, which is<br />

large enough to capture the entire area from where flux<br />

exits a step.<br />

The films <strong>of</strong> a batch to be measured are loaded into<br />

the film holder. For each film, the holder is moved on<br />

top <strong>of</strong> it <strong>and</strong> the vacuum is applied, attaching the film<br />

to the holder. While the steps <strong>of</strong> the film are centered in<br />

their longitudinal direction (parallel to the short dimension<br />

<strong>of</strong> the film) by the position <strong>of</strong> the holder perpendicular<br />

to its horizontal direction <strong>of</strong> travel, centering<br />

the steps in their transverse direction is accomplished<br />

by optical means. The location <strong>of</strong> the boundary between<br />

the first <strong>and</strong> second steps is found by measuring the<br />

signal as the film is moved horizontally just above the<br />

opal; a 5% decrease in the signal indicates the boundary.<br />

The positions <strong>of</strong> the centers <strong>of</strong> the steps are then<br />

referenced from the location <strong>of</strong> the boundary.<br />

The film is moved away from the opal <strong>and</strong> the aper -<br />

ture signal N j is measured at an amplifier gain G j = 10 5<br />

V/A. The transmitted signal N τ is measured by moving<br />

the film horizontally to center the step on the opal, lowering<br />

the film until it is on top <strong>of</strong> the opal, <strong>and</strong> applying<br />

a vacuum to the vacuum plate while releasing the<br />

vacuum on the film holder. The amplifier gain G τ is selected<br />

to yield a signal between 1 V <strong>and</strong> 12 V. After the<br />

last step is measured, the film is moved over the other<br />

film tray, the vacuum on the holder is released <strong>and</strong> air<br />

is introduced into the line, <strong>and</strong> the film falls onto the<br />

tray. The aperture signal is measured again as described<br />

previously. Dark signals are measured at each amplifier<br />

gain with the shutter closed, <strong>and</strong> these are subtracted<br />

from the signals obtained at that gain to yield<br />

net aperture <strong>and</strong> transmitted signals. The two aperture<br />

signals are averaged, <strong>and</strong> Eq. 27 is used to calculate<br />

the transmission density <strong>of</strong> each step, assuming that<br />

the photometric responsivity <strong>of</strong> the detector was constant<br />

for all the measurements. Note that only the amplifier<br />

gain ratio, G τ /G j , is needed for Eq. 27, not the<br />

absolute values <strong>of</strong> the gains.<br />

A batch <strong>of</strong> films is measured on three separate occasions,<br />

<strong>and</strong> the average transmission density <strong>of</strong> each step<br />

is reported on the calibration certificate that accompanies<br />

each film step tablet SRM. The st<strong>and</strong>ard deviation<br />

<strong>of</strong> the transmission density must be less than the exp<strong>and</strong>ed<br />

uncertainty due to r<strong>and</strong>om effects detailed below.<br />

Proper operation <strong>of</strong> the densitometer is verified by<br />

including in each batch several check st<strong>and</strong>ard films<br />

that were measured previously.<br />

Densitometer Characterization <strong>and</strong> Uncertainties<br />

The densitometer was thoroughly characterized, not<br />

only to ensure proper operation, but also to verify compliance<br />

with the applicable documentary st<strong>and</strong>ards for<br />

measuring visual diffuse transmission density. 2–4 These<br />

st<strong>and</strong>ards specify both the geometrical <strong>and</strong> spectral conditions<br />

for this measurement. The characterization also<br />

determines the uncertainties in the measurements, that<br />

are analyzed following the guidelines given in Ref. 7.<br />

In general, the purpose <strong>of</strong> a measurement is to determine<br />

the value <strong>of</strong> a measur<strong>and</strong> y. This result may be<br />

obtained from n other quantities x i through the functional<br />

relationship f, given by<br />

y = f (x 1 , x 2 ,...,x i ,...,x n ). (30)<br />

The st<strong>and</strong>ard uncertainty <strong>of</strong> an input quantity x i is the<br />

estimated st<strong>and</strong>ard deviation associated with this quantity<br />

<strong>and</strong> is denoted by u(x i ). The relative st<strong>and</strong>ard uncertainty<br />

is given by u(x i )/x i . The st<strong>and</strong>ard uncertainties<br />

may be classified either by the effect <strong>of</strong> their source<br />

or by their method <strong>of</strong> evaluation. The effects are either<br />

r<strong>and</strong>om or systematic; the r<strong>and</strong>om effect arising from<br />

stochastic temporal or spatial variations in the measurement,<br />

<strong>and</strong> the systematic effect from recognized effects<br />

on a measurement. The method <strong>of</strong> evaluation is either<br />

Type A, which is based on statistical analysis, or T ype<br />

B, which is based on other means.<br />

To first order, the estimated st<strong>and</strong>ard uncertainty u(y)<br />

in the measur<strong>and</strong>, due to a st<strong>and</strong>ard uncertainty u(x i )<br />

is<br />

∂f<br />

uy ( ) = ⋅<br />

x<br />

ux ( i)<br />

∂<br />

, (31)<br />

where ∂f/∂x i is the sensitivity coefficient. The combined<br />

st<strong>and</strong>ard uncertainty u c (y) in the measur<strong>and</strong> is the rootsum-square<br />

<strong>of</strong> the st<strong>and</strong>ard uncertainties associated<br />

with each quantity x i , assuming that these st<strong>and</strong>ard uncertainties<br />

are uncorrelated. The exp<strong>and</strong>ed uncertainty<br />

U is given by k·u c (y), where k is the coverage factor <strong>and</strong><br />

is chosen on the basis <strong>of</strong> the desired level <strong>of</strong> confidence<br />

to be associated with the interval defined by U.<br />

The components <strong>of</strong> uncertainty are conveniently divided<br />

into those arising from the operation <strong>of</strong> the densitometer,<br />

compliance with the st<strong>and</strong>ards, <strong>and</strong> the<br />

properties <strong>of</strong> the densitometer <strong>and</strong> the films. In the first<br />

case, the appropriate form <strong>of</strong> the measurement equation<br />

is Eq. 27. Expressing Eq. 27 as<br />

i<br />

D T = log 10 (x) (32)<br />

where D T is the transmission density <strong>and</strong> x can be a<br />

signal or the gain ratio, the sensitivity coefficient is<br />

∂D<br />

∂x<br />

T =<br />

0. 434 ⋅<br />

1 . (33)<br />

x<br />

Therefore, the st<strong>and</strong>ard uncertainty u(D T ) due to the<br />

st<strong>and</strong>ard uncertainty u(x) is<br />

ux ( )<br />

uD ( T ) = 0 . 434 ⋅ . (34)<br />

x<br />

Note that the st<strong>and</strong>ard uncertainty <strong>of</strong> D T is proportional<br />

to the relative st<strong>and</strong>ard uncertainty <strong>of</strong> x.<br />

There are several components <strong>of</strong> uncertainty associated<br />

with operation <strong>of</strong> the densitometer <strong>and</strong> calculating<br />

transmission density from Eq. 27. These components<br />

are the accuracy <strong>of</strong> the digital voltmeter , signal noise,<br />

lamp stability, detector linearity, <strong>and</strong> the ratio <strong>of</strong> the<br />

gains.<br />

The uncertainty arising from the accuracy <strong>of</strong> the digital<br />

voltmeter is a systematic effect with a Type B evaluation.<br />

Using the manufacturer’s specifications, the relative<br />

st<strong>and</strong>ard uncertainty <strong>of</strong> N j is 23·10 –6 , while the maximum<br />

relative st<strong>and</strong>ard uncertainty <strong>of</strong> N τ is 77·10 –6 . The<br />

combined relative st<strong>and</strong>ard uncertainty <strong>of</strong> the ratio<br />

N j /N τ is therefore 80·10 –6 which, by using Eq. 34, results<br />

in a st<strong>and</strong>ard uncertainty u(D T )


