LANTEK User Manual - Ideal Industries
LANTEK User Manual - Ideal Industries
LANTEK User Manual - Ideal Industries
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Chapter 3<br />
Structured Cable Field Calibration and Testing<br />
The Wire Map test guarantees the following minimum level of error detection (based<br />
on four pairs of conductors, shield optional):<br />
‣ Any wiring error or combination of wiring errors will indicate a wire map failure.<br />
‣ Any combination of up to three opens, shorts, or cross-connections will be<br />
correctly identified.<br />
‣ Opens and shorts will provide an indication of the cable end that the error<br />
occurred on (provided by Length screen results in Autotest).<br />
‣ Split pairs will be identified based on specific patterns of inconsistent NEXT<br />
(Near-End Crosstalk).<br />
Troubleshooting Wire Map Problems<br />
Problem: One or more open pins<br />
Probable Causes<br />
Connector-to-wire punch down not mated<br />
Defective jack or plug.<br />
Broken wire(s).<br />
Other Tests Affected Test Possible Result<br />
DC Resistance Fail.<br />
Attenuation<br />
Fail.<br />
NEXT<br />
Some false measurements.<br />
Mutual Capacitance 0 reading possible.<br />
Length<br />
May be low if the open is near the DH.<br />
Problem: Shorted pins<br />
Probable Causes<br />
Conductors making contact at a connector.<br />
Jack or plug has pin or circuit defect.<br />
Cable damaged.<br />
Other Tests Affected Test Possible Result<br />
DC Resistance Low or zero.<br />
Attenuation<br />
Fail.<br />
NEXT<br />
Some false measurements.<br />
Capacitance<br />
Over limit.<br />
Length<br />
Reduced or shorted pairs.<br />
Problem: Miswired pins<br />
Probable Causes<br />
Conductors reversed at a connector.<br />
Other Tests Affected Test Possible Result<br />
Usually none<br />
Infrequently, one or more tests may fail.<br />
3-21
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