An Investigation Into Ball Grid Array Inspection Techniques
An Investigation Into Ball Grid Array Inspection Techniques An Investigation Into Ball Grid Array Inspection Techniques
~esa STM-261 Figure Summary 4. Figure Machine used 61 62 63 64 65 66 67 Glenbrook Nicolet X-tek perpend. HP Four Pi 50X Reichert Reichert Reichert Defects Misalignment Misalignment Misalignment Misalignment Misalignment Misalignment Misalignment Figure 61. Glenbrook perpendicular transmission image of sample 4 showing misalignment. Figure 62. Nicolet perpendicular transmission image of sample 4 showing misalignment. 5.7. Results for Sample 4: Sample 4 contains a misaligned BGA. I... 46
47 Ball Grid Array Inspection Techniques Figure 63. X-tek perpendicular transmission image of sample 4 showing misalignment. Figure 64. HP5DX ball and pad slice laminography images of sample 4 showing misalignment.
- Page 1 and 2: An Investigation Into Ball Grid Arr
- Page 3: Abstract An evaluation of four diff
- Page 7 and 8: 1 Introduction X-ray techniques hav
- Page 9 and 10: X-rays and displays them as an imag
- Page 11 and 12: Each defect was identified using th
- Page 13 and 14: 2.3 BGA PCB Image Summary of defect
- Page 15 and 16: Sample 4 Misaligned component 2.4 U
- Page 17 and 18: 4. Equipment Evaluated Four machine
- Page 19 and 20: 'If ~ c.S"'
- Page 21 and 22: 5. Results This section is structur
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- Page 25 and 26: 19 Ball Grid Array Inspection Techn
- Page 27 and 28: .-:;,... ~ "''' . ..~ , '. ., ' -,
- Page 29 and 30: 5.3 Results For Sample 2 The defect
- Page 31 and 32: 25 Ball Grid Array Inspection Techn
- Page 33 and 34: 29 Ball Grid Array Inspection Techn
- Page 35 and 36: ~e 88el, e~.~tti '88.~_",! 88M_llle
- Page 37 and 38: 33 Ball Grid Array Inspection Techn
- Page 39 and 40: 5.5 Results For Sample 3 The defect
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- Page 45 and 46: . ..~.' '...~ .' _.I:t!IIDJ:I ""'1:
- Page 47: The laminography system also behave
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- Page 53 and 54: 51 Ball Grid Array Inspection Techn
- Page 55 and 56: 5.11. Identification of voids withi
- Page 57 and 58: Table 1: Defect Detectability and L
- Page 59 and 60: 7. Recommendations The most sensiti
- Page 61 and 62: 9. References 1. ESA PSS 01-708 The
- Page 63: ~esa STM-261 Editor: Copyright: Pub
47<br />
<strong>Ball</strong> <strong>Grid</strong> <strong>Array</strong> <strong>Inspection</strong> <strong>Techniques</strong><br />
Figure 63. X-tek perpendicular transmission<br />
image of sample 4 showing misalignment.<br />
Figure 64. HP5DX ball and pad slice<br />
laminography images of sample 4<br />
showing misalignment.