Figure 4. Relative responsivity (measured signal divided by<br />

actual flux) <strong>of</strong> the photodiode <strong>and</strong> amplifier as a function <strong>of</strong><br />

current at the amplifier gains given in the legend. The horizontal<br />

dotted line indicates the ideal value. T ypical limits <strong>of</strong><br />

the current measured by the densitometer are also indicated.<br />

Figure 5. Normalized signal <strong>of</strong> the efflux from the opal,<br />

divided by the cosine <strong>of</strong> the angle as a function <strong>of</strong> polar<br />

angle. The dotted line indicates the values for a Lambertian<br />

diffuser.<br />

ture flux over the time required to measure a film is<br />

0.002.<br />

The linearity <strong>of</strong> the photodiode-amplifier combination<br />

was measured using the beam addition method.<br />

8<br />

The<br />

relative responsivity, defined as the ratio <strong>of</strong> the measured<br />

signal to the incident flux, was determined at several<br />

amplifier gains <strong>and</strong> is shown in Fig. 4 as a function<br />

<strong>of</strong> current from the photodiode. Also shown are typical<br />

maximum <strong>and</strong> minimum measured currents. The relative<br />

responsivity is close to the ideal value <strong>of</strong> one over the<br />

entire range <strong>of</strong> measured currents. The uncertainty arising<br />

from the detector linearity is a systematic effect with<br />

a Type A evaluation. The maximum relative st<strong>and</strong>ard deviation<br />

<strong>of</strong> the relative responsivity is 0.0028 at a gain <strong>of</strong><br />

10 9 V/A, resulting in a st<strong>and</strong>ard uncertainty u(D T ) = 0.001.<br />

The gain ratios for successive gains were determined<br />

by measuring the voltage output <strong>of</strong> the amplifier at both<br />

gains with the same input current. Combinations <strong>of</strong><br />

these ratios were then used to calculate the ratio <strong>of</strong> each<br />

gain to the gain <strong>of</strong> 10 5 V/A. These calculated gain ratios<br />

that are not exactly powers <strong>of</strong> ten, are used in Eq. 27.<br />

The uncertainty arising from the gain ratio is a systematic<br />

effect with a Type A evaluation. The maximum st<strong>and</strong>ard<br />

uncertainty in the gain ratios is 10 –4 , resulting in<br />

a st<strong>and</strong>ard uncertainty u(D T )


Figure 6. 6°/hemispherical reflectance <strong>of</strong> the opal as a function<br />

<strong>of</strong> wavelength. The dotted line indicates the value specified<br />

in the documentary st<strong>and</strong>ard.<br />

The final properties to consider are spectral, which<br />

result in uncertainties in D T from Eq. 28 through the<br />

spectral correction factor C s . The spectral reflectance <strong>of</strong><br />

the opal ρ o (λ) is specified 4 to be 0.55 ± 0.05. The 6°/hemispherical<br />

reflectance <strong>of</strong> flash opals <strong>of</strong> the same type used<br />

in the densitometer was measured in the Spectral Trifunction<br />

Automated Reference Reflectometer facility , 9<br />

<strong>and</strong> is shown in Fig. 6 as a function <strong>of</strong> wavelength. The<br />

spectral reflectance decreases monotonically with wavelength<br />

<strong>and</strong> is within the values specified by the st<strong>and</strong>ard<br />

for wavelengths longer than 490 nm.<br />

The spectral flux distribution <strong>of</strong> the source, S H (λ), is<br />

also specified in Ref. 4. This distribution depends upon<br />

the opal, infrared filter, <strong>and</strong> current through the lamp.<br />

With the type <strong>of</strong> opal, lamp, <strong>and</strong> filter fixed, as well as<br />

the thickness <strong>of</strong> the filter, the only adjustable parameter<br />

is the current. Therefore, the optimal current to achieve<br />

a close approximation <strong>of</strong> S H (λ) was determined experimentally<br />

using the spectroradiometer in the Low-Level<br />

Radiance facility. 11 The best agreement between S H (λ) <strong>and</strong><br />

the measured spectral flux distribution S(λ) was obtained<br />

with a lamp current <strong>of</strong> 7.8 A. The two distributions, normalized<br />

at 560 nm, are shown as a function <strong>of</strong> wavelength<br />

in Fig. 7(a). The spectral flux distribution S(λ) was relatively<br />

insensitive to changes in lamp current <strong>of</strong> 0.1 A.<br />

Because the lamp power supply maintains a constant<br />

current to within 1 mA, this distribution is not expected<br />

to change during measurements.<br />

The relative spectral response function <strong>of</strong> the detector<br />

system, V T (λ), is specified in Ref. 4 to satisfy Eq. 4.<br />

The spectral responsivity <strong>of</strong> the photodiode was measured<br />

in the Spectral Comparator facility , 12 while the<br />

spectral transmittance <strong>of</strong> the photopic filter was measured<br />

in the Regular Spectral Transmittance facility. 13<br />

The relative spectral response function V(λ) <strong>of</strong> the densitometer,<br />

from the product <strong>of</strong> the responsivity <strong>and</strong><br />

transmittance, is shown as a function <strong>of</strong> wavelength in<br />

Fig. 7(b), as well as V T (λ). The relative spectral response<br />

function closely approximates V λ (λ). Because V λ (λ) is<br />

widely used, <strong>and</strong> because no filter could be readily found<br />

to correctly modify the relative spectral response function,<br />

no attempt was made to obtain V T (λ). The spectral<br />

product <strong>of</strong> the normalized spectral flux distribution <strong>and</strong><br />

the relative spectral response function, S(λ)·V(λ), is<br />

shown in Fig. 7(c) as a function <strong>of</strong> wavelength, as well<br />

as the specified product S H (λ)·V T (λ).<br />

Figure 7. Normalized spectral flux distribution (a), relative<br />

spectral response function (b), <strong>and</strong> spectral product (c) as a<br />

function <strong>of</strong> wavelength. The dashed lines are the values specified<br />

by the documentary st<strong>and</strong>ards, <strong>and</strong> the solid lines are the<br />

values measured for the densitometer.<br />

To calculate the spectral correction factor from Eq. 16<br />

<strong>and</strong> the transmittance correction factor from Eq. 24, the<br />

spectral transmittance <strong>and</strong> reflectance <strong>of</strong> the steps must<br />

be known to calculate the spectral hemispherical/directional<br />

transmittance factor from Eq. 10. These properties<br />

were measured using a commercial spectrophotometer<br />

for both types <strong>of</strong> film step tablets in unexposed areas<br />

<strong>and</strong> are representative <strong>of</strong> the base films. The spectral<br />

directional/hemispherical reflectance <strong>and</strong> spectral regular<br />

transmittance for both types <strong>of</strong> films are shown in<br />

Fig. 8 as a function <strong>of</strong> wavelength. There is spectral<br />

structure in these properties for the x-ray film, giving<br />

it a blue tint, while the neutral photographic film has<br />

no such spectral structure. The spectral transmittance<br />

will, <strong>of</strong> course, vary between steps, although its spectral<br />

shape is expected to remain similar for all steps <strong>of</strong><br />

the same type <strong>of</strong> film. The spectral reflectance, on the<br />

other h<strong>and</strong>, should remain the same for all steps <strong>of</strong> a<br />

given film type. Therefore, while the correction factors<br />

are calculated using the properties <strong>of</strong> the base films,<br />

there is a possibility <strong>of</strong> some dependence <strong>of</strong> these factors<br />

on the transmission density <strong>of</strong> the step.<br />

The spectral correction factor given by Eq. 16 uses<br />

the actual values for both the opal spectral reflectance<br />

<strong>and</strong> spectral product, <strong>and</strong> compares them with the ideal<br />

NIST Reference Densitometer for Visual Diffuse Transmission Density <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 395


TABLE I. Components <strong>of</strong> Uncertainty <strong>and</strong> the Resulting St<strong>and</strong>ard<br />

Uncertainties in Visual Diffuse Transmission Density.<br />

St<strong>and</strong>ard Uncertainty u(D T )<br />

X-Ray Photographic<br />

Component <strong>of</strong> Uncertainty Effect a) Type b) Film Film<br />

<strong>Vol</strong>tmeter Accuracy S B


yielding log 10 (C t ) = –0.018 <strong>and</strong> –0.021, respectively,<br />

which, from Eq. 10 are independent <strong>of</strong> transmission density<br />

if the reflectance <strong>of</strong> the film is likewise independent.<br />

Therefore, the transmittance density is always<br />

greater than the transmission density because it does<br />

not include the effects <strong>of</strong> inter -reflections between the<br />

opal <strong>and</strong> the step.<br />

Comparisons with other instruments that measure<br />

transmission density by an absolute method (without<br />

relying upon calibrated st<strong>and</strong>ards) are important for<br />

verifying the performance <strong>of</strong> the densitometer described<br />

here. While few such densitometers exist, several comparisons<br />

have been performed due to the new NIST instrument<br />

becoming operational, <strong>and</strong> are described in<br />

detail elsewhere. Briefly, a round-robin comparison<br />

among laboratories in the United States resulted in differences<br />

in transmission density 14 <strong>of</strong> less than 0.04,<br />

while a comparison with the Physikalisch –Technische<br />

Bundesanstalt, the national metrology institute <strong>of</strong> Germany,<br />

found systematic differences 15 <strong>of</strong> less than 0.015.<br />

This later comparison is particularly significant because<br />

it demonstrates good agreement between national metrology<br />

institutes, although the differences in transmission<br />

density are slightly greater than the combined<br />

exp<strong>and</strong>ed uncertainty for the comparison.<br />

Conclusions<br />

A densitometer is operational at NIST for measuring<br />

the visual diffuse transmission density <strong>of</strong> both x-ray<br />

<strong>and</strong> photographic film step tablet St<strong>and</strong>ard Reference<br />

