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Single Layer 5% 950K MW PMMA - Stanford Nanofabrication ...

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<strong>Single</strong> <strong>Layer</strong> <strong>5%</strong> <strong>950K</strong> <strong>PMMA</strong> in Anisole E-Beam Resist Process<br />

Revision 1.5 January 25, 2008<br />

James W. Conway<br />

<strong>Stanford</strong> <strong>Nanofabrication</strong> Facility - <strong>Stanford</strong> University<br />

jwc@snf.stanford.edu<br />

<strong>Single</strong> <strong>Layer</strong> <strong>5%</strong> <strong>950K</strong> <strong>PMMA</strong> in Anisole – 300 nm thin films for features to


Microchem <strong>5%</strong> <strong>950K</strong> <strong>MW</strong> <strong>PMMA</strong> Thickness (f) Spin Speed Chart:<br />

Film Thickness (angstrom)<br />

6000.00<br />

5000.00<br />

4000.00<br />

3000.00<br />

2000.00<br />

1000.00<br />

Microchem <strong>5%</strong> <strong>950K</strong> <strong>PMMA</strong> in Anisole<br />

Spin Speed (f) Thickness<br />

Non-Standard <strong>PMMA</strong> Blend<br />

0.00<br />

1500 2000 2500 3000 3500 4000 4500 5000 5500<br />

Area Features Size versus Dose-to-Clear:<br />

Dose to Clear (uC/cm**2)<br />

250<br />

200<br />

150<br />

100<br />

50<br />

Spin Speed (rpm)<br />

PCM TEST 04172007_1<br />

Area Feature Size vs. Dose to Clear<br />

<strong>5%</strong> <strong>950K</strong> <strong>PMMA</strong> by MICROCHEM<br />

non-Standard <strong>PMMA</strong> blend.<br />

0<br />

0.00 1.00 2.00 3.00 4.00 5.00 6.00 7.00 8.00 9.00 10.00<br />

Feature Size (um sq.)

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