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Thesis-PDF - IAP/TU Wien

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Figure 5.4: The AFM setup at the Institut für Allgemeine Physik at the<br />

<strong>TU</strong> Vienna. A - Scanning Head, B - Scanning Stage, C - Top View Optics,<br />

D - Top View Optics Light Source, E - Zeiss Inverted Optical Microscope<br />

open the possibility to implement new measurement techniques. It enables real<br />

time control of this type of AFM and possesses data acquisition functions, offline<br />

analysis and data manipulation tools. ([69])<br />

In order to ease the analysis of measured data, an Igor script was written,<br />

helping to reduce image artifacts resulting from the sometimes slow feedback loop.<br />

Only the combination of trace and retrace image data (i.e. scanning along the<br />

x-axis in both directions) gives the full information about sample topography (see<br />

Fig. 5.5).<br />

This calculation for the combination of trace and retrace images (for height or<br />

amplitude information) was included as as Igor script and made accessible through<br />

a custom menu (See Fig. 5.6 and Annex 1 on page 105 for the script file).<br />

5.3 Sample preparation<br />

5.3.1 Slide preparation<br />

Well prepared slides are a prerequisite for meaningful optical and fluorescence<br />

microscopy. Cell preparation includes the collection by centrifugation, treatment<br />

of the cell, immobilizing of cells by applying the proper pressure on the thin glass<br />

71

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