<strong>Material</strong>s using the diffuse influx mode. It is fully automated<br />

so that many films can be measured in one<br />

batch run. Comprehensive characterizations <strong>of</strong> the densitometer<br />

were performed to ensure that it complies<br />

with the relevant documentary st<strong>and</strong>ards for these<br />

measurements with the result that the exp<strong>and</strong>ed uncertainty<br />

(k = 3) for visual diffuse transmission density<br />

is 0.006.<br />

Acknowledgments. Design, construction, <strong>and</strong> characterization<br />

<strong>of</strong> the densitometer benefited from discussions<br />

with Michael R. Goodwin <strong>and</strong> Philip W ychorski <strong>of</strong> the<br />

Eastman Kodak Co.<br />

References<br />

1. E. A. Early, T. R. O’Brian, R. D. Saunders, <strong>and</strong> A. C. Parr, St<strong>and</strong>ard<br />

Reference <strong>Material</strong>s: Film Step Tablet St<strong>and</strong>ards <strong>of</strong> Diffuse Visual<br />

Transmission Density – SRM 1001 <strong>and</strong> SRM 1008, Natl. Inst. St<strong>and</strong>.<br />

Technol., Spec. Publ. 260–135 (1998).<br />

2. ISO 5–1: Photography – Density Measurements – Part 1: Terms, Symbols,<br />

<strong>and</strong> Notations (1984).<br />

3. ISO 5–2: Photography – Density Measurements – Part 2: Geometric<br />

Conditions for Transmission Density (1991).<br />

4. ISO 5–3: Photography – Density Measurements – Part 3: Spectral<br />

Conditions (1995).<br />

5. C. S. McCamy, Concepts, Terminology, <strong>and</strong> Notation for Optical Modulation,<br />

Photogr. Sci. Eng. 10, 314 (1966).<br />

6. H. Helmholtz, H<strong>and</strong>buch der Physiologischen Optik, Leoplold Voss,<br />

Leipzig, 1867, p. 168.<br />

7. B. N. Taylor <strong>and</strong> C. E. Kuyatt, Guidelines for Evaluating <strong>and</strong> Expressing<br />

the Uncertainty <strong>of</strong> NIST Measurement Results, Natl. Inst. St<strong>and</strong>.<br />

Technol. Tech. Note 1297 (1994).<br />

8. A. Thompson <strong>and</strong> H.-M. Chen, Beamcon III, a Linearity Measurement<br />

Instrument for Optical Detectors, J. Res. Natl. Inst. St<strong>and</strong>. Technol.<br />

99, 751 (1994).<br />

9. P. Y. Barnes, E. A. Early <strong>and</strong> A. C. Parr, NIST Measurement Services:<br />

Spectral Reflectance, Natl. Inst. St<strong>and</strong>. Technol. Spec. Publ. 250–48<br />

(1998).<br />

10. E. Buhr, D. Hoeshen <strong>and</strong> D. Bergmann, The Measurement <strong>of</strong> Diffuse<br />

Optical Densities. Part I: The Diffusion Coefficient, J. Imag. Sci.<br />

Technol. 39, 453 (1995).<br />

11. J. H. Walker <strong>and</strong> A. Thompson, Spectral Radiance <strong>of</strong> a Large-Area<br />

Integrating Sphere Source, J. Res. Natl. Inst. St<strong>and</strong>. Technol. 100,<br />

37 (1995).<br />

12. T. C. Larason, S. S. Bruce <strong>and</strong> A. C. Parr, Spectroradiometric Detector<br />

Measurements: Parts I <strong>and</strong> II - Ultraviolet <strong>and</strong> Visible to Near Infrared<br />

Detectors, Natl. Inst. St<strong>and</strong>. Technol., Spec. Publ. 250–41<br />

(1997).<br />

13. K. L. Eckerle, J. J. Hsia, K. D. Mielenz, <strong>and</strong> V. R. Weidner, Regular<br />

Spectral Transmittance, Natl. Bur. St<strong>and</strong>. (U.S.), Spec. Publ. 250–6<br />

(1986).<br />

14. E. A. Early <strong>and</strong> T. R. O’Brian, NIST Transmission Density Instrument,<br />

Analytica Chimica Acta 380, 143 (1999).<br />

15. E. Buhr, D. Bergmann, E. A. Early, <strong>and</strong> T. R. O’Brian, Intercomparison<br />

<strong>of</strong> Visual Diffuse Transmission Density Measurements, (in preparation).<br />

NIST Reference Densitometer for Visual Diffuse Transmission Density <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 397


JOURNAL OF IMAGING SCIENCE AND TECHNOLOGY • <strong>Vol</strong>ume 43, Number 4, July/August 1999<br />

Self-Excited Vibration Induced in Paper-Feed-Roller in<br />

Electrophotography Copy Machine<br />

Hiroyuki Kawamoto*<br />

Corporate Research Laboratories, Fuji Xerox Co., Ltd., Kanagawa, Japan<br />

Theoretical <strong>and</strong> experimental investigations have been performed to clarify the mechanism <strong>of</strong> a self-excited chatter vibration<br />

induced in a paper-feed-roller system in an electrophotography copy machine. From results <strong>of</strong> the investigation, the following<br />

points were deduced: (1) The chatter vibration is induced only when a platen cover is pushed with a certain force <strong>and</strong> a paper<br />

does not exist between the roller <strong>and</strong> a platen glass, i.e., the roller slips against the platen glass. The experimental observation<br />

suggests that the vibration is a stick-slip vibration induced by the negative speed dependence <strong>of</strong> the friction coefficient.<br />

(2) Calculated results based on the present model qualitatively agreed with experimental observations, <strong>and</strong> several methods to<br />

suppress the vibration were proposed. (3) The paper-feed-roller system must be designed to be (a) high damping, (b) low negative<br />

speed dependence <strong>of</strong> the friction coefficient, (c) small press force, <strong>and</strong> (d) low arm angle. The resonance frequency <strong>of</strong> the platen<br />

cover must be designed to be away from the resonance frequency <strong>and</strong> its ultraharmonic ones <strong>of</strong> the roller system.<br />

<strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> 43: 398–402 (1999)<br />

Introduction<br />

A paper-feed-roller system, shown in Fig. 1, is used to<br />

feed manuscripts automatically onto a platen glass in<br />

an electrophotography copy or facsimile machine. Friction<br />

force between a paper <strong>and</strong> the roller made <strong>of</strong> rubber<br />

is utilized to feed the paper initially set on an upper<br />

tray. Images written on the paper are read by an image<br />

sensor located under the platen glass. The rollers attached<br />

to a shaft are driven by a motor through gears<br />

<strong>and</strong> a belt. The shaft is connected to a cover through<br />

arms hinged at both ends <strong>of</strong> the shaft. The shaft is<br />

pressed to the platen glass by two springs inserted between<br />

the cover <strong>and</strong> the arms at the both ends <strong>of</strong> the<br />

shaft to induce the friction force. The low-frequency<br />

chatter vibration takes place in the roller system when<br />

the roller slips on the platen glass. This condition typically<br />

occurs in the case that no paper exists between<br />

the roller <strong>and</strong> the platen glass because the motor is operated<br />

<strong>and</strong> the roller is forced to rotate even if the paper<br />

is not fed. The abnormal chatter vibration is also<br />

observed when the paper sticks <strong>and</strong> slips to the roller .<br />

The vibration induces the intolerable large acoustic<br />

noise <strong>and</strong> image defect due to misread <strong>of</strong> a document.<br />

