15.08.2013 Views

shot noise in mesoscopic conductors - Low Temperature Laboratory

shot noise in mesoscopic conductors - Low Temperature Laboratory

shot noise in mesoscopic conductors - Low Temperature Laboratory

SHOW MORE
SHOW LESS

You also want an ePaper? Increase the reach of your titles

YUMPU automatically turns print PDFs into web optimized ePapers that Google loves.

32 Ya.M. Blanter, M. Bu( ttiker / Physics Reports 336 (2000) 1}166<br />

which two pairs of <strong>in</strong>dices are identical, R or R "!R . With these resistances we can<br />

now generalize the familiar Johnson}Nyquist relation S "4k ¹R for two-probe <strong>conductors</strong>, to<br />

the case of a multi-probe conductor. For the correlation of a voltage di!erence < !< measured<br />

between contacts and with a voltage #uctuation < !< measured between contacts and ,<br />

Eq. (67) leads to<br />

(< !< )(< !< )"2k ¹(R #R ) . (69)<br />

The mean-squared voltage #uctuations " and " are determ<strong>in</strong>ed by the two-term<strong>in</strong>al<br />

resistances R of the multi-probe conductor. The correlations of voltage #uctuations (<strong>in</strong> the case<br />

when all four <strong>in</strong>dices di!er) are related to symmetrized four-probe resistances.<br />

If <strong>shot</strong> <strong>noise</strong> is generated, for <strong>in</strong>stance, by a current <strong>in</strong>cident at contact and taken out at contact<br />

(<strong>in</strong> a zero external impedance loop) and with all other contacts connected to an <strong>in</strong>"nite<br />

impedance circuit, the voltage #uctuations are [22]<br />

(< !< )(< !< )" R R S , (70)<br />

<br />

<br />

where S is the <strong>noise</strong> power spectrum of the current correlations at contacts and , and is an<br />

<br />

arbitrary <strong>in</strong>dex.<br />

These examples demonstrate that the #uctuations <strong>in</strong> a conductor are <strong>in</strong> general a complicated<br />

expression of the <strong>noise</strong> power spectrum determ<strong>in</strong>ed for the zero-impedance case, the resistances<br />

(or far from equilibrium the di!erential resistances) and the external impedance (matrix). These<br />

considerations are of importance s<strong>in</strong>ce <strong>in</strong> experiments it is the voltage #uctuations which are<br />

actually measured and which eventually are converted to current #uctuations.<br />

2.6. Applications<br />

In this subsection, we give some simple applications of the general formulae derived above, and<br />

illustrate them with experimental results. We consider only the zero-frequency limit. As we<br />

expla<strong>in</strong>ed <strong>in</strong> the Introduction, we do not <strong>in</strong>tend to give here a review of all results concern<strong>in</strong>g<br />

a speci"c system. Instead, we focus on the application of the scatter<strong>in</strong>g approach. For results<br />

derived for these systems with other methods, the reader is addressed to Table 1.<br />

2.6.1. Tunnel barriers<br />

For a tunnel barrier, which can be realized, for example, as a layer of <strong>in</strong>sulator separat<strong>in</strong>g two<br />

normal metal electrodes, all the transmission coe$cients ¹ are small, ¹ ;1 for any n. Separat<strong>in</strong>g<br />

terms l<strong>in</strong>ear <strong>in</strong> ¹ <strong>in</strong> Eq. (62) and tak<strong>in</strong>g <strong>in</strong>to account the de"nition of the Poisson <strong>noise</strong>, Eq. (58),<br />

we obta<strong>in</strong><br />

S" e<<br />

coth e<<br />

2k ¹ <br />

<br />

¹ "coth e<<br />

2k ¹ S <br />

. (71)<br />

At a given temperature, Eq. (71) describes the crossover from thermal <strong>noise</strong> at voltages e

Hooray! Your file is uploaded and ready to be published.

Saved successfully!

Ooh no, something went wrong!