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The bivariate Gaussian has six unknown independent parameters:<br />

A = normalizing coefficient which adjusts for the peak value of the bivariate surface;<br />

ρ12 = correlation coefficient which defines the direction of the distributionindependent<br />

variations in relation to the Cartesian directions y and z (ρ12=0<br />

means that the distribution variations overlap the Cartesian coordinates);<br />

my and mz = peak locations in Cartesian coordinates; and<br />

σy and σz = standard deviations in Cartesian coordinates.<br />

Six independent beam paths are sufficient to determine one bivariate Gaussian that has six<br />

independent unknown parameters. Some reasonable assumptions are made when applying the<br />

VRPM methodology to this problem, to reduce the number of unknown parameters. The first is<br />

setting the correlation parameter ρ12 equal to zero. This assumes that the reconstructed bivariate<br />

Gaussian is limited only to changes in the vertical and crosswind directions. Secondly, when<br />

ground level emissions are known to exist, the ground level PIC is expected to be the largest of<br />

the vertical beams. Therefore, the peak location in the vertical direction can be fixed to the<br />

ground level. In the above ground-level scenario, Equation 2 reduces into Equation 3:<br />

A ⎧⎪ 1 ⎡(r ⋅ cosθ − m y ) 2<br />

(r ⋅ sin θ ) 2 ⎤⎫⎪ G(r,θ ) = exp⎨− ⎢ + 2 2 ⎥⎬<br />

2πσ yσ z ⎩<br />

2 σ σ<br />

⎪ ⎢⎣ y z ⎥⎦⎭ ⎪<br />

The standard deviation and peak location retrieved in the one-dimensional SBFM procedure are<br />

substituted in Equation 3 to yield:<br />

Where:<br />

A ⎧⎪ 1 ⎡(r ⋅cosθ − my−1D ) 2<br />

(r ⋅sinθ ) 2 ⎤⎫⎪ G(A,σ z ) = exp⎨− ⎢ + 2 2 ⎥⎬<br />

2πσ y−1Dσ<br />

z ⎩⎪ 2 ⎢⎣ σ y−1D σ z ⎦⎥ ⎭⎪ σy-1D = standard deviation along the crosswind direction (found in the one-dimensional<br />

SBFM procedure);<br />

my-1D = peak location along the crosswind direction (found in the one-dimensional<br />

SBFM procedure);<br />

A and σz are the unknown parameters to be retrieved in the second phase of the fitting procedure.<br />

An error function (SSE) for minimization is defined for this phase in a similar manner. The SSE<br />

function for the second phase is defined as:<br />

r i ⎛ ⎞ 2<br />

SSE(A,σ z ) = ∑⎜ PIC<br />

⎜ i − ∫G(r i ,θ i , A,σ z )dr ⎟ i ⎝ 0 ⎠<br />

Where PIC is the measured PIC value for the i th beam. The SSE function is minimized using the<br />

Simplex method to solve for the two unknown parameters.<br />

A-3<br />

(3)<br />

(4)<br />

(5)

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