Many papers have been published on the self-excited<br />

chatter vibration due to the friction force but, to the<br />

author’s knowledge, there has been no literature on this<br />

kind <strong>of</strong> system as <strong>of</strong> today . 1–4 The objectives <strong>of</strong> the<br />

present investigation are to clarify the vibration mechanism<br />

<strong>and</strong> to propose effective countermeasures against<br />

its cause in order to realize highly reliable copy machine.<br />

Original manuscript received November 2, 1998<br />

* Current address: Dept. <strong>of</strong> Mechanical Engineering, W aseda University,<br />

Tokyo, Japan.<br />

© 1999, IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

Figure 1. Schematic <strong>of</strong> paper-feed-roller system.<br />

Characteristics <strong>of</strong> Vibration<br />

Before conducting a quantitative experiment, qualitative<br />

characteristics <strong>of</strong> the vibration were investigated<br />

experimentally in order to construct a reasonable theoretical<br />

vibration model.<br />

1. Small normal noise due to the operation <strong>of</strong> the motor<br />

<strong>and</strong> gear was observed but any chatter vibration did<br />

not take place when the paper was properly fed. Here,<br />

398


the proper feed means that the roller does not slip on<br />

the paper.<br />

2. The vibration took place when the cover was pressed<br />

with more than a certain force <strong>and</strong> the paper was not<br />

fed or the paper was stuck even though the roller was<br />

driven. The characteristics 1 <strong>and</strong> 2 suggest that the<br />

chatter vibration is a stick-slip vibration due to the<br />

dry friction between the roller <strong>and</strong> the platen glass<br />

or the paper.<br />

3. The vibration was steady <strong>and</strong> continuous while the<br />

cover was pressed.<br />

4. The acoustic noise sounded uncomfortable, low<br />

frequency, <strong>and</strong> like a single-tone.<br />

5. Major portions <strong>of</strong> the vibration were the roller , the<br />

shaft, <strong>and</strong> the arms.<br />

Modeling<br />

Vibration Equation. Based on the experimentally observed<br />

characteristics <strong>of</strong> the vibration, a vibration model<br />

shown in Fig. 1 was introduced. A vibration equation <strong>of</strong><br />

the model is derived by the Lagrange’s equation.<br />

d ⎛ ∂T<br />

⎞ ∂T<br />

∂U<br />

∂V<br />

Q<br />

dt<br />

⎜<br />

q<br />

∂q˙<br />

⎟<br />

s ∂qs ∂qs ∂q˙<br />

s<br />

.<br />

⎝ ⎠<br />

− + + = (1)<br />

s<br />

where ( •• ) = d 2 /dt 2 , ( • ) = d/dt, t is time, C 0 ≡ C+cl 2 cos 2 Θ,<br />

<strong>and</strong> K 0 ≡ K+kl 2 cos 2 Θ. Because the friction coefficient is<br />

generally not constant but a function <strong>of</strong> the slip speed<br />

s, it is assumed to be linear with the speed. 3,4<br />

( ) =<br />

µ=µ( s) =µ V + x˙<br />

µ+ sgn( sl ) θ ˙(sinΘ+ 2θcos Θ) µ ' ( µ ' ≡ dµ<br />

/ dt),<br />

where V is a process speed, sgn(s) ≡ s/|s|, <strong>and</strong> µ′ is usually<br />

negative when the slip speed is slow. Substitution<br />

<strong>of</strong> Eq. 4 into Eq. 3 gives<br />

I ˙˙ 2 2<br />

( C ' kl y sin ) ˙ 2<br />

θ + 0 +µ 0 Θ θ + ( K0<br />

+µ kl sinΘcos Θ)<br />

θ +<br />

3 2<br />

' kl sin cos θθ ˙ 2 2 2<br />

µ Θ Θ +µ kl cos Θθ<br />

+<br />

(5)<br />

3 2<br />

µ ' kl sin cos θθ ˙ 2 3 3<br />

+ µ ' kl cos θθ ˙ 3<br />

3 Θ Θ 2 Θ = −µ kly0<br />

sin Θ.<br />

Here, the sign sgn( s) <strong>of</strong> µ is omitted, because the slip<br />

speed is always positive in the present system. Because<br />

the fifth, sixth, <strong>and</strong> seventh terms <strong>of</strong> the left h<strong>and</strong> side<br />

<strong>of</strong> Eq. 5 are negligibly small compared to the other terms<br />

with the given parameters cited in the Calculation<br />

section below, Eq. 5 is simplified as<br />

(4)<br />

The kinetic energy T, the potential energy U, the dissipation<br />

function V, <strong>and</strong> the non-conservative force Q are<br />

1 2 1<br />

2 1 2 1 2 1 2<br />

T = Iθ ˙ × U = K − + ky V = C + cy<br />

2 2<br />

( θ0<br />

θ ) 2<br />

, θ ˙ 2 2<br />

˙ ,<br />

Q =−µ Fl sin( Θ + θ ) ( F = ky),<br />

where<br />

C total viscous torsion damping constant <strong>of</strong> the arms,<br />

c total viscous damping constant <strong>of</strong> the rollers,<br />

F total press force <strong>of</strong> the rollers to the platen glass (=<br />

ky),<br />

I total inertia <strong>of</strong> the rollers, the shaft, <strong>and</strong> the arms,<br />

K total torsion stiffness <strong>of</strong> the arms induced by the two<br />

springs,<br />

k total stiffness <strong>of</strong> the rollers due to the Hertz contact,<br />

l length <strong>of</strong> the arms,<br />

q s generalized coordinate,<br />

y vertical displacement <strong>of</strong> the roller (defined as positive<br />

in the lower direction),<br />

µ friction coefficient,<br />

θ vibration angle from the statically equilibrium<br />

position (defined as positive in the anti-clockwise<br />

direction),<br />

Θ angle from the horizontal line to the statically<br />

equilibrium position <strong>of</strong> the arm,<br />

θ 0 angle from the free position to the statically<br />

equilibrium position <strong>of</strong> the arm.<br />

Substitution <strong>of</strong> Eq. 2 into the Lagrange’s Eq. 1 yields<br />

the following vibration equation with respect to the<br />

angle θ that is assumed to be the generalized coordinate<br />

q s <strong>of</strong> the Lagrange equation.<br />

I˙˙ C ˙ 2 2 2 2<br />

θ + 0θ + ( K0<br />

+µ kl sinΘcos Θ) θ +µ kl cos Θθ<br />

=<br />

−µ kly sin Θ,<br />

0<br />

(2)<br />

(3)<br />

⎧<br />

˙˙ ' k l y sin cos<br />

θ ( ' )<br />

˙<br />

a + ζ + ζ ωn<br />

− µµ 2 4 3<br />

⎪<br />

⎫⎪<br />

⎨2<br />

0 Θ Θ<br />

⎬θ<br />

a +<br />

2 2<br />

⎩⎪<br />

I ω n ⎭⎪<br />

' kl sin cos<br />

ω θ<br />

θ˙ n a + µ 3 2<br />

2<br />

Θ Θ<br />

aθa<br />

= 0,<br />

I<br />

where θ a is an angle from the statically equilibrium position<br />

under friction force, θ a = θ + µkly 0 sinΘ/(K 0 +<br />

µkl 2 sinΘcosΘ), ω n<br />

2<br />

= (K 0 + µkl 2 sinΘcosΘ)/I, 2ζω n = C 0 /I,<br />

<strong>and</strong> 2ζ’ω n = µ’kl 2 y 0 sin 2 Θ/Ι. Equation 6 is the basic vibration<br />

equation.<br />

Dynamic Stability. The condition for dynamic stability<br />

against the stick-slip vibration can be derived by examining<br />

the damping term, the second term in the left<br />

h<strong>and</strong> side <strong>of</strong> Eq. 6. For dynamic stability, this term must<br />

remain positive.<br />

⎛ kl<br />

C+ cl > −µ kl y − µ 2 ⎞<br />

2 2 2 2 sin Θcos<br />

Θ<br />

cos Θ ' 0 sin Θ⎜1<br />

2 ⎟.<br />

(7)<br />

⎝ Iω<br />

n ⎠<br />

The value in the parenthesis <strong>of</strong> the right h<strong>and</strong> side<br />

