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Untitled - IAP/TU Wien - Technische Universität Wien

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71st IUVSTA Workshop<br />

Electron scattering in graphene/copper system<br />

P. Jiek, 1,* J. Zemek, 1 O. Romanyuk, 1 and M. Kalb 2<br />

1 Institute of Physics, v. v. i., Academy of Sciences of the Czech Republic, Na Slovance 2, 182 21 Prague 8,<br />

Czech Republic,<br />

2 J. Heyrovsky Institute of Physical Chemistry, v. v. i., Academy of Sciences of the Czech Republic,<br />

Dolej!kova 3, 182 23 Prague 8, Czech Republic<br />

*corresponding author: jiricek@fzu.cz<br />

Electron scattering at solid surfaces has been of crucial importance for electron spectroscopy<br />

methods. With the growth of nanotechnology, the interest in the details of the dynamics of electrons near a<br />

vacuum-solid or solid-solid boundary has seen a remarkable revival. The electron inelastic and elastic<br />

scattering is well understood for bulk solids. For new class of two-dimensional materials (2DM) such as<br />

graphene and silicene on substrates, electron scattering mechanism is not fully understood and, thus, electron<br />

spectroscopy data could not be properly interpreted. In this contribution, graphene is grown on<br />

polycrystalline copper substrates by CVD method [1]. This system will be measured by X-ray induced<br />

angular resolved photoelectron spectroscopy and by reflection electron energy loss spectroscopy. Obtained<br />

data will be compared with the state-of-the-art theoretical approaches. On the basis of the comparison the<br />

validity or invalidity of available theoretical models developed for bulk solids or thick overlayers and<br />

applied to the 2DM film/substrate systems will be discussed.<br />

References<br />

[1] A. Siokou, F. Ravani, S. Karakalos, O. Frank, M. Kalbac, and C. Galiotis, Appl. Surf. Sci. 257 (2011)<br />

9785.<br />

61

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