DESIGN OF A CUSTOM ASIC INCORPORATING CAN™ AND 1 ...

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Stuff Error – To verify a Stuff Error, six consecutive bits with the same polarity are inserted in a CAN message between the Start of Frame and the CRC Delimiter. This causes a Stuff Error to occur and after ten bit time slots the message is resent with random dominant and recessive bits between the two delimiters. Error – Active Error State – Since this is normal operation as long as the Transmit Error Counter (TEC) and Receive Error Counter (REC) are below 128, no test is necessary to prove proper operation. If the TEC or REC exceeds 127, the nodes become either Error – Passive or go in to the Bus – Off state. Error – Passive Error State – A node becomes Error – Passive when either the TEC or REC exceeds 127. Error – Passive nodes are not permitted to transmit Active Error Flags on the bus, but instead, transmit Passive Error Flags, which consist of six recessive bits. To verify this state, the REC and TEC are set to random values above 127 but less than 255. This forces the nodes to enter the Error-Passive state and transmit a Passive Error Flag (six recessive bits). At this point a dominant bit is sent on the bus, which is seen by the Error – Passive nodes, and forces these nodes to see the bus as being idle for eight additional bit times after an intermission frame before recognizing the bus as available. After this time, the nodes begin retransmitting normally and return to the Error-Active state. Bus – Off – This test is an extension of the test performed in Section 5.3.21.1. To verify nodes being in the Bus-Off state, a value of 256 is placed in the TEC, since receive errors cannot cause nodes to go Bus-Off. While in this mode the nodes cannot send or receive 187
messages, acknowledge messages, or transmit Error Frames of any kind. The only way for nodes to leave this state is by a software reset. For these tests, 30 CAN are nodes connected to the Altera DE2 board. The test setup configuration is shown in Figure 5.40. Only two configurable pins are required on the Altera DE2 board to perform this test. Eight tests in all are performed, one for each of the five error types and one for each of the three error states that a CAN node can assume. These tests are only run at speeds of 10 kbps and 125 kbps, for the reason that these two speeds are closest to the normal and overdrive speeds of 1 – Wire® networks. Figure 5.40 Error Test Setup. 188
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DESIGN OF A CUSTOM ASIC INCORPORATI
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ABSTRACT The vast majority of today
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LIST OF ABBREVIATIONS AND SYMBOLS A
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ISO International Organization for
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SI Serial In SO Serial Out SOF Star
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ACKNOWLEDGEMENTS I would like to ex
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2.4 Types of Devices...............
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4.3.5 Communication Speed Different
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5.3.21.1 Synchronization Test (test
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5.3 Resource Utilization...........
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LIST OF FIGURES 2.1 1 - Wire® Netw
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4.12 Read-Data Time Slot...........
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6.4 DS1996 Address Registers ......
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manufacturing process. Structured o
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describes the 1 - Wire® and CAN co
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2.2 1 - Wire® Overview The basis o
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All 1 - Wire® masters described in
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attachments, microcontroller with b
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Figure 2.3 Bidirectional port pin w
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2.3.3 Synthesizable 1 - Wire® Bus
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Figure 2.7 UART/RS232 Serial Port I
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hardware. Through control registers
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Table 2.2 1 - Wire® Bus Operations
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2.3.6 1 - Wire® Search Algorithm F
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detected. This ‘read two bits’
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in Figure 2.15. Alternatively, the
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of the bit, then write the desired
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2.4.2 Device Functions and Typical
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and development (R&D) investments b
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2.5 Network Types and Precedents As
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2.5.2 1 - Wire® Network Topologies
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2.5.3 1 - Wire® Network Limitation
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with a single selected slave. If an
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user group was founded in March of
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protocol on multiple media for maxi
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ecessive bit and the monitored stat
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specification: Start-Of-Frame, Arbi
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Cyclic Redundancy Check (CRC) Field
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Arbitration FieldThe Arbitration Fi
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SOF SOF Bit 28 Bit 27 Arbitration f
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Afterwards it starts transmitting s
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Figure 3.9 Structure of the Interfr
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error occurs, an Error Frame is gen
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Table 3.4 Error Flag Output Timing
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3.5.2 Error-Passive A node becomes
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where tNBT is the Nominal Bit Time
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Figure 3.12 Propagation Delay Betwe
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3.6.4 Synchronization t t t t (3.