<strong>of</strong> Eq. 7 is positive in the present system (about 0.9 for<br />

the given parameters in the Calculation section below).<br />

This implies an interesting characteristic that the<br />

friction stabilizes the system. The system is prone to<br />

being dynamically unstable under condition <strong>of</strong> (a) small<br />

damping C + cl 2 cos 2 Θ, (b) large negative speed dependence<br />

<strong>of</strong> the friction coefficient µ′, (c) large press force<br />

<strong>of</strong> the rollers to the platen glass ky 0 , <strong>and</strong> (d) large arm<br />

angle Θ. The characteristic (b) was supported by the<br />

experimental evidence that the chatter vibration was<br />

suppressed when a tape made <strong>of</strong> polytetraflorethylene<br />

whose speed dependence <strong>of</strong> the friction coefficient is<br />

positive was stuck on the platen glass. The characteristic<br />

(c) was also confirmed by the experiment that the<br />

chatter vibration took place when the cover was pressed<br />

with more than a certain force, 1.0 N. It is evident that<br />

(6)<br />

Self-Excited Vibration Induced in Paper-Feed-Roller in Electrophotography Copy Machine <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 399


Natural Frequency. The stiffness term, the third term<br />

in the left h<strong>and</strong> side <strong>of</strong> Eq. 5, consists <strong>of</strong> the stiffness K 0<br />

that is independent <strong>of</strong> the friction <strong>and</strong> the stiffness due<br />

to the friction µkl 2 sinΘcosΘ. This means that the natural<br />

frequency with friction is larger than that without<br />

friction, i.e., the frequency <strong>of</strong> the chatter vibration is<br />

higher than the frequency when the chatter vibration<br />

does not take place. Although this characteristic was<br />

not quantitatively confirmed by the experiment because<br />

<strong>of</strong> a large experimental dispersion, the qualitative tendency<br />

that the frequency becomes slightly high under<br />

chatter vibration was observed in the experiment.<br />

Static Displacement. Static displacement θ a0 is dependent<br />

on the friction. The roller shifts up under high<br />

friction.<br />

Figure 2. Calculated free vibration without friction ( µ =<br />

µ′ = 0).<br />

µ kly0<br />

sin Θ<br />

θ a 0 ≅−<br />

( < 0).<br />

2<br />

K0<br />

+µ kl sin Θcos<br />

Θ<br />

(8)<br />

Figure 3. Calculated vibration response with constant friction<br />

(µ′ = 0).<br />

Figure 4. Calculated vibration response (µ′ = –5 s/m).<br />

Figure 5. Calculated vibration response (µ′ = –30 s/m).<br />

a simplest <strong>and</strong> easiest countermeasure to suppress the<br />

stick-slip vibration is to lower the press force. However,<br />

this method is limited by the condition that a cer -<br />

tain press force µ p F = µ p ky 0 (p: paper) must be<br />

maintained to feed the paper.<br />

Calculation<br />

Because it is not possible to derive an analytical solution<br />

<strong>of</strong> Eq. 5 without neglecting the nonlinear terms,<br />

numerical calculations were conducted using the Runge–<br />

Kutta method. This was done to investigate the characteristics<br />

<strong>of</strong> the vibration <strong>and</strong> the effect <strong>of</strong> speed<br />

dependence <strong>of</strong> the friction coefficient. Here the following<br />

system parameters were used for calculations: l =<br />

51 mm (designed), Θ = 19 deg (designed), µ = 0.4 (measured),<br />

k = 6 × 10 4 N/m (calculated by Hertz ’s contact<br />

theory), y 0 = 1.63 × 10 –4 m (derived from the measured<br />

threshold press force, 1.0 N), I = 0.0003 kgm 2 (designed),<br />

K = 25 Nm/rad (measured), C + cl 2 cos 2 Θ = 0.008887 Nsm<br />

(derived from the measured damping ratio, 0.02). Initial<br />

conditions are assumed to be ( θθ , ˙) = (0, 0) at t = 0<br />

except for the case <strong>of</strong> no friction. External force due to<br />

the friction, the right h<strong>and</strong> side <strong>of</strong> Eq. 5, induces transient<br />

vibration even if the initial displacement <strong>and</strong> velocity<br />

are assumed to be zero. Calculated results are<br />

shown in Figs. 2 through 5. The ordinates <strong>of</strong> the figures<br />

are vertical vibration <strong>of</strong> the roll, –y = – θlcosΘ.<br />

Figure 2 shows the vibration response without friction.<br />

This case corresponds to the normal condition that<br />

the paper is fed without stick or slip. The initial condition<br />

is assumed to be ( θθ , ˙) = (0.003 rad, 0) at t = 0,<br />

because no external force is applied in this case. Static<br />

displacement is not induced because no friction force is<br />

applied to the roller . The vibration is a simple linear<br />

damping response. The natural frequency <strong>and</strong> the damping<br />

ratio are 117.8 Hz <strong>and</strong> 0.02, respectively, which are<br />

calculated by the least square method applied to peaks<br />

<strong>of</strong> the vibration response. These values deservedly coincide<br />

with theoretical ones.<br />

Figure 3 shows the vibration response for the case<br />

that the friction coefficient is not zero but constant.<br />

Static displacement, 17.1 µm to the upper side, is induced<br />

in this case because friction force is applied to<br />

the roller. The vibration is also a simple linear damping<br />

response. The system is dynamically stable, because<br />

the speed dependence <strong>of</strong> the friction coefficient is assumed<br />

to be zero. The natural frequency is 124.5 Hz,<br />

which is a little higher than that <strong>of</strong> the no-friction case,<br />

117.8 Hz, as analytically predicted in the Modeling<br />

section above. Because the system is linear, the numerically<br />

calculated natural frequency <strong>and</strong> the damping ratio<br />

also coincides with the theoretical values.<br />

Figure 4 indicates the vibration response for the case<br />

that the speed dependence <strong>of</strong> the friction coefficient is<br />

−5 s/m which was estimated by data measured with glass<br />

<strong>and</strong> an automotive wiper made <strong>of</strong> rubber. 5 This case corresponds<br />

to the actual system in which the self-excited<br />

vibration takes place. The static displacement <strong>and</strong> the<br />

frequency is almost the same with those <strong>of</strong> Fig. 3, but<br />

the system is dynamically unstable with a negative<br />

damping ratio, –0.00685, which is derived by the least<br />

square method applied to peaks <strong>of</strong> the calculated vibration<br />

response in the approximately linear region.<br />

400 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Kawamoto


Figure 6. Nonlinearity with respect to vibration amplitude.<br />

Figure 7. Nonlinearity with respect to period.<br />

Figure 5 finally shows the vibration response for the<br />

case that the speed dependence <strong>of</strong> the friction coefficient<br />

is extremely large, –30 s/m, that is six times larger<br />

than that <strong>of</strong> Fig. 4. Although the vibration is linearly<br />

increased when the vibration amplitude is small, it suddenly<br />

diverges to the lower direction when the vibration<br />

amplitude exceeds about 400 µm.<br />

Parametric calculations taking µ′ as a parameter are<br />

conducted to investigate this kind <strong>of</strong> nonlinear characteristics.<br />

Figure 6 shows a relationship between the cycle<br />

number <strong>and</strong> the logarithm <strong>of</strong> vibration peaks. It is recognized<br />

that the vibration is linearly increased from the<br />

static displacement, 17.1 µm, when the vibration amplitude<br />

is small but it gradually deviates from the linearity<br />

in accordance with the increase <strong>of</strong> the vibration<br />

amplitude. A period <strong>of</strong> vibration between adjacent peaks<br />

indicates the similar characteristics as shown in Fig. 7.<br />

Although the period is constant, 8.03 ms, which corresponds<br />

to the natural frequency 124.5 Hz in the linear<br />

region, it becomes long as the vibration amplitude becomes<br />

nonlinearly large. These characteristics are due<br />

to the nonlinearlity <strong>of</strong> the system. That is, a consequence<br />

<strong>of</strong> the vibration increase is the decrease <strong>of</strong> the effective<br />

stiffness <strong>and</strong> hence increase <strong>of</strong> the vibration amplitude<br />

