LanTEK® II Series Manual - Ideal Industries Inc.
LanTEK® II Series Manual - Ideal Industries Inc.
LanTEK® II Series Manual - Ideal Industries Inc.
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Chapter 6<br />
Structured cabling testing<br />
Illustration 6.16. ACR-N (ACR) / Power Sum ACR-N (Power Sum<br />
ACR)<br />
6.16.1. ACR-N (ACR) Test and Power Sum ACR-N (Power Sum ACR) Test Error<br />
A large difference between the measuring values is preferable, since this indicates a strong<br />
signal and minor perturbations.<br />
6.16.2. Troubleshooting ACR-N (ACR) Test and Power Sum ACR-N (Power Sum ACR)<br />
Test Error<br />
For information on troubleshooting, refer to the corresponding sections on NEXT and loss<br />
test.<br />
6.17. Headroom Test<br />
The headroom test is a mathematical analysis of the data calculated during the preceding<br />
test. The sum of Power Sum ACR-N (Power Sum ACR) test (i.e. corresponding value of worst<br />
case wire pair after normalization of wire pair loss over 100 meters) and the additional<br />
margin between the worst case Power Sum NEXT-value and the limit for Power Sum NEXT.<br />
The headroom test is a simple way to indicate the margins available on a cable line for<br />
faultless support of an application. This test also indicates the additional margin obtainable by<br />
using "improved" cables and connections, as well as careful installation.<br />
6.17.1. Headroom Test Error<br />
Illustration 6.17. Margin Test<br />
The headroom value indicated in dB identifies the minimum margin available for a cable line.<br />
A high value is preferable, since it indicates a strong signal and minor perturbations. The<br />
pass/fail limits for the margin are identical with those for Power Sum ACR-N (ACR).<br />
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