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opposite value is inserted into the
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many systems, the bus length will b
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CHAPTER 4 THE CHALLENGES OF INTERFA
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In June 2004, Maxim Integrated Prod
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Wearable sensor technology is a new
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In traditional bus architectures, o
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Figure 4.3 Centralized arbiter with
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For the initial prototype design pr
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the ID of 31 transmits a ‘0’ (d
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Recently, a technique has been prop
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procedure, then the address claim p
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paradigms are prevalent in the desi
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systems possess a higher flexibilit
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fixed identifier and hence a fixed
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348sm Cm 47 8 smbit 11-bit hea
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est-case latency occurs when the bu
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to break the 1 - Wire® network int
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ow, is most critical for power deli
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computations have device-specific p
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Table 4.7 Example results with N 2
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4.3.5 Communication Speed Different
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anging” a port pin on a microproc
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From Figure 5.1, the block I/O pins
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5.2.2 Command Register In addition
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specifies the selected bit value to
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with i > m. This process is repeate
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Figure 5.6 Interrupt Register. OW_
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the INTR pin will be pulled high si
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master reset occurs. Table 5.2 show
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EN_FOW: Enable Force One Wire. Sett
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READ_ROM - Used to read the 64-bit
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5.2.8.1 Single Search ROM (single_s
Page 161 and 162: 5.2.8.3 Scratchpad Memory (scratchp
Page 163 and 164: 5.2.8.4 Command Recognition (cmd_re
Page 165 and 166: TBF - The Transmit Buffer provides
Page 167 and 168: compensate for the propagation dela
Page 169 and 170: Figure 5.15 CAN Module memory map [
Page 171 and 172: ‘0’, fast speed mode will be us
Page 173 and 174: COMP-SEL: Comparator Select. When t
Page 175 and 176: Figure 5.18 CAN Status Register. B
Page 177 and 178: that buffer is given to the CPU and
Page 179 and 180: Acceptance Mask Registers (accepted
Page 181 and 182: SJW1, SJW0: Synchronization Jump Wi
Page 183 and 184: TSEG22 - TSEG10: Time Segment Bits.
Page 185 and 186: The transmit clock (ttxclk) is used
Page 187 and 188: 5.3.13 CAN Module Transmit Buffer I
Page 189 and 190: Figure 5.28 CAN Transmit Data Segme
Page 191 and 192: 5.3.20 CAN Node Overview As stated
Page 193 and 194: Read Digital InputsRead the value o
Page 195 and 196: the clock high time is either 5 µs
Page 197 and 198: Yes Perform A/D Conversion on AN0 W
Page 199 and 200: and GP2 and GP5 as outputs. With th
Page 201 and 202: external INT pin, and then branches
Page 203 and 204: Read MCP2515 Rx Buffer for Digital
Page 205 and 206: When a valid message is received, t
Page 207 and 208: Table 5.19 Resource Utilization. Re
Page 209 and 210: For this test, only one CAN node wa
Page 211: an Error Frame to be generated. Aft
Page 215 and 216: 5.3.21.4 Send Basic Frame Test (sen
Page 217 and 218: going from one node to 30 nodes (se
Page 219 and 220: Table 6.1 Resource Utilization. Rev
Page 221 and 222: 6.2.1 Test Verification and Overvie
Page 223 and 224: has read access to this register. T
Page 225 and 226: system configuration used for this
Page 227 and 228: or not depends on the number of rec
Page 229 and 230: 6.4. There are two receiving CAN no
Page 231 and 232: CHAPTER 7 CONCLUSIONS AND FUTURE WO
Page 233 and 234: a communication bus reset will occu
Page 235 and 236: For the synthesizable CAN Controlle
Page 237 and 238: additional CAN nodes were added to
Page 239 and 240: Fall-Through Stack A LOW level on t
Page 241 and 242: In conclusion, the prototype system
Page 243 and 244: REFERENCES [1] IBM ASIC Products Ap
Page 245 and 246: [22] “CAN - a brief tutorial for
Page 247 and 248: [44] Microchip MCP2515 - Stand-Alon
Page 249 and 250: [67] K. Tindell and A. Burns, “Gu
Page 251 and 252: [88] “Verilog - A Language Refere
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