<strong>and</strong> the period, because the forth nonlinear term <strong>of</strong> the<br />

left h<strong>and</strong> side <strong>of</strong> Eq. 6 becomes relatively large compared<br />

to the third linear stiffness term. When the fourth<br />

term exceeds the third term, the effective stiffness falls<br />

in negative <strong>and</strong> thus the system is statically unstable.<br />

The roller goes down when the vibration amplitude exceeds<br />

the threshold indicated in Fig. 6.<br />

Experimental<br />

Experimental Procedure. A series <strong>of</strong> experiments was<br />

performed to clarify characteristics <strong>of</strong> the vibration <strong>and</strong><br />

to demonstrate the adequacy <strong>of</strong> the model. Figure 8<br />

shows an experimental set-up. The platen cover <strong>and</strong><br />

glass with the paper -feed roller system was used for<br />

experiments. The acoustic noise was detected by a microphone<br />

located at about one meter from the roller <strong>and</strong><br />

the vibration <strong>of</strong> the drum was measured by a laser displacement<br />

sensor. Transducer signals <strong>of</strong> the noise <strong>and</strong><br />

the vibration were introduced to an oscilloscope <strong>and</strong> to<br />

an FFT analyzer. Data were recorded on a hard disc in<br />

a personal computer <strong>and</strong> then analyzed. Noise measurement<br />

was conducted in an anechoic room.<br />

Acoustic Noise. Figure 9 shows measured spectra <strong>of</strong><br />

sound pressure levels under chatter vibration <strong>and</strong> with-<br />

Figure 8. Experimental set-up.<br />

out chatter vibration. The measured main resonance frequency<br />

under chatter vibration was 117 Hz which coincided<br />

fairly well with the calculated natural frequency,<br />

124.5 Hz. Resonance frequencies in parentheses, 182<br />

<strong>and</strong> 281 Hz, were not due to the self-excited vibration<br />

but probably a forced vibration <strong>of</strong> the motor <strong>and</strong> gears,<br />

because these were also observed without the chatter<br />

vibration. Other higher peeks, 229, 346, 463, 580, <strong>and</strong><br />

697 Hz, were superharmonic ones. These peaks were<br />

substantially large compared with the main frequency,<br />

probably because these coincided with eigen frequencies<br />

<strong>of</strong> the platen cover. Avoidance <strong>of</strong> the resonance with<br />

respect to not only the main but also superharmonic frequencies<br />

is not a countermeasure <strong>of</strong> the self-excited vibration<br />

but effective in order to reduce the acoustic noise<br />

when the self-excited vibration takes place.<br />

Self-Excited Vibration. Measurement <strong>of</strong> vibration response<br />

is more straightforward than the noise measurement<br />

to investigate characteristics <strong>of</strong> the chatter<br />

vibration. Measured vibration responses <strong>of</strong> the arm are<br />

shown in Fig. 10. Here the ordinates are the vertical<br />

vibration <strong>of</strong> the roller . Although the vibration is not<br />

strictly stationary but r<strong>and</strong>om, typical <strong>and</strong> quasi-stationary<br />

responses are shown in Fig. 10. It is observed<br />

that the magnitude <strong>of</strong> the chatter vibration was a limit<br />

cycle in the order <strong>of</strong> 10 µm, as a result <strong>of</strong> the nonlinearity<br />

<strong>of</strong> the stiffness <strong>and</strong>/or the damping. In either case the<br />

fourth nonlinear term in the left h<strong>and</strong> side <strong>of</strong> Eq. 6 is<br />

negligible, because the vibration magnitude is much<br />

smaller than the threshold shown in Fig. 6. Therefore,<br />

Self-Excited Vibration Induced in Paper-Feed-Roller in Electrophotography Copy Machine <strong>Vol</strong>. 43, No. 4, July/Aug. 1999 401


Figure 9. Measured spectra <strong>of</strong> sound pressure level.<br />

Figure 11. Measured spectra <strong>of</strong> vibration.<br />

Figure 10. (a) Measured vibration without chatter vibration;<br />

(b) measured vibration under chatter vibration.<br />

only Eq. 7 is the practical stability condition. The nonlinear<br />

terms must be taken into consideration when the<br />

negative speed dependence <strong>of</strong> the friction coefficient is<br />

extremely large under very low speed region even if the<br />

vibration magnitude is small.<br />

Figure 11 shows measured vibration spectra under<br />

chatter vibration <strong>and</strong> without chatter vibration. Resonance<br />

frequencies in parentheses, 38, 166, <strong>and</strong> 258 Hz,<br />

were not due to the self-excited vibration, because these<br />

were also observed without the chatter vibration. Except<br />

for these peaks, a peak at 1 18 Hz was most predominant<br />

<strong>and</strong> coincided fairly well with the calculated<br />

natural frequency, 124.5 Hz, <strong>and</strong> the measured resonance<br />

frequency <strong>of</strong> noise, 117 Hz. Other higher peaks,<br />

226, 338, <strong>and</strong> 448 Hz, were superharmonic. We conclude<br />

from these results that chatter vibration was self-excited<br />

vibration <strong>of</strong> the main resonance frequency 18 Hz.<br />

Conclusions<br />

Theoretical <strong>and</strong> experimental investigation has been<br />

performed to clarify the mechanism <strong>of</strong> the self-excited<br />

chatter vibration induced in the paper -feed-roller system<br />

in the electrophotography copy machine. From results<br />

<strong>of</strong> the investigation, the following points were<br />

deduced:<br />

1. The chatter vibration is induced only when the platen<br />

cover is pushed with a certain force <strong>and</strong> a paper does<br />

not exist between the roller <strong>and</strong> the platen glass, i.e.,<br />

the roller slips against the platen glass. The<br />

experimental observation suggests that the vibration<br />

is the stick-slip vibration induced by the negative<br />

speed dependence <strong>of</strong> the friction coefficient.<br />

2. Calculated results based on the present model<br />

qualitatively agreed with experimental observations,<br />

<strong>and</strong> several methods to suppress the vibration were<br />

proposed.<br />

3. The paper-feed-roller system must be designed to be<br />

(a) high damping, (b) low negative speed dependence<br />

<strong>of</strong> the friction coefficient, (c) small press force, <strong>and</strong><br />

(d) low arm angle. The resonance frequency <strong>of</strong> the<br />

platen cover must be designed to be away from the<br />

resonance frequency <strong>and</strong> its ultraharmonic ones <strong>of</strong><br />

the roller system. The characteristics (b) <strong>and</strong> (c) were<br />

experimentally confirmed. The chatter vibration<br />

problem has been overcome by sticking a tape made<br />

<strong>of</strong> polytetraflorethylene which makes the speed<br />

dependence <strong>of</strong> the friction coefficient positive <strong>and</strong><br />

reducing the press force <strong>of</strong> the springs.<br />

Acknowledgment. The author wishes to thank Y.<br />

Nakayama, Y. Ichikawa, <strong>and</strong> K. Watanabe (Fuji Xerox)<br />

who supported the work <strong>and</strong> to N. Kojima (Nagaoka University<br />

<strong>of</strong> <strong>Technology</strong>) who helped to carry out the experiment.<br />

The author would also like to express his<br />

thanks to Pr<strong>of</strong>. M. Yoshizawa at Keio University for his<br />

helpful suggestion.<br />

References<br />

1. A. Watari <strong>and</strong> T. Sugimoto, Vibrations Caused by Dry Friction, Trans.<br />

Japan Soc. Mech. Eng. 29, 769 (1963).<br />

2. A. Bhattacharyya, A. B. Chatteerjee, A. Bhattacharyya <strong>and</strong> B. K.<br />

Mallick, Analysis <strong>of</strong> Stick-Slip Motion <strong>of</strong> a V<strong>and</strong>er–Pol Model, CIRP,<br />

2011, 81 (1971).<br />

3. H. Kawamoto, Chatter Vibration <strong>of</strong> a Cleaner Blade in Electrophotography,<br />

J. <strong>Imaging</strong> Sci. Technol. 40, 8 (1996).<br />

4. H. Kawamoto, Self-Excited Vibration <strong>of</strong> a Lap Spring Clutch Used in<br />

Electrophotography Fuser, Nonlinear Dynamics, 16, 153 (1998).<br />

5. R. Suzuki <strong>and</strong> K. Yasuda, Analysis <strong>of</strong> the Chatter Vibration in an Automotive<br />

Wiper Assembly (Derivation <strong>of</strong> Approximate Solution <strong>and</strong><br />

Study <strong>of</strong> Vibration Characteristics), Trans. Japan Soc. Mech. Eng.<br />

61, 3203 (1995).<br />

402 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> Kawamoto


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• Recent Progress in Color<br />

