LanTEK® II Series Manual - Ideal Industries Inc.

Chapter 6
Structured cabling testing
Depending on cable type and specified test standard, the following single test analyses are
available:
Wiremap Resistance Length
Capacitance NEXT Loss/Insertion Loss
ACR-N (ACR) Return loss Impedance
Delay and Skew Power Sum NEXT Power Sum ACR-N (Power Sum ACR)
Margin ACR-F (ELFEXT) Power Sum ACR-F (Power Sum ELFEXT)
NOTE:
The following tests do not require a Remote handset (RH): Resistance, Length,
Capacitance, Impedance, Delay and Skew.
6.6. Wiremap Test
With the aid of Wiremap tests it is possible to pinpoint short circuits, interrupts and incorrect
wiring. To facilitate evaluation, the test results are displayed in graph format.
Illustration 6.6. Wiremap Test
An error indicated by the Wiremap test should always be corrected first, since it will cause
errors in other tests. An unwired contact can cause the tests for DC loop resistance and loss
to receive a failing grade as well. An interrupt can also lead to a zero result when testing
capacitance, resulting in failed NEXT measuring values.
The Wiremap test ensures the following minimum thresholds for fault recognition (based on
four wire pairs, optional shield):
‣ All Wiremap errors or combined Wiremap errors are indicated as errors in the Wiremap
diagram.
‣ All combinations of up to three interrupts, short circuits or reversed connections are
correctly detected.
‣ In case of interrupts and short circuits, the cable end at which the error occurred is
indicated (on Autotest screen for length measurement).
‣ Split wire pairs (Split Pairs) are detected by specific patterns of contradictory NEXT values
(Near End Cross-Talk).
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