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shot noise in mesoscopic conductors - Low Temperature Laboratory

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30 Ya.M. Blanter, M. Bu( ttiker / Physics Reports 336 (2000) 1}166<br />

Fig. 3. Noise measurements <strong>in</strong> an external circuit. The sample is denoted by S.<br />

of the spontaneous current #uctuations I() themselves. The total #uctuat<strong>in</strong>g current through the<br />

sample is thus given by<br />

I()"G()

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