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1998 (Mbr. $65; Non-Mbr. $75)<br />

• Recent Progress in Toner <strong>Technology</strong><br />

1997 (Mbr. $65; Non-Mbr. $75)<br />

• Recent Progress in Color <strong>Science</strong><br />

1997 (Mbr. $65; Non-Mbr. $75)<br />

• Recent Progress in Ink Jet Technologies II<br />

1999 (Mbr. $65; Non-Mbr. $75)<br />

ety for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>,<br />

technical information from several conferences<br />

<strong>and</strong> publications into a concise treatise<br />

<strong>of</strong> a subject. This series allows the pr<strong>of</strong>essional<br />

to stay up-to-date <strong>and</strong> to find the<br />

relevant data in the covered field quickly<br />

<strong>and</strong> efficiently.<br />

Available Now<br />

Available soon<br />

Contact IS&T to order Today!<br />

Phone: 703-642-9090<br />

Fax: 703-642-9094<br />

E-mail: info@imaging.org<br />

www.imaging.org<br />

• Recent Progress in Ink-Jet<br />

Technologies<br />

1996 (Mbr. $55; Non-Mbr. $65)<br />

• Recent Progress in Digital Halftoning<br />

1995 (Mbr. $55; Non-Mbr. $65)<br />

• Recent Progress in Digital Halftoning II<br />

1999 (Mbr. $65; Non-Mbr. $75)<br />

Plus shipping & h<strong>and</strong>ling: $4.50 U.S.;<br />

$8.50 outside the U.S.A.<br />

Positions Available <strong>and</strong><br />

Positions Wanted<br />

Can now be found<br />

on the<br />

IS&T homepage<br />

Please visit us at<br />

http://www.imaging.org<br />

click on<br />

EMPLOYMENT<br />

OPPORTUNITIES<br />

<strong>Vol</strong>. 43, No. 4, July/Aug. 1999 403


IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

1999-2000 Board <strong>of</strong> Directors<br />

President<br />

JOHN D. MEYER, Hewlett Packard Laboratories, 1501 Page Mill Rd., 2U-19, P.O. Box 10490, Palo Alto, CA 94304<br />

Voice: 650-857-2580 FAX: 650-857-4320 e-mail: meyer@hpl.hp.com<br />

Executive Vice President<br />

WAYNE JAEGER, Tektronix, M/S 61-IRD, 26600 S. W. Parkway, Wilsonville, OR 97070-1000<br />

Voice: 503-685-3281 FAX: 503-685-4366 e-mail: wayne.jaeger@tek.com<br />

Conference Vice President<br />

JAMES KING, Adobe Systems Inc., 345 Park Ave., MS: W14, San Jose, CA 95110-2704<br />

Voice: 408-536-4944 FAX: 408-536-6000 e-mail: jking@adobe.com<br />

Publications Vice President<br />

REINER ESCHBACH, Xerox Corporation, 800 Phillips Road, 0128-27E, Webster, New York 14580<br />

Voice: 716-422-3261 FAX: 716-422-6117 e-mail: eschbach@wrc.xerox.com<br />

Vice Presidents<br />

STEPHEN A. BENTON, Massachusetts Institute <strong>of</strong> <strong>Technology</strong>, Media Lab Spatial <strong>Imaging</strong> Group, 20 Ames Street, Rm. E15-416,<br />

Cambridge, Massachusetts 02139-4307<br />

Voice: 617-253-8145 FAX: 617-253-8823 e-mail: sab@media.mit.edu<br />

JAMES R. MILCH, Eastman Kodak Company Research Labs, 343 State Street, Rochester, New York 14650<br />

Voice: 716-588-9400 FAX: 716-588-3269 e-mail: jrmilch@kodak.com<br />

W. E. NELSON, Texas Instruments, P. O. Box 655474, MS 63, Dallas, TX 75265<br />

Voice: 972-575-0270 FAX: 972-575-0090 e-mail: wen@msg.ti.com<br />

SHIN OHNO, Sony Corporation, Business & Pr<strong>of</strong>essional Systems Co., 4-14-1 Okata, Atsugi 243, Kanagawa 243-0021, Japan<br />

Voice: 81-462-27-2373 FAX: 81-462-27-2374 e-mail: shin@avctl.cpg.sony.co.jp<br />

SABINE SÜSSTRUNK, Swiss Federal Institute <strong>of</strong> <strong>Technology</strong>, Communication-LCAV, Ecublens-INR, CH-1015 Lausanne, Switzerl<strong>and</strong><br />

Voice: +41-21-693-5634 FAX: +41-21-693-4312 e-mail: sabines@lcavsunl.epfl.ch<br />

DEREK WILSON, Coates Electrographics, Ltd., Norton Hill, Midsomer Norton, Bath, BA3 4RT, Engl<strong>and</strong><br />

Voice: 44-1761-408545 FAX: 44-1761-418544 e-mail: derek.wilson@msn.coates.co.uk<br />

Secretary<br />

BERNICE ROGOWITZ, IBM Corp., T. J. Watson Research, P. O. Box 704, M/S H2-B62, Yorktown Heights, NY 10598-0218<br />

Voice: 914-784-7954 FAX: 914-784-6245 e-mail: rogowtz@us.ibm.com<br />

Treasurer<br />

GEORGE MARSHALL, Lexmark International, Inc., 6555 Monarch Rd., Dept. 57R/031A, Boulder, CO 80301<br />

Voice: 303-581-5052 FAX: 303-581-5097 e-mail: toner@lexmark.com<br />

Immediate Past President<br />

ROBERT GRUBER, Xerox Corporation, 800 Phillips Road, W114-40D, Webster, NY 14580<br />

Voice: 716-422-5611 FAX: 716-422-7716 e-mail: rgruber@crt.xerox.com<br />

Executive Director<br />

CALVA LEONARD, IS&T, 7003 Kilworth Lane, Springfield, VA 22151<br />

Voice: 703-642-9090 FAX: 703-642-9094 e-mail: calva@imaging.org<br />

CHAPTER DIRECTORS<br />

Boston, Massachusetts (BO)<br />

LYNNE CHAMPION, 1265 Main Street, W4-2M, Waltham, MA 02454<br />

Korea (KO)<br />

J.-H. KIM, Pusan National Univ., Dept. <strong>of</strong> Elec. Eng., San 30 Chang Jun-Dong, Kumjung, Pusan 609-735, Korea<br />

Rochester, New York (RO)<br />

DENNIS ABRAMSOHN, Xerox Corporation, Wilson Research Center, 800 Phillips Road, MC 147-11C, Webster, New York 14570<br />

Tokyo, Japan (JA)<br />

YOICHI MIYAKE, Dept. <strong>of</strong> Information <strong>and</strong> Computer Sci., Faculty <strong>of</strong> Engineering, Chiba Univ., 1-33 Yayoicho, Inage-ku, Chiba 263, Japan<br />

Tri-State<br />

JAMES CHUNG, Fuji Photo Film, 555 Taxter Road, Elmsford, NY 10523<br />

404 <strong>Journal</strong> <strong>of</strong> <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong>


IS&T’s NIP15:<br />

International<br />

Conference on<br />

Digital Printing<br />

Technologies<br />

October 17–22, 1999<br />

Come <strong>and</strong> meet us in Florida for IS&T's NIP15: International Conference on<br />

Digital Printing Technologies. Over the years, the NIP Conferences have<br />

emerged as the preeminent forum for discussion <strong>of</strong> advances <strong>and</strong> directions in<br />

the field <strong>of</strong> non-impact <strong>and</strong> digital printing technologies. A comprehensive<br />

program <strong>of</strong> more than 150 contributed papers from leading scientists <strong>and</strong><br />

engineers, is planned along with daily keynote addresses, an extensive program<br />

