LANTEK User Manual - Ideal Industries
LANTEK User Manual - Ideal Industries
LANTEK User Manual - Ideal Industries
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Chapter 3<br />
Structured Cable Field Calibration and Testing<br />
ANALYZE TESTING FOR STRUCTURED CABLE<br />
ANALYZE SINGLE TEST MODE OVERVIEW<br />
Analyze mode allows you to troubleshoot by running individual tests, making<br />
adjustments, and observing changed test results. For example, a failed capacitance<br />
measurement can indicate crimped or stretched cable. With Analyze testing, you can<br />
walk the cable and check for damage and stretching. Freeing the cable at suspected<br />
problem areas should improve the measured reading.<br />
Depending on the cable type and defined test standard, any or all of the following<br />
individual tests are available:<br />
Wire Map Resistance Length<br />
Capacitance NEXT Attenuation/Insertion Loss<br />
ACR Return Loss Impedance<br />
Delay and Skew Power Sum NEXT Power Sum ACR<br />
Headroom ELFEXT Power Sum ELFEXT<br />
TDR<br />
Note: The RH is required to perform all tests with the exception of: TDR, Resistance,<br />
Length, Capacitance, Impedance, and Delay & Skew.<br />
Wire Map Test<br />
Wire Map testing is used to locate shorts, opens, and miswires. Test results are<br />
displayed graphically for easy visual indication of any problems.<br />
Wire Map Errors<br />
Figure 3-10: Wire Map Test Screen<br />
A failure in a Wire Map should always be the first problem corrected, since it causes<br />
faults in other tests. One open pin can cause DC loop resistance and attenuation tests<br />
to fail. An open may also cause a zero capacitance reading, and will cause false<br />
readings in NEXT tests.<br />
A wire map test will always look for and map all nine possible wires (four pairs +<br />
shield) but will only consider wires defined as present in the selected cable type for<br />
pass/fail criteria. For example, a wire that is not specified in the cable type will show<br />
on the map but will not cause a test failure.<br />
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