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LANTEK User Manual - Ideal Industries

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Chapter 3<br />

Structured Cable Field Calibration and Testing<br />

Troubleshooting Impedance Problems<br />

Problem: High Impedance Readings<br />

Probable Causes<br />

Compression, stretching, or excessive bending damage to the<br />

cable.<br />

Defective connectors.<br />

Insulation damage at a connector.<br />

Ground loops created between cable shielding (if used) and<br />

equipment grounding (via RS-232 cable to computer, or auxiliary<br />

power).<br />

Improperly chosen cables or patch cords.<br />

Moisture in the cable.<br />

Other Tests Affected Test Possible Result<br />

Length<br />

Affected pairs will appear longer.<br />

Average Impedance Change in average impedance is inversely<br />

proportional to change in capacitance.<br />

Delay and Skew Test<br />

This test measures the period of time for a test signal applied to one end of a cable<br />

run to reach the other end. Skew indicates the difference between the measured time<br />

delay for that pair and the pair with the lowest value (displayed as 0.0 ns). Delay and<br />

Skew limits are set according to the currently selected cable type.<br />

Delay and Skew Errors<br />

Figure 3-19: Delay and Skew Test Screen<br />

Delay and skew measurements will usually differ slightly between pairs in the same<br />

cable. A substantial difference indicates a cable installation problem or a pair defect.<br />

Troubleshooting Delay and Skew Problems<br />

Problem: Excessive Differences between Measurements<br />

Probable Causes<br />

Other Tests Affected<br />

Cables which use different materials for insulating the four pairs of<br />

wires.<br />

A break or short in the pair.<br />

Excessive cable length.<br />

Cable installation problems.<br />

Not Applicable<br />

3-29

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