<strong>of</strong> 26 tutorials, a print gallery <strong>and</strong> an exhibition <strong>of</strong> digital printing products,<br />

components, materials <strong>and</strong> equipment. Following the presentations<br />

each day, the authors will be available for one-on-one discussions. The preliminary<br />

program is now available at www.imaging.org.<br />

The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong><br />

7003 Kilworth Lane, Springfield, VA 22151 USA<br />

703-642-9090; FAX:703-642-9094;<br />

Email:info@imaging.org; www.imaging.org<br />

The Caribe Royal Resort Suites,<br />

Lake Buena Vista, Florida<br />

General Chair:<br />

Michael Lee<br />

• Toner Based Marking: Processes<br />

• Toner Based Marking: <strong>Material</strong>s<br />

• Optoelectronic <strong>Imaging</strong> <strong>Material</strong>s<br />

<strong>and</strong> Devices<br />

• Ink-Jet Processes<br />

• Ink-Jet <strong>Material</strong>s<br />

• Printing Systems—Engineering/<br />

Optimization<br />

• Media for Digital Printing<br />

• Print <strong>and</strong> Image Quality<br />

• Color <strong>Science</strong>/Image Processing<br />

• Advanced <strong>and</strong> Novel Printing<br />

• Specialty Printing Applications<br />

• Thermal Printing<br />

• Liquid Toner Processes <strong>and</strong> <strong>Material</strong>s<br />

• Textile <strong>and</strong> Fabric Printing<br />

• Computer-to-Plate <strong>Technology</strong><br />

• Digital Printing Instrumentation<br />

• Environmental Issues<br />

7th IS&T/SID<br />

Color <strong>Imaging</strong> Conference<br />

Color <strong>Science</strong>, Systems <strong>and</strong> Applications<br />

November 16–19, 1999 • The SunBurst Resort • Scottsdale, Arizona<br />

General Co-Chairs: Jack Holm, Hewlett Packard (IS&T)<br />

<strong>and</strong> Todd Newman, Canon Information Systems (SID)<br />

The Color <strong>Imaging</strong> Conference is the premier technical conference for scientists <strong>and</strong> engineers<br />

working in the areas <strong>of</strong> color science, color engineering <strong>and</strong> their application to color<br />

products <strong>and</strong> color imaging technology. 1999 marks the seventh year <strong>of</strong> this topical, annual<br />

conference. The conference is international in nature. In previous years one third <strong>of</strong> the<br />

participants came from outside the United States <strong>and</strong> Canada. The range <strong>of</strong> pr<strong>of</strong>essional disciplines represented includes: digital photography, color<br />

science, color engineering, image processing, color reproduction, prepress, display design, computer simulation, data visualization in color, psychophysics,<br />

optical physics, virtual reality, systems engineering, s<strong>of</strong>tware applications development, <strong>and</strong> hardware development. It is the broad mix <strong>of</strong><br />

pr<strong>of</strong>essional interests that is the hallmark <strong>of</strong> this conference. The focus is color-color as a critical element <strong>of</strong> the research <strong>and</strong> application efforts <strong>of</strong><br />

this segment <strong>of</strong> the pr<strong>of</strong>essional community. The conference program is designed to promote interaction among the participants. The format includes<br />

invited addresses by leading specialists in various color-related fields as well as submitted papers presented in oral <strong>and</strong> poster format. We will<br />

continue the single-session format for this year’s conference to allow participants to attend all presentations. This is the conference to meet <strong>and</strong> talk<br />

with those people that share your interest in color, color research <strong>and</strong> its application to products. Preliminary program is now available at<br />

www.imaging.org.<br />

• Image Capture<br />

• Scene Perception<br />

• Color Management<br />

• Color Appearance<br />

• Color Constancy<br />

• St<strong>and</strong>ards<br />

• Gamut Mapping<br />

• Printing<br />

Co-sponsored by IS&T—The Society for <strong>Imaging</strong> <strong>Science</strong> <strong>and</strong> <strong>Technology</strong> <strong>and</strong> SID—Society for Information Display<br />

For more information contact IS&T, 703-642-9090; FAX: 703-642-9094; EMAIL: info@imaging.org; www.imaging.org


IS&T Corporate Members<br />

The Corporate Members <strong>of</strong> your Society provide a significant amount <strong>of</strong> financial support that assists IS&T in disseminating information <strong>and</strong><br />

providing pr<strong>of</strong>essional services to imaging scientists <strong>and</strong> engineers. In turn, the Society provides a number <strong>of</strong> material benefits to its Corporate<br />

Members. For complete information on the Corporate Membership program, contact IS&T, 7003 Kilworth Lane, Springfield, VA 22151.<br />

Sustaining Corporate Members<br />

Applied <strong>Science</strong> Fiction<br />

8920 Business Park Drive<br />

Austin, TX 78759<br />

Eastman Kodak Company<br />

343 State Street<br />

Rochester, NY 14650<br />

Hewlett Packard Labs.<br />

1501 Page Mill Road<br />

Palo Alto, CA 94304<br />

Lexmark International, Inc.<br />

740 New Circle Road NW<br />

Lexington, KY 40511<br />

Polaroid Corporation<br />

P.O. Box 150<br />

Cambridge, MA 02139<br />

Tektronix, Inc.<br />

P.O. Box 4675<br />

Beaverton, OR 97076-4675<br />

Xerox Corporation<br />

Webster Research Center<br />

Webster, NY 14580<br />

Supporting Corporate Members<br />

Adobe Corporation<br />

345 Park Avenue<br />

San Jose, CA 95110-2704<br />

Konica Corporation<br />

No. 1 Sakura-machi<br />

Hino-shi, Tokyo 191 Japan<br />

Kodak Polychrome Graphics<br />

401 Merritt 7<br />

Norwalk, CT 06851<br />

Torrey Pines Research<br />

6359 Paseo Del Lago<br />

Carlsbad, CA 92009<br />

Xeikon, NV<br />

Vredebaan 72<br />

2640 Mortsel, Belgium<br />

Donor Corporate Members<br />

Agfa Division Bayer Corp.<br />

100 Challenger Road<br />

Ridgefield Park, NJ 07760<br />

BARCO Graphics<br />

Tramstraat 69<br />

B-9052 Gent, Belgium<br />

BASF Corporation<br />

100 Cherry Hill Road<br />

Parsippany, NJ 07054<br />

Canon , Inc.<br />

Shimonaruko 3-40-2<br />

Ohta-ku, Tokyo 146 Japan<br />

Dunord Technologies, Inc.<br />

276 St. Jacques, Ste 703<br />

Montreal, Quebec H2Y IN3 Canada<br />

Felix Schoeller Jr. GmbH & Co. KG<br />

Postfach 3667<br />

D-49026 Osnabruck, Germany<br />

Fuji Photo Film USA, Inc.<br />

555 Taxter Road<br />

Elmsford, NY 10523<br />

Hallmark Cards, Inc.<br />

Chemistry R & D<br />

2501 McGee, #359<br />

Kansas City, MO 64141-6580<br />

Hitachi Koki Co., Ltd.<br />

1060 Takeda, Hitachinaka-City<br />

Ibaraki- Pref 312 Japan<br />

Ilford <strong>Imaging</strong> U.S.A. , Inc.<br />

West 70 Century Road<br />

Paramus, NJ 07653<br />

KDY Associates<br />

9 Townsend West<br />

Nashua, NH 03063<br />

Kind & Knox Gelatin, Inc.<br />

P.O. Box 927<br />

Sioux City, IA 51102<br />

Minolta Co., Ltd.<br />

1-2, Sakuramachi<br />

Takatsaki, Osaka 569 Japan<br />

Mitsubishi Electric<br />

5-1-1 Ofuna, Kamakura<br />

Kanagawa 247 Japan<br />

Monroe Electronics, Inc.<br />

100 Housel Avenue<br />

Lyndonville, NY 14098<br />

Nitta Gelatin NA Inc.<br />

201 W. Passaic Street<br />

Rochelle Park, NJ 07662-3100<br />

Quality Engineering Assoc.<br />

25 Adams Street,<br />

Burlington, MA 01803<br />

Research Laboratories <strong>of</strong> Australia<br />

7, Valetta Road, Kidman Park<br />

S. Australia, 5025, Australia<br />

Ricoh Company Ltd.<br />

15-5, Minami-Aoyama<br />

1-chome, Minato-ku, Tokyo 107 Japan<br />

SKW Biosystems, Inc.<br />

2021 Cabot Boulevard West<br />

Langhorne, PA 19047<br />

Sharp Corporation<br />

492 Minosho-cho<br />

Yamatokoriyama,<br />

Nara 639-1186 Japan<br />

Sony Corporation<br />

6-7-35 Kita-shinagawa<br />

Shinagawa, Tokyo 141 Japan<br />

Sony Electronic Photography & Printing<br />

3 Paragon Drive<br />

Montvale, NJ 07645<br />

Trebla Chemical Company<br />

8417 Chapin Ind. Drive<br />

St. Louis, MO 63114

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