Untitled - IAP/TU Wien - Technische Universität Wien
Untitled - IAP/TU Wien - Technische Universität Wien
Untitled - IAP/TU Wien - Technische Universität Wien
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71st IUVSTA Workshop<br />
Electron scattering in graphene/copper system<br />
P. Jiek, 1,* J. Zemek, 1 O. Romanyuk, 1 and M. Kalb 2<br />
1 Institute of Physics, v. v. i., Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8,<br />
Czech Republic,<br />
2 J. Heyrovsky Institute of Physical Chemistry, v. v. i., Academy of Sciences of the Czech Republic,<br />
Dolej!kova 3, 182 23 Prague 8, Czech Republic<br />
*corresponding author: jiricek@fzu.cz<br />
Electron scattering at solid surfaces has been of crucial importance for electron spectroscopy<br />
methods. With the growth of nanotechnology, the interest in the details of the dynamics of electrons near a<br />
vacuum-solid or solid-solid boundary has seen a remarkable revival. The electron inelastic and elastic<br />
scattering is well understood for bulk solids. For new class of two-dimensional materials (2DM) such as<br />
graphene and silicene on substrates, electron scattering mechanism is not fully understood and, thus, electron<br />
spectroscopy data could not be properly interpreted. In this contribution, graphene is grown on<br />
polycrystalline copper substrates by CVD method [1]. This system will be measured by X-ray induced<br />
angular resolved photoelectron spectroscopy and by reflection electron energy loss spectroscopy. Obtained<br />
data will be compared with the state-of-the-art theoretical approaches. On the basis of the comparison the<br />
validity or invalidity of available theoretical models developed for bulk solids or thick overlayers and<br />
applied to the 2DM film/substrate systems will be discussed.<br />
References<br />
[1] A. Siokou, F. Ravani, S. Karakalos, O. Frank, M. Kalbac, and C. Galiotis, Appl. Surf. Sci. 257 (2011)<br />
9785.<br />
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